Year |
Citation |
Score |
2012 |
Nam Y, Lee W, Yun GS, Park HK, Elbeze D, Segui JL, Sabot R, Chenevoix JP. Design of the reflective optics for Tore Supra ECEI system. The Review of Scientific Instruments. 83: 10E318. PMID 23126976 DOI: 10.1063/1.4732852 |
0.324 |
|
2011 |
Yun G, Crabtree K, Chipman RA. Skew aberration: a form of polarization aberration. Optics Letters. 36: 4062-4. PMID 22002386 DOI: 10.1364/Ol.36.004062 |
0.745 |
|
2011 |
Yun G, McClain SC, Chipman RA. Three-dimensional polarization ray-tracing calculus II: retardance. Applied Optics. 50: 2866-74. PMID 21691349 DOI: 10.1364/Ao.50.002866 |
0.771 |
|
2011 |
Yun G, Crabtree K, Chipman RA. Three-dimensional polarization ray-tracing calculus I: definition and diattenuation. Applied Optics. 50: 2855-65. PMID 21691348 DOI: 10.1364/Ao.50.002855 |
0.768 |
|
2011 |
Yun G, Crabtree K, Chipman RA. Skew aberration: A form of polarization aberration Optics Letters. 36: 4062-4064. DOI: 10.1364/OL.36.004062 |
0.76 |
|
2011 |
Yun G, McClain SC, Chipman RA. Three-dimensional polarization ray-tracing calculus II: Retardance Applied Optics. 50: 2866-2874. DOI: 10.1364/AO.50.002866 |
0.654 |
|
2011 |
Yun G, Crabtree K, Chipman RA. Three-dimensional polarization ray-tracing calculus I: Definition and diattenuation Applied Optics. 50: 2855-2865. DOI: 10.1364/AO.50.002855 |
0.776 |
|
2010 |
Lee W, Yun GS, Nam Y, Hong I, Kim JB, Park HK, Tobias B, Liang T, Domier CW, Luhmann NC. Comparative study between the reflective optics and lens based system for microwave imaging system on KSTAR. The Review of Scientific Instruments. 81: 10D932. PMID 21033960 DOI: 10.1063/1.3491189 |
0.312 |
|
2010 |
Yun G, Chipman RA. Three-dimensional polarization ray tracing, retardance Optics Infobase Conference Papers. DOI: 10.1117/12.868589 |
0.703 |
|
2009 |
Yun G, Chipman RA. Retardance in three-dimensional polarization ray tracing Proceedings of Spie - the International Society For Optical Engineering. 7461. DOI: 10.1117/12.827303 |
0.779 |
|
2007 |
Yun G, Crabtree K, Chipman RA. Properties of the polarization ray tracing matrix Proceedings of Spie - the International Society For Optical Engineering. 6682. DOI: 10.1117/12.734315 |
0.74 |
|
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