Year |
Citation |
Score |
2020 |
Carter CB, Norton MG, Blanford CF. Celebrating 1000 issues Journal of Materials Science. 55: 10281-10283. DOI: 10.1007/S10853-020-04731-2 |
0.566 |
|
2017 |
Carter CB, Blanford CF. All authors must now supply ORCID identifiers Journal of Materials Science. 52: 6147-6149. DOI: 10.1007/S10853-017-0919-7 |
0.561 |
|
2016 |
Blanford CF, Carter CB. The art of being found: crafting the right title Journal of Materials Science. 51: 8761-8763. DOI: 10.1007/S10853-016-0110-6 |
0.561 |
|
2016 |
Carter CB, Blanford CF. Plagiarism and detection Journal of Materials Science. 1-2. DOI: 10.1007/S10853-016-0004-7 |
0.559 |
|
2016 |
Winterstein JP, Sezen M, Rečnik A, Carter CB. Electron microscopy observations of the spinel-forming reaction using MgO nanocubes on Al2O3 substrates Journal of Materials Science. 51: 144-157. DOI: 10.1007/S10853-015-9366-5 |
0.699 |
|
2015 |
Li Z, Tan X, Li P, Kalisvaart P, Janish MT, Mook WM, Luber EJ, Jungjohann KL, Carter CB, Mitlin D. Coupling In Situ TEM and Ex Situ Analysis to Understand Heterogeneous Sodiation of Antimony. Nano Letters. 15: 6339-48. PMID 26389786 DOI: 10.1021/Acs.Nanolett.5B03373 |
0.32 |
|
2015 |
Janish MT, Mook WM, Carter CB. Nucleation of fcc Ta when heating thin films Scripta Materialia. 96: 21-24. DOI: 10.1016/J.Scriptamat.2014.10.010 |
0.356 |
|
2015 |
Janish MT, Mackay DT, Liu Y, Jungjohann KL, Carter CB, Norton MG. TEM in situ lithiation of tin nanoneedles for battery applications Journal of Materials Science. 51: 589-602. DOI: 10.1007/S10853-015-9318-0 |
0.302 |
|
2015 |
Janish MT, Kotula PG, Boyce BL, Carter CB. Observations of fcc and hcp tantalum Journal of Materials Science. 50: 3706-3715. DOI: 10.1007/S10853-015-8931-2 |
0.354 |
|
2014 |
Winterstein JP, Carter CB. Electron-beam damage and point defects near grain boundaries in cerium oxide Journal of the European Ceramic Society. 34: 3007-3018. DOI: 10.1016/J.Jeurceramsoc.2014.02.017 |
0.683 |
|
2011 |
Bhowmick S, Xue Y, Winterstein J, Carter CB. Influence of alumina impurities on microstructure of LSM–CeO2 composites Solid State Ionics. 187: 68-77. DOI: 10.1016/J.Ssi.2011.02.007 |
0.704 |
|
2011 |
Riesterer JL, Carter CB. Changes in dewetting behavior of SiO2 films on TiO2 substrates due to film thickness and crucible choice Journal of Materials Science. 46: 4397-4406. DOI: 10.1007/S10853-011-5353-7 |
0.321 |
|
2010 |
Bhowmick S, Basu J, Xue Y, Carter CB. Hydrothermal Synthesis of Nanocrystalline Barium Cerate Using Hexamethylenetetramine Journal of the American Ceramic Society. 93: 4041-4046. DOI: 10.1111/J.1551-2916.2010.03998.X |
0.368 |
|
2010 |
Basu J, Divakar R, Winterstein JP, Carter CB. Low-temperature and ambient-pressure synthesis and shape evolution of nanocrystalline pure, La-doped and Gd-doped CeO2 Applied Surface Science. 256: 3772-3777. DOI: 10.1016/J.Apsusc.2010.01.024 |
0.697 |
|
2009 |
Basu J, Carter CB, Divakar R, Mukherjee B, Ravishankar N. Nanopatterning by solid-state dewetting on reconstructed ceramic surfaces Applied Physics Letters. 94. DOI: 10.1063/1.3127442 |
0.35 |
|
2009 |
Winterstein J, Carter C. Reacting Oxide Nanoparticles with a Substrate Microscopy and Microanalysis. 15: 1332-1333. DOI: 10.1017/S1431927609097955 |
0.651 |
|
2009 |
Basu J, Bhowmick S, Winterstein J, Wang C, Xue Y, Carter C. Microscopy of Oxide Nanoparticles for Energy Applications Microscopy and Microanalysis. 15: 1404-1405. DOI: 10.1017/S1431927609096305 |
0.653 |
|
2009 |
Winterstein J, Wang C, Carter C. Electron Microscopy Analysis of Interfaces in Oxides for Energy Applications Microscopy and Microanalysis. 15: 1444-1445. DOI: 10.1017/S143192760909357X |
0.665 |
|
2009 |
Nowak JD, Carter CB. Forming contacts and grain boundaries between MgO nanoparticles Journal of Materials Science. 44: 2408-2418. DOI: 10.1007/S10853-009-3308-Z |
0.347 |
|
2008 |
Basu J, Divakar R, Nowak J, Hofmann S, Colli A, Franciosi A, Carter CB. Structure and growth mechanism of ZnSe nanowires Journal of Applied Physics. 104: 64302. DOI: 10.1063/1.2977722 |
0.33 |
|
2008 |
Winterstein JP, Basu J, Herzing A, Anderson IM, Carter CB. Combined structural and chemical investigations of ceria nanoparticles in the TEM Microscopy and Microanalysis. 14: 280-281. DOI: 10.1017/S1431927608087060 |
0.649 |
|
2008 |
Basu J, Divakar R, Winterstein JP, Ravishankar N, Carter CB. In situ microscopy: A tool to understand mechanisms Microscopy and Microanalysis. 14: 246-247. DOI: 10.1017/S143192760808673X |
0.643 |
|
2008 |
Blanford CF, Carter CB, Stein A. In situ high-temperature electron microscopy of 3DOM cobalt, iron oxide, and nickel Journal of Materials Science. 43: 3539-3552. DOI: 10.1007/S10853-008-2550-0 |
0.698 |
|
2007 |
Mook WM, Nowak JD, Perrey CR, Carter CB, Mukherjee R, Girshick SL, McMurry PH, Gerberich WW. Compressive stress effects on nanoparticle modulus and fracture Physical Review B - Condensed Matter and Materials Physics. 75. DOI: 10.1103/Physrevb.75.214112 |
0.655 |
|
2006 |
Gerberich WW, Mook WM, Chambers MD, Cordill MJ, Perrey CR, Carter CB, Miller RE, Curtin WA, Mukherjee R, Girshick SL. An energy balance criterion for nanoindentation-induced single and multiple dislocation events Journal of Applied Mechanics, Transactions Asme. 73: 327-334. DOI: 10.1115/1.2125988 |
0.681 |
|
2006 |
Blanford CF, Carter CB, Stein A. Determination of void arrangements in inverse opals by transmission electron microscopy Journal of Physics: Conference Series. 26: 264-267. DOI: 10.1088/1742-6596/26/1/063 |
0.588 |
|
2006 |
Riesterer JL, Farrer JK, Munoz NE, Gilliss SR, Ravishankar N, Carter CB. Studying alumina boundary migration using combined microscopy techniques Journal of Physics: Conference Series. 26: 123-126. DOI: 10.1088/1742-6596/26/1/029 |
0.717 |
|
2006 |
Bentley J, Gilliss SR, Carter CB, Al-Sharab JF, Cosandey F, Anderson IM, Kotula PJ. Nanoscale EELS analysis of oxides: composition mapping, valence determination and beam damage Journal of Physics: Conference Series. 26: 69-72. DOI: 10.1088/1742-6596/26/1/016 |
0.688 |
|
2006 |
McCarty KF, Pierce JP, Carter CB. Translation-related domain boundaries form to relieve strain in a thin alumina film on NiAl (110) Applied Physics Letters. 88. DOI: 10.1063/1.2191739 |
0.306 |
|
2006 |
Bentley J, Farrer JK, Johnson MT, Carter CB. Forsterite Formed on MgO Single Crystals During In-Situ Annealing Microscopy and Microanalysis. 12: 814-815. DOI: 10.1017/S1431927606066876 |
0.717 |
|
2006 |
Riesterer J, Gilliss S, Ravishankar N, Carter C. A Study of Dewetting on (001) Rutile using AFM Microscopy and Microanalysis. 12: 1028-1029. DOI: 10.1017/S143192760606418X |
0.763 |
|
2006 |
Riesterer J, Farrer J, Ravishankar N, Carter C. Studying Trapped Grains in Alumina using SEM and EBSD Microscopy and Microanalysis. 12: 1020-1021. DOI: 10.1017/S1431927606063069 |
0.774 |
|
2006 |
Cordill MJ, Chambers MD, Lund MS, Hallman DM, Perrey CR, Carter CB, Bapat A, Kortshagen U, Gerberich WW. Plasticity responses in ultra-small confined cubes and films Acta Materialia. 54: 4515-4523. DOI: 10.1016/J.Actamat.2006.05.037 |
0.665 |
|
2006 |
Perrey CR, Carter CB. Insights into nanoparticle formation mechanisms Journal of Materials Science. 41: 2711-2722. DOI: 10.1007/S10853-006-7874-Z |
0.676 |
|
2006 |
Farrer JK, Carter CB. Defect structure in GaN pyramids Journal of Materials Science. 41: 779-792. DOI: 10.1007/S10853-006-6563-2 |
0.742 |
|
2006 |
Farrer JK, Carter CB, Ravishankar N. The effects of crystallography on grain-boundary migration in alumina Journal of Materials Science. 41: 661-674. DOI: 10.1007/S10853-006-6482-2 |
0.758 |
|
2006 |
Farrer JK, Carter CB. Texture in solid-state reactions Journal of Materials Science. 41: 5169-5184. DOI: 10.1007/S10853-006-0428-6 |
0.743 |
|
2006 |
Deneen J, Mook WM, Minor A, Gerberich WW, Carter CB. In situ deformation of silicon nanospheres Journal of Materials Science. 41: 4477-4483. DOI: 10.1007/S10853-006-0085-9 |
0.333 |
|
2005 |
Thompson S, Perrey CR, Belich TJ, Blackwell C, Carter CB, Kakalios J, Kortshagen U. Experimental Study of Silane Plasma Nanoparticle Formation in Amorphous Silicon Thin Films Mrs Proceedings. 862. DOI: 10.1557/PROC-862-A8.1 |
0.683 |
|
2005 |
Ding YP, Bapat A, Dong Y, Perrey CR, Kortshagen UR, Carter CB, Campbell SA. A single nanoparticle silicon transistor Device Research Conference - Conference Digest, Drc. 2005: 165-166. DOI: 10.1109/DRC.2005.1553104 |
0.66 |
|
2005 |
Thompson S, Perrey CR, Carter CB, Belich TJ, Kakalios J, Kortshagen U. Experimental investigations into the formation of nanoparticles in a/nc-Si:H thin films Journal of Applied Physics. 97. DOI: 10.1063/1.1849435 |
0.683 |
|
2005 |
Gerberich WW, Mook WM, Cordill MJ, Carter CB, Perrey CR, Heberlein JV, Girshick SL. Reverse plasticity in single crystal silicon nanospheres International Journal of Plasticity. 21: 2391-2405. DOI: 10.1016/J.Ijplas.2005.03.001 |
0.682 |
|
2005 |
Gilliss SR, Bentley J, Carter CB. Electron energy-loss spectroscopic study of the surface of ceria abrasives Applied Surface Science. 241: 61-67. DOI: 10.1016/J.Apsusc.2004.09.018 |
0.742 |
|
2005 |
Gerberich WW, Cordill MJ, Mook WM, Moody NR, Perrey CR, Carter CB, Mukherjee R, Girshick SL. A boundary constraint energy balance criterion for small volume deformation Acta Materialia. 53: 2215-2229. DOI: 10.1016/J.Actamat.2005.01.028 |
0.675 |
|
2004 |
Blanford CF, Carter CB, Stein A. A method for determining void arrangements in inverse opals. Journal of Microscopy. 216: 263-87. PMID 15566498 DOI: 10.1111/J.0022-2720.2004.01421.X |
0.661 |
|
2004 |
Perrey CR, Carter CB, Michael JR, Kotula PG, Stach EA, Radmilovic VR. Using the FIB to characterize nanoparticle materials. Journal of Microscopy. 214: 222-36. PMID 15157190 DOI: 10.1111/J.0022-2720.2004.01325.X |
0.691 |
|
2004 |
A SS, Shenoy VB, Carter CB, Ravishankar N. Nanopatterning on Reconstructed Ceramic Surfaces Mrs Proceedings. 819. DOI: 10.1557/Proc-819-N5.8 |
0.328 |
|
2004 |
Deb B, Altay A, Gilliss SR, Munoz N, Carter CB. Technique for Monitoring the Etching Rate of Alumina Mrs Proceedings. 819. DOI: 10.1557/Proc-819-N3.11 |
0.735 |
|
2004 |
Bapat A, Dong Y, Perrey CR, Carter CB, Campbell SA, Kortshagen UR. Silicon Nanoparticle Synthesis Using Constricted Mode Capacitive Silane Plasma Mrs Proceedings. 818: 405-410. DOI: 10.1557/Proc-818-M14.4.1 |
0.646 |
|
2004 |
Perrey CR, Deneen JM, Carter CB. The Effects of Processing on the Morphology of Nanoparticles Mrs Proceedings. 818. DOI: 10.1557/Proc-818-M11.10.1 |
0.685 |
|
2004 |
Perrey CR, Thompson SS, Lentzen M, Kortshagen U, Carter CB. Understanding the structure of Si nanoclusters in a/nc-Si:H films using spherical aberration-corrected transmission electron microscopy Mrs Proceedings. 808: 17-22. DOI: 10.1557/Proc-808-A8.7 |
0.7 |
|
2004 |
Johnson MT, Carter CB, Schmalzried H. Behavior of MgFe2O4 Films on MgO in an Electric Field Journal of the American Ceramic Society. 83: 1768-1772. DOI: 10.1111/J.1151-2916.2000.Tb01462.X |
0.35 |
|
2004 |
Johnson MT, Carter CB, Michael J. SEM Analysis of Oxide Thin Films and Reactions Journal of the American Ceramic Society. 82: 1644-1646. DOI: 10.1111/J.1151-2916.1999.Tb01981.X |
0.351 |
|
2004 |
Mallamaci MP, Carter CB. Crystallization of Pseudo‐orthorhombic Anorthite on Basal Sapphire Journal of the American Ceramic Society. 82: 33-42. DOI: 10.1111/J.1151-2916.1999.Tb01720.X |
0.375 |
|
2004 |
Bapat A, Anderson C, Perrey CR, Carter CB, Campbell SA, Kortshagen UR. Plasma synthesis of single-crystal silicon nanoparticles for novel electronic device applications Plasma Physics and Controlled Fusion. 46. DOI: 10.1088/0741-3335/46/12B/009 |
0.704 |
|
2004 |
Munoz NE, Gilliss SR, Carter CB. The monitoring of grain-boundary grooves in alumina Philosophical Magazine Letters. 84: 21-26. DOI: 10.1080/09500830310001614487 |
0.739 |
|
2004 |
Perrey CR, Deneen JM, Carter CB. The Effects of Rapid Cooling on the Structure and Morphology of Silicon Nanoparticles Microscopy and Microanalysis. 10: 592-593. DOI: 10.1017/S1431927604885064 |
0.687 |
|
2004 |
Perrey CR, Deneen JM, Thompson SS, Lentzen M, Kortshagen U, Carter CB. Observation of Si nanocrystals by spherical-aberration corrected transmission electron microscopy Microscopy and Microanalysis. 10: 996-997. DOI: 10.1017/S1431927604884976 |
0.695 |
|
2004 |
Munoz N, Gilliss S, Carter C. Remnant grooves on alumina surfaces Surface Science. 573: 391-402. DOI: 10.1016/J.Susc.2004.10.006 |
0.734 |
|
2004 |
Hafiz J, Wang X, Mukherjee R, Mook W, Perrey CR, Deneen J, Heberlein JVR, McMurry PH, Gerberich WW, Carter CB, Girshick SL. Hypersonic plasma particle deposition of Si-Ti-N nanostructured coatings Surface and Coatings Technology. 188: 364-370. DOI: 10.1016/J.Surfcoat.2004.08.226 |
0.685 |
|
2004 |
Perrey CR, Thompson S, Lentzen M, Kortshagen U, Carter CB. Observation of Si nanocrystals in a/nc-Si:H films by spherical-aberration corrected transmission electron microscopy Journal of Non-Crystalline Solids. 343: 78-84. DOI: 10.1016/J.Jnoncrysol.2004.06.013 |
0.71 |
|
2003 |
Blanford CF, Carter CB. Electron radiation damage of MCM-41 and related materials. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 9: 245-63. PMID 12807675 DOI: 10.1017/S1431927603030447 |
0.615 |
|
2003 |
Gilliss SR, Ravishankar N, Farrer JK, Carter CB. Boundary Migration in Rutile Microscopy and Microanalysis. 9: 676-677. DOI: 10.2172/822867 |
0.803 |
|
2003 |
Belich TJ, Thompson S, Perrey C, Kortshagen U, Carter C, Kakalios J. Hydrogenated Amorphous Silicon Thin Films with Nanocrystalline Silicon Inclusions Mrs Proceedings. 762. DOI: 10.1557/PROC-762-A14.4 |
0.667 |
|
2003 |
Bapat A, Perrey CR, Campbell SA, Carter CB, Kortshagen U. Synthesis of highly oriented, single-crystal silicon nanoparticles in a low-pressure, inductively coupled plasma Journal of Applied Physics. 94: 1969-1974. DOI: 10.1063/1.1586957 |
0.699 |
|
2003 |
Cohen D, Carter CB. Σ = 3, {112} Lateral Twin Boundaries in GaP Interface Science. 11: 391-401. DOI: 10.1023/A:1026187726360 |
0.358 |
|
2003 |
Perrey CR, Carter CB, Lentzen M. Application of Variable CS HRTEM to the Study of Nanoscale Structures Microscopy and Microanalysis. 9: 958-959. DOI: 10.1017/S1431927603444796 |
0.659 |
|
2003 |
Gilliss SR, Riesterer J, Altay A, Carter CB. On the Faceting of Alumina Surfaces Microscopy and Microanalysis. 9: 674-675. DOI: 10.1017/S1431927603443377 |
0.773 |
|
2003 |
Gilliss SR, Bentley J, Carter CB. Electron Energy-Loss Spectroscopy of Ceria Abrasives Microscopy and Microanalysis. 9: 420-421. DOI: 10.1017/S1431927603442104 |
0.716 |
|
2003 |
Perrey CR, Carter CB, Bentley J, Lentzen M. Analysis of Amorphous and Oxide Surface Layers on Nanoparticles Microscopy and Microanalysis. 9: 412-413. DOI: 10.1017/S1431927603442062 |
0.699 |
|
2003 |
Perrey CR, Lentzen M, Carter CB. Distinct as Snowflakes: the Shapes of Silicon Nanoscale Particles Microscopy and Microanalysis. 9: 394-395. DOI: 10.1017/S1431927603441974 |
0.672 |
|
2003 |
Carter CB, Gilliss SR, Perrey CR. Effects Of Sample Preparation In Analysis: Imaging Microscopy and Microanalysis. 9: 102-103. DOI: 10.1017/S143192760344107X |
0.75 |
|
2003 |
Gilliss SR, Munoz N, Perrey CR, Riesterer J, Ravishankar N, Farrer JK, Carter CB. Analysis of Grain Boundary Migration in Alumina Microscopy and Microanalysis. 9: 64-65. DOI: 10.1017/S1431927603441019 |
0.757 |
|
2003 |
Ravishankar N, Gilliss SR, Carter C. Glass and metals on crystalline oxides Journal of the European Ceramic Society. 23: 2777-2785. DOI: 10.1016/S0955-2219(03)00289-9 |
0.739 |
|
2003 |
Gerberich WW, Mook WM, Perrey CR, Carter CB, Baskes MI, Mukherjee R, Gidwani A, Heberlein J, McMurry PH, Girshick SL. Superhard silicon nanospheres Journal of the Mechanics and Physics of Solids. 51: 979-992. DOI: 10.1016/S0022-5096(03)00018-8 |
0.667 |
|
2002 |
Ravishankar N, Gilliss SR, Carter CB. Dewetting of liquids on ceramic surfaces at high temperatures. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 8: 257-67. PMID 12533223 DOI: 10.1017/S1431927602020196 |
0.787 |
|
2002 |
Perrey CR, Mook WM, Carter CB, Gerberich WW. Characterization of mechanical deformation of nanoscale volumes Materials Research Society Symposium - Proceedings. 740: 87-92. DOI: 10.1557/Proc-740-I3.13 |
0.694 |
|
2002 |
Bapat A, Kortshagen UR, Campbell SA, Perrey CR, Carter CB. Synthesis of Crystalline Silicon Nanoparticles in Low-Pressure Inductive Plasmas Mrs Proceedings. 737: 301-306. DOI: 10.1557/Proc-737-F1.10 |
0.716 |
|
2002 |
Yanina SV, Carter CB. Precipitation from a reactive silicate on MgO Journal of Materials Research. 17: 3056-3064. DOI: 10.1557/Jmr.2002.0444 |
0.788 |
|
2002 |
Ravishankar N, Carter CB. Bunching of Surface Steps and Facet Formation on Analumina Surface Journal of Materials Research. 17: 98-106. DOI: 10.1557/Jmr.2002.0016 |
0.312 |
|
2002 |
Gilliss SR, Ravishankar N, Kotula PG, Michael JR, Carter CB. Application of FIB and TEM for the Characterization of Dewetting Behavior on Ceramics Microscopy and Microanalysis. 8: 562-563. DOI: 10.1017/S1431927602105484 |
0.708 |
|
2002 |
Perrey CR, Carter CB, Kotula PG, Michael JR. Characterization of Nanoparticle Films and Structures Using Focused Ion Beam Milling and Transmission Electron Microscopy Microscopy and Microanalysis. 8: 1144-1145. DOI: 10.1017/S1431927602103795 |
0.678 |
|
2002 |
Yanina SV, Carter CB. Terraces and ledges on (001) spinel surfaces Surface Science. 513. DOI: 10.1016/S0039-6028(02)01825-3 |
0.779 |
|
2002 |
Yanina SV, Carter CB. Dislocations at spinel surfaces Surface Science. 511: 133-146. DOI: 10.1016/S0039-6028(02)01561-3 |
0.79 |
|
2001 |
Farrer JK, Carter CB, Mao Z, McKernan S. Thickness-fringe Contrast Analysis of Defects in GaN Mrs Proceedings. 673. DOI: 10.1557/Proc-673-P3.12 |
0.747 |
|
2001 |
Ravishankar N, Carter CB. Exuding Liquid from Grain Boundaries in Alumina Journal of the American Ceramic Society. 84: 859-862. DOI: 10.1111/J.1151-2916.2001.Tb00752.X |
0.354 |
|
2001 |
Gilliss SR, Fairer JK, Ravishankar N, Schwabel MG, Carter CB. Microanalysis of AFM Tips Coated with Cerium Oxide Microscopy and Microanalysis. 7: 1236-1237. DOI: 10.1017/S1431927600032256 |
0.71 |
|
2001 |
Ravishankar N, Carter CB. Surface Steps on Flux-Grown Alumina Microscopy and Microanalysis. 7: 416-417. DOI: 10.1017/S1431927600028154 |
0.317 |
|
2000 |
Ravishankar N, Farrer JK, Carter CB. Exudation of Silicate Liquid from Polycrystalline Alumina Mrs Proceedings. 654. DOI: 10.1557/Proc-654-Aa5.8.1 |
0.757 |
|
2000 |
Farrer JK, Ravishankar N, Michael JR, Carter CB. Grain Boundary Migration in Alumina Mrs Proceedings. 652. DOI: 10.1557/Proc-652-Y1.2 |
0.739 |
|
2000 |
Ramamurthy S, Schmalzried H, Carter CB. Interaction of silicate liquid with a sapphire surface Philosophical Magazine. 80: 2651-2674. DOI: 10.1080/01418610008216497 |
0.353 |
|
2000 |
Ravishankar N, Carter CB. Glass/Crystal Interfaces in Liquid-Phase Sintered Materials Interface Science. 8: 295-304. DOI: 10.1023/A:1008767111340 |
0.319 |
|
2000 |
Gilliss SR, Yanina SV, Ravishankar N, Carter CB. Surfaces of Gadolinium Gallium Garnet Microscopy and Microanalysis. 6: 716-717. DOI: 10.1017/S1431927600036072 |
0.715 |
|
2000 |
Yanina SV, Carter CB. Evaporation Spirals on {111} and {001} Surfaces of MgAl2O4 Spinel Microscopy and Microanalysis. 6: 714-715. DOI: 10.1017/S1431927600036060 |
0.778 |
|
2000 |
Ravishankar N, Carter CB. Silicate Glass and Evaporation from Sapphire Surfaces Microscopy and Microanalysis. 6: 388-389. DOI: 10.1017/S1431927600034437 |
0.304 |
|
2000 |
Blanford CF, Yan HW, Stein A, Carter CB. SEM and TEM of Metallic Inverse Opals Microscopy and Microanalysis. 6: 70-71. DOI: 10.1017/S1431927600032840 |
0.623 |
|
1999 |
Cohen D, McKernan S, Carter CB. Characterization of the Absolute Crystal Polarity across Twin Boundaries in Gallium Phosphide Using Convergent-Beam Electron Diffraction. Microscopy and Microanalysis. 5: 173-186. PMID 10383990 DOI: 10.1017/S1431927699000124 |
0.322 |
|
1999 |
Ravishankar N, Carter CB. Control of Grain Boundary Microstructures in Liquid-Phase Sintered Alumina Mrs Proceedings. 586: 59. DOI: 10.1557/Proc-586-59 |
0.348 |
|
1999 |
Zagrebelny AV, Lilleodden ET, Gerberich WW, Carter CB. Indentation of silicate-glass films on Al2O3 substrates Journal of the American Ceramic Society. 82: 1803-1808. DOI: 10.1111/J.1151-2916.1999.Tb02002.X |
0.336 |
|
1999 |
Johnson MT, Michael JR, Gilliss SR, Carter CB. Iron oxide on (001) MgO Philosophical Magazine A. 79: 2887-2898. DOI: 10.1080/01418619908212031 |
0.734 |
|
1999 |
Blanford C, Stein A, Carter C. Electron Microscopy of Hierarchical Materials Microscopy and Microanalysis. 5: 820-821. DOI: 10.1017/S1431927600017426 |
0.666 |
|
1999 |
Ravishankar N, Carter CB. Migration of Silicate Liquid Out of Grain Boundaries in Ceramics Microscopy and Microanalysis. 5: 800-801. DOI: 10.1017/S1431927600017323 |
0.303 |
|
1999 |
Johnson MT, Kotula PG, Carter CB. Growth of nickel ferrite thin films using pulsed-laser deposition Journal of Crystal Growth. 206: 299-307. DOI: 10.1016/S0022-0248(99)00342-5 |
0.324 |
|
1999 |
Yang W, McPherson SA, Mao Z, McKernan S, Carter CB. Single-crystal GaN pyramids grown on (1 1 1)Si substrates by selective lateral overgrowth Journal of Crystal Growth. 204: 270-274. DOI: 10.1016/S0022-0248(99)00205-5 |
0.314 |
|
1998 |
Johnson MT, Carter CB. Thin-Film Reaction between [alpha]-Fe2O3 and (001) MgO. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 4: 141-5. PMID 23232183 DOI: 10.1017/S1431927698980138 |
0.32 |
|
1998 |
Caldwell DA, Chen L-, Bensaoula AH, Farrer JK, Carter CB, Palmstrøm CJ. In-Situ Regrowthi of GaAs Through Controlled Phase Transformations and Reactions of Thin Films on GaAs Mrs Proceedings. 514. DOI: 10.1557/Proc-514-455 |
0.712 |
|
1998 |
Mallamaci MP, Sartain KB, Carter CB. Crystallization of calcium hexaluminate on basal alumina Philosophical Magazine. 77: 561-575. DOI: 10.1080/01418619808224069 |
0.316 |
|
1998 |
Johnson MT, Gilliss SR, Carter CB. Use of Pt Markers in the Study of Solid-State Reactions in the
Presence of an Electric Field Microscopy and Microanalysis. 4: 158-163. DOI: 10.1017/S1431927698980151 |
0.735 |
|
1998 |
Blanford CF, Bentley J, Stein A, Carter CB. An Investigation Into Beam Damage of Mesoporous Materials Microscopy and Microanalysis. 4: 712-713. DOI: 10.1017/S1431927600023680 |
0.662 |
|
1998 |
Mao Z, Johnson MT, Carter CB. Microstructural Characterization of GaN on (0001) Sapphire Microscopy and Microanalysis. 4: 628-629. DOI: 10.1017/S1431927600023266 |
0.306 |
|
1998 |
Yanina SV, Johnson MT, Mao Z, Carter CB. On Devitrification of Monticellite (CaMgSiO4) Films Grown on (001)-Oriented Single-Crystal MgO. Microscopy and Microanalysis. 4: 590-591. DOI: 10.1017/S1431927600023072 |
0.777 |
|
1997 |
Johnson MT, Mao Z, Carter CB. Crystal Defects In Gan On (0001) Sapphire Mrs Proceedings. 482: 405. DOI: 10.1557/Proc-482-405 |
0.346 |
|
1997 |
Johnson MT, Gilliss SR, Carter CB. Electric-Field Effects on Reactions Between Oxides Mrs Proceedings. 481. DOI: 10.1557/Proc-481-303 |
0.73 |
|
1997 |
Zagrebelny AV, Lilleodden ET, Carter CB. Effect of glass composition on mechanical properties of interfaces between alumina and silicate glass Materials Research Society Symposium - Proceedings. 458: 179-184. DOI: 10.1557/Proc-458-179 |
0.354 |
|
1997 |
Heffelfinger JR, Carter CB. The effect of surface structure on the growth of ceramic thin films Philosophical Magazine Letters. 76: 223-232. DOI: 10.1080/095008397179192 |
0.328 |
|
1997 |
Yanina SV, Johnson MT, Carter CB. The Dynamics of Mgo Surface Faceting Microscopy and Microanalysis. 3: 741-742. DOI: 10.1017/S143192760001059X |
0.771 |
|
1997 |
Zagrebelny AV, Carter CB. Indentation of strained silicate-glass films on alumina substrates Scripta Materialia. 37: 1869-1875. DOI: 10.1016/S1359-6462(97)00380-1 |
0.302 |
|
1997 |
Heffelfinger JR, Carter CB. Mechanisms of surface faceting and coarsening Surface Science. 389: 188-200. DOI: 10.1016/S0039-6028(97)00411-1 |
0.356 |
|
1996 |
Cohen D, Carter CB. Characterization Of APB's In GaP Mrs Proceedings. 442. DOI: 10.1557/Proc-442-503 |
0.366 |
|
1996 |
Zagrebelny AV, Nelson JC, Carter CB. Micromechanical Deformation of Single-Crystal Alumina Surfaces Mrs Proceedings. 440: 189. DOI: 10.1557/Proc-440-189 |
0.322 |
|
1996 |
Zagrebelny AV, Nelson JC, Lilleodden ET, Ramamurthy S, Carter CB. Alumina-silicate glass interfacial properties probed by micromechanical testing techniques Materials Research Society Symposium - Proceedings. 401: 103-108. DOI: 10.1557/Proc-401-103 |
0.346 |
|
1995 |
Kotula PG, Carter CB. Nucleation of Solid‐State Reactions between Nickel Oxide and Aluminium Oxide Journal of the American Ceramic Society. 78: 248-250. DOI: 10.1111/J.1151-2916.1995.Tb08395.X |
0.349 |
|
1995 |
Zhu JG, Palmstrom CJ, Carter CB. Lattice matched GaAs/Sc0.3Er0.7As/GaAs heterostructures grown on various substrate orientations Journal of Applied Physics. 77: 4321-4328. DOI: 10.1063/1.359455 |
0.574 |
|
1995 |
Zhu JG, Palmstrom CJ, Carter CB. Study of molecular-beam epitactic growth of GaAs on (100) Sc xE1-xAs/GaAs Journal of Applied Physics. 77: 4312-4320. DOI: 10.1063/1.359454 |
0.575 |
|
1995 |
Heffelfinger JR, Bench MW, Carter CB. On the faceting of ceramic surfaces Surface Science. 343. DOI: 10.1016/0039-6028(95)00896-9 |
0.355 |
|
1994 |
Kotula PG, Erickson DD, Carter CB. Use of Thin‐Film Substrates to Study Enhanced Solid‐State Phase Transformations Journal of the American Ceramic Society. 77: 3287-3291. DOI: 10.1111/J.1151-2916.1994.Tb04588.X |
0.313 |
|
1993 |
Mallamaci MP, Bentley J, Carter CB. In-Situ TEM Crystallization of Anorthite-Glass Films on α-Al 2 O 3 Mrs Proceedings. 321. DOI: 10.1557/Proc-321-567 |
0.339 |
|
1993 |
Mallamaci MP, Ramamurthy S, Carter CB. Liquid Infiltration of MgO and Al 2 O 3 Thin Films Mrs Proceedings. 318: 589. DOI: 10.1557/Proc-318-589 |
0.355 |
|
1993 |
King S, Heffelfinger J, Mallamaci M, McKernan S, Carter CB. Surface Steps on (100) MgO Foils Imaged by TEM, SEM and AFM Mrs Proceedings. 318. DOI: 10.1557/Proc-318-407 |
0.312 |
|
1993 |
King S, Carter CB. The Role Of Steps On The Micro Structure Of Titanium-Oxide Films Deposited By Pld Onto (100) Mgo Surfaces Mrs Proceedings. 317: 65. DOI: 10.1557/Proc-317-65 |
0.344 |
|
1993 |
Tietz LA, Carter CB. Structure of the Fe2O3–Al2O3 (1102) interface Philosophical Magazine. 67: 729-744. DOI: 10.1080/01418619308207186 |
0.32 |
|
1993 |
Tietz LA, Carter CB. Structure of the Fe2O3–Al2O3 (0001) interface Philosophical Magazine. 67: 699-727. DOI: 10.1080/01418619308207185 |
0.348 |
|
1992 |
Mckernan S, Carter CB. Image simulations of Ge twin boundaries Mrs Proceedings. 295: 173. DOI: 10.1557/Proc-295-173 |
0.302 |
|
1992 |
Kotula PG, Carter CB. Interfacial Reactions During Processing of Thin Nickel Oxide Films Grown by Pulsed-Laser Ablation Mrs Proceedings. 285. DOI: 10.1557/Proc-285-373 |
0.319 |
|
1992 |
King S, Carter CB. A TEM study of step morphology on the non-uhv heat-treated MgO (100) surface Mrs Proceedings. 280: 157. DOI: 10.1557/Proc-280-157 |
0.309 |
|
1992 |
Susnitzky DW, Carter CB. Surface Morphology of Heat‐Treated Ceramic Thin Films Journal of the American Ceramic Society. 75: 2463-2478. DOI: 10.1111/J.1151-2916.1992.Tb05599.X |
0.349 |
|
1991 |
Anderson IM, Tietz LA, Carter CB. Interface Structure Of Iron Oxide Thin Films Grown On Sapphire And Single-Crystal MgO Mrs Proceedings. 238. DOI: 10.1557/Proc-238-807 |
0.309 |
|
1991 |
Susnitzky DW, Carter CB. Defect/surface interactions in heat-treated ceramic thin films Journal of Materials Research. 6: 2403-2411. DOI: 10.1557/Jmr.1991.2403 |
0.363 |
|
1991 |
Carter CB, Anderson G, Ponce F. Accommodation Of Misfit During The Initial Growth Of Gaas On 111-Si Philosophical Magazine. 63: 279-298. DOI: 10.1080/01418619108204850 |
0.314 |
|
1991 |
Norton MG, Kotula PG, Carter CB. Oriented aluminum nitride thin films deposited by pulsed‐laser ablation Journal of Applied Physics. 70: 2871-2873. DOI: 10.1063/1.349352 |
0.32 |
|
1990 |
Norton MG, Carter CB. Interfaces in Structural Ceramics Mrs Bulletin. 15: 51-59. DOI: 10.1557/S088376940005867X |
0.334 |
|
1990 |
Finstad TG, Palmstrøm CJ, Mounier S, Keramidas VG, Zhu JG, Carter CB. Initial Stages of Gaas Growth on Sc l-X Er x as Surfaces Mrs Proceedings. 202: 413. DOI: 10.1557/Proc-202-413 |
0.5 |
|
1990 |
Zhu JG, Palmstrdøm CJ, Carter CB. Defects in Mbe-Grown GaAs/Sc x Er 1–x As/GaAs Layers Mrs Proceedings. 198: 177. DOI: 10.1557/Proc-198-177 |
0.502 |
|
1990 |
Zhu JG, Carter CB, Palmstrom CJ. Misfit Dislocations at Mismatched Epitactic Heterojunctions Mrs Proceedings. 198. DOI: 10.1557/Proc-198-171 |
0.58 |
|
1990 |
PalmstrØM CJ, Harbison JP, Sands T, Ramesh R, Finstad TG, Mounier S, Zhu JG, Carter CB, Florez LT, Keramidas VG. Buried Metal/III-V Semiconductor Heteroepitaxy: Approaches to Lattice Matching Mrs Proceedings. 198: 153. DOI: 10.1557/Proc-198-153 |
0.515 |
|
1990 |
Zhu JG, Carter CB. 60° dislocations in (001) GaAs/Si interfaces Philosophical Magazine. 62: 319-328. DOI: 10.1080/01418619008242506 |
0.548 |
|
1990 |
Norton MG, Summerfelt SR, Carter CB. Surface preparation for the heteroepitactic growth of ceramic thin films Applied Physics Letters. 56: 2246-2248. DOI: 10.1063/1.103246 |
0.364 |
|
1990 |
Zhu JG, Carter CB, Palmstrøm CJ, Mounier S. Microstructure of epitactically grown GaAs/ErAs/GaAs Applied Physics Letters. 56: 1323-1325. DOI: 10.1063/1.102506 |
0.608 |
|
1989 |
Mckernan S, Carter CB. High-Resolution Electron Microscopy of Olivine-Magnetite Interfaces. Mrs Proceedings. 280: 553. DOI: 10.1557/Proc-280-553 |
0.304 |
|
1989 |
Norton MG, Tietz LA, Carter CB, Russek SE, Moeckly BH, Buhrman RA. Grain Boundaries in Yba 2 Cu 3 O 7-δ Thin Films Mrs Proceedings. 169: 513. DOI: 10.1557/Proc-169-513 |
0.335 |
|
1989 |
Zhu JG, Palmstrøm CJ, Mounier S, Carter CB. Characterization of ErAs/GaAs and GaAs/ErAs/GaAs Structures Mrs Proceedings. 160: 325. DOI: 10.1557/Proc-160-325 |
0.556 |
|
1989 |
Zhu JG, McKeman S, Palmstrøm CJ, Carter CB. High-Resolution Imaging of Coga/GaAs and Eras/GaAs Interfaces Mrs Proceedings. 159. DOI: 10.1557/Proc-159-89 |
0.527 |
|
1989 |
Tietz LA, Summerfelt SR, English GR, Carter CB. Early stages of the heteroepitactic growth of hematite on (0001) Al2O3 by transmission electron microscopy Applied Physics Letters. 55: 1202-1204. DOI: 10.1063/1.102464 |
0.357 |
|
1989 |
Norton MG, Tietz LA, Summerfelt SR, Carter CB. Observation of the early stages of growth of superconducting thin films by transmission electron microscopy Applied Physics Letters. 55: 2348-2350. DOI: 10.1063/1.102363 |
0.338 |
|
1989 |
Zhu JG, Carter CB, Palmstrøm CJ, Garrison KC. Characterization of the CoGa/GaAs interface Applied Physics Letters. 55: 39-41. DOI: 10.1063/1.101748 |
0.603 |
|
1989 |
De Cooman BC, Carter CB, Wicks GW, Tanoue T, Eastman LF. The structure of InAs/GaSb superlattices Thin Solid Films. 170: 49-62. DOI: 10.1016/0040-6090(89)90621-4 |
0.379 |
|
1988 |
Zhu JG, McKernan S, Carter CB, Schaff WJ, Eastman LF. Dislocations in GaAs/Si Interfaces Mrs Proceedings. 144: 285. DOI: 10.1557/Proc-144-285 |
0.608 |
|
1988 |
McKernan S, Zhu JG, Carter CB, Caridi E, Schaff W. Defects and Interfaces in GaAs Grown on Si Mrs Proceedings. 116. DOI: 10.1557/Proc-116-273 |
0.562 |
|
1987 |
De Cooman BC, McKernan S, Carter CB, Ralston JR, Wicks GW, Eastman LF. The Observation of Stacking-Fault Tetrahedra in III-V Compounds Philosophical Magazine Letters. 56: 85-90. DOI: 10.1080/09500838708205254 |
0.332 |
|
1986 |
Ralston J, Wicks GW, Eastman LF, De Cooman BC, Carter CB. Defect structure and intermixing of ion-implanted AlxGa 1-xAs/GaAs superlattices Journal of Applied Physics. 59: 120-123. DOI: 10.1063/1.336852 |
0.366 |
|
1986 |
Schaus CF, Shealy JR, Eastman LF, Cooman BC, Carter CB. Improved GaAs/AlGaAs quantum-well heterostructures by organometallic vapor-phase epitaxy Journal of Applied Physics. 59: 678-680. DOI: 10.1063/1.336637 |
0.386 |
|
1985 |
Cooman BCD, Carter CB, Ralston J, Wicks GW, Eastman LF. THE DEFECT STRUCTURE OF ION-IMPLANTED Al x Ga 1−x As/GaAs SUPERLATFICES Mrs Proceedings. 56: 333. DOI: 10.1557/Proc-56-333 |
0.323 |
|
1985 |
Ralston J, Wicks GW, Eastman LF, Rathbun L, DeCooman BC, Carter CB. INTERMIXING OF ION-IMLANTED AlGaAs/GaAs SUPERLATTICES Mrs Proceedings. 56: 327. DOI: 10.1557/Proc-56-327 |
0.372 |
|
Low-probability matches (unlikely to be authored by this person) |
1998 |
Medlin DL, Campbell GH, Carter CB. Grain Boundary Dislocations and Stacking Defects in the 9R Phase at an Incoherent Twin Boundary in Copper Microscopy and Microanalysis. 4: 774-775. DOI: 10.1017/S1431927600023990 |
0.3 |
|
1995 |
Tietz LA, Carter CB, McKernan S. Top-bottom effects in double diffraction Ultramicroscopy. 60: 241-246. DOI: 10.1016/0304-3991(95)00067-2 |
0.299 |
|
2014 |
Mackay DT, Janish MT, Sahaym U, Kotula PG, Jungjohann KL, Carter CB, Norton MG. Template-free electrochemical synthesis of tin nanostructures Journal of Materials Science. 49: 1476-1483. DOI: 10.1007/S10853-013-7917-1 |
0.298 |
|
1992 |
King S, McKernan S, Carter CB. The Determination of Step Heights on the Non-Uhv Heat-Treated MgO (100) Surface by CBED Mrs Proceedings. 280. DOI: 10.1557/Proc-280-661 |
0.298 |
|
1995 |
Ramamurthy S, Hebert BC, Carter CB. Dewetting of glass-coated α-Al2O3{1010} surface Philosophical Magazine Letters. 72: 269-275. DOI: 10.1080/09500839508242463 |
0.298 |
|
1993 |
Kotula PG, Carter CB. Observation of the Phase-Boundary Controlled Formation of NiA1 2 O 4 From a Single-Crystal NiO Thin Film and a Single-Crystal α-A1 2 O 3 Substrate Mrs Proceedings. 319: 63. DOI: 10.1557/Proc-319-63 |
0.296 |
|
2005 |
Kotula PG, Carter CB. Kinetics of Thin‐Film Reactions of Nickel Oxide with Alumina: II, {1100} and {1102} Reaction Couples Journal of the American Ceramic Society. 81: 2877-2884. DOI: 10.1111/J.1151-2916.1998.Tb02708.X |
0.296 |
|
2016 |
Carter CB. Dislocations and Grain Boundaries in Ceramics and Metals Microscopy and Microanalysis. 22: 1220-1221. DOI: 10.1017/S1431927616006942 |
0.296 |
|
1993 |
Ramamurthy S, Mallamaci MP, Carter CB. Crystallization of Glass Films on Single-Crystal MgO Substrates Mrs Proceedings. 321. DOI: 10.1557/Proc-321-633 |
0.292 |
|
2011 |
Basu J, Suresh A, Wilhite BA, Carter CB. Microstructural evolution of cobalt-doped barium cerate-zirconate at elevated temperatures under moist reducing conditions Journal of the European Ceramic Society. 31: 1421-1429. DOI: 10.1016/J.Jeurceramsoc.2011.02.029 |
0.292 |
|
2019 |
McComb DW, Lengyel J, Carter CB. Cryogenic transmission electron microscopy for materials research Mrs Bulletin. 44: 924-928. DOI: 10.1557/Mrs.2019.283 |
0.291 |
|
1999 |
Anderson IM, Carter CB, Schmalzried H. On the microstructures of equilibrated and quenched spinel-containing nickel titanates Philosophical Magazine Letters. 79: 901-911. DOI: 10.1080/095008399176490 |
0.291 |
|
1999 |
Johnson MT, Carter CB. Movement of Pt markers in MgO during a solid-state reaction Philosophical Magazine Letters. 79: 609-617. DOI: 10.1080/095008399176995 |
0.29 |
|
1997 |
Cohen D, McKernan S, Carter CB. Characterization of Crystal Polarity Across Twin Boundaries in GaP Microscopy and Microanalysis. 3: 491-492. DOI: 10.1017/S143192760000934X |
0.289 |
|
2017 |
Huang F, Motealleh B, Zheng W, Janish MT, Carter CB, Cornelius CJ. Electrospinning amorphous SiO2-TiO2 and TiO2 nanofibers using sol-gel chemistry and its thermal conversion into anatase and rutile Ceramics International. 44: 4577-4585. DOI: 10.1016/J.Ceramint.2017.10.134 |
0.289 |
|
2000 |
Ravishankar N, Carter CB. Glass-Crystal Boundaries in Liquid-Phase Sintered Ceramics Mrs Proceedings. 620. DOI: 10.1557/Proc-620-M2.8.1 |
0.287 |
|
1996 |
Campbell GH, Chan DK, Medlin DL, Angelo JE, Carter CB. Dynamic observation of the FCC to 9R shear transformation in a copper Σ = 3 incoherent twin boundary Scripta Materialia. 35: 837-842. DOI: 10.1016/1359-6462(96)00220-5 |
0.287 |
|
2020 |
Tripathi S, Kotula P, Singh MK, Ghosh C, Bakan G, Silva H, Carter CB. Role of Oxygen on Chemical Segregation in Uncapped Ge2Sb2Te5 Thin Films on Silicon Nitride Ecs Journal of Solid State Science and Technology. 9: 054007. DOI: 10.1149/2162-8777/Ab9A19 |
0.286 |
|
2016 |
Janish MT, Mook B, Vachhani SJ, Cerreta E, Carter CB. Microscopy of the Deformation of Tantalum Microscopy and Microanalysis. 22: 1644-1645. DOI: 10.1017/S1431927616009065 |
0.285 |
|
1991 |
Anderson IM, Carter CB. Determination of the Width of the Single Phase Stability Field of Nickel Titanate Spinel Mrs Proceedings. 237. DOI: 10.1557/Proc-237-175 |
0.285 |
|
1998 |
Mallamaci MP, Carter CB. Faceting of the interface between Al2O3 and anorthite glass Acta Materialia. 46: 2895-2907. DOI: 10.1016/S1359-6454(97)00463-1 |
0.285 |
|
2004 |
Deneen JM, Lentzen M, Carter CB. Investigation of ZnS Nanobelts by Spherical-aberration Corrected Transmission Electron Microscopy Microscopy and Microanalysis. 10: 54-55. DOI: 10.1017/S1431927604886598 |
0.282 |
|
1998 |
Carter CB. Dislocations in Ceramics Microscopy and Microanalysis. 4: 550-551. DOI: 10.1017/S143192760002287X |
0.282 |
|
2019 |
Carter CB, Williams DB. Transmission Microscopy: Beginning Automation Microscopy and Microanalysis. 25: 2256-2257. DOI: 10.1017/S1431927619012017 |
0.281 |
|
2015 |
Janish MT, Carter CB. In situ TEM observations of the lithiation of molybdenum disulfide Scripta Materialia. 107: 22-25. DOI: 10.1016/J.Scriptamat.2015.05.011 |
0.278 |
|
1999 |
Mao Z, McKernan S, Carter CB, Yang W, McPherson SA. Defects in GaN Pyramids Grown on Si(111) Substrates by Selective Lateral Overgrowth Mrs Internet Journal of Nitride Semiconductor Research. 4: 179-184. DOI: 10.1557/S1092578300002428 |
0.277 |
|
1998 |
Mao Z, McKernan S, Carter CB, Yang W, McPherson SA. Defects in GaN Pyramids Grown on Si(111) Substrates by Selective Lateral Overgrowth Mrs Proceedings. 537. DOI: 10.1557/Proc-537-G3.13 |
0.277 |
|
2013 |
Roller JM, Arellano-Jiménez MJ, Jain R, Yu H, Carter CB, Marica R. Oxygen evolution during water electrolysis from thin films using bimetallic oxides of Ir-Pt and Ir-Ru Journal of the Electrochemical Society. 160: F716-F730. DOI: 10.1149/2.121306Jes |
0.277 |
|
1996 |
Ramamurthy S, Mallamaci MP, Carter CB. Initial stages of solid-liquid interactions in the MgO-CaMgSiO4 system Scripta Materialia. 34: 1779-1783. DOI: 10.1016/1359-6462(96)00054-1 |
0.276 |
|
2020 |
Ghosh C, Singh M, Watt J, Silva H, Carter CB. Defect Imaging and Structure Evolution in GST Films During In-situ Heating Microscopy and Microanalysis. 1-4. DOI: 10.1017/S1431927620017961 |
0.275 |
|
2010 |
Suresh A, Basu J, Carter CB, Sammes N, Wilhite BA. Synthesis of cobalt-doped barium cerate-zirconate and its evaluation for hydrogen production and electrochemical characterization Journal of Materials Science. 45: 3215-3227. DOI: 10.1007/S10853-010-4329-3 |
0.275 |
|
1993 |
Kotula PG, Erickson DD, Carter CB. The use of thin Film Substrates to Study Enhanced Solid-State Phase Transformations Mrs Proceedings. 319. DOI: 10.1557/Proc-319-57 |
0.272 |
|
1999 |
Zagrebelny AV, Carter CB. Detection of residual stresses in glass-penetrated polycrystalline alumina with nanoindentation Philosophical Magazine. 79: 835-845. DOI: 10.1080/01418619908210334 |
0.272 |
|
1993 |
Heffelfinger JR, Carter CB. Evolution of Yttrium Aluminum Garnet Films by Solid-State Reaction Mrs Proceedings. 317: 553. DOI: 10.1557/Proc-317-553 |
0.271 |
|
1995 |
Ramamurthy S, Hebert BC, Carter CB, Schmalzried H. Interaction of Silicate Liquid with Sapphire Surfaces Mrs Proceedings. 398. DOI: 10.1557/Proc-398-295 |
0.271 |
|
1992 |
Summerfelt SR, Carter CB. Coarsening and shape transformation of NiFe2O4 precipitates in a NiO matrix Philosophical Magazine. 65: 1503-1519. DOI: 10.1080/01418619208205619 |
0.269 |
|
2009 |
Jia W, Wang Y, Basu J, Strout T, Carter CB, Gokirmak A, Lei Y. Nanoengineered transparent, free-standing, conductive nanofibrous membranes Journal of Physical Chemistry C. 113: 19525-19530. DOI: 10.1021/Jp905023E |
0.269 |
|
1999 |
Johnson MT, Carter CB. AlN films grown by electric field induced flux of Al cations Thin Solid Films. 339: 117-119. DOI: 10.1016/S0040-6090(98)01162-6 |
0.269 |
|
1996 |
Heffelfinger JR, Kotula PG, Carter CB. Ceramic Thin-Film Reactions Materials Science Forum. 705-708. DOI: 10.4028/Www.Scientific.Net/Msf.207-209.705 |
0.268 |
|
1997 |
Johnson MT, Kotula PG, Carter CB. Formation of Nickel Ferrite Films by Solid-State Reaction Microscopy and Microanalysis. 3: 739-740. DOI: 10.1017/S1431927600010588 |
0.267 |
|
2020 |
Parida S, Mishra A, Chen J, Wang J, Dobley A, Carter CB, Dongare AM. Vertically Stacked 2H‐1T Dual‐Phase MoS2 Microstructures during Lithium Intercalation: A First Principles Study Journal of the American Ceramic Society. 103: 6603-6614. DOI: 10.1111/Jace.17367 |
0.267 |
|
1996 |
Ramamurthy S, Mallamaci MP, Zimmerman CM, Sartain KB, Carter CB. Glass Crystallization and Interfaces Materials Science Forum. 753-756. DOI: 10.4028/Www.Scientific.Net/Msf.207-209.753 |
0.267 |
|
1989 |
Tietz LA, Summerfelt SR, Carter CB. The Structure of Interfaces in Oxide Heterojunctions Formed by CVD Mrs Proceedings. 159. DOI: 10.1557/Proc-159-209 |
0.267 |
|
1985 |
Chen SH, Zheng LR, Carter CB, Mayer JW. Transmission electron microscopy studies on the lateral growth of nickel silicides Journal of Applied Physics. 57: 258-263. DOI: 10.1063/1.335482 |
0.266 |
|
2000 |
Li M, Carter CB, Gerberich WW. Nanoindentation measurements of mechanical properties of polystyrene thin films Mrs Proceedings. 649. DOI: 10.1557/Proc-649-Q7.21 |
0.265 |
|
1987 |
Tietz LA, Cooman BCD, Carter CB, Lathrop DK, Russek SE, Buhrman RA. The Morphology of YBa 2 Cu 3 O 7−x Thin Films Grown on Ceramic Substrates Mrs Proceedings. 99: 719-722. DOI: 10.1557/Proc-99-719 |
0.265 |
|
1990 |
Norton MG, Carter CB. Observation of the early stages of heteroepitactic growth of BaTiO3 thin-films Journal of Materials Research. 5: 2762-2765. DOI: 10.1557/Jmr.1990.2762 |
0.264 |
|
2001 |
Li M, Carter CB, Hillmyer MA, Gerberich WW. Adhesion of polymer–inorganic interfaces by nanoindentation Journal of Materials Research. 16: 3378-3388. DOI: 10.1557/Jmr.2001.0466 |
0.264 |
|
1996 |
Ramamurthy S, Mallamaci MP, Zimmerman CM, Carter CB, Duncombe PR, Shaw TM. Microstructure of polycrystalline MgO penetrated by a silicate liquid Microscopy and Microanalysis. 2: 113-128. DOI: 10.1017/S1431927696211134 |
0.26 |
|
2013 |
Liu G, Arellano-Jiménez MJ, Carter CB, Agrios AG. Preparation of functionalized platinum nanoparticles: A comparison of different methods and reagents Journal of Nanoparticle Research. 15. DOI: 10.1007/S11051-013-1744-9 |
0.259 |
|
1990 |
Norton MG, English GR, Carter CB. Early Stages of Growth of BaTiO3 Thin-Films Mrs Proceedings. 200. DOI: 10.1557/Proc-200-237 |
0.259 |
|
1998 |
Kotula PG, Johnson MT, Carter CB. Thin-Film Reactions Zeitschrift FüR Physikalische Chemie. 206: 73-99. DOI: 10.1002/BBPC.19860900811 |
0.258 |
|
2000 |
Ravishankar N, Johnson MT, Carter CB. Migrating Interfaces in Sapphire Bicrystals and Tricrystals Microscopy and Microanalysis. 6: 386-387. DOI: 10.1017/S1431927600034425 |
0.258 |
|
1998 |
Johnson MT, Mao Z, Carter CB. Ain Films Grown by Electric Field Induced Flux of al Cations Microscopy and Microanalysis. 4: 638-639. DOI: 10.1017/S143192760002331X |
0.258 |
|
2016 |
Chou SS, Swartzentruber BS, Janish MT, Meyer KC, Biedermann LB, Okur S, Burckel DB, Carter CB, Kaehr B. Laser Direct Write Synthesis of Lead Halide Perovskites. The Journal of Physical Chemistry Letters. PMID 27593712 DOI: 10.1021/Acs.Jpclett.6B01557 |
0.257 |
|
1980 |
Carter C. The Study of Grain Boundaries in Ceramics by Electron Diffraction Proceedings, Annual Meeting, Electron Microscopy Society of America. 38: 370-373. DOI: 10.1017/s1431927600001562 |
0.254 |
|
2014 |
Carter CB. The Role of Microscopy in Understanding Ceramic Processing Microscopy and Microanalysis. 20: 1914-1915. DOI: 10.1017/S1431927614011301 |
0.254 |
|
1991 |
Norton MG, Scarfone C, Li J, Carter CB, Mayer JW. Epitaxy of barium titanate thin films grown on MgO by pulsed-laser ablation Journal of Materials Research. 6: 2022-2025. DOI: 10.1557/Jmr.1991.2022 |
0.254 |
|
1999 |
Carter CB, Ravishankar N, Korte C, Mallamaci MP. Interfaces In Glass-Containing Ceramics Microscopy and Microanalysis. 5: 98-99. DOI: 10.1017/S1431927600013817 |
0.253 |
|
2019 |
Williams DB, Carter CB. Teaching Microscopy Beats Analysis Microscopy and Microanalysis. 25: 2266-2267. DOI: 10.1017/S1431927619012066 |
0.253 |
|
1993 |
Bench MW, Sartain KB, Heffelfinger JR, Carter CB. On the Evolution of Copper Oxide Films Grown on α-A12O3 By Pulsed-Laser Ablation Mrs Proceedings. 317. DOI: 10.1557/Proc-317-491 |
0.249 |
|
1996 |
Zagrebelny AV, Lilleodden ET, Nelson JC, Ramamurthy S, Carter CB. In-situ and ex-situ AFM imaging of μN load indents on silicate glass/alumina interfaces Proceedings, Annual Meeting, Electron Microscopy Society of America. 54: 660-661. DOI: 10.1017/S0424820100165768 |
0.248 |
|
1998 |
Cohen D, Medlin DL, Carter CB. Determination Of Rigid-Body Lattice Translations Across Antiphase and Twin Boundaries in Compound Semiconductors Microscopy and Microanalysis. 4: 786-787. DOI: 10.1017/S1431927600024053 |
0.247 |
|
2016 |
Mackay DT, Janish MT, Sahaym U, Kotula PG, Jungjohann KL, Carter CB, Norton MG. Erratum to: Template-free electrochemical synthesis of tin nanostructures Journal of Materials Science. 51: 2759-2760. DOI: 10.1007/S10853-015-9607-7 |
0.246 |
|
1992 |
Norton MG, Carter CB, Fleischer EL, Mayer JW. Solid krypton in MgO Journal of Materials Research. 7: 3171-3174. DOI: 10.1557/Jmr.1992.3171 |
0.245 |
|
1991 |
Susnitzky DW, Carter CB. The formation of copper aluminate by solid-state reaction Journal of Materials Research. 6: 1958-1963. DOI: 10.1557/JMR.1991.1958 |
0.244 |
|
1987 |
Cho N, McKernan S, Carter CB, Wagner DK. Interface Defects in GaAs and GaAs-AlxGa1−xAs Grown on Ge Mrs Proceedings. 104. DOI: 10.1557/PROC-104-617 |
0.243 |
|
1984 |
Chen SH, Enquist P, Carter CB. Tin-Doping Induced Defects in GaAs Films Grown by Molecular Beam Epitaxy Mrs Proceedings. 41. DOI: 10.1557/PROC-41-369 |
0.243 |
|
1998 |
Cohen D, Campbell GH, King WE, Carter CB. Quantitative Hrtem of Twin Boundaries in Compound Semiconductors and Metals Using Non-Linear Least-Squares Methods Microscopy and Microanalysis. 4: 784-785. DOI: 10.1017/S1431927600024041 |
0.243 |
|
1999 |
Mao Z, McKeraan S, Carter CB, Yang W, McPherson SA. Weak-Beam Thickness-Fringe Contrast Analysis of Defects in GaN Pyramids Microscopy and Microanalysis. 5: 736-737. DOI: 10.1017/S1431927600017001 |
0.243 |
|
1999 |
Cohen D, Carter CB. Evaluation of the extrinsic and intrinsic stacking-fault energies of GaP Philosophical Magazine. 79: 1805-1815. DOI: 10.1080/01418619908210393 |
0.242 |
|
2007 |
Leschkies KS, Divakar R, Basu J, Enache-Pommer E, Boercker JE, Carter CB, Kortshagen UR, Norris DJ, Aydil ES. Photosensitization of ZnO nanowires with CdSe quantum dots for photovoltaic devices. Nano Letters. 7: 1793-8. PMID 17503867 DOI: 10.1021/Nl070430O |
0.242 |
|
1986 |
Susnitzky D, Carter C. Surface Morphology of Single-Crystal Ceramics Mrs Proceedings. 82. DOI: 10.1557/PROC-82-463 |
0.241 |
|
2005 |
Ling WL, Bartelt NC, McCarty KF, Carter CB. Twin boundaries can be moved by step edges during film growth. Physical Review Letters. 95: 166105. PMID 16241821 DOI: 10.1103/PHYSREVLETT.95.166105 |
0.24 |
|
1994 |
Ramamurthy S, Kotula PG, Carter CB. Growth of Rock-Salt and Spinel Structured Oxides on α-Al 2 O 3 , c-ZrO 2 and MgO Mrs Proceedings. 343: 517. DOI: 10.1557/Proc-343-517 |
0.239 |
|
1992 |
Mallamaci MP, Bentley J, Carter CB. Microanalysis of Calcium-Aluminosilicate Glass Films Grown on α-Al 2 O 3 by Pulsed-Laser Ablation Mrs Proceedings. 285: 433. DOI: 10.1557/Proc-285-433 |
0.238 |
|
1998 |
Mao Z, Johnson MT, Carter CB. Defects in Pseudo-Orthorhombic Anorthite on Basal Sapphire Microscopy and Microanalysis. 4: 592-593. DOI: 10.1017/S1431927600023084 |
0.237 |
|
2021 |
Ruggles TJ, Deitz JI, Allerman AA, Carter CB, Michael JR. Identification of Star Defects in Gallium Nitride with HREBSD and ECCI. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 27: 257-265. PMID 33860742 DOI: 10.1017/S143192762100009X |
0.237 |
|
1980 |
Carter CB, Kohlstedt DL, Sass SL. Electron Diffraction and Microscopy Studies of the Structure of Grain Boundaries in Al2O3 Journal of the American Ceramic Society. 63: 623-627. DOI: 10.1111/J.1151-2916.1980.Tb09848.X |
0.237 |
|
2014 |
Carter CB. Imaging Extended Defects by TEM Microscopy and Microanalysis. 20: 1020-1021. DOI: 10.1017/S1431927614006825 |
0.236 |
|
2020 |
Singh M, Ghosh C, Kotula P, Watt J, Silva H, Carter CB. Direct Observation of Phase Transformations in Ge-Sb-Te Materials Microscopy and Microanalysis. 1-5. DOI: 10.1017/S1431927620018036 |
0.236 |
|
1988 |
Tietz LA, De Cooman BC, Carter CB, Lathrop DK, Russek SE, Buhrman RA. Structure of superconducting thin films of YBa2Cu3O7-x grown on SrTiO3 and cubic zirconia. Journal of Electron Microscopy Technique. 8: 263-72. PMID 3246617 DOI: 10.1002/Jemt.1060080305 |
0.236 |
|
1984 |
Morrissey KJ, Carter CB. Surface Steps on α-Alumina Films Mrs Proceedings. 41. DOI: 10.1557/PROC-41-137 |
0.235 |
|
1995 |
Heffelfinger JR, Bench MW, Carter CB. On the Roughening of Ceramic Surfaces Mrs Proceedings. 399. DOI: 10.1557/PROC-399-263 |
0.235 |
|
1992 |
McKernan S, Sung GY, Carter CB. Flat interfaces in zinc oxide-based varistor ceramics Journal of Materials Research. 7: 474-481. DOI: 10.1557/JMR.1992.0474 |
0.234 |
|
1985 |
Simpson YK, Carter CB, Sklad P, Bentley J. Grain-Boundary, Glassy-Phase Identification and Possible Artifacts Mrs Proceedings. 62. DOI: 10.1557/PROC-62-427 |
0.233 |
|
2020 |
Ghosh C, Singh M, Janish M, Parida S, Dongare AM, Carter CB. HRTEM and EELS Studies on the Structural and Chemical Modification of MoS2 and Graphite During In-situ Reactions with Li and Na Microscopy and Microanalysis. 1-4. DOI: 10.1017/S1431927620021492 |
0.232 |
|
1987 |
Carter C, Cho N, Mckernan S, Wagner D. Characterization of APBs in GaAs Grown on Si and Ge Mrs Proceedings. 91. DOI: 10.1557/PROC-91-181 |
0.231 |
|
1981 |
Carter CB, Foell H, Ast DG, Sass SL. ELECTRON DIFFRACTION AND MICROSCOPY STUDIES OF THE STRUCTURE OF GRAIN BOUNDARIES IN SILICON. Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 43: 441-467. DOI: 10.1080/01418618108239420 |
0.231 |
|
2020 |
Singh M, Ghosh C, Janish M, Parida S, Dongare AM, Carter CB. Structures of Layered Materials After Reaction with Li/Na Microscopy and Microanalysis. 1-3. DOI: 10.1017/S1431927620021303 |
0.23 |
|
2001 |
Fairer JK, Ravishankar N, Michael JR, Carter CB. TEM Analysis of an Alumina Bicrystal Section Using a Fib Microscopy and Microanalysis. 7: 326-327. DOI: 10.1017/S1431927600027707 |
0.229 |
|
2014 |
Correa-Baena JP, Rastegar V, Kotula PG, Agrios AG, Carter CB. Antimony doped tin oxide aerogels for applications in energy conversion and energy storage Microscopy and Microanalysis. 20: 1952-1953. DOI: 10.1017/S1431927614011490 |
0.228 |
|
1996 |
Heffelfinger JR, Bench MW, Johnson MT, Carter CB. AFM as a Tool for Studying Ceramic Surfaces Proceedings, Annual Meeting, Electron Microscopy Society of America. 54: 368-369. DOI: 10.1017/S0424820100164301 |
0.228 |
|
2006 |
Basu J, Divarkar R, Deneen J, Wang X, Jacobs HO, Carter CB. Interfaces of ZnO nanowires grown on semiconducting surfaces Microscopy and Microanalysis. 12: 694-695. DOI: 10.1017/S143192760606613X |
0.227 |
|
1995 |
Kotula PG, Carter CB. Volume expansion and lattice rotations in solid-state reactions between oxides Scripta Metallurgica Et Materialia. 32: 863-866. DOI: 10.1016/0956-716X(95)93215-P |
0.227 |
|
1991 |
Norton MG, McKernan S, Carter CB. A Technique for the Examination of Surface Effects in Aluminum Nitride Ceramics Mrs Proceedings. 225. DOI: 10.1557/PROC-225-349 |
0.227 |
|
1985 |
Simpson YK, Carter CB. The Study of the Formation and Growth of Ni-Al Spinel Using a New, Thin-Film, Specimen Geometry Mrs Proceedings. 60. DOI: 10.1557/PROC-60-265 |
0.226 |
|
1987 |
Simpson YK, Colgan EG, Carter CB. The Kinetics of Ni-Al Spinel Growth Using Rutherford Backscattering Spectroscopy Mrs Proceedings. 94. DOI: 10.1557/PROC-94-299 |
0.226 |
|
2018 |
Tripathi S, Janish M, Dirisaglik F, Cywar A, Zhu Y, Jungjohann K, Silva H, Carter CB. Phase-Change Materials; the Challenges for TEM Microscopy and Microanalysis. 24: 1904-1905. DOI: 10.1017/S1431927618010000 |
0.225 |
|
2014 |
Roller J, Renner J, Yu H, Capuano C, Kwak T, Wang Y, Carter CB, Ayers K, Mustain WE, Maric R. Flame-based processing as a practical approach for manufacturing hydrogen evolution electrodes Journal of Power Sources. 271: 366-376. DOI: 10.1016/J.Jpowsour.2014.08.013 |
0.224 |
|
1998 |
Johnson MT, Carter CB. The Effect of an Electric Field on the Reaction Between Oxides Microscopy and Microanalysis. 4: 594-595. DOI: 10.1017/S1431927600023096 |
0.223 |
|
1991 |
Norton MG, Fleischer EL, Hertl W, Carter CB, Mayer JW, Johnson E. Occurrence of solid noble-gas inclusions in ion-beam-implanted magnesium oxide. Physical Review. B, Condensed Matter. 43: 9291-9294. PMID 9996608 DOI: 10.1103/Physrevb.43.9291 |
0.222 |
|
1999 |
Ravishankar N, Ramamurthy S, Schmalzried H, Carter CB. Wetting of Anorthite Liquid On m-Sapphire Substrates Microscopy and Microanalysis. 5: 812-813. DOI: 10.1017/S1431927600017384 |
0.221 |
|
1980 |
Carter CB, Donald AM, Sass SL. STUDY OF GRAIN BOUNDARY THICKNESS USING ELECTRON DIFFRACTION TECHNIQUES. Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 41: 467-475. DOI: 10.1080/01418618008239326 |
0.22 |
|
1996 |
Medlin DL, Foiles SM, Carter CB. Grain Boundary Dislocation Structure and Motion in an Aluminum Σ=3 [011] Bicrystal Mrs Proceedings. 466. DOI: 10.1557/PROC-466-125 |
0.22 |
|
1983 |
Wendt H, Ostyn KM, Carter CB. Dislocation Dissociation in MgQnAl2O3 Spinels Mrs Proceedings. 24. DOI: 10.1557/PROC-24-87 |
0.219 |
|
1996 |
Zagrebelny AV, Nelson JC, Ramamurthy S, Carter CB. Silicate-Glass/Sapphire Interfaces Probed with Micromechanical Testing Instruments: Sem and Tem Combined Characterization Proceedings, Annual Meeting, Electron Microscopy Society of America. 54: 662-663. DOI: 10.1017/S042482010016577X |
0.218 |
|
1987 |
Cho N, McKernan S, Carter C, Wagner K. Faceted antiphase boundaries in GaAs grown on Ge Proceedings, Annual Meeting, Electron Microscopy Society of America. 45: 314-315. DOI: 10.1017/s042482010012638x |
0.218 |
|
1991 |
Norton MG, Moeckly BH, Carter CB, Buhrman RA. Growth mechanism of YBa2Cu3O7-δ thin films on vicinal MgO Journal of Crystal Growth. 114: 258-263. DOI: 10.1016/0022-0248(91)90700-F |
0.218 |
|
1988 |
Rasmussen D, Simpson YK, Kilaas R, Carter CB. Contrast effects at grooved interfaces Proceedings, Annual Meeting, Electron Microscopy Society of America. 46: 610-611. DOI: 10.1017/s0424820100105114 |
0.217 |
|
1990 |
Susnitzky DW, Carter CB. Structure of Alumina Grain Boundaries Prepared with and without a Thin Amorphous Intergranular Film Journal of the American Ceramic Society. 73: 2485-2493. DOI: 10.1111/J.1151-2916.1990.TB07616.X |
0.215 |
|
1992 |
McKernan S, Norton MG, Carter CB. The 45° grain boundaries in YBa2Cu3O7−δ Journal of Materials Research. 7: 1052-1059. DOI: 10.1557/JMR.1992.1052 |
0.213 |
|
1988 |
Cho N, Carter C. The use of image symmetry in the analysis of high-resolution image of grain boundaries in GaAs Proceedings, Annual Meeting, Electron Microscopy Society of America. 46: 594-595. DOI: 10.1017/s0424820100105035 |
0.212 |
|
1988 |
Simpson YK, Carter CB. The interaction between basal-twin boundaries and a glassy phase in α-Alumina compacts Proceedings, Annual Meeting, Electron Microscopy Society of America. 46: 570-571. DOI: 10.1017/s0424820100104911 |
0.212 |
|
1981 |
Carter CB, Sass SL. ELECTRON DIFFRACTION AND MICROSCOPY TECHNIQUES FOR STUDYING GRAIN-BOUNDARY STRUCTURE. Journal of the American Ceramic Society. 64: 335-345. DOI: 10.1111/J.1151-2916.1981.Tb10299.X |
0.211 |
|
1997 |
Johnson MT, Carter CB. solid-state reactions in the presence of an electric field Microscopy and Microanalysis. 3: 623-624. DOI: 10.1017/S143192760001000X |
0.211 |
|
2016 |
Carter CB, Janish MT, Jungjohann KL, Norton G. Using TEM
Operando
Methods to Understand Energy Storage Microscopy and Microanalysis. 22: 1320-1321. DOI: 10.1017/S1431927616007443 |
0.211 |
|
1988 |
Skrotzki W, Wendt H, Carter CB, Kohlstedt DL. The relation between the structure and mechanical properties of A σ = 51 tilt boundary in germanium Acta Metallurgica. 36: 983-994. DOI: 10.1016/0001-6160(88)90153-8 |
0.21 |
|
1990 |
Norton MG, Yang TA, Kotula P, Rugg KL, McKernan S, Carter CB. Modification and Reactions of Aluminum Nitride Surfaces Mrs Proceedings. 203. DOI: 10.1557/PROC-203-241 |
0.209 |
|
2010 |
Winterstein J, Carter C, Grogger W, Hofer F. Microscopy and Microanalysis of Grain Boundaries in Cerium Oxide Microscopy and Microanalysis. 16: 1416-1417. DOI: 10.1017/S1431927610060150 |
0.209 |
|
1989 |
Norton MG, Tietz LA, Summerfelt SR, Carter CB. Direct Observation by Transmission Electron Microscopy of the Early Stages of Growth of Superconducting Thin Films Mrs Proceedings. 169. DOI: 10.1557/PROC-169-509 |
0.209 |
|
2000 |
Yanina S, Carter C. Moving Steps and Crystal Defects on Spinel Surfaces Mrs Proceedings. 620. DOI: 10.1557/PROC-620-M9.4.1 |
0.209 |
|
1987 |
Cho N, Mckernan S, Carter CB, De Cooman BC, Wagner K. Characterization of Dislocations in GaAs Grown on Si and Ge Mrs Proceedings. 91. DOI: 10.1557/PROC-91-161 |
0.208 |
|
1999 |
Yanina SV, Carter CB. Dewetting of Reactive CaMgSiO4 Glass Films on Single-Crystal MgO(001) Substrate Mrs Proceedings. 586. DOI: 10.1557/PROC-586-87 |
0.208 |
|
1979 |
Carter CB, Donald AM, Sass SL. DIFFRACTION EFFECTS AND IMAGES FROM INCLINED GRAIN BOUNDARIES IN POLYCRYSTALLINE THIN FOILS. Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 39: 533-549. DOI: 10.1080/01418617908239290 |
0.207 |
|
1988 |
Conner JR, Theodore ND, Arney SC, Carter CB, MacDonald NC. Transmission electron microscopy of 1/4-micron SOI structures Proceedings, Annual Meeting, Electron Microscopy Society of America. 46: 922-923. DOI: 10.1017/s0424820100106673 |
0.205 |
|
1991 |
McKernan S, Zhu GJ, Carter CB. Observation of double ribbons in GaAs and AlGaAs Philosophical Magazine Letters. 64: 349-355. DOI: 10.1080/09500839108215115 |
0.204 |
|
2001 |
de La Figuera J, Pohl K, de La Fuente OR, Schmid AK, Bartelt NC, Carter CB, Hwang RQ. Direct observation of misfit dislocation glide on surfaces. Physical Review Letters. 86: 3819-22. PMID 11329332 DOI: 10.1103/Physrevlett.86.3819 |
0.204 |
|
1985 |
Carter CB. Structure of Dislocations and Interfaces in Non-Metallic Crystalline Materials Mrs Proceedings. 60. DOI: 10.1557/PROC-60-199 |
0.203 |
|
1986 |
Simpson YK, Carter CB, Morrissey KJ, Angelini P, Bentley J. The identification of thin amorphous films at grain-boundaries in Al2O3 Journal of Materials Science. 21: 2689-2696. DOI: 10.1007/BF00551474 |
0.203 |
|
1982 |
Hagege S, Carter CB, Cosandey F, Sass SL. VARIATION OF GRAIN BOUNDARY STRUCTURAL WIDTH WITH MISORIENTATION ANGLE AND BOUNDARY PLANE. Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 45: 723-740. DOI: 10.1080/01418618208236201 |
0.203 |
|
1990 |
Mckernan S, Norton MG, Carter CB. Grain Boundaries in High Thermal Conductivity Aluminum Nitride. Mrs Proceedings. 203. DOI: 10.1557/PROC-203-229 |
0.203 |
|
1988 |
Skrotzki W, Wendt H, Carter CB, Kohlstedt DL. Secondary dislocations in [011] tilt boundaries in germanium Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 57: 383-409. DOI: 10.1080/01418618808204676 |
0.203 |
|
1999 |
Cohen D, Carter CB. Statistical Assessment Of Experimental Uncertainty In The Quantitative Analysis Of Strong-Beam A-Fringe Contrast. Microscopy and Microanalysis. 5: 172-173. DOI: 10.1017/S1431927600014185 |
0.202 |
|
1994 |
Bentley J, Horton L, Mchargue C, Mckernan S, Carter C, Revcolevschi A, Tanaka S, Davis R. Compositions and Chemical Bonding in Ceramics by Quantitative Electron Energy-Loss Spectrometry Mrs Proceedings. 332. DOI: 10.1557/PROC-332-385 |
0.202 |
|
1997 |
Medlin DL, Carter CB, Angelo JE, Mills MJ. Climb and glide of a/3〈111〉 dislocations in an aluminium Σ = 3 boundary Philosophical Magazine. 75: 733-747. DOI: 10.1080/01418619708207199 |
0.201 |
|
1996 |
Lilleodden ET, Zagrebelny AV, Ramamurthy S, Carter CB. Probing silicate/sapphire interfaces with AFM and nanoindentation Materials Research Society Symposium - Proceedings. 436. DOI: 10.1557/Proc-436-177 |
0.201 |
|
2003 |
Cohen D, Carter CB. Structure of the (110) antiphase boundary in gallium phosphide. Journal of Microscopy. 208: 84-99. PMID 12423259 DOI: 10.1046/j.1365-2818.2002.01070.x |
0.201 |
|
1992 |
Norton MG, Carter CB. Analysis of moiré patterns in images of thin YBa2Cu3O7-δ films on MgO Proceedings, Annual Meeting, Electron Microscopy Society of America. 50: 236-237. DOI: 10.1017/s0424820100121582 |
0.201 |
|
1989 |
Tietz LA, Summerfelt SR, English GR, Carter CB. Initial Stages in the Growth of Oxide Thin Films by CVD Mrs Proceedings. 168. DOI: 10.1557/PROC-168-113 |
0.2 |
|
2001 |
Ravishankar N, Carter C. Migration of alumina grain boundaries containing a thin glass film Acta Materialia. 49: 1963-1969. DOI: 10.1016/S1359-6454(01)00098-2 |
0.199 |
|
1983 |
Kavanagh K, Chen S, Palmstrom C, Carter C. RBS and TEM Analysis of Ta Silicides on GaAs Mrs Proceedings. 25. DOI: 10.1557/PROC-25-143 |
0.198 |
|
1987 |
Simpson YK, Carter CB. The Early Stages of the Spinel-Alumina Phase Transformation Mrs Proceedings. 94. DOI: 10.1557/PROC-94-45 |
0.198 |
|
1985 |
Susnitzky D, Simpson YK, De Cooman B, Carter C. The Structure of Surface Steps on Low-Index Planes of Oxides. Mrs Proceedings. 60. DOI: 10.1557/PROC-60-219 |
0.198 |
|
2000 |
Cho N-, Carter CB. Structural features of tilt grain boundaries in GaAs thin films Metals and Materials. 6: 181-187. DOI: 10.1007/BF03028210 |
0.198 |
|
1997 |
Zagrebelny AV, Carter CB. Micromechanical Properties of Silicate Glass Films on Sapphire Substrates Mrs Proceedings. 505. DOI: 10.1557/PROC-505-481 |
0.198 |
|
1981 |
Carter CB, Kohlstedt DL. Electron irradiation damage in natural quartz grains Physics and Chemistry of Minerals. 7: 110-116. DOI: 10.1007/Bf00308226 |
0.197 |
|
1991 |
Norton MG, Kotula PG, Li J, Mckernan S, Cracknell KPB, Carter CB, Mayer JW. Growth and Microstructure of Aluminum Nitride Thin Films Mrs Proceedings. 226: 209. DOI: 10.1557/Proc-226-209 |
0.196 |
|
1983 |
Elgat Z, Carter CB. Formation of Microtwins in Low Angle Grain Boundaries in Germanium Mrs Proceedings. 25. DOI: 10.1557/PROC-25-293 |
0.196 |
|
1993 |
Carter CB. Elementary dislocation theory, by Johannes Weertman and Julia R. Weertman, 1992. Oxford University Press, $16.95 Microscopy Research and Technique. 25: 187-187. DOI: 10.1002/Jemt.1070250217 |
0.195 |
|
1987 |
Chen SH, Carter CB, Enquist P. Transmission electron microscopy study of defects in Sn-doped GaAs films grown by molecular beam epitaxy Applied Physics a Solids and Surfaces. 44: 143-151. DOI: 10.1007/BF00626415 |
0.193 |
|
1991 |
Moeck1y BH, Lathrop DK, Russek SE, Buhrman RA, Norton MG, Carter CB. Growth And Properties of YBa2Cu3O7 Thin Films On Non-Lattice-Matched And Polycrystalline Substrates Ieee Transactions On Magnetics. 27: 1017-1020. DOI: 10.1109/20.133965 |
0.192 |
|
2015 |
Arellano-Jimenez MJ, Janish M, Kotula P, Rodriguez W, Carter CB. Microtomy on Heat-Treated Electro-Spun TiO 2 Fibers Microscopy and Microanalysis. 21: 317-318. DOI: 10.1017/S143192761500238X |
0.191 |
|
1983 |
Morrissey KJ, Carter CB. Faceted grain boundaries in Al2O3 Proceedings, Annual Meeting, Electron Microscopy Society of America. 41: 48-49. DOI: 10.1017/s0424820100074161 |
0.191 |
|
1990 |
Norton MG, Carter CB. Effect of Substrate on the Early Stages of the Growth of YBa2Cu3O7-δ Thin-Films Mrs Proceedings. 191. DOI: 10.1557/PROC-191-165 |
0.191 |
|
1992 |
Carter CB, McKernan S. High-resolution imaging of ceramics Proceedings, Annual Meeting, Electron Microscopy Society of America. 50: 112-113. DOI: 10.1017/s0424820100120965 |
0.189 |
|
1992 |
Palmstrøm CJ, Zhu JG, Wilkens BJ, Cheeks TL, Carter CB, Martin R, Gilchrist HL. Effect of orientation on the Schottky barrier height of thermodynamically stable epitaxial metal/GaAs structures Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 10: 1946-1953. DOI: 10.1116/1.578120 |
0.187 |
|
1997 |
Bench MW, Kotula PG, Carter C. Influence of the nature of the (0001) alumina surface on thin film growth Surface Science. 391: 183-195. DOI: 10.1016/S0039-6028(97)00481-0 |
0.187 |
|
1981 |
Carter C. The Structure of Dislocations in Low-Angle Grain Boundaries in the Diamond Cubic Lattice Mrs Proceedings. 5. DOI: 10.1557/PROC-5-33 |
0.186 |
|
2018 |
Tripathi S, Janish MT, Mook WM, Jungjohann KL, Dongare A, Carter CB. Observing the Lithiation of M0S2 Microscopy and Microanalysis. 24: 1858-1859. DOI: 10.1017/S1431927618009777 |
0.186 |
|
1983 |
Carter CB. The Structure of Grain Boundaries and Phase Boundaries in Ceramics Mrs Proceedings. 31. DOI: 10.1557/PROC-31-267 |
0.185 |
|
1990 |
Moeckly BH, Russek SE, Lathrop DK, Buhrman RA, Norton MG, Carter CB. Growth and properties of YBa2Cu3O7 thin films on vicinal and polycrystalline MgO substrates Applied Physics Letters. 57: 2951-2953. DOI: 10.1063/1.104208 |
0.181 |
|
1999 |
Carter CB, Medlin DL, Cohen D, Campbell G. Stacking-Fault Fringes Microscopy and Microanalysis. 5: 694-695. DOI: 10.1017/S1431927600016792 |
0.181 |
|
1989 |
Sung GY, McKernan S, Carter CB. Grain boundaries in zinc oxide-based varistor ceramics Proceedings, Annual Meeting, Electron Microscopy Society of America. 47: 598-599. DOI: 10.1017/s0424820100154962 |
0.181 |
|
1985 |
Chen SH, Elgat Z, Barbour JC, Zheng LR, Mayer JW, Carter CB. High-resolution electron microscopy studies of Ni silicides formed in lateral diffusion couples Ultramicroscopy. 18: 297-303. DOI: 10.1016/0304-3991(85)90147-0 |
0.18 |
|
1996 |
Johnson MT, Schmalzried HB, Carter CB. Heterogeneous solid-state reactions between MgO(00l) and iron oxide Proceedings, Annual Meeting, Electron Microscopy Society of America. 54: 642-643. DOI: 10.1017/s0424820100165677 |
0.18 |
|
1985 |
Chen SH, Carter CB, Palmstrøm CJ, Ohashi T. Lateral Reactions of Gaas with Ni Studied by Transmission Electron Microscopy Mrs Proceedings. 54. DOI: 10.1557/PROC-54-361 |
0.179 |
|
1978 |
Cosandey F, Komem Y, Bauer CL, Carter CB. Lattice imaging of low-angle [001] tilt boundaries in bicrystalline films of gold Scripta Metallurgica. 12: 577-582. DOI: 10.1016/0036-9748(78)90212-0 |
0.178 |
|
1989 |
Theodore N, Mei P, Schwarz S, Carter C, Palmstrom C, Harbison J, Florez L. Behavior of Dopant-Related Defects in AlGaAs Superlattices Mrs Proceedings. 163. DOI: 10.1557/PROC-163-709 |
0.177 |
|
2021 |
Singh MK, Ghosh C, Miller B, Carter CB. Direct Visualization of the Earliest Stages of Crystallization. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-7. PMID 33973507 DOI: 10.1017/S1431927621000441 |
0.177 |
|
1986 |
Chen SH, Carter CB, Palmstrom CJ, Ohashi T. Transmission electron microscopy studies on lateral reaction of GaAs with Ni Applied Physics Letters Applied Physics Letters. 48: 803-805. DOI: 10.1063/1.96675 |
0.177 |
|
1994 |
Bench MW, Carter C. Pulsed-laser deposition growth of copper oxide on α-Al2O3 and MgO Proceedings, Annual Meeting, Electron Microscopy Society of America. 52: 528-529. DOI: 10.1017/s0424820100170372 |
0.175 |
|
2006 |
Anderson C, Blackwell C, Deneen J, Carter CB, Kakalios J, Kortshagen U. Dual-chamber plasma co-deposition of nanoparticles in amorphous silicon thin films Mrs Proceedings. 910: 79-84. DOI: 10.1557/Proc-0910-A04-02 |
0.174 |
|
2020 |
Singh MK, Ghosh C, Miller B, Kotula PG, Tripathi S, Watt J, Bakan G, Silva H, Carter CB. In situ TEM study of crystallization and chemical changes in an oxidized uncapped Ge2Sb2Te5 film Journal of Applied Physics. 128: 124505. DOI: 10.1063/5.0023761 |
0.174 |
|
1991 |
Rasmussen DR, Carter CB. Interpretation of HRTEM images of interfaces containing misfit dislocations lying parallel to the surface of the sample Philosophical Magazine A. 63: 503-517. DOI: 10.1080/01418619108213895 |
0.173 |
|
2007 |
Carter CB, Rawlings RD. Professor Cyril A Hogarth Journal of Materials Science. 42: 2537-2537. DOI: 10.1007/S10853-006-1471-Z |
0.173 |
|
2014 |
Zhang H, Suresh A, Carter CB, Wilhite BA. Materials synthesis, electrochemical characterization and oxygen permeation properties of Fe-doped BaZrO3 Solid State Ionics. 266: 58-67. DOI: 10.1016/J.Ssi.2014.08.011 |
0.172 |
|
1982 |
Carter C, Desimone D, Griem H, Wood C. Analysis of Defects in Heavily-Doped MBE-GaAs Mrs Proceedings. 14. DOI: 10.1557/PROC-14-271 |
0.172 |
|
1987 |
Chen SH, Carter CB, Elgat Z, Zheng LR, Mayer JW. The structure of Ni5Si2 formed in Ni‐Si thin‐film lateral diffusion couples Journal of Applied Physics. 62: 1189-1194. DOI: 10.1063/1.339830 |
0.171 |
|
1988 |
Mckernan S, De Cooman BC, Carter CB, Bour DP, Shealy JR. Direct observation of ordering in (galn) p Journal of Materials Research. 3: 406-409. DOI: 10.1557/Jmr.1988.0406 |
0.171 |
|
1998 |
Mallamaci M, Bentley J, Carter C. In-Situ TEM Crystallization of Silicate-Glass Films on Al2O3 Acta Materialia. 46: 283-303. DOI: 10.1016/S1359-6454(97)00191-2 |
0.17 |
|
1988 |
Theodore ND, Carter CB, Mei P, Schwarz SA, Harbison JP, Venkatesan T. Defects Related to Mixing Behavior of Highly Silicon-Doped GaAs/AlAs Superlatitices Mrs Proceedings. 144. DOI: 10.1557/PROC-144-139 |
0.17 |
|
2006 |
MORRISSEY KJ, CARTER CB. Faceted Grain Boundaries in Al2O3 Journal of the American Ceramic Society. 67: 292-301. DOI: 10.1111/J.1151-2916.1984.TB18851.X |
0.17 |
|
1983 |
Morrissey KJ, Carter CB. Special Grain Boundaries in Alumina Mrs Proceedings. 24. DOI: 10.1557/PROC-24-121 |
0.169 |
|
2018 |
Carter CB. The new Editors Journal of Materials Science. 53: 847-850. DOI: 10.1007/S10853-017-1656-7 |
0.169 |
|
2006 |
Ding Y, Dong Y, Bapat A, Nowak JD, Carter CB, Kortshagen UR, Campbell SA. Single nanoparticle semiconductor devices Ieee Transactions On Electron Devices. 53: 2525-2531. DOI: 10.1109/Ted.2006.882047 |
0.167 |
|
1988 |
Rasmussen D, Cho N, Carter C. Determination of the lattice translation across {110} APBs in GaAs Proceedings, Annual Meeting, Electron Microscopy Society of America. 46: 600-601. DOI: 10.1017/s0424820100105060 |
0.167 |
|
1988 |
Chen SH, Carter CB, PalmstrΦm CJ. Lateral diffusion in Ni–GaAs couples investigated by transmission electron microscopy Journal of Materials Research. 3: 1385-1396. DOI: 10.1557/JMR.1988.1385 |
0.165 |
|
1986 |
Cooman BCD, Conner JR, Summerfelt SR, McKernan S, Carter CB, Shealy JR. Imaging of III-V Compound Superlattices by Hrem and Rem Mrs Proceedings. 77. DOI: 10.1557/Proc-77-187 |
0.165 |
|
1985 |
Elgat Z, Carter C. Analysis of grain boundaries by HREM Ultramicroscopy. 18: 313-321. DOI: 10.1016/0304-3991(85)90149-4 |
0.163 |
|
2007 |
Deneen Nowak J, Mook WM, Minor AM, Gerberich WW, Carter CB. Fracturing a nanoparticle Philosophical Magazine. 87: 29-37. DOI: 10.1080/14786430600876585 |
0.163 |
|
2006 |
Blackwell C, Anderson C, Deneen J, Carter CB, Kortshagen U, Kakalios J. The influence of thermophoresis effects during deposition of hydrogenated amorphous silicon thin films with nanocrystalline silicon inclusions Mrs Proceedings. 910: 181-186. DOI: 10.1557/Proc-0910-A07-07 |
0.162 |
|
2001 |
Cho N, Carter CB. Structural Features of Σ=3 and 9, [110] GaAs Tilt Grain Boundaries Japanese Journal of Applied Physics. 40: 4458-4465. DOI: 10.1143/JJAP.40.4458 |
0.162 |
|
1993 |
Bench M, Miller T, Nathan M, Carter C. Characterization of Al/GaAs Schottky barriers with thin Si interfacial layers Proceedings, Annual Meeting, Electron Microscopy Society of America. 51: 800-801. DOI: 10.1017/s0424820100149830 |
0.16 |
|
1986 |
Susnitzky DW, Carter CB. Identification of alpha-Alumina Surface Structures by Electron Diffraction Journal of the American Ceramic Society. 69: C-217-C-220. DOI: 10.1111/J.1151-2916.1986.TB07484.X |
0.16 |
|
1988 |
CHO N, McKERNAN S, WAGNER DK, CARTER CB. GRAIN BOUNDARIES AND ANTIPHASE BOUNDARIES IN GaAs Le Journal De Physique Colloques. 49: C5-245-C5-250. DOI: 10.1051/JPHYSCOL:1988527 |
0.16 |
|
1991 |
Norton M, Hellman E, Hartford E, Carter C. Early stages of growth of epitactic barium bismuth oxide films on single-crystal MgO Journal of Crystal Growth. 113: 716-721. DOI: 10.1016/0022-0248(91)90108-H |
0.159 |
|
1988 |
Theodore ND, Carter CB, Arney SC, MacDonald NC. Behavior of Defects Related to Interface-Stresses in Model Submicron Soi Structures Mrs Proceedings. 130. DOI: 10.1557/Proc-130-377 |
0.159 |
|
1994 |
Anderson IM, Carter CB, Bentley J. Microstructure and chemistry of MgO- and CoO-doped nickel-titanate spinels Proceedings, Annual Meeting, Electron Microscopy Society of America. 52: 1002-1003. DOI: 10.1017/S0424820100172747 |
0.157 |
|
1989 |
McArdle JL, Messing GL, Tietz LA, Carter CB. Solid-Phase Epitaxy of Boehmite-Derived alpha-Alumina on Hematite Seed Crystals Journal of the American Ceramic Society. 72: 864-867. DOI: 10.1111/J.1151-2916.1989.Tb06235.X |
0.157 |
|
1987 |
Tietz LA, Carter CB, Lathrop DK, Russek SE, Buhrman RA. Grain Boundaries in YBa2Cu3O7−x Mrs Proceedings. 99. DOI: 10.1557/Proc-99-715 |
0.156 |
|
2013 |
Janish M, Huang F, Zhang L, Rastegar V, Martin N, Chan J, McKenzie B, Michael J, Cornelius C, Carter C. Characterization of Novel Ceramic Composite Nanofibers by Electron Microscopy Microscopy and Microanalysis. 19: 1894-1895. DOI: 10.1017/S143192761301146X |
0.156 |
|
1989 |
de Cooman BC, Carter CB. High-Resolution Microscopy of Dissociated Screw Dislocations in GaAs Physica Status Solidi (a). 112: 473-492. DOI: 10.1002/PSSA.2211120204 |
0.156 |
|
1982 |
Shaw T, Carter C. Faceting of twin boundaries in spinel Scripta Metallurgica. 16: 1431-1436. DOI: 10.1016/0036-9748(82)90441-0 |
0.156 |
|
2010 |
Basu J, Garg A, Carter C. Structure and Chemistry of La Doped BiFeO3 Multiferroic Thin Film Microscopy and Microanalysis. 16: 1234-1235. DOI: 10.1017/S1431927610060654 |
0.156 |
|
1985 |
Kuesters KH, de Cooman BC, Shealy JR, Carter CB. TEM observations of compositional variations in AlxGa1-xAs grown by OMVPE Journal of Crystal Growth. 71: 514-518. DOI: 10.1016/0022-0248(85)90357-4 |
0.155 |
|
1992 |
Norton MG, Cracknell KPB, Carter CB. Pulsed‐Laser Deposition of Barium Titanate Thin Films Journal of the American Ceramic Society. 75: 1999-2002. DOI: 10.1111/j.1151-2916.1992.tb07234.x |
0.155 |
|
1994 |
Kotula PG, Carter CB, Norton MG. Surface morphology of pulsed-laser deposited aluminium nitride thin films Journal of Materials Science Letters. 13: 1275-1277. DOI: 10.1007/BF00270959 |
0.155 |
|
1984 |
Chen SH, Zheng LR, Barbour JC, Zingu EC, Hung LS, Carter CB, Mayer JW. Lateral-diffusion couples studied by transmission electron microscopy Materials Letters. 2: 469-476. DOI: 10.1016/0167-577X(84)90075-2 |
0.154 |
|
1985 |
De Cooman BC, Kuesters K, Carter CB. The Core Structure of Dislocations in GaAs Mrs Proceedings. 62. DOI: 10.1557/PROC-62-37 |
0.154 |
|
1988 |
Carter C. gS = 99 and Σ = 41 Grain boundaries Acta Metallurgica. 36: 2753-2760. DOI: 10.1016/0001-6160(88)90121-6 |
0.154 |
|
1983 |
Ostyn K, Carter C. Dislocation dissociation in low-angle spinel boundaries Proceedings, Annual Meeting, Electron Microscopy Society of America. 41: 50-51. DOI: 10.1017/s0424820100074173 |
0.154 |
|
2010 |
Winterstein J, Sezen M, Rečnik A, Carter C. Microscopy of the Spinel-Forming Reaction with Nanoparticles Microscopy and Microanalysis. 16: 1486-1487. DOI: 10.1017/S143192761005960X |
0.153 |
|
1987 |
Carter CB, Elgat Z, Shaw TM. Lateral twin boundaries in spinel Philosophical Magazine A. 55: 21-38. DOI: 10.1080/01418618708209798 |
0.153 |
|
1992 |
Norton MG, Hellman E, Hartford E, Carter C. Observations on the growth of barium bismuth oxide thin films Proceedings, Annual Meeting, Electron Microscopy Society of America. 50: 76-77. DOI: 10.1017/s0424820100120783 |
0.152 |
|
2000 |
Li M, Carter C, Hillmyer M, Gerberich W. Characterizing Interfacial Fracture Toughness Using AFM Microscopy and Microanalysis. 6: 722-723. DOI: 10.1017/s1431927600036102 |
0.151 |
|
1990 |
Mckernan S, Norton MG, Carter CB. High-Resolution Electron Microscopy of Planar Defects in Ain. Mrs Proceedings. 183. DOI: 10.1557/PROC-183-267 |
0.151 |
|
1987 |
Carter CB, Elgat Z, Shaw TM. Twin boundaries parallel to the common-{111} plane in spinel Philosophical Magazine A. 55: 1-19. DOI: 10.1080/01418618708209797 |
0.151 |
|
1983 |
Morrissey KJ, Elgat Z, Kouh Y, Carter CB. High Resolution Tem Studies of β-Alumina Type Structures Mrs Proceedings. 31. DOI: 10.1557/PROC-31-331 |
0.15 |
|
2005 |
Farrer J, Johnson M, Bentley J, Carter C. Epitactic formation of forsterite on MgO single crystals during vacuum annealing Surface Science. 587: 205-218. DOI: 10.1016/J.SUSC.2005.05.020 |
0.15 |
|
1988 |
Skrotzki W, Wendt H, Carter C, Kohlstedt D. Structure and mechanical properties of a Σ= 51 [011] tilt boundary in germanium Revue De Physique AppliquéE. 23: 681-681. DOI: 10.1051/RPHYSAP:01988002304068100 |
0.149 |
|
1985 |
Cho N, De Cooman BC, Carter CB, Fletcher R, Wagner DK. Antiphase boundaries in GaAs Applied Physics Letters. 47: 879-881. DOI: 10.1063/1.95963 |
0.149 |
|
2006 |
Divakar R, Basu J, Carter C. Growth of ZnO Nanorods: A TEM Study Microscopy and Microanalysis. 12: 698-699. DOI: 10.1017/S1431927606065688 |
0.149 |
|
1989 |
McKernan S, Carter CB. Planar defects in AIN Proceedings, Annual Meeting, Electron Microscopy Society of America. 47: 432-433. DOI: 10.1017/s0424820100154135 |
0.149 |
|
1999 |
Gai P, Boyes E, Carter C, Marks L, Pennycook S. Archie Howie Symposium : Celebrations in Pioneering Electron Microscopy Microscopy and Microanalysis. 5: 658-659. DOI: 10.1017/s1431927600016615 |
0.149 |
|
1996 |
Carter CB, Medlin DL, Angelo JE, Mills MJ. The 112 Lateral Twin Boundary in FCC Materials Materials Science Forum. 209-212. DOI: 10.4028/Www.Scientific.Net/Msf.207-209.209 |
0.148 |
|
1991 |
Summerfelt SR, Carter CB. Interaction Between Dislocations and NiFe2O4 Precipitates In A NiO Matrix Mrs Proceedings. 230. DOI: 10.1557/PROC-230-351 |
0.147 |
|
1993 |
Norton M, Hellman E, Hartford E, Carter C. Compositionally modulated nucleation and growth of barium bismuth oxide thin films on MgO Physica C: Superconductivity. 205: 347-353. DOI: 10.1016/0921-4534(93)90401-B |
0.147 |
|
1988 |
Susnitzky D, Carter C, Hertl W. The ZrO2 (+Y2O3) - Yvo4 Interface: Destabilization of Cubic ZrO2 (+Y2O3) in the Presence of V2O5 Mrs Proceedings. 122. DOI: 10.1557/PROC-122-491 |
0.146 |
|
1992 |
Summerfelt SR, Carter CB. Direct observation of nucleation embryos during NiFe2O4 precipitation in NiO Journal of Materials Research. 7: 1271-1277. DOI: 10.1557/JMR.1992.1271 |
0.146 |
|
2006 |
Deneen J, Carter C. Characterization of Defects in Nanoparticles Microscopy and Microanalysis. 12: 594-595. DOI: 10.1017/S1431927606065731 |
0.146 |
|
1991 |
Norton MG, Fleischer EL, Hertl W, Carter CB, Mayer JW. Transmission-electron microscopy study of ion-beam implanted single-crystal ceramics Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 59: 1215-1218. DOI: 10.1016/0168-583X(91)95796-G |
0.142 |
|
1995 |
Heffelfinger JR, Kieschke RR, Carter CB. Interfacial Reactions in Metal-Matrix Composites Mrs Proceedings. 398. DOI: 10.1557/PROC-398-251 |
0.141 |
|
2006 |
Basu J, Ramachandran D, Kumar S, Carter C. Inversion Domain Boundaries in Wurtzite GaN Microscopy and Microanalysis. 12: 1084-1085. DOI: 10.1017/S1431927606065925 |
0.141 |
|
2006 |
Ling WL, Hamilton JC, Thürmer K, Thayer GE, de la Figuera J, Hwang RQ, Carter CB, Bartelt NC, McCarty KF. Herringbone and triangular patterns of dislocations in Ag, Au, and AgAu alloy films on Ru(0 0 0 1) Surface Science. 600: 1735-1757. DOI: 10.1016/j.susc.2006.01.055 |
0.14 |
|
2003 |
Gilliss SR, Ravishankar N, Farrer JK, Carter CB. Boundary Migration in Rutile Microscopy and Microanalysis. 9: 676-677. DOI: 10.1017/s1431927603443389 |
0.14 |
|
1984 |
De Cooman BC, Kuesters K, Carter CB, Hsu T, Wicks G. Reflection electron microscopy of epilayers grown by molecular beam epitaxy Philosophical Magazine A. 50: 849-856. DOI: 10.1080/01418618408237542 |
0.14 |
|
1985 |
Carter CB, Cooman BCD, Cho NH, Fletcher RM, Wagner DK, Ballantyne J. DEFECTS IN GaAs GROWN ON Ge SUBSTRATES Mrs Proceedings. 56: 73. DOI: 10.1557/Proc-56-73 |
0.139 |
|
1984 |
Czanderna KK, Morrissey KJ, Carter CB, Merrill RP. High-resolution TEM observations of γ-Al2O3 in transition alumina films Journal of Catalysis. 89: 182-184. DOI: 10.1016/0021-9517(84)90295-1 |
0.139 |
|
1989 |
De Cooman BC, Carter CB, Kam Toi C, Shealy JR. The characterization of misfit dislocations at {100} heterojunctions in III-V compound semiconductors Acta Metallurgica. 37: 2779-2793. DOI: 10.1016/0001-6160(89)90312-X |
0.138 |
|
1994 |
Carter CB. The Measurement of Grain Boundary Geometry. By V. Randle Journal of Microscopy. 174: 59-59. DOI: 10.1111/J.1365-2818.1994.TB04326.X |
0.138 |
|
2004 |
Thürmer K, Carter CB, Bartelt NC, Hwang RQ. Self-assembly via adsorbate-driven dislocation reactions. Physical Review Letters. 92: 106101. PMID 15089218 DOI: 10.1103/PHYSREVLETT.92.106101 |
0.138 |
|
1989 |
Carter CB, Zhu JG, Palmstrøm CJ. Metal/GaAs interfaces Proceedings, Annual Meeting, Electron Microscopy Society of America. 47: 446-447. DOI: 10.1017/s0424820100154202 |
0.137 |
|
1995 |
Zhu JG, Palmstrøm CJ, Carter CB. Misfit dislocations at ErAs/GaAs heterojunctions Acta Metallurgica Et Materialia. 43: 4171-4177. DOI: 10.1016/0956-7151(95)00109-9 |
0.136 |
|
1990 |
Alford TL, Theodore ND, Fleischer EL, Mayer JW, Carter CB, Bo/rgesen P, Ullrich BM, Cheung NW, Wong H. Observation of multiple precipitate layers in MeV Au++‐implanted silicon Applied Physics Letters. 56: 1796-1798. DOI: 10.1063/1.103103 |
0.135 |
|
1983 |
Skrotzki W, Wendt H, Carter CB, Kohlstedt DL. Structure and Dissociation of 15° l110g Tilt Boundaries in Germanium Mrs Proceedings. 25. DOI: 10.1557/Proc-25-299 |
0.135 |
|
1991 |
Norton M, Carter C. The nucleation and heteroepitactic growth of YBa2Cu3O7 − δ thin films on MgO Journal of Crystal Growth. 110: 641-651. DOI: 10.1016/0022-0248(91)90303-M |
0.135 |
|
2021 |
Ghosh C, Singh MK, Parida S, Janish MT, Dobley A, Dongare AM, Carter CB. Phase evolution and structural modulation during in situ lithiation of MoS, WS and graphite in TEM. Scientific Reports. 11: 9014. PMID 33907244 DOI: 10.1038/s41598-021-88395-1 |
0.135 |
|
1988 |
CARTER CB, COLGAN EG, McKERNAN S, SIMPSON YK, SUMMERFELT SR, SUSNITZKY DW, TIETZ LA. HETERO- AND HOMO-PHASE BOUNDARIES IN CERAMIC OXIDES Le Journal De Physique Colloques. 49: C5-239-C5-244. DOI: 10.1051/JPHYSCOL:1988526 |
0.133 |
|
2000 |
Gai P, Boyes E, Carter C, Cockayne D, Marks L, Pennycook S. Celebrations in Pioneering Electron Microscopy: A Symposium in Honor of
Professor Archie Howie—Introduction Microscopy and Microanalysis. 6: 281-284. DOI: 10.1007/s100050010039 |
0.133 |
|
1989 |
Smith DA, Elgat Z, Krakow W, Levi A, Carter C. Multiple structures in a Σ = 27 related boundary in germanium Ultramicroscopy. 30: 8-12. DOI: 10.1016/0304-3991(89)90166-6 |
0.133 |
|
2008 |
Pi XD, Liptak RW, Deneen Nowak J, Wells NP, Carter CB, Campbell SA, Kortshagen U. Air-stable full-visible-spectrum emission from silicon nanocrystals synthesized by an all-gas-phase plasma approach. Nanotechnology. 19: 245603. PMID 21825815 DOI: 10.1088/0957-4484/19/24/245603 |
0.132 |
|
2009 |
Williams DB, Carter CB. Transmission electron microscopy: A textbook for materials science Transmission Electron Microscopy: a Textbook For Materials Science. 1-760. DOI: 10.1007/978-0-387-76501-3 |
0.13 |
|
2009 |
Altay A, Carter CB, Arslan I, Gulgun MA. Crystallization of CaAl4O7 and CaAl 12O19 powders Philosophical Magazine. 89: 605-621. DOI: 10.1080/14786430902720986 |
0.13 |
|
2007 |
Nowak JD, Song S, Campbell S, Carter C. Characterization of Ytterbium Silicide Thin Films Microscopy and Microanalysis. 13. DOI: 10.1017/S143192760707777X |
0.13 |
|
1984 |
Skrotski W, Wendt H, Carter CB, Kohlstedt DL. Structural Changes of a σ = 51 Tilt Boundary in Germanium During High Temperature Creep Mrs Proceedings. 41: 261. DOI: 10.1557/Proc-41-261 |
0.129 |
|
1987 |
De Cooman B, McKeman S, Carter C. Stacking-fault tetrahedra in ion-implanted III-V compounds Proceedings, Annual Meeting, Electron Microscopy Society of America. 45: 316-317. DOI: 10.1017/s0424820100126391 |
0.129 |
|
1992 |
Summerfelt S, Carter C. Morphology of NiFe2O4 precipitation in NiO Acta Metallurgica Et Materialia. 40: 1051-1067. DOI: 10.1016/0956-7151(92)90083-Q |
0.128 |
|
1995 |
Norton MG, Carter CB. Moir� patterns and their application to the study of the growth of YBa2Cu3O7-? thin films Journal of Materials Science. 30: 381-389. DOI: 10.1007/BF00354400 |
0.128 |
|
1984 |
De Cooman BC, Carter CB, Wicks GW, Tanoue T. Tem Study of GaSb/InAs Strained Layer Supeplattices Mrs Proceedings. 37. DOI: 10.1557/PROC-37-239 |
0.128 |
|
1990 |
Rasmussen D, Carter C. On the Fresnel-fringe technique for the analysis of interfacial films Ultramicroscopy. 32: 337-348. DOI: 10.1016/0304-3991(90)90080-6 |
0.127 |
|
1989 |
Carter C, Mckernan S, Rasmussen D, Simpson Y, Summerfelt S, Susnitzky D, Tietz L. High-Resolution Microscopy of Ceramics Mrs Proceedings. 139. DOI: 10.1557/PROC-139-189 |
0.127 |
|
2003 |
Figuera Jdl, Schmid AK, Pohl K, Bartelt NC, Carter CB, Hwang RQ. Glide and Climb of Dislocations in Ultra-Thin Metal Films Materials Science Forum. 3421-3426. DOI: 10.4028/Www.Scientific.Net/Msf.426-432.3421 |
0.127 |
|
1989 |
Summerfelt SR, Carter C. The movement of the spinel-NiO interface in thin films Ultramicroscopy. 30: 150-156. DOI: 10.1016/0304-3991(89)90182-4 |
0.125 |
|
1989 |
Rasmussen D, Cho N, Susnitzky DW, Carter C. Determination of the lattice translation across antiphase boundaries Ultramicroscopy. 30: 27-32. DOI: 10.1016/0304-3991(89)90169-1 |
0.125 |
|
1989 |
McKernan S, Rasmussen DR, Carter CB. High-Resolution Electron Microscopy of Hematite Formed by External Oxidation of Iron-Bearing Olivine Mrs Proceedings. 139. DOI: 10.1557/PROC-139-309 |
0.125 |
|
2002 |
Korte C, Hesse D, Schmalzried H, Carter CB. Microscopic Investigations on Electric Field Driven Phase Boundaries in the System MgO / MgIn2O4 /In2O3 Zeitschrift FüR Anorganische Und Allgemeine Chemie. 628: 2153-2153. DOI: 10.1002/1521-3749(200209)628:9/10<2153::AID-ZAAC2153>3.0.CO;2-6 |
0.125 |
|
1992 |
Tietz LA, Summerfelt SR, Carter CB. The effect of substrate orientation on the chemical vapour deposition growth of αfe2o3on α-al2o3 Philosophical Magazine A. 65: 439-460. DOI: 10.1080/01418619208201532 |
0.125 |
|
1997 |
Johnson MT, Heffelfinger JR, Kotula PG, CARTER CB. Microscopy of interfaces in model oxide composites Journal of Microscopy. 185: 225-232. DOI: 10.1046/j.1365-2818.1997.1650726.x |
0.124 |
|
1994 |
Carter C, Rasmussen Y. Growth of spinel particles on alumina thin films—II. Morphology and crystallography of the interface Acta Metallurgica Et Materialia. 42: 2741-2752. DOI: 10.1016/0956-7151(94)90215-1 |
0.122 |
|
1997 |
Heffelfinger J, Bench M, Carter C. Steps and the structure of the (0001) α-alumina surface Surface Science. 370: L168-L172. DOI: 10.1016/S0039-6028(96)01123-5 |
0.122 |
|
2008 |
Basu J, Divakar R, Ravishankar N, Carter CB. Complementary microscopy techniques for characterizing nanostructures Microscopy and Microanalysis. 14: 374-375. DOI: 10.1017/S1431927608086753 |
0.122 |
|
1992 |
Tietz LA, Carter CB. Imaging and Diffraction Study of Continuous alpha-Fe2O3 Films on (0001)Al2O3 Journal of the American Ceramic Society. 75: 1097-1102. DOI: 10.1111/J.1151-2916.1992.TB05544.X |
0.121 |
|
2001 |
Cho N, Carter CB. Journal of Materials Science. 36: 4209-4222. DOI: 10.1023/A:1017981324721 |
0.12 |
|
2001 |
Cho N, Carter CB. Journal of Materials Science. 36: 4511-4518. DOI: 10.1023/A:1017943105582 |
0.12 |
|
1980 |
Carter CB. Observations on the climb of extended dislocations due to irradiation in the HVEM Philosophical Magazine A. 42: 31-46. DOI: 10.1080/01418618008239354 |
0.12 |
|
2006 |
Deneen J, Cernetti P, Gresback R, Kortshagen U, Carter C. TEM Study of the Morphology of Nanoparticles Microscopy and Microanalysis. 12: 612-613. DOI: 10.1017/S1431927606069443 |
0.12 |
|
1984 |
DeCooman B, Carter C. Electron interferometry from voids in spinel Ultramicroscopy. 13: 233-239. DOI: 10.1016/0304-3991(84)90202-X |
0.119 |
|
1987 |
Simpson YK, Colgan EG, Carter CB. Kinetics of the Growth of Spinel on Alumina Using Rutherford Backscattering Spectroscopy Journal of the American Ceramic Society. 70: C-149-C-151. DOI: 10.1111/J.1151-2916.1987.TB05691.X |
0.116 |
|
1998 |
Medlin D, Campbell G, Carter C. Stacking defects in the 9R phase at an incoherent twin boundary in copper Acta Materialia. 46: 5135-5142. DOI: 10.1016/S1359-6454(98)00164-5 |
0.116 |
|
1984 |
Carter CB. Electron diffraction from microtwins and long-period polytypes Philosophical Magazine A. 50: 133-141. DOI: 10.1080/01418618408244217 |
0.116 |
|
1988 |
Cho N, Rasmussen D, Mckernan S, Carter C, Wagner D. The Study of Interfaces in Gaas Mrs Proceedings. 122. DOI: 10.1557/PROC-122-33 |
0.116 |
|
1988 |
Susnitzky D, Summerfelt S, Carter C. Thin-film NiOAl2O3 reaction couples prepared by CVD Scripta Metallurgica. 22: 1149-1154. DOI: 10.1016/S0036-9748(88)80121-2 |
0.114 |
|
1989 |
Mckernan S, Carter CB. On the Structure of Planar Defects in ALN Mrs Proceedings. 167. DOI: 10.1557/PROC-167-259 |
0.114 |
|
1986 |
Cooman BCD, Carter C. Partial Dislocation Mobility in GaAS Mrs Proceedings. 82. DOI: 10.1557/PROC-82-253 |
0.114 |
|
1989 |
Theodore ND, De Cooman BC, Carter CB. Extrinsic Dissociation of a Dislocation in GaAs in the Presence of Point Defects Physica Status Solidi (a). 114: 105-111. DOI: 10.1002/PSSA.2211140107 |
0.113 |
|
2003 |
de la Figuera J, Carter C, Bartelt N, Hwang R. Interplay between gas adsorption and dislocation structure on a metal surface Surface Science. 531: 29-38. DOI: 10.1016/S0039-6028(03)00401-1 |
0.112 |
|
1989 |
Czanderna KK, Morrissey KJ, Palmstrøm CJ, Carter CB, Merrill RP. Growth of γ-alumina on crystallographically distinct aluminium substrates Journal of Materials Science. 24: 515-522. DOI: 10.1007/BF01107436 |
0.112 |
|
1991 |
Zhu JG, Palmstrøm CJ, Carter CB. A study of GaAs/Sc0.3Er0.7As/GaAs heterostructures grown on novel GaAs substrate orientations Proceedings, Annual Meeting, Electron Microscopy Society of America. 49: 848-849. DOI: 10.1017/s0424820100088555 |
0.109 |
|
1988 |
Mei P, Schwarz SA, Venkatesan T, Schwartz CL, Harbison JP, Florez L, Theodore ND, Carter CB. Mixing inhibition and crystalline defects in heavily Si‐doped AlAs/GaAs superlattices Applied Physics Letters. 53: 2650-2652. DOI: 10.1063/1.100183 |
0.109 |
|
1988 |
Susnitzky D, Summerfelt S, Carter C. Metal-Ceramic Interphase Interfaces: Preparation and Structural Characterization Mrs Proceedings. 122. DOI: 10.1557/PROC-122-541 |
0.108 |
|
1997 |
Schmid AK, Bartelt NC, Hamilton JC, Carter CB, Hwang RQ. Brownian Motion of Dislocations in Thin Films Physical Review Letters. 78: 3507-3510. DOI: 10.1103/PHYSREVLETT.78.3507 |
0.108 |
|
1991 |
Sung GY, Carter CB, Cho DH, Kim CH. Sinter-forged YBa2Cu3O7−x superconducting ceramics from the spray-roasted powders Journal of Materials Science. 26: 1803-1807. DOI: 10.1007/BF00543606 |
0.107 |
|
1991 |
Rasmussen DR, McKernan S, Carter CB. A quantitative analysis of strong-beam α fringes from {110} antiphase boundaries in GaAs Philosophical Magazine A. 63: 1299-1314. DOI: 10.1080/01418619108205584 |
0.107 |
|
1992 |
Theodore ND, Alford TL, Barbour JC, Carter CB, Mayer JW. TEM characterization of yttrium silicide layers synthesized by ion implantation Applied Physics a Solids and Surfaces. 54: 527-532. DOI: 10.1007/Bf00324334 |
0.107 |
|
2010 |
Altay A, Carter C, Rulis P, Ching W, Arslan I, Gülgün M. Characterizing CA2 and CA6 using ELNES Journal of Solid State Chemistry. 183: 1776-1784. DOI: 10.1016/J.Jssc.2010.05.028 |
0.107 |
|
1994 |
Colbert DT, Zhang J, McClure SM, Nikolaev P, Chen Z, Hafner JH, Owens DW, Kotula PG, Carter CB, Weaver JH, Rinzler AG, Smalley RE. Growth and sintering of fullerene nanotubes. Science (New York, N.Y.). 266: 1218-22. PMID 17810264 DOI: 10.1126/Science.266.5188.1218 |
0.107 |
|
1994 |
McKernan S, Carter CB. Convergent-beam thickness determination: The advantages of digital imaging Proceedings, Annual Meeting, Electron Microscopy Society of America. 52: 420-421. DOI: 10.1017/s0424820100169833 |
0.107 |
|
1991 |
Rasmussen DR, Carter CB. A computer program for many-beam image simulation of amplitude-contrast images. Journal of Electron Microscopy Technique. 18: 429-36. PMID 1919796 DOI: 10.1002/JEMT.1060180412 |
0.106 |
|
1991 |
Fleischer EL, Norton MG, Zaleski MA, Hertl W, Carter CB, Mayer JW. Microstructure of hardened and softened zirconia after xenon implantation Journal of Materials Research. 6: 1905-1912. DOI: 10.1557/Jmr.1991.1905 |
0.103 |
|
2013 |
Jain R, Kuo C, Roller J, Suib S, Carter C, Maric R. TEM Characterization of Ceria supported Pt Catalyst for Water-Gas Shift Reaction Produced by Reactive Spray Deposition Technique Microscopy and Microanalysis. 19: 1722-1723. DOI: 10.1017/S143192761301060X |
0.103 |
|
1990 |
Norton M, Carter C. On the optimization of the laser ablation process for the deposition of YBa2Cu3O7−δ thin films Physica C: Superconductivity. 172: 47-56. DOI: 10.1016/0921-4534(90)90641-Q |
0.102 |
|
1990 |
Scarfone C, Norton MG, Carter CB, Li J, Mayer JW. Characterization of BaTiO 3 Thin Films Deposited by Pulsed-Laser Ablation Mrs Proceedings. 201. DOI: 10.1557/Proc-201-183 |
0.102 |
|
2013 |
Roller JM, Arellano-Jimenez J, Jain R, Yu H, Maric R, Carter CB. Processing, Activity and Microstructure of Oxygen Evolution Anodes Prepared by a Dry and Direct Deposition Technique Ecs Transactions. 45: 97-106. DOI: 10.1149/04521.0097ECST |
0.102 |
|
1980 |
Föll H, Carter CB, Wilkens M. Weak-beam contrast of stacking faults in transmission electron microscopy Physica Status Solidi (a). 58: 393-407. DOI: 10.1002/PSSA.2210580210 |
0.102 |
|
1994 |
Anderson IM, Bentley J, Carter CB. Aem Investigation of Tetrahedrally Coordinated TI4+ in Nickel-Titanate Spinel Mrs Proceedings. 332. DOI: 10.1557/PROC-332-309 |
0.1 |
|
1972 |
Carter CB, Williams PM. An electron microscopy study of intercalation in transition metal dichalcogenides Philosophical Magazine. 26: 393-398. DOI: 10.1080/14786437208227436 |
0.098 |
|
1978 |
Carter C, Föll H. The contrast from incoherent twin interfaces observed using the weak-beam technique Scripta Metallurgica. 12: 1135-1139. DOI: 10.1016/0036-9748(78)90090-X |
0.096 |
|
1988 |
Veyssié P, Carter CB. Dissociation of dislocations in MgAl2O4spinel deformed at low temperatures Philosophical Magazine Letters. 57: 211-220. DOI: 10.1080/09500838808214710 |
0.095 |
|
2013 |
Roller J, Jain R, Yu H, Arellano-Jiménez M, Maric R, Carter C. Structure and Phase Determination of a Bimetallic Pd-Ru Catalyst Prepared From the Vapor Phase with Reactive Spray Deposition Technology Microscopy and Microanalysis. 19: 1730-1731. DOI: 10.1017/S1431927613010647 |
0.095 |
|
1975 |
Carter CB, Holmes SM. The study of faulted dipoles in copper using weak-beam electron microscopy The Philosophical Magazine: a Journal of Theoretical Experimental and Applied Physics. 32: 599-614. DOI: 10.1080/14786437508220883 |
0.093 |
|
1989 |
Rasmussen D, Simpson YK, Kilaas R, Carter C. Contrast effects at grooved interfaces Ultramicroscopy. 30: 52-57. DOI: 10.1016/0304-3991(89)90172-1 |
0.092 |
|
2013 |
Rastegar V, Roller J, Arellano-Jimenez M, Janish M, Jain R, Maric R, Carter C. TEM Characterization on Oxygen-Deficient Titania Supported Pt Electrocatalysts for Energy Conversion Microscopy and Microanalysis. 19: 1720-1721. DOI: 10.1017/S1431927613010593 |
0.092 |
|
2007 |
Gerberich WW, Mook WM, Carter CB, Ballarini R. A crack extension force correlation for hard materials International Journal of Fracture. 148: 109-114. DOI: 10.1007/S10704-008-9177-7 |
0.09 |
|
1994 |
Carter C, Rasmussen Y. Growth of spinel particles on alumina thin films—I. Orientation relationships and shape of the particles Acta Metallurgica Et Materialia. 42: 2729-2740. DOI: 10.1016/0956-7151(94)90214-3 |
0.09 |
|
1995 |
Bench MW, Carter CB, Wang F, Cohen PI. Characterization of iron based precipitates in GaAs layers grown by molecular‐beam epitaxy Applied Physics Letters. 66: 2400-2402. DOI: 10.1063/1.113953 |
0.087 |
|
1980 |
Chiang SW, Carter CB, Kohlstedt DL. Constricted segments of faulted dipoles in germanium Scripta Metallurgica. 14: 803-807. DOI: 10.1016/0036-9748(80)90293-8 |
0.087 |
|
1992 |
Summerfelt SR, Carter CB. Kinetics of NiFe2O4 Precipitation in NiO Journal of the American Ceramic Society. 75: 2244-2250. DOI: 10.1111/J.1151-2916.1992.TB04491.X |
0.087 |
|
1990 |
Norton MG, Carter CB, Moeckly BH, Russek SE, Buhrman RA. Optimizing Process Parameters for the Growth of YBa 2 Cu 3 O 7−δ thin-films Mrs Proceedings. 191: 141. DOI: 10.1557/Proc-191-141 |
0.086 |
|
1980 |
Chiang SW, Carter CB, Kohlstedt DL. FAULTED DIPOLES IN GERMANIUM. A HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY STUDY Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 42: 204-232. DOI: 10.1080/01418618008239358 |
0.086 |
|
1989 |
De Cooman BC, Carter CB. Dislocation configurations in semi-insulating, n-type and p-type GaAs deformed at 150°C Philosophical Magazine A. 60: 245-266. DOI: 10.1080/01418618908219283 |
0.084 |
|
1984 |
Chen SH, Barbour JC, Zheng LR, Carter CB, Mayer JW. Structure Analysis of Ni-Silicides Formed in Lateral Diffusion Couples Mrs Proceedings. 37: 635. DOI: 10.1557/Proc-37-635 |
0.084 |
|
1979 |
Föll H, Carter CB. Direct TEM determination of intrinsic and extrinsic stacking fault energies of silicon Philosophical Magazine A. 40: 497-510. DOI: 10.1080/01418617908234855 |
0.083 |
|
2023 |
Parida S, Dobley A, Carter CB, Dongare AM. Phase engineering of layered anode materials during ion-intercalation in Van der Waal heterostructures. Scientific Reports. 13: 5408. PMID 37012258 DOI: 10.1038/s41598-023-31342-z |
0.081 |
|
1983 |
Carter CB. Multiple ribbons in face-centered cubic materials. IV. The interaction between double ribbons and inclined dislocations Physica Status Solidi (a). 80: 51-64. DOI: 10.1002/PSSA.2210800104 |
0.081 |
|
1992 |
Theodore ND, Alford TL, Carter CB, Mayer JW, Cheung NW. TEM analysis of the influence of dose on damage behavior in MeV Au2+-implanted silicon Applied Physics a Solids and Surfaces. 54: 124-131. DOI: 10.1007/BF00323898 |
0.08 |
|
1974 |
Carter CB, Ray ILF. Observations of constrictions on dissociated dislocation lines in copper alloys Philosophical Magazine. 29: 1231-1235. DOI: 10.1080/14786437408226609 |
0.079 |
|
1998 |
Ramamurthy S, Carter CB. The {111}/{100} Interface in Cubic Materials and Related Systems Physica Status Solidi (a). 166: 37-55. DOI: 10.1002/(SICI)1521-396X(199803)166:1<37::AID-PSSA37>3.0.CO;2-W |
0.079 |
|
2007 |
Divakar R, Basu J, Carter C. Hydrothermal Synthesis of Cuboidal Nanocrystalline Ceria Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607076489 |
0.078 |
|
2010 |
COLBERT DT, ZHANG J, MCCLURE SM, NIKOLAEV P, CHEN Z, HAFNER JH, OWENS DW, KOTULA PG, CARTER CB, WEAVER JH, RINZLER AG, SMALLEY RE. ChemInform Abstract: Growth and Sintering of Fullerene Nanotubes. Cheminform. 26: no-no. DOI: 10.1002/chin.199509018 |
0.078 |
|
1986 |
Carter CB. Interfaces in Solid-State Reactions Berichte Der Bunsengesellschaft FüR Physikalische Chemie. 90: 643-649. DOI: 10.1002/BBPC.19860900805 |
0.078 |
|
1995 |
ANDERSON IM, BENTLEY J, CARTER CB. The secondary fluorescence correction for X-ray microanalysis in the analytical electron microscope Journal of Microscopy. 178: 226-239. DOI: 10.1111/j.1365-2818.1995.tb03600.x |
0.077 |
|
1987 |
McKernan S, Cooman BCD, Carter CB, Bour DP, Shealy JR. TEM Studies of Ordering in MOCVD-Grown (GaIn)P on GaAs Mrs Proceedings. 104: 637. DOI: 10.1557/Proc-104-637 |
0.074 |
|
1985 |
De Cooman BC, Kuesters K, Carter CB. Cross-sectional reflection electron microscopy of III-V compound epilayers Journal of Electron Microscopy Technique. 2: 533-546. DOI: 10.1002/JEMT.1060020603 |
0.074 |
|
1992 |
Summerfelt S, Carter C. Interaction between dislocations and NiFe2O4 precipitates in a NiO matrix Acta Metallurgica Et Materialia. 40: 2805-2812. DOI: 10.1016/0956-7151(92)90351-E |
0.073 |
|
1997 |
Anderson IM, Bentley J, Carter CB. Secondary fluorescence correction formulae for X-ray microanalysis - I parallel-sided thin foil, wedge, and bulk specimens Ultramicroscopy. 68: 77-94. DOI: 10.1016/S0304-3991(97)00015-6 |
0.073 |
|
1986 |
Cho N, Carter CB, Elgat Z, Wagner DK. Growth of GaAs bicrystals Applied Physics Letters. 49: 29-31. DOI: 10.1063/1.97073 |
0.072 |
|
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