| Year |
Citation |
Score |
| 2020 |
Arwin H, Magnusson R, Järrendahl K, Schoeche S. Effective structural chirality of beetle cuticle determined from transmission Mueller matrices using the Tellegen constitutive relations Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 38: 14004. DOI: 10.1116/1.5131634 |
0.351 |
|
| 2020 |
Mendoza-Galván A, Li Y, Yang X, Magnusson R, Järrendahl K, Berglund L, Arwin H. Transmission Mueller-matrix characterization of transparent ramie films Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 38: 14008. DOI: 10.1116/1.5129651 |
0.403 |
|
| 2019 |
Galván AM, Järrendahl K, Arwin H. Mueller-matrix modeling of the architecture in the cuticle of the beetle Chrysina resplendens Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 37: 62904. DOI: 10.1116/1.5122824 |
0.344 |
|
| 2018 |
Mendoza-Galván A, Muñoz-Pineda E, Järrendahl K, Arwin H. Pitch profile across the cuticle of the scarab beetle determined by analysis of Mueller matrix measurements. Royal Society Open Science. 5: 181096. PMID 30662728 DOI: 10.1098/Rsos.181096 |
0.372 |
|
| 2018 |
Mendoza-Galván A, Tejeda-Galán T, Domínguez-Gómez AB, Mauricio-Sánchez RA, Järrendahl K, Arwin H. Linear Birefringent Films of Cellulose Nanocrystals Produced by Dip-Coating. Nanomaterials (Basel, Switzerland). 9. PMID 30602653 DOI: 10.3390/Nano9010045 |
0.39 |
|
| 2018 |
Mendoza-Galván A, Río LFd, Järrendahl K, Arwin H. Graded pitch profile for the helicoidal broadband reflector and left-handed circularly polarizing cuticle of the scarab beetle Chrysina chrysargyrea. Scientific Reports. 8: 6456. PMID 29691430 DOI: 10.1038/S41598-018-24761-W |
0.328 |
|
| 2018 |
Mendoza-Galván A, Muñoz-Pineda E, Ribeiro SJL, Santos MV, Järrendahl K, Arwin H. Mueller matrix spectroscopic ellipsometry study of chiral nanocrystalline cellulose films Journal of Optics. 20: 24001. DOI: 10.1088/2040-8986/Aa9E7D |
0.374 |
|
| 2018 |
Bergqvist J, Arwin H, Inganäs O. Uniaxial Anisotropy in PEDOT:PSS Electrodes Enhances the Photocurrent at Oblique Incidence in Organic Solar Cells Acs Photonics. 5: 3023-3030. DOI: 10.1021/Acsphotonics.8B00221 |
0.526 |
|
| 2017 |
Nygren K, Samuelsson M, Arwin H, Jansson U. Optical methods to quantify amorphous carbon in carbide-based nanocomposite coatings Thin Solid Films. 638: 291-297. DOI: 10.1016/J.Tsf.2017.07.053 |
0.308 |
|
| 2017 |
Popa PL, Sønderby S, Kerdsongpanya S, Lu J, Arwin H, Eklund P. Structural, morphological, and optical properties of Bi2O3 thin films grown by reactive sputtering Thin Solid Films. 624: 41-48. DOI: 10.1016/J.Tsf.2017.01.013 |
0.321 |
|
| 2017 |
Valyukh S, Arwin H, Birch J, Järrendahl K. Bragg reflection from periodic helicoidal media with laterally graded refractive index Optical Materials. 72: 334-340. DOI: 10.1016/J.Optmat.2017.06.018 |
0.304 |
|
| 2017 |
Arwin H, Río LFd, kerlind C, Valyukh S, Mendoza-Galván A, Magnusson R, Landin J, Järrendahl K. On the polarization of light reflected from beetle cuticle Materials Today: Proceedings. 4: 4933-4941. DOI: 10.1016/J.Matpr.2017.04.099 |
0.318 |
|
| 2016 |
Fernández Del Río L, Arwin H, Järrendahl K. Polarizing properties and structure of the cuticle of scarab beetles from the Chrysina genus. Physical Review. E. 94: 012409. PMID 27575166 DOI: 10.1103/Physreve.94.012409 |
0.358 |
|
| 2016 |
Mendoza-Galvan A, Munoz-Pineda E, Järrendahl K, Arwin H. Birefringence of nanocrystalline chitin films studied by Mueller-matrix spectroscopic ellipsometry Optical Materials Express. 6: 671-681. DOI: 10.1364/Ome.6.000671 |
0.4 |
|
| 2016 |
Arwin H, Mendoza-Galván A, Magnusson R, Andersson A, Landin J, Järrendahl K, Garcia-Caurel E, Ossikovski R. Structural circular birefringence and dichroism quantified by differential decomposition of spectroscopic transmission Mueller matrices from Cetonia aurata Optics Letters. 41: 3293-3296. DOI: 10.1364/Ol.41.003293 |
0.335 |
|
| 2016 |
Karpus V, Tumėnas S, Eikevičius A, Arwin H. Interband optical transitions of Zn Physica Status Solidi B-Basic Solid State Physics. 253: 419-428. DOI: 10.1002/Pssb.201552581 |
0.36 |
|
| 2015 |
Åkerlind C, Arwin H, Hallberg T, Landin J, Gustafsson J, Kariis H, Järrendahl K. Scattering and polarization properties of the scarab beetle Cyphochilus insulanus cuticle. Applied Optics. 54: 6037-45. PMID 26193149 DOI: 10.1364/Ao.54.006037 |
0.353 |
|
| 2015 |
Arwin H, Magnusson R, Garcia-Caurel E, Fallet C, Järrendahl K, Foldyna M, De Martino A, Ossikovski R. Sum decomposition of Mueller-matrix images and spectra of beetle cuticles Optics Express. 23: 1951-1966. DOI: 10.1364/Oe.23.001951 |
0.329 |
|
| 2015 |
Magnusson R, Birch J, Hsiao CL, Sandström P, Arwin H, Järrendahl K. In<inf>x</inf>Al<inf>1-x</inf>N chiral nanorods mimicking the polarization features of scarab beetles Proceedings of Spie - the International Society For Optical Engineering. 9429. DOI: 10.1117/12.2084164 |
0.446 |
|
| 2015 |
Arwin H, Magnusson R, Fernández Del Río L, Landin J, Mendoza-Galván A, Järrendahl K. Exploring polarization features in light reflection from beetles with structural colors Proceedings of Spie - the International Society For Optical Engineering. 9429. DOI: 10.1117/12.2083032 |
0.321 |
|
| 2014 |
Mendoza-Galván A, Muñoz-Pineda E, Järrendahl K, Arwin H. Evidence for a dispersion relation of optical modes in the cuticle of the scarab beetle Cotinis mutabilis Optical Materials Express. 4: 2484-2496. DOI: 10.1364/Ome.4.002484 |
0.337 |
|
| 2014 |
Magnusson R, Hsiao CL, Birch J, Arwin H, Järrendahl K. Chiral nanostructures producing near circular polarization Optical Materials Express. 4: 1389-1403. DOI: 10.1364/Ome.4.001389 |
0.402 |
|
| 2014 |
Valyukh I, Jiao Z, Arwin H, Sun XW. Optical properties of hydrated tungsten trioxide 3WO3·H2O Thin Solid Films. 571: 644-647. DOI: 10.1016/J.Tsf.2014.04.049 |
0.429 |
|
| 2014 |
Magnusson R, Birch J, Sandström P, Hsiao CL, Arwin H, Järrendahl K. Optical Mueller matrix modeling of chiral AlxIn1 - XN nanospirals Thin Solid Films. 571: 447-452. DOI: 10.1016/J.Tsf.2014.02.015 |
0.416 |
|
| 2014 |
Río LFd, Arwin H, Järrendahl K. Polarizing properties and structural characteristics of the cuticle of the scarab Beetle Chrysina gloriosa Thin Solid Films. 571: 410-415. DOI: 10.1016/J.Tsf.2013.11.149 |
0.301 |
|
| 2014 |
Muñoz-Pineda E, Järrendahl K, Arwin H, Mendoza-Galván A. Symmetries and relationships between elements of the Mueller matrix spectra of the cuticle of the beetle Cotinis mutabilis Thin Solid Films. 571: 660-665. DOI: 10.1016/J.Tsf.2013.11.144 |
0.305 |
|
| 2014 |
Arwin H, Magnusson R, del Río LF, Åkerlind C, Muñoz-Pineda E, Landin J, Mendoza-Galván A, Järrendahl K. Exploring optics of beetle cuticles with Mueller-matrix ellipsometry Materials Today: Proceedings. 1: 155-160. DOI: 10.1016/J.Matpr.2014.09.016 |
0.363 |
|
| 2013 |
Arwin H, Berlind T, Johs B, Järrendahl K. Cuticle structure of the scarab beetle Cetonia aurata analyzed by regression analysis of Mueller-matrix ellipsometric data. Optics Express. 21: 22645-56. PMID 24104152 DOI: 10.1364/Oe.21.022645 |
0.343 |
|
| 2013 |
Johansson MB, Baldissera G, Valyukh I, Persson C, Arwin H, Niklasson GA, Osterlund L. Electronic and optical properties of nanocrystalline WO₃ thin films studied by optical spectroscopy and density functional calculations. Journal of Physics. Condensed Matter : An Institute of Physics Journal. 25: 205502. PMID 23614973 DOI: 10.1088/0953-8984/25/20/205502 |
0.391 |
|
| 2013 |
Bergqvist J, Mauger SA, Tvingstedt K, Arwin H, Inganäs O. In situ reflectance imaging of organic thin film formation from solution deposition Solar Energy Materials and Solar Cells. 114: 89-98. DOI: 10.1016/J.Solmat.2013.02.030 |
0.507 |
|
| 2012 |
Mendoza-Galván A, Järrendahl K, Dmitriev A, Pakizeh T, Käll M, Arwin H. Fano interference in supported gold nanosandwiches with weakly coupled nanodisks Optics Express. 20: 29646-29658. PMID 23388792 DOI: 10.1364/Oe.20.029646 |
0.378 |
|
| 2012 |
Valyukh S, Chigrinov V, Kwok HS, Arwin H. On liquid crystal diffractive optical elements utilizing inhomogeneous alignment. Optics Express. 20: 15209-21. PMID 22772219 DOI: 10.1364/Oe.20.015209 |
0.317 |
|
| 2012 |
Granberg H, Coppel LG, Eita M, De Mayolo EA, Arwin H, Wågberg L. Dynamics of moisture interaction with polyelectrolyte multilayers containing nanofibrillated cellulose Nordic Pulp and Paper Research Journal. 27: 496-499. DOI: 10.3183/Npprj-2012-27-02-P496-499 |
0.419 |
|
| 2012 |
Valyukh I, Green S, Granqvist C, Gunnarsson K, Arwin H, Niklasson GA. Ellipsometrically determined optical properties of nickel-containing tungsten oxide thin films : Nanostructure inferred from effective medium theory Journal of Applied Physics. 112: 44308. DOI: 10.1063/1.4748166 |
0.377 |
|
| 2012 |
Tumėnas S, Karpus V, Bertulis K, Arwin H. Dielectric function and refractive index of GaBix As1-x (x = 0.035, 0.052, 0.075) Physica Status Solidi (C). 9: 1633-1635. DOI: 10.1002/Pssc.201100696 |
0.316 |
|
| 2011 |
Eita M, Arwin H, Granberg H, Wågberg L. Addition of silica nanoparticles to tailor the mechanical properties of nanofibrillated cellulose thin films Journal of Colloid and Interface Science. 363: 566-572. PMID 21868023 DOI: 10.1016/J.Jcis.2011.07.085 |
0.393 |
|
| 2011 |
Mendoza-Galvan A, Järrendahl K, Dmitriev A, Pakizeh T, Käll M, Arwin H. Optical response of supported gold nanodisks. Optics Express. 19: 12093-12107. PMID 21716446 DOI: 10.1364/Oe.19.012093 |
0.404 |
|
| 2011 |
Cranston ED, Eita M, Johansson E, Netrval J, Salajková M, Arwin H, Wågberg L. Determination of Young's modulus for nanofibrillated cellulose multilayer thin films using buckling mechanics. Biomacromolecules. 12: 961-9. PMID 21395236 DOI: 10.1021/Bm101330W |
0.327 |
|
| 2011 |
Oates TW, Ranjan M, Facsko S, Arwin H. Highly anisotropic effective dielectric functions of silver nanoparticle arrays. Optics Express. 19: 2014-28. PMID 21369018 DOI: 10.1364/Oe.19.002014 |
0.307 |
|
| 2011 |
Berlind T, Tengvall P, Hultman L, Arwin H. Protein adsorption on thin films of carbon and carbon nitride monitored with in situ ellipsometry Acta Biomaterialia. 7: 1369-1378. PMID 20977950 DOI: 10.1016/J.Actbio.2010.10.024 |
0.377 |
|
| 2011 |
Rehammar R, Magnusson R, Lassesson A, Arwin H, Kinaret J, Campbell E. Carbon nanofiber-based photonic crystals - Fabrication, diffraction and ellipsometry investigations Materials Research Society Symposium Proceedings. 1283: 28-33. DOI: 10.1557/Opl.2011.549 |
0.323 |
|
| 2011 |
Tumėnas S, Kašalynas I, Karpus V, Arwin H. Infrared Reflectance Kramers-Kronig Analysis by Anchor-Window Technique Acta Physica Polonica A. 119: 140-142. DOI: 10.12693/Aphyspola.119.140 |
0.335 |
|
| 2011 |
Mendoza-Galván A, Rybka M, Järrendahl K, Arwin H, Magnuson M, Hultman L, Barsoum MW. Spectroscopic ellipsometry study on the dielectric function of bulk Ti2AlN, Ti2AlC, Nb2AlC, "(Ti0.5 ,Nb0.5)2AlC, and Ti3GeC2 MAX-phases Journal of Applied Physics. 109. DOI: 10.1063/1.3525648 |
0.319 |
|
| 2011 |
Müller C, Bergqvist J, Vandewal K, Tvingstedt K, Anselmo AS, Magnusson R, Alonso MI, Moons E, Arwin H, Campoy-Quiles M, Inganäs O. Phase behaviour of liquid-crystalline polymer/fullerene organic photovoltaic blends: Thermal stability and miscibility Journal of Materials Chemistry. 21: 10676-10684. DOI: 10.1039/C1Jm11239B |
0.48 |
|
| 2011 |
Akerlind C, Arwin H, Jakobsson F, Kariis H, Järrendahl K. Optical properties and switching of a Rose Bengal derivative: A spectroscopic ellipsometry study Thin Solid Films. 519: 3582-3586. DOI: 10.1016/J.Tsf.2011.01.269 |
0.379 |
|
| 2011 |
Schmidt D, Müller C, Hofmann T, Inganäs O, Arwin H, Schubert E, Schubert M. Optical properties of hybrid titanium chevron sculptured thin films coated with a semiconducting polymer Thin Solid Films. 519: 2645-2649. DOI: 10.1016/J.Tsf.2010.12.111 |
0.572 |
|
| 2011 |
Gallas B, Guth N, Rivory J, Arwin H, Magnusson R, Guida G, Yang J, Robbie K. Nanostructured chiral silver thin films: A route to metamaterials at optical frequencies Thin Solid Films. 519: 2650-2654. DOI: 10.1016/J.Tsf.2010.12.078 |
0.379 |
|
| 2011 |
Tumėnas S, Karpus V, Arwin H, Assmus W. Optical conductivity of fci-ZnMgRE quasicrystals Thin Solid Films. 519: 2951-2954. DOI: 10.1016/J.Tsf.2010.12.050 |
0.345 |
|
| 2011 |
Wronkowska AA, Arwin H, Firszt F, Łęgowski S, Wronkowski A, Skowroński Ł. Optical spectra of Zn1-xBexTe mixed crystals determined by IR―VIS―UV ellipsometry and photoluminescence measurements Thin Solid Films. 519: 2795-2800. DOI: 10.1016/J.Tsf.2010.12.043 |
0.311 |
|
| 2011 |
Valyukh I, Green S, Granqvist C, Niklasson G, Valyukh S, Arwin H. Optical properties of thin films of mixed Ni-W oxide made by reactive DC magnetron sputtering Thin Solid Films. 519: 2914-2918. DOI: 10.1016/J.Tsf.2010.11.089 |
0.394 |
|
| 2011 |
Arwin H. Application of ellipsometry techniques to biological materials Thin Solid Films. 519: 2589-2592. DOI: 10.1016/J.Tsf.2010.11.082 |
0.376 |
|
| 2011 |
Oates TWH, Wormeester H, Arwin H. Spectroscopic ellipsometry of plasmonic thin films and metamaterials Progress in Surface Science. 86: 328-376. DOI: 10.1016/J.Prosuef.2011.08.004 |
0.373 |
|
| 2011 |
Oates TWH, Wormeester H, Arwin H. Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry Progress in Surface Science. 86: 328-376. DOI: 10.1016/J.Progsurf.2011.08.004 |
0.36 |
|
| 2010 |
Rehammar R, Magnusson R, Fernandez-Dominguez AI, Arwin H, Kinaret JM, Maier SA, Campbell EE. Optical properties of carbon nanofiber photonic crystals. Nanotechnology. 21: 465203. PMID 20972321 DOI: 10.1088/0957-4484/21/46/465203 |
0.309 |
|
| 2010 |
Berlind T, Poksinski M, Tengvall P, Arwin H. Formation and cross-linking of fibrinogen layers monitored with in situ spectroscopic ellipsometry. Colloids and Surfaces B: Biointerfaces. 75: 410-417. PMID 19854626 DOI: 10.1016/J.Colsurfb.2009.09.013 |
0.31 |
|
| 2010 |
Valyukh I, Green S, Arwin H, Niklasson GA, Wäckelgård E, Granqvist C. Spectroscopic ellipsometry characterization of electrochromic tungsten oxide and nickel oxide thin films made by sputter deposition Solar Energy Materials and Solar Cells. 94: 724-732. DOI: 10.1016/J.Solmat.2009.12.011 |
0.307 |
|
| 2009 |
Mendoza-Galván A, Järrendahl K, Arwin H, Huang YF, Chen LC, Chen KH. Spectroscopic ellipsometry analysis of silicon nanotips obtained by electron cyclotron resonance plasma etching. Applied Optics. 48: 4996-5004. PMID 19745863 DOI: 10.1364/Ao.48.004996 |
0.37 |
|
| 2009 |
Karpus V, Babonas G, Reza A, Tumenas S, Arwin H, Assmus W, Brühne S. Optical response of si-ZnMgHo quasicrystal Zeitschrift Fur Kristallographie. 224: 39-41. DOI: 10.1524/Zkri.2009.1075 |
0.33 |
|
| 2009 |
Arwin H, Aspnes DE. Follow the light: Ellipsometry and polarimetry Physics Today. 62: 70-71. DOI: 10.1063/1.3141950 |
0.514 |
|
| 2009 |
Berlind T, Furlan A, Czigany Z, Neidhardt J, Hultman L, Arwin H. Spectroscopic ellipsometry characterization of amorphous carbon and amorphous, graphitic and fullerene-like carbon nitride thin films Thin Solid Films. 517: 6652-6658. DOI: 10.1016/J.Tsf.2009.04.065 |
0.354 |
|
| 2008 |
Valyukh I, Arwin H, Chigrinov V, Valyukh S. UV-induced in-plane anisotropy in layers of mixture of the azo-dyes SD-1/SDA-2 characterized by spectroscopic ellipsometry Physica Status Solidi (C). 5: 1274-1277. DOI: 10.1002/Pssc.200777881 |
0.405 |
|
| 2008 |
Bakker JWP, Arwin H, Lundström I, Filippini D. Immunodetection using computer screen photo-assisted ellipsometry Physica Status Solidi (C). 5: 1431-1433. DOI: 10.1002/Pssc.200777861 |
0.458 |
|
| 2008 |
Campoy-Quiles M, Nelson J, Etchegoin PG, Bradley DDC, Zhokhavets V, Gobsch G, Vaughan H, Monkman A, Ingänas O, Persson NK, Arwin H, Garriga M, Alonso MI, Herrmann G, Becker M, et al. On the determination of anisotropy in polymer thin films: A comparative study of optical techniques Physica Status Solidi (C). 5: 1270-1273. DOI: 10.1002/Pssc.200777835 |
0.536 |
|
| 2008 |
Wronkowska AA, Arwin H, Bukaluk A, Skowroński Ł, Trzcinski M, Okulewicz K, Wronkowski A. IR-VIS-UV ellipsometry, XRD and AES investigation of In/Cu and In/Pd thin films Physica Status Solidi (C). 5: 1141-1144. DOI: 10.1002/Pssc.200777777 |
0.348 |
|
| 2008 |
Arwin H, Poksinski M, Johansen K. Enhancement in ellipsometric thin film sensitivity near surface plasmon resonance conditions Physica Status Solidi (a). 205: 817-820. DOI: 10.1002/Pssa.200777899 |
0.378 |
|
| 2008 |
Gallas B, Rivory J, Arwin H, Vidal F, Stchakovsky M. Monitoring the α-to β-phase transition in MnAs/GaAs(001) thin films as function of temperature Physica Status Solidi a-Applications and Materials Science. 205: 863-866. DOI: 10.1002/Pssa.200777783 |
0.339 |
|
| 2008 |
Gallas B, Rivory J, Arwin H, Vidal F, Etgens VH. Changes in optical properties of MnAs thin films on GaAs(001) induced by α‐ to β‐phase transition Physica Status Solidi (a). 205: 859-862. DOI: 10.1002/Pssa.200777782 |
0.318 |
|
| 2008 |
Dantas NS, Arwin H, Nzulu G, Rappl PHdO, Silva AFd, Persson C. Optical characterization of rocksalt Pb1-xSnxTe alloys Physica Status Solidi (a). 205: 837-840. DOI: 10.1002/Pssa.200777747 |
0.321 |
|
| 2007 |
Poksinski M, Arwin H. Total internal reflection ellipsometry: ultrahigh sensitivity for protein adsorption on metal surfaces. Optics Letters. 32: 1308-10. PMID 17440570 DOI: 10.1364/Ol.32.001308 |
0.364 |
|
| 2007 |
Valyukh I, Valyukh S, Arwin H, Chigrinov V. Characteristic functions for uniformly twisted birefringent media Journal of Applied Physics. 102: 63110. DOI: 10.1063/1.2781300 |
0.305 |
|
| 2007 |
Darakchieva V, Paskova T, Schubert M, Paskov PP, Arwin H, Monemar B, Hommel D, Heuken M, Off J, Haskell BA, Fini PT, Speck JS, Nakamura S. Effect of anisotropic strain on phonons in a-plane and c-plane GaN layers Journal of Crystal Growth. 300: 233-238. DOI: 10.1016/J.Jcrysgro.2006.11.023 |
0.354 |
|
| 2007 |
Levin M, Wiklund P, Arwin H. Adsorption and film growth of N-methylamino substituted triazoles on copper surfaces in hydrocarbon media Applied Surface Science. 254: 1528-1533. DOI: 10.1016/J.Apsusc.2007.07.023 |
0.337 |
|
| 2006 |
Bakker JWP, Arwin H, Lundström I, Filippini D. Computer screen photoassisted off-null ellipsometry. Applied Optics. 45: 7795-7799. PMID 17068512 DOI: 10.1364/Ao.45.007795 |
0.447 |
|
| 2006 |
Baroni MPMA, Conceicao MV, Rosa RR, Persson C, Arwin H, Silva EFd, Roman LS, Nakamura O, Pepe I, Silva AFd. Optical and morphological properties of porous diamond-like-carbon films deposited by magnetron sputtering Journal of Non-Crystalline Solids. 352: 3734-3738. DOI: 10.1016/J.Jnoncrysol.2006.02.126 |
0.402 |
|
| 2006 |
Tazawa M, Kakiuchida H, Xu G, Jin P, Arwin H. Optical constants of vacuum evaporated SiO film and an application Journal of Electroceramics. 16: 511-515. DOI: 10.1007/S10832-006-9908-Y |
0.446 |
|
| 2006 |
Wronkowska AA, Firszt F, Arwin H, Wronkowski A, Wakuła M, Strzałkowski K, Paszkowicz W. Characterisation of Cd1-x-yZnxBeySe crystals by spectroscopic ellipsometry and luminescence Physica Status Solidi (C). 3: 1193-1196. DOI: 10.1002/Pssc.200564725 |
0.314 |
|
| 2005 |
Persson N, Arwin H, Inganas O. Optical optimization of polyfluorene-fullerene blend photodiodes Journal of Applied Physics. 97: 34503. DOI: 10.1063/1.1836005 |
0.509 |
|
| 2005 |
Piacham T, Josell Å, Arwin H, Prachayasittikul V, Ye L. Erratum to “Molecularly imprinted polymer thin films on quartz crystal microbalance using a surface bound photo-radical initiator”: [Analytica Chimica Acta 536 (2005) 191–196] Analytica Chimica Acta. 542. DOI: 10.1016/J.Aca.2005.05.036 |
0.327 |
|
| 2005 |
Piacham T, Josell Å, Arwin H, Prachayasittikul V, Ye L. Molecularly imprinted polymer thin films on quartz crystal microbalance using a surface bound photo-radical initiator Analytica Chimica Acta. 536: 191-196. DOI: 10.1016/J.Aca.2004.12.067 |
0.352 |
|
| 2005 |
Arwin H, Karlsson LM, Kozarcanin A, Thompson DW, Tiwald T, Woollam JA. Carbonic anhydrase adsorption in porous silicon studied with infrared ellipsometry Physica Status Solidi (a) Applications and Materials Science. 202: 1688-1692. DOI: 10.1002/Pssa.200461228 |
0.333 |
|
| 2004 |
Arwin H, Poksinski M, Johansen K. Total internal reflection ellipsometry: principles and applications. Applied Optics. 43: 3028-36. PMID 15176189 DOI: 10.1364/Ao.43.003028 |
0.382 |
|
| 2004 |
Wang G, Arwin H. Return-path ellipsometry in gas sensing Measurement Science and Technology. 15: 216-220. DOI: 10.1088/0957-0233/15/1/030 |
0.308 |
|
| 2004 |
Schubert M, Bundesmann C, Wenckstern Hv, Jakopic G, Haase A, Persson N, Zhang F, Arwin H, Inganäs O. Carrier redistribution in organic/inorganic (poly(3,4-ethylenedioxy thiophene/poly(styrenesulfonate)polymer)-Si) heterojunction determined from infrared ellipsometry Applied Physics Letters. 84: 1311-1313. DOI: 10.1063/1.1649822 |
0.446 |
|
| 2004 |
Schubert M, Bundesmann C, Jacopic G, Maresch H, Arwin H. Infrared dielectric function and vibrational modes of pentacene thin films Applied Physics Letters. 84: 200-202. DOI: 10.1063/1.1639129 |
0.357 |
|
| 2004 |
Karlsson LM, Schubert M, Ashkenov N, Arwin H. Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry Thin Solid Films. 455: 726-730. DOI: 10.1016/J.Tsf.2004.01.062 |
0.326 |
|
| 2004 |
Poksinski M, Arwin H. Protein monolayers monitored by internal reflection ellipsometry Thin Solid Films. 455: 716-721. DOI: 10.1016/J.Tsf.2004.01.037 |
0.309 |
|
| 2004 |
Bakker JWP, Bryntse G, Arwin H. Determination of refractive index of printed and unprinted paper using spectroscopic ellipsometry Thin Solid Films. 455: 361-365. DOI: 10.1016/J.Tsf.2004.01.024 |
0.319 |
|
| 2004 |
Lindquist OPA, Schubert M, Arwin H, Järrendahl K. Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry Thin Solid Films. 455: 235-238. DOI: 10.1016/J.Tsf.2004.01.008 |
0.308 |
|
| 2004 |
Tazawa M, Xu G, Jin P, Arwin H. A memory application of light reflection from anisotropic micro-structured thin films Thin Solid Films. 455: 824-827. DOI: 10.1016/J.Tsf.2003.11.267 |
0.365 |
|
| 2004 |
Schubert M, Bundesmann C, Jakopic G, Maresch H, Arwin H, Persson N-, Zhang F, Inganäs O. Infrared ellipsometry characterization of conducting thin organic films Thin Solid Films. 455: 295-300. DOI: 10.1016/J.Tsf.2003.11.194 |
0.534 |
|
| 2003 |
Lindquist OPA, Arwin H, Henry A, Järrendahl K. Infrared Optical Properties of 3C, 4H and 6H Silicon Carbide Materials Science Forum. 329-332. DOI: 10.4028/Www.Scientific.Net/Msf.433-436.329 |
0.342 |
|
| 2003 |
Darakchieva V, Paskov PP, Schubert M, Valcheva E, Paskova T, Arwin H, Monemar B, Amano H, Akasaki I. Strain evolution and phonons in AlN/GaN superlattices Mrs Proceedings. 798. DOI: 10.1557/Proc-798-Y5.60 |
0.313 |
|
| 2003 |
Poksinski M, Dzuho H, Arwin H. Copper Corrosion Monitoring with Total Internal Reflection Ellipsometry Journal of the Electrochemical Society. 150. DOI: 10.1149/1.1618224 |
0.38 |
|
| 2003 |
Isidorsson J, Giebels IAME, Arwin H, Griessen RP. Optical properties of MgH2 measured in situ by ellipsometry and spectrophotometry Physical Review B. 68: 115112. DOI: 10.1103/Physrevb.68.115112 |
0.341 |
|
| 2003 |
Ashkenov N, Mbenkum BN, Bundesmann C, Riede V, Lorenz M, Spemann D, Kaidashev EM, Kasic A, Schubert M, Grundmann M, Wagner G, Neumann H, Darakchieva V, Arwin H, Monemar B. Infrared dielectric functions and phonon modes of high-quality ZnO films Journal of Applied Physics. 93: 126-133. DOI: 10.1063/1.1526935 |
0.385 |
|
| 2003 |
Poksinski M, Arwin H. In situ monitoring of metal surfaces exposed to milk using total internal reflection ellipsometry Sensors and Actuators B-Chemical. 94: 247-252. DOI: 10.1016/S0925-4005(03)00382-4 |
0.314 |
|
| 2003 |
Arwin H, Wang G, Jansson R. Gas sensing based on ellipsometric measurement on porous silicon Physica Status Solidi (a) Applied Research. 197: 518-522. DOI: 10.1002/Pssa.200306556 |
0.329 |
|
| 2003 |
Bakker JWP, Arwin H, Wang G, Järrendahl K. Improvement of porous silicon based gas sensors by polymer modification Physica Status Solidi (a). 197: 378-381. DOI: 10.1002/Pssa.200306529 |
0.301 |
|
| 2003 |
Karlsson LM, Tengvall P, Lundström I, Arwin H. Adsorption of human serum albumin in porous silicon gradients Physica Status Solidi (a). 197: 326-330. DOI: 10.1002/Pssa.200306518 |
0.48 |
|
| 2002 |
Karlsson LM, Tengvall P, Lundström I, Arwin H. Back-side Etching A Tool for Making Morphology Gradients in Porous Silicon Journal of the Electrochemical Society. 149. DOI: 10.1149/1.1519851 |
0.522 |
|
| 2002 |
Ahuja R, Arwin H, Silva AFd, Persson C, Osorio-Guillén JM, Almeida JSd, Araujo CM, Veje E, Veissid N, An CY, Pepe I, Johansson B. Electronic and optical properties of lead iodide Journal of Applied Physics. 92: 7219-7224. DOI: 10.1063/1.1523145 |
0.35 |
|
| 2002 |
Wang G, Arwin H. Modification of vapor sensitivity in ellipsometric gas sensing by copper deposition in porous silicon Sensors and Actuators B-Chemical. 85: 95-103. DOI: 10.1016/S0925-4005(02)00059-X |
0.317 |
|
| 2001 |
Lindquist OPA, Järrendahl K, Arwin H, Peters S, Zettler JT, Cobet C, Esser N, Aspnes DE, Henry A, Edwards NV. Ordinary and extra-ordinary dielectric function of 4H- and 6H-SiC in the 0.7 to 9.0 eV photon energy range Materials Research Society Symposium - Proceedings. 640: H5.24.1-H5.24.6. DOI: 10.1557/Proc-640-H5.24 |
0.457 |
|
| 2001 |
Zangooie S, Arwin H. Surface, Pore Morphology, and Optical Properties of Porous 4H-SiC Journal of the Electrochemical Society. 148. DOI: 10.1149/1.1368109 |
0.384 |
|
| 2001 |
Arwin H. Is ellipsometry suitable for sensor applications Sensors and Actuators a-Physical. 92: 43-51. DOI: 10.1016/S0924-4247(01)00538-6 |
0.309 |
|
| 2001 |
Wongmanerod C, Zangooie S, Arwin H. Determination of pore size distribution and surface area of thin porous silicon layers by spectroscopic ellipsometry Applied Surface Science. 172: 117-125. DOI: 10.1016/S0169-4332(00)00847-3 |
0.363 |
|
| 2001 |
Rantzer A, Arwin H, Birch J, Hjörvarsson B, Bakker JWP, Järrendahl K. Optical properties of intrinsic and doped a-Si:H films grown by d.c. magnetron sputter deposition Thin Solid Films. 394: 255-262. DOI: 10.1016/S0040-6090(01)01179-8 |
0.398 |
|
| 2001 |
Jansson R, Zangooie S, Kugler T, Arwin H. Optical and microstructural characterization of thin films of photochromic fulgides Journal of Physics and Chemistry of Solids. 62: 1219-1228. DOI: 10.1016/S0022-3697(01)00012-9 |
0.444 |
|
| 2001 |
Arwin H. Spectroscopic ellipsometry for characterization and monitoring of organic layers Physica Status Solidi (a). 188: 1331-1338. DOI: 10.1002/1521-396X(200112)188:4<1331::Aid-Pssa1331>3.0.Co;2-1 |
0.328 |
|
| 2000 |
Lindquist OPA, Arwin H, Forsberg U, Bergman JP, Järrendahl K. Optical Characterization of 4H-SiC by Variable Angle of Incidence Spectroscopic Ellipsometry Materials Science Forum. 575-578. DOI: 10.4028/Www.Scientific.Net/Msf.338-342.575 |
0.369 |
|
| 2000 |
Zangooie S, Arwin H, Lundström I, Lloyd-Spets A. Ozone treatment of SiC for improved performance of gas sensitive Schottky diodes Materials Science Forum. 1085-1088. DOI: 10.4028/Www.Scientific.Net/Msf.338-342.1085 |
0.439 |
|
| 2000 |
Zangooie S, Persson P, Hilfiker J, Hultman L, Arwin H. Microstructural and infrared optical properties of electrochemically etched highly doped 4H–SiC Journal of Applied Physics. 87: 8497-8503. DOI: 10.1063/1.373569 |
0.349 |
|
| 2000 |
Johansen K, Arwin H, Lundström I, Liedberg B. Imaging surface plasmon resonance sensor based on multiple wavelengths: Sensitivity considerations Review of Scientific Instruments. 71: 3530-3538. DOI: 10.1063/1.1287631 |
0.517 |
|
| 2000 |
Arwin H. Ellipsometry on thin organic layers of biological interest : characterization and applications Thin Solid Films. 377: 48-56. DOI: 10.1016/S0040-6090(00)01385-7 |
0.354 |
|
| 2000 |
Arwin H, Gavutis M, Gustafsson J, Schultzberg M, Zangooie S, Tengvall P. Protein Adsorption in Thin Porous Silicon Layers Physica Status Solidi (a). 182: 515-520. DOI: 10.1002/1521-396X(200011)182:1<515::Aid-Pssa515>3.0.Co;2-W |
0.343 |
|
| 2000 |
Zangooie S, Arwin H. Porous Anodic 4H‐SiC: Thickness Dependent Anisotropy in Pore Propagation and Ellipsometric Characterization Physica Status Solidi (a). 182: 213-219. DOI: 10.1002/1521-396X(200011)182:1<213::Aid-Pssa213>3.0.Co;2-F |
0.365 |
|
| 1999 |
Johansson ÅA, Järrendahl K, Birch J, Hjörvarsson B, Arwin H. Intrinsic, n- and p-doped a-Si:H thin films grown by DC magnetron sputtering with doped targets Mrs Proceedings. 557: 31-36. DOI: 10.1557/Proc-557-31 |
0.327 |
|
| 1999 |
Zangooie S, Jansson R, Arwin H. Electrochemical Tailoring and Optical Investigation of Advanced Refractive Index Profiles in Porous Silicon Layers Mrs Proceedings. 557: 195. DOI: 10.1557/Proc-557-195 |
0.357 |
|
| 1999 |
Zangooie S, Jansson R, Arwin H. Investigation Of Optical Anisotropy Of Refractive-Index-Profiled Porous Silicon Employing Generalized Ellipsometry Journal of Materials Research. 14: 4167-4175. DOI: 10.1557/Jmr.1999.0564 |
0.354 |
|
| 1999 |
Zangooie S, Jansson R, Arwin H. Ellipsometric characterization of anisotropic porous silicon Fabry–Pérot filters and investigation of temperature effects on capillary condensation efficiency Journal of Applied Physics. 86: 850-858. DOI: 10.1063/1.370814 |
0.341 |
|
| 1999 |
Bergström L, Stemme S, Dahlfors T, Arwin H, Ödberg L. Spectroscopic Ellipsometry Characterisation and Estimation of the Hamaker Constant of Cellulose Cellulose. 6: 1-13. DOI: 10.1023/A:1009250111253 |
0.366 |
|
| 1999 |
Pettersson LAA, Johansson T, Carlsson F, Arwin H, Inganäs O. Anisotropic optical properties of doped poly(3,4-ethylenedioxythiophene) Synthetic Metals. 101: 198-199. DOI: 10.1016/S0379-6779(98)01215-6 |
0.584 |
|
| 1999 |
Wronkowska AA, Wronkowski A, Arwin H. Pd-Induced Effects In The Electronic Structure Of Thin Cu And Au Films Vacuum. 54: 167-172. DOI: 10.1016/S0042-207X(98)00454-0 |
0.317 |
|
| 1998 |
Pettersson LAA, Hultman L, Arwin H. Porosity depth profiling of thin porous silicon layers by use of variable-angle spectroscopic ellipsometry: a porosity graded-layer model Applied Optics. 37: 4130-4136. PMID 18285852 DOI: 10.1364/Ao.37.004130 |
0.33 |
|
| 1998 |
Noort Dv, Welin-Klintström S, Arwin H, Zangooie S, Lundström I, Mandenius C. Monitoring specific interaction of low molecular weight biomolecules on oxidized porous silicon using ellipsometry. Biosensors and Bioelectronics. 13: 439-449. PMID 9642775 DOI: 10.1016/S0956-5663(97)00094-8 |
0.49 |
|
| 1998 |
Zangooie S, Jansson R, Arwin H. Reversible and irreversible control of optical properties of porous silicon superlattices by thermal oxidation, vapor adsorption, and liquid penetration Journal of Vacuum Science and Technology. 16: 2901-2912. DOI: 10.1116/1.581438 |
0.385 |
|
| 1998 |
Bjorklund RB, Hedlund J, Sterte J, Arwin H. Vapor adsorption in thin silicalite-1 films studied by spectroscopic ellipsometry Journal of Physical Chemistry B. 102: 2245-2250. DOI: 10.1021/Jp973385P |
0.439 |
|
| 1998 |
Zangooie S, Jansson R, Arwin H. Microstructural control of porous silicon by electrochemical etching in mixed HCl/HF solutions Applied Surface Science. 136: 123-130. DOI: 10.1016/S0169-4332(98)00328-6 |
0.332 |
|
| 1998 |
Zangooie S, Bjorklund R, Arwin H. Protein adsorption in thermally oxidized porous silicon layers Thin Solid Films. 313: 825-830. DOI: 10.1016/S0040-6090(97)01003-1 |
0.332 |
|
| 1998 |
Arwin H. Spectroscopic ellipsometry and biology: recent developments and challenges Thin Solid Films. 313: 764-774. DOI: 10.1016/S0040-6090(97)00993-0 |
0.328 |
|
| 1998 |
Pettersson LAA, Carlsson F, Inganäs O, Arwin H. Spectroscopic ellipsometry studies of the optical properties of doped poly(3,4-ethylenedioxythiophene): an anisotropic metal Thin Solid Films. 313: 356-361. DOI: 10.1016/S0040-6090(97)00846-8 |
0.583 |
|
| 1998 |
Järrendahl K, Arwin H. Multiple sample analysis of spectroscopic ellipsometry data of semi-transparent films Thin Solid Films. 313: 114-118. DOI: 10.1016/S0040-6090(97)00781-5 |
0.419 |
|
| 1997 |
Zangooie S, Bjorklund R, Arwin H. Water Interaction with Thermally Oxidized Porous Silicon Layers Journal of the Electrochemical Society. 144: 4027-4035. DOI: 10.1149/1.1838130 |
0.346 |
|
| 1997 |
Bjorklund RB, Zangooie S, Arwin H. Adsorption of surfactants in porous silicon films Langmuir. 13: 1440-1445. DOI: 10.1021/La960659B |
0.405 |
|
| 1997 |
Guo S, Rochotzki R, Lundström I, Arwin H. Ellipsometric sensitivity to halothane vapors of hexamethyldisiloxane plasma polymer films Sensors and Actuators B-Chemical. 44: 243-247. DOI: 10.1016/S0925-4005(97)00216-5 |
0.524 |
|
| 1997 |
Zangooie S, Bjorklund R, Arwin H. Vapor sensitivity of thin porous silicon layers Sensors and Actuators B-Chemical. 43: 168-174. DOI: 10.1016/S0925-4005(97)00148-2 |
0.35 |
|
| 1997 |
Guo S, Hedborg E, Lundström I, Arwin H. Air pockets in thin porous platinum films studied by spectroscopic ellipsometry Thin Solid Films. 293: 179-184. DOI: 10.1016/S0040-6090(95)08494-0 |
0.556 |
|
| 1996 |
Guo S, Gustafsson G, Hagel OJ, Arwin H. Determination of refractive index and thickness of thick transparent films by variable-angle spectroscopic ellipsometry: application to benzocyclobutene films Applied Optics. 35: 1693-1699. PMID 21085291 DOI: 10.1364/Ao.35.001693 |
0.388 |
|
| 1996 |
Pettersson LAA, Zangooie S, Bjorklund R, Arwin H. Microstructural Analysis and Modelling of Thin Porous Silicon Layers with Variable Angle Spectroscopic Ellipsometry Mrs Proceedings. 431: 259. DOI: 10.1557/Proc-431-259 |
0.313 |
|
| 1996 |
Bjorklund RB, Zangooie S, Arwin H. Color changes in thin porous silicon films caused by vapor exposure Applied Physics Letters. 69: 3001-3003. DOI: 10.1063/1.116819 |
0.39 |
|
| 1996 |
Jin G, Jansson R, Arwin H. Imaging ellipsometry revisited: Developments for visualization of thin transparent layers on silicon substrates Review of Scientific Instruments. 67: 2930-2936. DOI: 10.1063/1.1147074 |
0.328 |
|
| 1995 |
Jin G, Tengvall P, Lundström I, Arwin H. A Biosensor Concept Based on Imaging Ellipsometry for Visualization of Biomolecular Interactions Analytical Biochemistry. 232: 69-72. PMID 8600834 DOI: 10.1006/Abio.1995.9959 |
0.504 |
|
| 1995 |
Guo S, Arwin H, Jacobsen SN, Järrendahl K, Helmersson U. A spectroscopic ellipsometry study of cerium dioxide thin films grown on sapphire by rf magnetron sputtering Journal of Applied Physics. 77: 5369-5376. DOI: 10.1063/1.359225 |
0.421 |
|
| 1995 |
Oedberg L, Sandberg S, Welin-Klintstroem S, Arwin H. Thickness of adsorbed layers of high molecular weight polyelectrolytes studied by ellipsometry Langmuir. 11: 2621-2625. DOI: 10.1021/La00007A048 |
0.32 |
|
| 1995 |
Maartensson J, Arwin H. Interpretation of Spectroscopic Ellipsometry Data on Protein Layers on Gold Including Substrate-Layer Interactions Langmuir. 11: 963-968. DOI: 10.1021/La00003A045 |
0.384 |
|
| 1995 |
Mårtensson J, Arwin H, Nygren H, Lundström I. Adsorption and Optical Properties of Ferritin Layers on Gold Studied with Spectroscopic Ellipsometry Journal of Colloid and Interface Science. 174: 79-85. DOI: 10.1006/Jcis.1995.1366 |
0.529 |
|
| 1994 |
Veszelei M, Andersson K, Ribbing C-, Järrendahl K, Arwin H. Optical constants and Drude analysis of sputtered zirconium nitride films Applied Optics. 33: 1993-2001. PMID 20885535 DOI: 10.1364/Ao.33.001993 |
0.447 |
|
| 1994 |
Jacobsen SSN, Helmersson U, Järrendahl K, Madsen LD, Tengvall P, Arwin H. Characterization of Sputtered Cerium Dioxide Thin Films Mrs Proceedings. 355. DOI: 10.1557/Proc-355-209 |
0.352 |
|
| 1994 |
Jansson R, Arwin H, Lundström I. Quasi three-dimensional, n-bit optical memory based on the ellipsometric principle: Model calculations Applied Optics. 33: 6843-6854. DOI: 10.1364/Ao.33.006843 |
0.52 |
|
| 1994 |
Järrendahl K, Pécz B, Sundgren J-, Arwin H. Growth and ellipsometric studies of periodic and cantor aperiodic amorphous Ge/Si superlattices Thin Solid Films. 240: 7-13. DOI: 10.1016/0040-6090(94)90686-6 |
0.31 |
|
| 1994 |
Jansson R, Wigren R, Järrendahl K, Lundström I, Arwin H. A quasi three-dimensional optical memory with n-bit memory cells based on the ellipsometric principle: concept and prototype devices Optics Communications. 104: 277-279. DOI: 10.1016/0030-4018(94)90555-X |
0.492 |
|
| 1994 |
Arwin H, Jansson R. Line-shape analysis of ellipsometric spectra on thin conducting polymer films Electrochimica Acta. 39: 211-215. DOI: 10.1016/0013-4686(94)80056-1 |
0.367 |
|
| 1992 |
Arwin H, Martensson J, Jansson R. Line-shape analysis of ellipsometric spectra on thin organic films Applied Optics. 31: 6707-6715. DOI: 10.1364/Ao.31.006707 |
0.338 |
|
| 1991 |
Mårtensson J, Arwin H. Applications of derivative line-shape fitting to ellipsometric spectra of thin films of metal-substituted phthalocyanines Thin Solid Films. 205: 252-257. DOI: 10.1016/0040-6090(91)90310-T |
0.337 |
|
| 1990 |
Mårtensson J, Arwin H, Lundström I. Thin films of phthalocyanines studied with spectroscopic ellipsometry: an optical gas sensor? Sensors and Actuators B-Chemical. 1: 134-137. DOI: 10.1016/0925-4005(90)80188-6 |
0.554 |
|
| 1990 |
Mårtensson J, Arwin H. Optical characterization of thin films of some phthalocyanines by spectroscopic ellipsometry Thin Solid Films. 188: 181-192. DOI: 10.1016/0040-6090(90)90204-Q |
0.389 |
|
| 1989 |
Jansson R, Arwin H, Gustafsson G, Inganäs O. Thin films of poly(3-hexylthiophene) studied with spectroscopic ellipsometry Synthetic Metals. 28: 371-376. DOI: 10.1016/0379-6779(89)90548-1 |
0.531 |
|
| 1989 |
Jansson R, Arwin H, Armgarth M, Lundström I. Activation of hydrogen sensitive palladium-oxide-semiconductor structures studied with simultaneous ellipsometric and capacitance measurements Applied Surface Science. 37: 44-54. DOI: 10.1016/0169-4332(89)90972-0 |
0.483 |
|
| 1988 |
Arwin H, Lundström I. [33] Surface-oriented optical methods for biomedical analysis Methods in Enzymology. 137: 366-381. PMID 3374346 DOI: 10.1016/0076-6879(88)37035-7 |
0.542 |
|
| 1987 |
Welin S, Elwing H, Arwin H, Lundström I, Wikström M. The reflectomer: an instrument for studies of immunological and enzymatic reactions on solid surfaces Annals of the New York Academy of Sciences. 501: 560-561. DOI: 10.1111/J.1749-6632.1987.Tb45779.X |
0.454 |
|
| 1985 |
Arwin H, Lundström I. A reflectance method for quantification of immunological reactions on surfaces Analytical Biochemistry. 145: 106-112. PMID 2988365 DOI: 10.1016/0003-2697(85)90334-3 |
0.55 |
|
| 1985 |
Jansson R, Arwin H, Bjorklund R, Lundström I. Characterization and switching of thin poly-N- methylpyrrole films Thin Solid Films. 125: 205-211. DOI: 10.1016/0040-6090(85)90223-8 |
0.563 |
|
| 1984 |
Welin S, Elwing H, Arwin H, Lundström I, Wikström M. Reflectometry in kinetic studies of immunological and enzymatic reactions on solid surfaces Analytica Chimica Acta. 163: 263-267. DOI: 10.1016/S0003-2670(00)81516-0 |
0.529 |
|
| 1984 |
Arwin H, Lundström I. Adsorption of a tripeptide on platinum electrodes: II. Kinetics and isotherms Surface Science. 140: 339-354. DOI: 10.1016/0039-6028(84)90737-4 |
0.475 |
|
| 1984 |
Arwin H, Lundström I, Palmqvist A. Adsorption of a tripeptide on platinum electrodes. I. Ac admittance measurements Surface Science. 140: 321-338. DOI: 10.1016/0039-6028(84)90736-2 |
0.453 |
|
| 1983 |
Agner E, Claeson G, Palmqvist A, Arwin H, Lundström I. The electrode adsorption method for determination of enzyme activity: a study of substrate requirements. Journal of Biochemical and Biophysical Methods. 8: 69-83. PMID 6630870 DOI: 10.1016/0165-022X(83)90023-4 |
0.494 |
|
| 1982 |
Arwin H, Lundström I, Palmqvist A. Electrode adsorption method for determination of enzymatic activity Medical & Biological Engineering & Computing. 20: 362-374. PMID 7109733 DOI: 10.1007/Bf02442806 |
0.47 |
|
| 1982 |
Ericson T, Pruitt KM, Arwin H, Lundström I. Ellipsometric studies of film formation on tooth enamel and hydrophilic silicon surfaces. Acta Odontologica Scandinavica. 40: 197-201. PMID 6958164 DOI: 10.3109/00016358209019812 |
0.531 |
|
| 1980 |
Arwin H, Lundström I. Some different ways to use adsorption of molecules on electrodes to measure enzymatic activity Febs Letters. 109: 252-256. PMID 7353646 DOI: 10.1016/0014-5793(80)81098-2 |
0.475 |
|
| 1978 |
Claeson G, Ekenstam Ba, Aurell L, Arwin H, Lundström I. New Electric Method to Determine Enzymatic Activity. Determination of Antithrombin in Whole Blood Pathophysiology of Haemostasis and Thrombosis. 7: 135-136. PMID 658775 DOI: 10.1159/000214250 |
0.427 |
|
| 1976 |
Arwin H, Lundström I. Electric method for measurements of enzymatic activity Review of Scientific Instruments. 47: 1394-1396. PMID 981940 DOI: 10.1063/1.1134530 |
0.468 |
|
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