Year |
Citation |
Score |
2019 |
Wang Z, Goodge BH, Baek DJ, Zachman MJ, Huang X, Bai X, Brooks CM, Paik H, Mei AB, Brock JD, Maria J, Kourkoutis LF, Schlom DG. Epitaxial
SrTiO3
film on silicon with narrow rocking curve despite huge defect density Physical Review Materials. 3. DOI: 10.1103/Physrevmaterials.3.073403 |
0.311 |
|
2019 |
Joress H, Arlington SQ, Weihs TP, Brock JD, Woll AR. X-ray reflectivity with a twist: Quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation Applied Physics Letters. 114: 081904. DOI: 10.1063/1.5085063 |
0.636 |
|
2018 |
Joress H, Brock JD, Woll AR. Quick X-ray reflectivity using monochromatic synchrotron radiation for time-resolved applications. Journal of Synchrotron Radiation. 25: 706-716. PMID 29714180 DOI: 10.1107/S1600577518003004 |
0.645 |
|
2018 |
Huang X, Plaza M, Ko JYP, Abruña HD, Brock JD. Relaxation of asymmetric crystallographic tilt: In situ x-ray diffraction studies of epitaxial electrodeposition of bismuth on GaAs (110) Journal of Applied Physics. 124: 035301. DOI: 10.1063/1.5026630 |
0.338 |
|
2015 |
Gutiérrez-Llorente A, Joress H, Woll A, Holtz ME, Ward MJ, Sullivan MC, Muller DA, Brock JD. Epitaxial crystals of Bi2Pt2O7 pyrochlore through the transformation of δ -Bi2O3 fluorite Apl Materials. 3. DOI: 10.1063/1.4908103 |
0.653 |
|
2015 |
Sullivan MC, Ward MJ, Gutiérrez-Llorente A, Adler ER, Joress H, Woll A, Brock JD. Complex oxide growth using simultaneous in situ reflection high-energy electron diffraction and x-ray reflectivity: When is one layer complete? Applied Physics Letters. 106. DOI: 10.1063/1.4906419 |
0.639 |
|
2011 |
Ferguson JD, Kim Y, Kourkoutis LF, Vodnick A, Woll AR, Muller DA, Brock JD. Epitaxial oxygen getter for a brownmillerite phase transformation in manganite films. Advanced Materials (Deerfield Beach, Fla.). 23: 1226-30. PMID 21381119 DOI: 10.1002/Adma.201003581 |
0.579 |
|
2011 |
Dale D, Gruner SM, Brock J, Bilderback D, Fontes E. Science at the Hard X-ray Diffraction Limit (XDL2011), Part 1 Synchrotron Radiation News. 24: 4-11. DOI: 10.1080/08940886.2011.634312 |
0.426 |
|
2010 |
Bilderback DH, Brock JD, Dale DS, Finkelstein KD, Pfeifer MA, Gruner SM. Energy recovery linac (ERL) coherent hard x-ray sources New Journal of Physics. 12. DOI: 10.1088/1367-2630/12/3/035011 |
0.315 |
|
2010 |
Brock JD, Ferguson JD, Kim Y, Wang HQ, Woll AR. Nucleation, coarsening, and coalescence during layer-by-layer growth of complex oxides via pulsed laser deposition: Time-resolved, diffuse X-ray scattering studies Materials Science and Engineering A. 528: 72-76. DOI: 10.1016/J.Msea.2010.07.053 |
0.674 |
|
2010 |
Brock JD, Ferguson JD, Woll AR. X-ray scattering studies of the surface structure of complex oxide films during layer-by-layer growth via pulsed laser deposition Metallurgical and Materials Transactions a: Physical Metallurgy and Materials Science. 41: 1162-1166. DOI: 10.1007/S11661-009-9910-5 |
0.715 |
|
2009 |
Ferguson JD, Arikan G, Dale DS, Woll AR, Brock JD. Measurements of surface diffusivity and coarsening during pulsed laser deposition. Physical Review Letters. 103: 256103. PMID 20366266 DOI: 10.1103/Physrevlett.103.256103 |
0.667 |
|
2009 |
Amassian A, Pozdin VA, Desai TV, Hong S, Woll AR, Ferguson JD, Brock JD, Malliaras GG, Engstrom JR. Post-deposition reorganization of pentacene films deposited on low-energy surfaces Journal of Materials Chemistry. 19: 5580-5592. DOI: 10.1039/B907947E |
0.663 |
|
2008 |
Hong S, Amassian A, Woll AR, Bhargava S, Ferguson JD, Malliaras GG, Brock JD, Engstrom JR. Real time monitoring of pentacene growth on Si O2 from a supersonic source Applied Physics Letters. 92. DOI: 10.1063/1.2946497 |
0.677 |
|
2007 |
Ferguson JD, Woll AR, Arikan G, Dale DS, Amassian A, Tate MW, Brock JD. Time Resolved In-Situ Diffuse X-ray Scattering Measurements of the Surface Morphology of Homoepitaxial SrTiO3 Films During Pulsed Laser Deposition Mrs Proceedings. 1034. DOI: 10.1557/PROC-1034-K10-20 |
0.705 |
|
2007 |
Dale D, Fleet A, Woll A, Suzuki Y, Brock JD. Technical Report:In-situStudies of Pulsed Laser Deposition Growth at CHESS Synchrotron Radiation News. 20: 32-37. DOI: 10.1080/08940880701401151 |
0.722 |
|
2006 |
Fleet A, Dale D, Woll AR, Suzuki Y, Brock JD. Multiple time scales in diffraction measurements of diffusive surface relaxation. Physical Review Letters. 96: 055508. PMID 16486952 DOI: 10.1103/Physrevlett.96.055508 |
0.739 |
|
2006 |
Dale D, Fleet A, Suzuki Y, Brock JD. X-ray scattering from real surfaces: Discrete and continuous components of roughness Physical Review B - Condensed Matter and Materials Physics. 74. DOI: 10.1103/Physrevb.74.085419 |
0.688 |
|
2005 |
Fleet A, Dale D, Suzuki Y, Brock JD. Observed effects of a changing step-edge density on thin-film growth dynamics. Physical Review Letters. 94: 036102. PMID 15698285 DOI: 10.1103/Physrevlett.94.036102 |
0.721 |
|
2004 |
Wang HH, Fleet A, Brock JD, Dale D, Suzuki Y. Nearly strain-free heteroepitaxial system for fundamental studies of pulsed laser deposition: EuTiO 3 on SrTiO 3 Journal of Applied Physics. 96: 5324-5328. DOI: 10.1063/1.1794362 |
0.74 |
|
2003 |
Dale D, Fleet A, Brock JD, Suzuki Y. Dynamically tuning properties of epitaxial colossal magnetoresistance thin films Applied Physics Letters. 82: 3725-3727. DOI: 10.1063/1.1578186 |
0.675 |
|
2002 |
Dale D, Fleet A, Brock J, Suzuki Y. The Effect of Changing Epitaxial Strain on Colossal Magnetoresistance Thin Films Mrs Proceedings. 751. DOI: 10.1557/Proc-751-Z3.32 |
0.669 |
|
2001 |
Pomeroy JM, Couture A, Jacobsen J, Cooper BH, Sethna J, Brock JD. STM investigation of energetic insertion during direct ion deposition Mrs Proceedings. 672. DOI: 10.1557/PROC-672-O2.9 |
0.662 |
|
2000 |
Pomeroy JM, Couture A, Jacobsen J, Hill CC, Sethna JP, Cooper BH, Brock JD. STM characterization of Cu thin films grown by direct ion deposition Mrs Proceedings. 648. DOI: 10.1557/PROC-648-P7.3 |
0.68 |
|
1999 |
Judy A, Murty MR, Butler E, Pomeroy J, Cooper B, Woll A, Brock J, Kycia S, Headrick R. Roughening of Au(111) Surfaces During Ion Beam Erosion: A Scanning Tunneling Microscope and X-Ray Diffraction Study Mrs Proceedings. 570. DOI: 10.1557/Proc-570-61 |
0.731 |
|
1998 |
Murty MVR, Curcic T, Judy A, Cooper BH, Woll AR, Brock JD, Kycia S, Headrick RL. X-Ray Scattering Study of the Surface Morphology of Au(111) duringAr+Ion Irradiation Physical Review Letters. 80: 4713-4716. DOI: 10.1103/Physrevlett.80.4713 |
0.657 |
|
1998 |
Headrick RL, Kycia S, Woll AR, Brock JD, Ramana Murty MV. Ion-assisted nucleation and growth of GaN on sapphire(0001) Physical Review B. 58: 4818-4824. DOI: 10.1103/PhysRevB.58.4818 |
0.548 |
|
1996 |
Headrick RL, Kycia S, Park YK, Woll AR, Brock JD. Real-time x-ray-scattering measurement of the nucleation kinetics of cubic gallium nitride on beta -SiC(001). Physical Review. B, Condensed Matter. 54: 14686-14691. PMID 9985477 |
0.609 |
|
1992 |
Bilderback DH, Batterman BW, Bedzyk MJ, Brock J, Finkelstein K, Headrick R, Shen Q. High-flux x-ray undulator radiation from proposed B factory storage rings at Cornell University Review of Scientific Instruments. 63: 1590-1593. DOI: 10.1063/1.1142985 |
0.302 |
|
1991 |
Noh DY, Brock JD, Fossum JO, Hill JP, Nuttall WJ, Litster JD, Birgeneau RJ. Synchrotron x-ray study of dimensional crossover in solid-phase smectic liquid-crystal films. Physical Review. B, Condensed Matter. 43: 842-850. PMID 9996278 DOI: 10.1103/Physrevb.43.842 |
0.378 |
|
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