Year |
Citation |
Score |
2008 |
Progl CL, Parish CM, Vitarelli JP, Russell PE. Analysis of v defects in GaN-based light emitting diodes by scanning transmission electron microscopy and electron beam induced current Applied Physics Letters. 92. DOI: 10.1063/1.2945232 |
0.418 |
|
2007 |
Parish CM, Russell PE. Scanning Cathodoluminescence Microscopy Advances in Imaging and Electron Physics. 147: 1-135. DOI: 10.1016/S1076-5670(07)47001-X |
0.311 |
|
2006 |
Parish CM, Russell PE. On the use of Monte Carlo modeling in the mathematical analysis of scanning electron microscopy-electron beam induced current data Applied Physics Letters. 89. DOI: 10.1063/1.2385212 |
0.407 |
|
2006 |
Progl C, Vitarelli J, Russell P. Focused Ion Beam Based Micromanipulation to Form Air Bridge Interconnect Microscopy and Microanalysis. 12: 1278-1279. DOI: 10.1017/S1431927606067158 |
0.344 |
|
2006 |
Parish CM, Progl CL, Salmon ME, Russell PE. Combined SEM electron-beam-induced current and cathodoluminescence imaging and STEM structural analysis of GaN light emitting diodes Microscopy and Microanalysis. 12: 1514-1515. DOI: 10.1017/S1431927606066578 |
0.658 |
|
2006 |
Garetto AD, Garcia R, Griffis DP, Russell PE. Effects of beam and scan parameters on 3-dimensional carbon structure growth using electron beam induced chemistry Microscopy and Microanalysis. 12: 1284-1285. DOI: 10.1017/S1431927606065950 |
0.373 |
|
2005 |
Bunker KL, Garcia R, Russell PE. Scanning electron microscopy cathodoluminescence studies of piezoelectric fields in an InGaN∕GaN quantum-well light-emitting diode Applied Physics Letters. 86: 082108. DOI: 10.1063/1.1868886 |
0.731 |
|
2005 |
Russell PE, Salmon ME. The Evolution of Scanned Probe Microscopy: Two Decades of Rapidly Evolving Techniques and Applications Microscopy and Microanalysis. 11. DOI: 10.1017/S143192760550566X |
0.583 |
|
2005 |
Salmon ME, Russell PE, Troughton EB. Growth and Characterization of Self-assembled Nanofibers Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605504227 |
0.559 |
|
2005 |
Garetto AD, Griffis DD, Russell PE, Rack PD, Fowlkes J. Growth Mechanisms of Electron Beam Induced Carbon Deposition Using Hydrocarbon Contamination Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605503325 |
0.559 |
|
2005 |
Russell PE, Bunker KL, Garcia R, Stark TJ, Vitarelli JP. Focused Ion Beam Sample Preparation of Complex Devices Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605501284 |
0.722 |
|
2004 |
Bunker KL, Garcia R, Russell PE. Scanning Electron Microscopy Cathodoluminescence Studies of Piezoelectric Fields in an InGaN Multiple Quantum Well Light Emitting Diode Mrs Proceedings. 831. DOI: 10.1557/Proc-831-E11.41 |
0.736 |
|
2004 |
Garcia R, Bunker K, Kennedy T, Russell P. Sample Preparation of Fully Packaged Quantum Well Laser Diodes for STEM-EBIC Analysis Microscopy and Microanalysis. 10: 146-147. DOI: 10.1017/S1431927604884344 |
0.722 |
|
2004 |
Bunker K, Garcia R, Russell P. Development of a STEM-EBIC/CL System for Structural, Compositional, Electrical, and Optical Characterization of Quantum Well Devices Microscopy and Microanalysis. 10: 194-195. DOI: 10.1017/S1431927604882679 |
0.721 |
|
2003 |
Bender JW, Salmon ME, Russell PE. Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes. Scanning. 25: 45-51. PMID 12627898 DOI: 10.1002/Sca.4950250109 |
0.621 |
|
2003 |
Wang J, Griffis DP, Garcia R, Russell PE. Etching characteristics of chromium thin films by an electron beam induced surface reaction Semiconductor Science and Technology. 18: 199-205. DOI: 10.1088/0268-1242/18/4/302 |
0.37 |
|
2003 |
Salmon ME, Russell P, Troughton E. Characterization of Self-Assembled Nanofibers Microscopy and Microanalysis. 9: 1226-1227. DOI: 10.1017/S1431927603446138 |
0.558 |
|
2003 |
Bunker K, Garcia R, Russell P. Development of a STEM-EBIC/CL System Microscopy and Microanalysis. 9: 474-475. DOI: 10.1017/S1431927603442372 |
0.688 |
|
2003 |
González JC, Silva MINd, Bunker KL, Batchelor AD, Russell PE. Electrical characterization of InGaN quantum well p -n heterostructures Microelectronics Journal. 34: 455-457. DOI: 10.1016/S0026-2692(03)00072-7 |
0.755 |
|
2003 |
Silva MINd, González JC, Russell PE. Cross-sectional Scanning Probe Microscopy of GaN-based p–n heterostructures Microelectronics Journal. 34: 571-573. DOI: 10.1016/S0026-2692(03)00051-X |
0.347 |
|
2002 |
Bunker KL, Gonzalez JC, Batchelor D, Stark TJ, Russell PE. Development of a High Lateral Resolution Electron Beam Induced Current Technique for Electrical Characterization of InGaN-Based Quantum Well Light Emitting Diodes Mrs Proceedings. 743. DOI: 10.1557/Proc-743-L10.10 |
0.768 |
|
2002 |
Bunker K, Gonzalez J, Batchelor A, Russell P. Measurements of GaN-Based Heterostructures with Electron Beam Induced Current Microscopy and Microanalysis. 8: 1208-1209. DOI: 10.1017/S1431927602107914 |
0.743 |
|
2002 |
Silva MINd, González JC, Russell PE. Electrical and Structural Characterization of GaN p-n Heterostuctures by Scanning Probe Microscopy Microscopy and Microanalysis. 8: 1206-1207. DOI: 10.1017/S1431927602107902 |
0.318 |
|
2002 |
Salmon ME, Russell P, Troughton-Jr E. Investigation of Self-assembled Nanofibers using Atomic Force Microscopy Microscopy and Microanalysis. 8: 770-771. DOI: 10.1017/S1431927602106659 |
0.585 |
|
2002 |
Russell PE, Stevie FA. Focused Ion Beam (FIB) Microscopy and Technology Microscopy and Microanalysis. 8: 558-559. DOI: 10.1017/S1431927602105460 |
0.337 |
|
2002 |
Russell P, Stark T, Viterelli J, Guichard A, Wang J, Bunker KL, Gonzalez J, Griffis D. Focused Ion Beam: Much More Than a Sample Preparation Tool Microscopy and Microanalysis. 8: 54-55. DOI: 10.1017/S1431927602101590 |
0.721 |
|
2001 |
Neves BRA, Salmon ME, Troughton EB, Russell PE. Self-healing on OPA self-assembled monolayers Nanotechnology. 12: 285-289. DOI: 10.1088/0957-4484/12/3/315 |
0.587 |
|
2001 |
Gonzalez JC, Bunker KL, Russell PE. Minority-carrier diffusion length in a GaN-based light-emitting diode Applied Physics Letters. 79: 1567-1569. DOI: 10.1063/1.1400075 |
0.725 |
|
2001 |
Russell PE, Stark TJ, Griffis DP, Gonzales JC. Chemically Assisted Focused ION Beam Micromachining: Overview, Recent Developments and Current Needs Microscopy and Microanalysis. 7: 928-929. DOI: 10.1017/S1431927600030713 |
0.341 |
|
2001 |
Bunker KL, Gonzalez JC, Russell PE. EBIC Measurements of Minority Carrier Diffusion Length in a Gan-based Light Emitting Diode Microscopy and Microanalysis. 7: 566-567. DOI: 10.1017/S1431927600028907 |
0.703 |
|
2000 |
Kline R, Richards J, Russell P. Increasing the Lateral Resolution of Scanning Spreading Resistance Microscopy Mrs Proceedings. 610. DOI: 10.1557/Proc-610-B2.4 |
0.336 |
|
1999 |
Neves BR, Salmon ME, Russell PE, Troughton EB. Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 5: 413-419. PMID 10556351 DOI: 10.1017/S1431927699990475 |
0.616 |
|
1999 |
Neves BRA, Leonard DN, Salmon ME, Russell PE, Troughton EB. Observation of topography inversion in atomic force microscopy of self-assembled monolayers Nanotechnology. 10: 399-404. DOI: 10.1088/0957-4484/10/4/307 |
0.601 |
|
1998 |
Russell PE. Chemically and geometrically enhanced focused ion beam micromachining Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 16: 2494. DOI: 10.1116/1.590197 |
0.313 |
|
1998 |
Russell PE, Batchelor AD. AFM and Other Scanned Probe Microscopies Tutorial Microscopy and Microanalysis. 4: 878-879. DOI: 10.1017/S143192760002451X |
0.339 |
|
1998 |
Kline RJ, Richards JF, Russell PE. Scanning Kelvin Force and Capacitance Microscopy Applications Microscopy and Microanalysis. 4: 330-331. DOI: 10.1017/S1431927600021772 |
0.314 |
|
1998 |
Phillips JR, Jarausch KF, Stark TJ, Houston JE, Griffis DP, Russell PE. Diamond Indenter Shaping Using Focused Ion Beam Microscopy and Microanalysis. 4: 320-321. DOI: 10.1017/S1431927600021723 |
0.334 |
|
1998 |
Santiago JR, Troughton EB, Dennis RA, Russell PE. Atomic Force Microscopy Studies of Microstructure and Properties of Self Assembled Monolayers Microscopy and Microanalysis. 4: 308-309. DOI: 10.1017/S1431927600021668 |
0.306 |
|
1996 |
Thaus DM, Stark TJ, Griffis DP, Russell PE. Organochloride chemically enhanced focused ion beam micromachining of permalloy Applied Physics Letters. 68: 3829-3831. DOI: 10.1063/1.116631 |
0.312 |
|
1994 |
Kimball JF, Allen PE, Griffis DP, Radzimski ZJ, Russell PE. Selectivity variations of electron beam patterned silicon dioxide films* Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 12: 2457-2461. DOI: 10.1116/1.579193 |
0.359 |
|
1994 |
Vitarelli J, Russell P. Time delay measurements using conventional E-beam technology Microelectronic Engineering. 24: 221-232. DOI: 10.1016/0167-9317(94)90074-4 |
0.339 |
|
1993 |
Kelliher JT, Thornton JT, Russell PE, Bachmann KJ. Surface Morphology of Gallium Phosphide Deposited by Chemical Beam Epitaxy and Interrupted Cycle Chemical Beam Epitaxy Mrs Proceedings. 317. DOI: 10.1557/Proc-317-597 |
0.363 |
|
1993 |
Marrian CRK, Griffith JE, Grigg DA, Kochanski GP, Vasile MJ, Russell PE. Metrology with scanning probe microscopes Advanced Optical Technologies. 10310. DOI: 10.1117/12.183192 |
0.315 |
|
1992 |
Allen PE, Griffis DP, Radzimski ZJ, Russell PE. Electron beam patterning of Si02 Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 10: 965-969. DOI: 10.1116/1.577887 |
0.372 |
|
1992 |
Grigg DA, Russell PE, Griffith JE. Tip–sample forces in scanning probe microscopy in air and vacuum Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 10: 680-683. DOI: 10.1116/1.577709 |
0.31 |
|
1992 |
Ximen H, Russell PE. Microfabrication of AFM tips using focused ion and electron beam techniques Ultramicroscopy. 1526-1532. DOI: 10.1016/0304-3991(92)90477-2 |
0.416 |
|
1992 |
Grigg DA, Russell PE, Griffith JE. Rocking-beam force-balance approach to atomic force microscopy Ultramicroscopy. 1504-1508. DOI: 10.1016/0304-3991(92)90473-W |
0.315 |
|
1991 |
Vasile MJ, Grigg DA, Griffith JE, Fitzgerald EA, Russell PE. Scanning probe tips formed by focused ion beams Review of Scientific Instruments. 62: 2167-2171. DOI: 10.1063/1.1142334 |
0.391 |
|
1990 |
Musselman IH, Russell PE. Platinum/iridium tips with controlled geometry for scanning tunneling microscopy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 3558-3562. DOI: 10.1116/1.576507 |
0.331 |
|
1990 |
Musselman IH, Peterson PA, Russell PE. Fabrication of tips with controlled geometry for scanning tunnelling microscopy Precision Engineering. 12: 3-6. DOI: 10.1016/0141-6359(90)90002-G |
0.339 |
|
1988 |
Buonaquisti A, Russell P. Scanning electron beam submicron analytical techniques Ultramicroscopy. 24: 87-95. DOI: 10.1016/0304-3991(88)90303-8 |
0.329 |
|
1986 |
Russell PE. Sem-Based Characterization Techniques Mrs Proceedings. 69. DOI: 10.1557/Proc-69-15 |
0.383 |
|
1984 |
Buonaquisti AD, Matson RJ, Russell PE, Holloway PH. Magnetron sputtered gold contacts onn-GaAs Surface and Interface Analysis. 6: 279-281. DOI: 10.1002/Sia.740060606 |
0.477 |
|
1981 |
Russell P, Herrington C, Burke D, Holloway P. The Effect of Heat Treatment on Grain Boundary Properties in Cast Polycrystalline Silicon Mrs Proceedings. 5. DOI: 10.1557/Proc-5-185 |
0.383 |
|
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