Xiaochun Han, Ph.D. - Publications
Affiliations: | 2014 | Nuclear, Plasma, and Radiological Engineering | University of Illinois, Urbana-Champaign, Urbana-Champaign, IL |
Area:
Nuclear Engineering, Materials Science Engineering, Radiation PhysicsYear | Citation | Score | |||
---|---|---|---|---|---|
2019 | Bernhardt JR, Han X, Heuser BJ. Oxygen-18 Tracer Measurements of Anion Diffusion in Uranium Dioxide Thin Films Jom. 71: 4808-4816. DOI: 10.1007/S11837-019-03796-Y | 0.587 | |||
2016 | Zhong W, Mouche PA, Han X, Heuser BJ, Mandapaka KK, Was GS. Performance of iron-chromium-aluminum alloy surface coatings on Zircaloy 2 under high-temperature steam and normal BWR operating conditions Journal of Nuclear Materials. 470: 327-338. DOI: 10.1016/J.Jnucmat.2015.11.037 | 0.532 | |||
2015 | Lin Jl, Han X, Heuser BJ, Almer JD. Study of the mechanical behavior of the hydride blister/rim structure in Zircaloy-4 using in-situ synchrotron X-ray diffraction Journal of Nuclear Materials. DOI: 10.1016/J.Jnucmat.2015.12.048 | 0.503 | |||
2015 | Han X, Heuser BJ. Radiation enhanced diffusion of Nd in UO<inf>2</inf> Journal of Nuclear Materials. 466: 588-596. DOI: 10.1016/J.Jnucmat.2015.08.018 | 0.588 | |||
2012 | Strehle MM, Heuser BJ, Elbakhshwan MS, Han X, Gennardo DJ, Pappas HK, Ju H. Characterization of single crystal uranium-oxide thin films grown via reactive-gas magnetron sputtering on yttria-stabilized zirconia and sapphire Thin Solid Films. 520: 5616-5626. DOI: 10.1016/J.Tsf.2012.04.022 | 0.571 | |||
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