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John Silcox - Publications

Affiliations: 
1961- Applied and Engineering Physics Cornell University, Ithaca, NY, United States 
Area:
Condensed Matter Physics, Materials Science Engineering
Website:
https://www.aep.cornell.edu/faculty-directory/john-silcox
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109 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2009 Wang X, Ren X, Kahen K, Hahn MA, Rajeswaran M, Maccagnano-Zacher S, Silcox J, Cragg GE, Efros AL, Krauss TD. Non-blinking semiconductor nanocrystals. Nature. 459: 686-9. PMID 19430463 DOI: 10.1038/Nature08072  0.302
2009 Andre Mkhoyan K, Contryman AW, Silcox J, Stewart DA, Eda G, Mattevi C, Miller S, Chhowalla M. Atomic and electronic structure of graphene-oxide. Nano Letters. 9: 1058-63. PMID 19199476 DOI: 10.1021/Nl8034256  0.375
2008 Yu Z, Hahn MA, Maccagnano-Zacher SE, Calcines J, Krauss TD, Alldredge ES, Silcox J. Small-angle rotation in individual colloidal CdSe quantum rods. Acs Nano. 2: 1179-88. PMID 19206335 DOI: 10.1021/Nn700323V  0.653
2008 Silcox J. Microscopy: Spot the atom. Nature. 454: 283-4. PMID 18633403 DOI: 10.1038/454283A  0.313
2008 Ozatay O, Gowtham PG, Tan KW, Read JC, Mkhoyan KA, Thomas MG, Fuchs GD, Braganca PM, Ryan EM, Thadani KV, Silcox J, Ralph DC, Buhrman RA. Sidewall oxide effects on spin-torque- and magnetic-field-induced reversal characteristics of thin-film nanomagnets. Nature Materials. 7: 567-73. PMID 18536721 DOI: 10.1038/Nmat2204  0.643
2008 Mkhoyan KA, Maccagnano-Zacher SE, Kirkland EJ, Silcox J. Effects of amorphous layers on ADF-STEM imaging. Ultramicroscopy. 108: 791-803. PMID 18374489 DOI: 10.1016/J.Ultramic.2008.01.007  0.712
2008 Muller DA, Kourkoutis LF, Murfitt M, Song JH, Hwang HY, Silcox J, Dellby N, Krivanek OL. Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy. Science (New York, N.Y.). 319: 1073-6. PMID 18292338 DOI: 10.1126/Science.1148820  0.666
2008 Mkhoyan KA, Maccagnano-Zacher SE, Thomas MG, Silcox J. Critical role of inelastic interactions in quantitative electron microscopy. Physical Review Letters. 100: 025503. PMID 18232885 DOI: 10.1017/S1431927608085954  0.705
2008 Maccagnano-Zacher SE, Mkhoyan KA, Kirkland EJ, Silcox J. Effects of tilt on high-resolution ADF-STEM imaging. Ultramicroscopy. 108: 718-26. PMID 18160220 DOI: 10.1016/J.Ultramic.2007.11.003  0.71
2008 Yu Z, Muller DA, Silcox J. Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfaces. Ultramicroscopy. 108: 494-501. PMID 17920197 DOI: 10.1016/J.Ultramic.2007.08.007  0.695
2008 Maccagnano-Zacher S, Mkhoyan A, Silcox J. High-resolution electron imaging of amorphous layers with aberration-corrected probes Microscopy and Microanalysis. 14: 940-941. DOI: 10.1017/S1431927608088120  0.406
2008 Muller D, Kourkoutis L, Murfitt M, Song J, Hwang H, Silcox J, Dellby N, Krivanek O. Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy Microscopy and Microanalysis. 14: 132-133. DOI: 10.1017/S1431927608087448  0.623
2007 Mkhoyan KA, Babinec T, Maccagnano SE, Kirkland EJ, Silcox J. Separation of bulk and surface-losses in low-loss EELS measurements in STEM. Ultramicroscopy. 107: 345-55. PMID 17074441 DOI: 10.1017/S1431927606063045  0.672
2007 Maccagnano-Zacher S, Mkhoyan A, Silcox J. Reduction of Contrast in ADF-STEM Images Due To Amorphous Layer Mrs Proceedings. 1026. DOI: 10.1557/Proc-1026-C16-02  0.378
2007 Maccagnano S, Mkhoyan A, Kirkland E, Silcox J. Effect of Amorphous Layers on ADF-STEM Imaging using Aberration-Corrected Probes Microscopy and Microanalysis. 13: 1202-1203. DOI: 10.1017/S1431927607073552  0.345
2007 Mkhoyan A, Batson P, Cha J, Schaff W, Silcox J. Direct Determination of Local Lattice Polarity in Crystals Microscopy and Microanalysis. 13: 1188-1189. DOI: 10.1017/S1431927607073539  0.641
2007 Mkhoyan A, Silcox J, McGuire M, DiSalvo F. Radiolytic Purification of CaO by Electron Beams Microscopy and Microanalysis. 13: 1268-1269. DOI: 10.1017/S1431927607073370  0.345
2006 Mkhoyan KA, Silcox J, Ellison A, Ast D, Dieckmann R. Full recovery of electron damage in glass at ambient temperatures. Physical Review Letters. 96: 205506. PMID 16803186 DOI: 10.1103/Physrevlett.96.205506  0.704
2006 Mkhoyan KA, Batson PE, Cha J, Schaff WJ, Silcox J. Direct determination of local lattice polarity in crystals. Science (New York, N.Y.). 312: 1354. PMID 16741114 DOI: 10.1126/Science.1124511  0.758
2006 Mkhoyan KA, Silcox J, McGuire MA, Disalvo FJ. Radiolytic purification of CaO by electron beams Philosophical Magazine. 86: 2907-2917. DOI: 10.1080/14786430600658025  0.708
2006 Ozatay O, Mkhoyan KA, Thomas MG, Fuchs GD, Silcox J, Buhrman RA. Analytical electron microscopy study of growth mechanism for smoothing of metallic multilayer thin films Applied Physics Letters. 89. DOI: 10.1063/1.2358958  0.706
2006 Silcox J, Mkhoyan KA. A STEM study of glass Microscopy and Microanalysis. 12: 1334-1335. DOI: 10.1017/S1431927606063896  0.642
2006 Maccagnano S, Mkhoyan KA, Calcines J, Krauss TD, Silcox J. Electron damage of CdSe quantum rods Microscopy and Microanalysis. 12: 498-499. DOI: 10.1017/S1431927606062301  0.695
2005 Yu Z, Guo L, Du H, Krauss T, Silcox J. Shell distribution on colloidal CdSe/ZnS quantum dots. Nano Letters. 5: 565-70. PMID 15826088 DOI: 10.1021/Nl048245N  0.638
2005 Yu Z, Hahn MA, Calcines J, Krauss TD, Silcox J. Study of the internal structure of individual CdSe quantum rods using electron nanodiffraction Applied Physics Letters. 86: 013101-1-013101-3. DOI: 10.1063/1.1843278  0.655
2005 Yu Z, Quo L, Du H, Krauss T, Silcox J. Shell distribution on colloidal CdSe/ZnS quantum dots Nano Letters. 5: 565-570. DOI: 10.1021/nl048245n  0.55
2005 Maccagnano S, Mkhoyan KA, Calcines J, Krauss TD, Silcox J. Shape of CdSe Quantum Rods using Quantitative ADF STEM Imaging Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605503726  0.683
2004 Krishnan R, Hahn MA, Yu Z, Silcox J, Fauchet PM, Krauss TD. Polarization surface-charge density of single semiconductor quantum rods. Physical Review Letters. 92: 216803. PMID 15245305 DOI: 10.1103/Physrevlett.92.216803  0.597
2004 Yu Z, Guo L, Du H, Krauss T, Silcox J. Characterization of shell material on colloidal CdSe/ZnS quantum dots Materials Research Society Symposium Proceedings. 818: 177-182. DOI: 10.1557/Proc-818-M6.8.1  0.591
2004 Jiang N, Qiu J, Silcox J. Effects of high-energy electron irradiation on heavy-metal fluoride glass Journal of Applied Physics. 96: 6230-6233. DOI: 10.1063/1.1814812  0.35
2004 Mkhoyan KA, Kirkland EJ, Silcox J, Alldredge ES. Atomic level scanning transmission electron microscopy characterization of GaN/AlN quantum wells Journal of Applied Physics. 96: 738-746. DOI: 10.1063/1.1756222  0.731
2004 Yu Z, Muller DA, Silcox J. Study of strain fields at a-Si/c-Si interface Journal of Applied Physics. 95: 3362-3371. DOI: 10.1063/1.1649463  0.686
2004 Mkhoyan KA, Silcox J, Yu Z, Schaff WJ, Eastman LF. Formation of a quasi-two-dimensional electron gas in GaN/AlxGa1-xN heterostructures with diffuse interfaces Journal of Applied Physics. 95: 1843-1848. DOI: 10.1063/1.1641148  0.776
2004 Yu Z, Silcox J. Channeling of Sub–angstrom Probes Along Isolated Atomic Columns Microscopy and Microanalysis. 10: 570-571. DOI: 10.1017/S143192760488485X  0.571
2004 Jiang N, Silcox J. High-energy electron irradiation and b coordination in Na 2O-B2O3-SiO2 glass Journal of Non-Crystalline Solids. 342: 12-17. DOI: 10.1016/J.Jnoncrysol.2004.07.001  0.361
2003 Yu Z, Batson PE, Silcox J. Artifacts in aberration-corrected ADF-STEM imaging. Ultramicroscopy. 96: 275-84. PMID 12871794 DOI: 10.1016/S0304-3991(03)00093-7  0.768
2003 Jiang N, Qiu J, Ellison A, Silcox J. Fundamentals of high-energy electron-irradiation-induced modifications of silicate glasses Physical Review B. 68: 64207. DOI: 10.1103/Physrevb.68.064207  0.326
2003 Mkhoyan KA, Silcox J, Wu H, Schaff WJ, Eastman LF. Nonuniformities in GaN/AlN quantum wells Applied Physics Letters. 83: 2668-2670. DOI: 10.1063/1.1614439  0.715
2003 Jiang N, Hembree GG, Spence JCH, Qiu J, Garcia de Abajo FJ, Silcox J. Nanoring formation by direct-write inorganic electron-beam lithography Applied Physics Letters. 83: 551-553. DOI: 10.1063/1.1592895  0.405
2003 Mkhoyan KA, Silcox J, Alldredge ES, Ashcroft NW, Lu H, Schaff WJ, Eastman LF. Measuring electronic structure of wurtzite InN using electron energy loss spectroscopy Applied Physics Letters. 82: 1407-1409. DOI: 10.1063/1.1559660  0.694
2003 Mkhoyan KA, Silcox J. Electron-beam-induced damage in wurtzite InN Applied Physics Letters. 82: 859-861. DOI: 10.1063/1.1543642  0.697
2003 Yu Z, Muller DA, Silcox J. Relative contrast in a-Si and c-Si in ADF-STEM imaging Microscopy and Microanalysis. 9: 848-849. DOI: 10.1017/S1431927603444243  0.658
2003 Mkhoyan KA, Wu H, Schaff WJ, Eastman LF, Silcox J. Measuring non-uniformities in GaN/AIN quantum wells Microscopy and Microanalysis. 9: 816-817. DOI: 10.1017/S1431927603444085  0.664
2003 Yu Z, Hahn M, Krauss T, Silcox J. STEM observations of twisting in colloidal CdSe quantum rods Microscopy and Microanalysis. 9: 362-363. DOI: 10.1017/S1431927603441810  0.605
2002 Wu H, Schaff WJ, Koley G, Furis M, Cartwright AN, Mkhoyan KA, Silcox J, Henderson W, Doolittle WA, Osinsky AV. Molecular Beam Epitaxial Growth of AlN/GaN Multiple Quantum Wells Mrs Proceedings. 743: 375-380. DOI: 10.1557/Proc-743-L6.2  0.697
2002 Jiang N, Silcox J. Electron irradiation induced phase decomposition in alkaline earth multi-component oxide glass Journal of Applied Physics. 92: 2310-2316. DOI: 10.1063/1.1496148  0.341
2002 Jiang N, Qiu J, Gaeta AL, Silcox J. Nanoscale modification of optical properties in Ge-doped SiO2 glass by electron-beam irradiation Applied Physics Letters. 80: 2005-2007. DOI: 10.1063/1.1454211  0.373
2002 Jiang N, Eustis TJ, Cai J, Ponce F, Spence J, Silcox J. Polarity determination by atomic location by channeling-enhanced microanalysis Applied Physics Letters. 80: 389-391. DOI: 10.1063/1.1433919  0.776
2002 Silcox J. The Emergence of Aberration Correctors for Electron Lenses Microscopy Today. 10: 8-9. DOI: 10.1017/S1551929500057977  0.352
2002 Mkhoyan KA, Silcox J. Electron beam induced damage in wurtzite InN Microscopy and Microanalysis. 8: 628-629. DOI: 10.1017/S1431927602106088  0.688
2002 Yu Z, Silcox J. Observation of Non-uniformities in Calcium Aluminosilicate Glass using EELS Microscopy and Microanalysis. 8: 604-605. DOI: 10.1017/S1431927602105964  0.552
2002 Mkhoyan KA, Alldredge ES, Ashcroft NW, Silcox J. EELS measurements on wurtzite InN Microscopy and Microanalysis. 8: 570-571. DOI: 10.1017/S1431927602105794  0.637
2002 Silcox J. The Emergence of Aberration Correctors for Electron Lenses Microscopy and Microanalysis. 8: 2-3. DOI: 10.1017/S1431927602101449  0.352
2001 Muller DA, Edwards B, Kirkland EJ, Silcox J. Simulation of thermal diffuse scattering including a detailed phonon dispersion curve. Ultramicroscopy. 86: 371-80. PMID 11281157 DOI: 10.1016/S0304-3991(00)00128-5  0.506
2001 Plisch MJ, Chang JL, Silcox J, Buhrman RA. Atomic-scale characterization of a Co/AlOx/Co magnetic tunnel junction by scanning transmission electron microscopy Applied Physics Letters. 79: 391-393. DOI: 10.1063/1.1383569  0.364
2001 Mkhoyan KA, Alldredge ES, Silcox J, Ashcroft NW. Determination of the Width of the GaN/AlxGa1-xN Heterointerface Using EELS Microscopy and Microanalysis. 7: 216-217. DOI: 10.1017/S143192760002715X  0.661
2000 Eustis TJ, Silcox J, Murphy MJ, Schaff WJ. Evidence From EELS of Oxygen in the Nucleation Layer of a MBE Grown III-N HEMT Mrs Internet Journal of Nitride Semiconductor Research. 5: 188-194. DOI: 10.1557/S1092578300004269  0.755
2000 Jiang N, Silcox J. Observations of reaction zones at chromium/oxide glass interfaces Journal of Applied Physics. 87: 3768-3776. DOI: 10.1063/1.372412  0.315
2000 Lee JL, Silcox J. Annular dark-field image simulation of the YBa2Cu3O(7-δ)/BaF2 interface Ultramicroscopy. 84: 65-74. DOI: 10.1016/S0304-3991(00)00020-6  0.369
1999 Eustis TJ, Silcox J, Murphy MJ, Schaff WJ. Evidence from EELS of Oxygen in the Nucleation Layer of a MBE grown III-N HEMT Mrs Proceedings. 595. DOI: 10.1557/Proc-595-F99W3.31  0.755
1999 Vanfleet R, Muller D, Gossmann H, Citrin P, Silcox J. Atomic-Scale Imaging of Dopant Atom Distributions Within Silicon δ-Doped Layers Mrs Proceedings. 589. DOI: 10.1557/Proc-589-173  0.489
1999 Murphy MJ, Chu K, Wu H, Yeo W, Schaff WJ, Ambacher O, Eastman LF, Eustis TJ, Silcox J, Dimitrov R, Stutzmann M. High-frequency AlGaN/GaN polarization-induced high electron mobility transistors grown by plasma-assisted molecular-beam epitaxy Applied Physics Letters. 75: 3653-3655. DOI: 10.1063/1.125418  0.775
1999 Vanfleet RR, Muller D, Gossmann H-, Silcox J. Antimony Delta Doping by Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy Microscopy and Microanalysis. 5: 614-615. DOI: 10.1017/S1431927600016391  0.529
1998 Muller DA, Shashkov DA, Benedek R, Yang LH, Silcox J, Seidman DN. Atomic-Scale Studies of the Electronic Structure of Ceramic/Metal Interfaces:{222}MgO/Cu Materials Science Forum. 99-102. DOI: 10.4028/Www.Scientific.Net/Msf.294-296.99  0.527
1998 Muller DA, Shashkov DA, Benedek R, Yang LH, Silcox J, Seidman DN. Atomic Scale Observations of Metal-Induced Gap States at{222}MgO/Cu Interfaces Physical Review Letters. 80: 4741-4744. DOI: 10.1103/Physrevlett.80.4741  0.494
1998 Muller DA, Batson PE, Silcox J. Measurement and models of electron-energy-loss spectroscopy core-level shifts in nickel aluminum intermetallics Physical Review B. 58: 11970-11981. DOI: 10.1103/Physrevb.58.11970  0.497
1998 Muller DA, Singh DJ, Silcox J. Connections between the electron-energy-loss spectra, the local electronic structure, and the physical properties of a material: A study of nickel aluminum alloys Physical Review B. 57: 8181-8202. DOI: 10.1103/Physrevb.57.8181  0.525
1998 Vanfleet RR, Silcox J. Prospects For Imaging of Single Dopant Atoms in Silicon by ADF Stem Microscopy and Microanalysis. 4: 646-647. DOI: 10.1017/S1431927600023357  0.334
1998 Silcox J. Core-loss EELS Current Opinion in Solid State and Materials Science. 3: 336-342. DOI: 10.1016/S1359-0286(98)80042-9  0.41
1997 Benedek R, Shashkov DA, Seidman DN, Muller DA, Silcox J, Chisholm MF, Yang LH. Atomic Structure of a Polar Ceramic/Metal Interface: {222}MgO/Cu Mrs Proceedings. 492. DOI: 10.1557/Proc-492-103  0.527
1997 Subramanian S, Muller DA, Silcox J, Sass SL. Chemistry, bonding and fracture of grain boundaries in Ni3Si Acta Materialia. 45: 3565-3571. DOI: 10.1557/Proc-460-647  0.461
1997 Lipovskii A, Kolobkova E, Petrikov V, Kang I, Olkhovets A, Krauss T, Thomas M, Silcox J, Wise F, Shen Q, Kycia S. Synthesis and characterization of PbSe quantum dots in phosphate glass Applied Physics Letters. 71: 3406-3408. DOI: 10.1063/1.120349  0.336
1997 Müller DA, Edwards B, Kirkland EJ, Silcox J. Detailed Calculations of Thermal Diffuse Scattering Microscopy and Microanalysis. 3: 1153-1154. DOI: 10.1017/S1431927600012654  0.393
1997 Müller DA, Shashkov DA, Benedek R, Yang LH, Seidman DN, Silcox J. Chemistry and Bonding at {222}Mgo/Cu Heterophase Interfaces Microscopy and Microanalysis. 3: 647-648. DOI: 10.1017/S1431927600010126  0.4
1997 Subramanian S, Muller DA, Silcox J, Sass SL. The role of chemistry in controlling the bonding and fracture properties of grain boundaries in L12 intermetallic compounds Materials Science and Engineering A. 239: 297-308. DOI: 10.1016/S0921-5093(97)00597-2  0.441
1996 Muller DA, Subramanian S, Batson PE, Silcox J, Sass SL. Structure, chemistry and bonding at grain boundaries in Ni3Al - I. The role of boron in ductilizing grain boundaries Acta Materialia. 44: 1637-1645. DOI: 10.1016/1359-6454(95)00267-7  0.471
1996 Subramanian S, Muller DA, Silcox J, Sass SL. Structure, chemistry and bonding at grain boundaries in Ni3Al - II. The structure of small angle boundaries, Ni-enrichment and its influence on bonding, structure, energy and properties Acta Materialia. 44: 1647-1655. DOI: 10.1016/1359-6454(95)00266-9  0.503
1995 Muller DA, Subramanian S, Batson PE, Sass SL, Silcox J. Near atomic scale studies of electronic structure at grain boundaries in Ni3Al. Physical Review Letters. 75: 4744-4747. PMID 10059986 DOI: 10.1103/Physrevlett.75.4744  0.471
1995 Muller DA, Subramanian S, Sass SL, Silcox J, Batson PE. Local electronic structure and cohesion of grain boundaries in Ni3Al Materials Research Society Symposium - Proceedings. 364: 743-748. DOI: 10.1557/Proc-364-743  0.473
1995 Muller DA, Silcox J. Radiation damage of Ni3Al by 100 keV electrons Philosophical Magazine A. 71: 1375-1387. DOI: 10.1080/01418619508244380  0.487
1995 Subramanian S, Muller DA, Batson PE, Silcox J, Sass SL. The structure, bonding and chemistry of grain boundaries in Ni3Al Materials Science and Engineering A. 192: 936-944. DOI: 10.1016/0921-5093(94)03324-2  0.483
1995 Muller D, Silcox J. Delocalization in inelastic scattering Ultramicroscopy. 59: 195-213. DOI: 10.1016/0304-3991(95)00029-Z  0.5
1995 Hillyard S, Silcox J. Detector geometry, thermal diffuse scattering and strain effects in ADF STEM imaging Ultramicroscopy. 58: 6-17. DOI: 10.1016/0304-3991(94)00173-K  0.367
1994 Lee T, Silcox J. Electron beam irradiated effects of SiO{sub 2} in STEM Mrs Proceedings. 373. DOI: 10.1557/Proc-373-335  0.409
1994 Subramanian S, Muller DA, Silcox J, Sass SL. Ni-Enrichment and its Influence on the Structure Chemistry and Bonding of Grain Boundaries in Ni3Al Mrs Proceedings. 364. DOI: 10.1557/Proc-364-333  0.507
1994 Muller DA, Tzou Y, Raj R, Silcox J. Electronic Structure and Bonding at Interfaces Between cvd Diamond and Silicon Mrs Proceedings. 332. DOI: 10.1557/Proc-332-163  0.53
1994 Muller DA, Batson PE, Subramanian S, Sass SL, Silcox J. Experimental measurement of the local electronic structure of grain boundaries in Ni3Al Materials Research Society Symposium - Proceedings. 319: 299-304. DOI: 10.1557/Proc-319-299  0.482
1993 Lee T, Soave RJ, Shacham-Diamand YY, Silcox J. Nanometer-Scale Oxide Particles in Gesi Films Grown by Wet Oxidation Mrs Proceedings. 321. DOI: 10.1557/Proc-321-615  0.308
1993 Zeng X, Lee T, Silcox J, Thompson MO. Interface Stability During Solid Phase Epitaxy Of Strained GexS1-x Films on Si (100) Mrs Proceedings. 321. DOI: 10.1557/Proc-321-503  0.304
1993 Muller DA, Tzou Y, Raj R, Silcox J. Mapping sp2 and sp3 states of carbon at sub-nanometre spatial resolution Nature. 366: 725-727. DOI: 10.1038/366725A0  0.451
1993 Hillyard S, Loane RF, Silcox J. Annular dark-field imaging: Resolution and thickness effects Ultramicroscopy. 49: 14-25. DOI: 10.1016/0304-3991(93)90209-G  0.378
1993 Hillyard S, Silcox J. Thickness effects in ADF STEM zone axis images Ultramicroscopy. 52: 325-334. DOI: 10.1016/0304-3991(93)90043-W  0.418
1992 Hallen HD, Fernandez A, Huang T, Silcox J, Buhrman RA. Scattering and spectral shape in ballistic-electron-emission microscopy of NiSi2-Si(111) and Au-Si samples. Physical Review. B, Condensed Matter. 46: 7256-7259. PMID 10002447 DOI: 10.1103/Physrevb.46.7256  0.357
1992 Silcox J, Xu P, Loane RF. Resolution limits in annular dark field STEM Ultramicroscopy. 47: 173-186. DOI: 10.1016/0304-3991(92)90194-O  0.361
1992 Wong K, Kirkland E, Xu P, Loane R, Silcox J. Measurement of spherical aberration in STEM Ultramicroscopy. 40: 139-150. DOI: 10.1016/0304-3991(92)90055-O  0.362
1992 Loane RF, Xu P, Silcox J. Incoherent imaging of zone axis crystals with ADF STEM Ultramicroscopy. 40: 121-138. DOI: 10.1016/0304-3991(92)90054-N  0.34
1991 Fernandez A, Hallen HD, Huang T, Buhrman RA, Silcox J. Elastic scattering in ballistic-electron-emission microscopy studies of the epitaxial NiSi2/Si(111) interface. Physical Review. B, Condensed Matter. 44: 3428-3431. PMID 9999960 DOI: 10.1103/Physrevb.44.3428  0.39
1991 Loane RF, Xu P, Silcox J. Thermal vibrations in convergent-beam electron diffraction Acta Crystallographica Section a Foundations of Crystallography. 47: 267-278. DOI: 10.1107/S0108767391000375  0.366
1991 Xu P, Loane RF, Silcox J. Energy-filtered convergent-beam electron diffraction in STEM Ultramicroscopy. 38: 127-133. DOI: 10.1016/0304-3991(91)90113-K  0.378
1990 Xu P, Miller P, Silcox J. The Nucleation and Epitaxial Growth of Au and Ag on Thin Silicon Studied With a Scanning Transmission Electron Microscope Mrs Proceedings. 202: 19. DOI: 10.1557/Proc-202-19  0.358
1990 Shin DH, Silcox J, Russek SE, Lathrop DK, Moeckly B, Buhrman RA. Clean grain boundaries and weak links in high Tc superconducting YBa2Cu3O7-x thin films Applied Physics Letters. 57: 508-510. DOI: 10.1063/1.104242  0.317
1990 Fernandez A, Hallen HD, Huang T, Buhrman RA, Silcox J. Ballistic electron studies and modification of the Au/Si interface Applied Physics Letters. 57: 2826-2828. DOI: 10.1063/1.103754  0.364
1990 XU P, Kirkland EJ, Silcox J, Keyse R. High-resolution imaging of silicon (111) using a 100 keV STEM Ultramicroscopy. 32: 93-102. DOI: 10.1016/0304-3991(90)90027-J  0.355
1989 Shin DH, Kirkland EJ, Silcox J. Annular dark field electron microscope images with better than 2 Å resolution at 100 kV Applied Physics Letters. 55: 2456-2458. DOI: 10.1063/1.102297  0.377
1988 Loane RF, Kirkland EJ, Silcox J. Visibility of single heavy atoms on thin crystalline silicon in simulated annular dark-field STEM images Acta Crystallographica Section a Foundations of Crystallography. 44: 912-927. DOI: 10.1107/S0108767388006403  0.397
1987 Kirkland EJ, Loane RF, Silcox J. Simulation of annular dark field stem images using a modified multislice method Ultramicroscopy. 23: 77-96. DOI: 10.1016/0304-3991(87)90229-4  0.385
1979 Chen CH, Silcox J. Calculations of the electron-energy-loss probability in thin uniaxial crystals at oblique incidence Physical Review B. 20: 3605-3614. DOI: 10.1103/Physrevb.20.3605  0.361
1975 Chen CH, Silcox J, Vincent R. Electron-energy losses in silicon: Bulk and surface plasmons and Čerenkov radiation Physical Review B. 12: 64-71. DOI: 10.1103/Physrevb.12.64  0.34
1968 Srivastava ON, Silcox J. Dislocation climb in gadolinium due to thermal diffusion Philosophical Magazine. 18: 503-518. DOI: 10.1080/14786436808227456  0.335
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