Year |
Citation |
Score |
2020 |
Watson BH, Brova MJ, Fanton M, Meyer RJ, Messing GL. Textured Mn-doped PIN-PMN-PT Ceramics: Harnessing Intrinsic Piezoelectricity for High-power Transducer Applications Journal of the European Ceramic Society. DOI: 10.1016/J.Jeurceramsoc.2020.07.071 |
0.361 |
|
2020 |
Watson BH, Brova MJ, Fanton MA, Meyer RJ, Messing GL. Densification and properties of oxygen sintered CuO-doped PIN-PMN-PT ceramics Journal of the European Ceramic Society. 40: 3956-3964. DOI: 10.1016/J.Jeurceramsoc.2020.04.040 |
0.325 |
|
2019 |
Watson BH, Brova MJ, Chang Y, Misture ST, Fanton MA, Meyer RJ, Messing GL. Low temperature reactive sintering of CuO-doped PIN-PMN-PT ceramics Journal of the European Ceramic Society. 39: 4719-4726. DOI: 10.1016/J.Jeurceramsoc.2019.06.030 |
0.374 |
|
2018 |
Sbrockey NM, Tompa GS, Lavelle R, Trumbull KA, Fanton MA, Snyder DW, Polcawich RG, Potrepka DM. Atomic layer deposition of PbTiO3 and PbZrxTi1-xO3 films using metal alkyl and alkylamide precursors Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 36: 031509. DOI: 10.1116/1.5014030 |
0.371 |
|
2017 |
Chang Y, Watson B, Fanton M, Meyer RJ, Messing GL. Enhanced texture evolution and piezoelectric properties in CuO-doped Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 grain-oriented ceramics Applied Physics Letters. 111: 232901. DOI: 10.1063/1.5006288 |
0.35 |
|
2012 |
Redwing JM, Manning IC, Weng X, Eichfeld SM, Acord JD, Fanton MA, Snyder DW. Effects of silicon doping and threading dislocation density on stress evolution in AlGaN films Materials Research Society Symposium Proceedings. 1396: 183-191. DOI: 10.1557/Opl.2012.215 |
0.673 |
|
2012 |
Weng X, Robinson JA, Trumbull K, Cavalero R, Fanton MA, Snyder D. Epitaxial graphene on SiC(0001̄): Stacking order and interfacial structure Applied Physics Letters. 100. DOI: 10.1063/1.3678021 |
0.379 |
|
2011 |
Fanton MA, Robinson JA, Puls C, Liu Y, Hollander MJ, Weiland BE, Labella M, Trumbull K, Kasarda R, Howsare C, Stitt J, Snyder DW. Characterization of graphene films and transistors grown on sapphire by metal-free chemical vapor deposition. Acs Nano. 5: 8062-9. PMID 21905713 DOI: 10.1021/Nn202643T |
0.398 |
|
2011 |
Robinson JA, Trumbull KA, Labella M, Cavalero R, Hollander MJ, Zhu M, Wetherington MT, Fanton M, Snyder DW. Effects of substrate orientation on the structural and electronic properties of epitaxial graphene on SiC(0001) Applied Physics Letters. 98. DOI: 10.1063/1.3597356 |
0.372 |
|
2010 |
Robinson JA, Labella M, Trumbull KA, Weng X, Cavelero R, Daniels T, Hughes Z, Hollander M, Fanton M, Snyder D. Epitaxial graphene materials integration: effects of dielectric overlayers on structural and electronic properties. Acs Nano. 4: 2667-72. PMID 20415460 DOI: 10.1021/Nn1003138 |
0.36 |
|
2010 |
Robinson J, Weng X, Trumbull K, Cavalero R, Wetherington M, Frantz E, Labella M, Hughes Z, Fanton M, Snyder D. Nucleation of epitaxial graphene on SiC(0001). Acs Nano. 4: 153-8. PMID 20000439 DOI: 10.1021/Nn901248J |
0.356 |
|
2010 |
Moon JS, Curtis D, Bui S, Marshall T, Wheeler D, Valles I, Kim S, Wang E, Weng X, Fanton M. Top-Gated Graphene Field-Effect Transistors Using Graphene on Si (111) Wafers Ieee Electron Device Letters. 31: 1193-1195. DOI: 10.1109/Led.2010.2065792 |
0.334 |
|
2010 |
Weng X, Robinson JA, Trumbull K, Cavalero R, Fanton MA, Snyder D. Structure of few-layer epitaxial graphene on 6H -SiC(0001) at atomic resolution Applied Physics Letters. 97. DOI: 10.1063/1.3517505 |
0.352 |
|
2010 |
Manning IC, Weng X, Fanton MA, Snyder DW, Redwing JM. Effects of composition on dislocation microstructure and stress in Si-doped AlxGa1-xN Journal of Crystal Growth. 312: 1301-1306. DOI: 10.1016/J.Jcrysgro.2009.11.024 |
0.723 |
|
2010 |
Fanton MA, Robinson JA, Hollander M, Weiland BE, Trumbull K, Labella M. Synthesis of thin carbon films on 4H-SiC by low temperature extraction of Si with HCl Carbon. 48: 2671-2673. DOI: 10.1016/J.Carbon.2010.03.072 |
0.45 |
|
2009 |
Robinson JA, Wetherington M, Tedesco JL, Campbell PM, Weng X, Stitt J, Fanton MA, Frantz E, Snyder D, VanMil BL, Jernigan GG, Myers-Ward RL, Eddy CR, Gaskill DK. Correlating Raman spectral signatures with carrier mobility in epitaxial graphene: a guide to achieving high mobility on the wafer scale. Nano Letters. 9: 2873-6. PMID 19719106 DOI: 10.1021/Nl901073G |
0.359 |
|
2009 |
Maximenko SI, Freitas JA, Garces NY, Glaser ER, Fanton MA. Evolution of D1-defect center in 4H-SiC during high temperature annealing Materials Science Forum. 600: 429-432. DOI: 10.4028/Www.Scientific.Net/Msf.600-603.429 |
0.411 |
|
2009 |
Garces NY, Glaser ER, Carlos WE, Fanton MA. Behavior of native defects in semi-insulating 4H-SiC after high temperature anneals and different cool-down rates Materials Science Forum. 600: 389-392. DOI: 10.4028/Www.Scientific.Net/Msf.600-603.389 |
0.454 |
|
2009 |
Fanton MA, Robinson JA, Weiland BE, Moon J. 3C-SIC films grown on Si(111) substrates as a template for graphene epitaxy Ecs Transactions. 19: 131-135. DOI: 10.1149/1.3119537 |
0.404 |
|
2009 |
Gaskill DK, Jernigan GG, Campbell PM, Tedesco JL, Culbertson JC, VanMil BL, Myers-Ward RL, Eddy CR, Moon J, Curtis D, Hu M, Wong D, McGuire C, Robinson JA, Fanton MA, et al. Epitaxial graphene growth on SiC wafers Ecs Transactions. 19: 117-124. DOI: 10.1149/1.3119535 |
0.476 |
|
2009 |
Manning IC, Weng X, Acord JD, Fanton MA, Snyder DW, Redwing JM. Tensile stress generation and dislocation reduction in Si-doped Al x Ga1-x N films Journal of Applied Physics. 106. DOI: 10.1063/1.3160331 |
0.733 |
|
2009 |
Maximenko SI, Freitas JA, Garces NY, Glaser ER, Fanton MA. Evolution of deep defect centers in semi-insulating 4H-SiC substrates under high-temperature annealing Journal of Electronic Materials. 38: 551-556. DOI: 10.1007/S11664-008-0607-0 |
0.431 |
|
2008 |
Fanton MA, Weiland BE, Redwing JM. Growth of thick p-type SiC epitaxial layers by halide chemical vapor deposition Journal of Crystal Growth. 310: 4088-4093. DOI: 10.1016/J.Jcrysgro.2008.06.027 |
0.652 |
|
2007 |
Fanton MA, Weiland BE, Snyder DW, Redwing JM. Thermodynamic equilibrium limitations on the growth of SiC by halide chemical vapor deposition Journal of Applied Physics. 101. DOI: 10.1063/1.2399882 |
0.637 |
|
2007 |
Garces NY, Glaser ER, Carlos WE, Fanton MA. Behaviour of defects in semi-insulating 4H-SiC after ultra-high temperature anneal treatments Physica B: Condensed Matter. 401: 77-80. DOI: 10.1016/J.Physb.2007.08.117 |
0.488 |
|
2007 |
Fanton MA, Li Q, Polyakov AY, Skowronski M. Electrical properties and deep levels spectra of bulk SiC crystals grown by hybrid physical-chemical vapor transport method Journal of Crystal Growth. 300: 314-318. DOI: 10.1016/J.Jcrysgro.2007.01.002 |
0.395 |
|
2007 |
Garces NY, Carlos WE, Glaser ER, Fanton MA. Identification of a three-site defect in semi-insulating 4H-SiC Journal of Electronic Materials. 36: 268-271. DOI: 10.1007/S11664-006-0043-Y |
0.394 |
|
2006 |
Chung HJ, Huh SW, Polyakov AY, Nigam S, Li Q, Grim J, Skowronski M, Glaser ER, Carlos WE, Freitas JA, Fanton MA. Electrical properties of undoped 6H- and 4H-SiC bulk crystals grown by halide chemical vapor deposition Materials Science Forum. 527: 625-628. DOI: 10.4028/Www.Scientific.Net/Msf.527-529.625 |
0.486 |
|
2006 |
Carlos WE, Glaser ER, Garces NY, Shanabrook BV, Fanton MA. Thermal evolution of defects in semi-insulating 4H SiC Materials Science Forum. 527: 531-534. DOI: 10.4028/Www.Scientific.Net/Msf.527-529.531 |
0.439 |
|
2006 |
Li Q, Polyakov AY, Skowronski M, Sanchez EK, Loboda MJ, Fanton MA, Bogart T, Gamble D, Smirnov NB, Makarov Y. Resistivity distribution in undoped 6H-SiC boules and wafers Materials Science Forum. 527: 51-54. DOI: 10.4028/Www.Scientific.Net/Msf.527-529.51 |
0.491 |
|
2006 |
Huh SW, Polyakov AY, Chung HJ, Nigam S, Skowronski M, Glaser ER, Carlos WE, Fanton MA, Smirnov NB. Deep electron and hole traps in 6H-SiC bulk crystals grown by the halide chemical vapor deposition Materials Science Forum. 527: 497-500. DOI: 10.4028/Www.Scientific.Net/Msf.527-529.497 |
0.519 |
|
2006 |
Fanton MA, Cavalero RL, Ray RG, Weiland BE, Everson W, Snyder D, Gamble R, Oslosky E. Growth of SiC boules with low boron concentration Materials Science Forum. 527: 47-50. DOI: 10.4028/Www.Scientific.Net/Msf.527-529.47 |
0.398 |
|
2006 |
Nigam S, Chung HJ, Huh SW, Grim J, Polyakov AY, Fanton MA, Weiland B, Snyder DW, Skowronski M. Growth kinetics and polytype stability in halide chemical vapor deposition of SiC Materials Science Forum. 527: 27-30. DOI: 10.4028/Www.Scientific.Net/Msf.527-529.27 |
0.447 |
|
2006 |
Polyakov AY, Fanton MA, Skowronski M, Chung HJ, Nigam S, Huh SW. Halide-CVD growth of bulk SiC crystals Materials Science Forum. 527: 21-26. DOI: 10.4028/Www.Scientific.Net/Msf.527-529.21 |
0.498 |
|
2006 |
Fanton MA, Li Q, Polyakov AY, Cavalero RL, Ray RG, Weiland BE, Skowronski M. Hybrid physical-chemical vapor transport growth of SiC bulk crystals Materials Science Forum. 527: 103-106. DOI: 10.4028/Www.Scientific.Net/Msf.527-529.103 |
0.369 |
|
2006 |
Carlos WE, Garces NY, Glaser ER, Fanton MA. Annealing of multivacancy defects in 4H-SiC Physical Review B - Condensed Matter and Materials Physics. 74. DOI: 10.1103/Physrevb.74.235201 |
0.403 |
|
2006 |
Huh SW, Chung HJ, Nigam S, Polyakov AY, Li Q, Skowronski M, Glaser ER, Carlos WE, Shanabrook BV, Fanton MA, Smirnov NB. Residual impurities and native defects in 6H-SiC bulk crystals grown by halide chemical-vapor deposition Journal of Applied Physics. 99. DOI: 10.1063/1.2150593 |
0.421 |
|
2006 |
Fanton MA, Cavalero RL, Weiland BE, Ray RG, Snyder DW, Gamble RD, Oslosky EJ, Everson WJ. Growth of 6H-SiC crystals with low boron concentration Journal of Crystal Growth. 287: 363-366. DOI: 10.1016/J.Jcrysgro.2005.11.045 |
0.413 |
|
2006 |
Fanton M, Snyder D, Weiland B, Cavalero R, Polyakov A, Skowronski M, Chung H. Growth of nitrogen-doped SiC boules by halide chemical vapor deposition Journal of Crystal Growth. 287: 359-362. DOI: 10.1016/J.Jcrysgro.2005.11.044 |
0.405 |
|
2006 |
Fanton MA, Li Q, Polyakov AY, Skowronski M, Cavalero R, Ray R. Effects of hydrogen on the properties of SiC crystals grown by physical vapor transport: Thermodynamic considerations and experimental results Journal of Crystal Growth. 287: 339-343. DOI: 10.1016/J.Jcrysgro.2005.11.022 |
0.435 |
|
2005 |
Li Q, Polyakov AY, Skowronski M, Fanton MA, Cavalero RC, Ray RG, Weiland BE. Properties of 6H-SiC crystals grown by hydrogen-assisted physical vapor transport Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1923181 |
0.46 |
|
2005 |
Li Q, Polyakov AY, Skowronski M, Sanchez EK, Loboda MJ, Fanton MA, Bogart T, Gamble RD. Nonuniformities of electrical resistivity in undoped 6H-SiC wafers Journal of Applied Physics. 97. DOI: 10.1063/1.1921340 |
0.445 |
|
2005 |
Chung HJ, Polyakov AY, Huh SW, Nigam S, Skowronski M, Fanton MA, Weiland BE, Snyder DW. Bulk growth of high-purity 6H-SiC single crystals by halide chemical-vapor deposition Journal of Applied Physics. 97. DOI: 10.1063/1.1865317 |
0.481 |
|
2005 |
Nigam S, Chung HJ, Polyakov AY, Fanton MA, Weiland BE, Snyder DW, Skowronski M. Growth kinetics study in halide chemical vapor deposition of SiC Journal of Crystal Growth. 284: 112-122. DOI: 10.1016/J.Jcrysgro.2005.06.027 |
0.426 |
|
2004 |
Fanton M, Skowronski M, Snyder DW, Chung HJ, Nigam S, Weiland B, Huh SW. Growth of Bulk SiC by Halide Chemical Vapor Deposition Materials Science Forum. 87-90. DOI: 10.4028/Www.Scientific.Net/Msf.457-460.87 |
0.408 |
|
2004 |
Li Q, Polyakov AY, Skowronski M, Roth MD, Fanton MA, Snyder DW. Electrical nonuniformities and their impact on the electron mobility in semi-insulating SiC crystals Journal of Applied Physics. 96: 411-414. DOI: 10.1063/1.1739290 |
0.453 |
|
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