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Guneet Sethi, Ph.D. - Publications

Affiliations: 
2010 Pennsylvania State University, State College, PA, United States 
Area:
Materials Science Engineering, Electronics and Electrical Engineering, Solid State Physics
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6 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2014 Sethi G, Furman E, Koch B, Lanagan MT. Influence of impedance contrast on field distribution and tree growth in laminate dielectrics Modelling and Simulation in Materials Science and Engineering. 22. DOI: 10.1088/0965-0393/22/2/025024  0.489
2011 Sethi G, Bontempo B, Furman E, Horn MW, Lanagan MT, Bharadwaja SSN, Li J. Impedance analysis of amorphous and polycrystalline tantalum oxide sputtered films Journal of Materials Research. 26: 745-753. DOI: 10.1557/Jmr.2010.77  0.543
2009 Sethi G, Sunal P, Horn MW, Lanagan MT. Influence of reactive sputter deposition conditions on crystallization of zirconium oxide thin films Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 27: 577-583. DOI: 10.1116/1.3119669  0.531
2009 Sethi G, Sahul R, Min C, Tewari P, Furman E, Horn MW, Lanagan MT. Dielectric Response of Tantalum Oxide Deposited on Polyethylene Terephthalate (PET) Film by Low-Temperature Pulsed-DC Sputtering for Wound Capacitors Ieee Transactions On Components and Packaging Technologies. 32: 915-925. DOI: 10.1109/Tcapt.2009.2025960  0.606
2009 Tewari P, Sethi G, Horn MW, Lanagan MT. Enhanced polarization in zirconia-P(VDF-TrFE) laminar composite dielectrics Journal of Materials Science: Materials in Electronics. 20: 1001-1007. DOI: 10.1007/S10854-008-9823-X  0.591
2006 Sethi G, Lanagan MT, Furman E, Horn MW. Development of Structure-Property Relationships in Disordered Zirconia Thin Films for High Energy Density Mim Capacitors Mrs Proceedings. 969. DOI: 10.1557/Proc-0969-W03-14  0.557
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