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Ivan Dolog, Ph.D. - Publications

Affiliations: 
2008 University of Akron, Akron, OH, United States 
Area:
Physical Chemistry
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5 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2008 Rowicka E, Kashyn D, Reagan MA, Hirano T, Paramonov PB, Dolog I, Mallik RR, Lyuksyutov SF. Influence of Water condensation on charge transport and electric breakdown between an Atomic Force Microscope tip, polymeric, and (semiconductor) CdS surfaces Current Nanoscience. 4: 166-172. DOI: 10.2174/157341308784340868  0.353
2007 Dolog I, Mallik RR, Lyuksyutov SF. Robust functionalization of amorphous cadmium sulfide films using z -lift amplitude modulated atomic force microscopy-assisted electrostatic nanolithography Applied Physics Letters. 90. DOI: 10.1063/1.2742910  0.464
2006 Dolog I, Mallik RR, Mozynski A, Hu J, Wang H. Adsorption of 7-ethynyl-2,4,9-trithia-tricyclo[3.3.1.13,7]decane on ultra-thin CdS films Surface Science. 600: 2972-2979. DOI: 10.1016/J.Susc.2006.05.011  0.373
2004 Dolog I, Mallik RR, Malz D, Mozynski A. Spectroscopic, topological, and electronic characterization of ultrathin a-CdTe:O tunnel barriers Journal of Applied Physics. 95: 3075-3080. DOI: 10.1063/1.1647259  0.367
2003 Lyuksyutov SF, Paramonov PB, Dolog I, Ralich RM. Peculiarities of an anomalous electronic current during atomic force microscopy assisted nanolithography on n-type silicon Nanotechnology. 14: 716-721. DOI: 10.1088/0957-4484/14/7/305  0.45
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