Year |
Citation |
Score |
2019 |
Chen Y, Tong SY, Kim JS, Kesmodel LL, Rodach T, Bohnen KP, Ho KM. Characterization of surface phonons on Cu(001) and Ag(001): First-principles phonon calculations with experimental and theoretical studies of high-resolution electron-energy-loss spectra. Physical Review. B, Condensed Matter. 44: 11394-11401. PMID 9999263 DOI: 10.1103/Physrevb.44.11394 |
0.357 |
|
2019 |
Chen Y, Wu ZQ, Xu ML, Tong SY, Ho K, Wang X. Characterization of surface and resonance phonons for the Ni(001)-c(2 x 2) system. Physical Review. B, Condensed Matter. 37: 9978-9984. PMID 9944422 DOI: 10.1103/Physrevb.37.9978 |
0.33 |
|
2016 |
Xu H, Dong L, Shi X, Liu Y, Hove MAV, Lin N, Tong SY. Observation and Analysis of Ordered and Disordered Structures on the ZnO(0001) Polar Surface Journal of Physical Chemistry C. 120: 26915-26921. DOI: 10.1021/Acs.Jpcc.6B09217 |
0.36 |
|
2013 |
Ng AMC, Dong L, Ho WK, Djurišić AB, Xie MH, Wu HS, Lin N, Tong SY. Recovery of clean ordered (1 1 1) surface of etched silicon Applied Surface Science. 282: 156-160. DOI: 10.1016/J.Apsusc.2013.05.092 |
0.325 |
|
2008 |
Gavaza GM, Yu ZX, Hove MAV, Tong SY. Theory of low-energy electron diffraction for nanomaterials?subclusters, automated searches Journal of Physics: Condensed Matter. 20: 304202. DOI: 10.1088/0953-8984/20/30/304202 |
0.339 |
|
2007 |
Gavaza GM, Yu ZX, Tsang L, Chan CH, Tong SY, Van Hove MA. Theory of low-energy electron diffraction for detailed structural determination of nanomaterials: Finite-size and disordered structures Physical Review B. 75. DOI: 10.1103/Physrevb.75.235403 |
0.313 |
|
2007 |
Wu H, Wang J, So R, Tong SY. Multi-slice finite difference method for full potential calculation of low energy electron diffraction spectra Journal of Physics: Condensed Matter. 19: 386203. DOI: 10.1088/0953-8984/19/38/386203 |
0.311 |
|
2007 |
Yu ZX, Hove MAV, Tong SY, Wisbey D, Losovyj YB, Wu N, Manno M, Wang L, Leighton C, Mei WN, Dowben PA. The structure of the CoS2 (100)-(1 ? 1) surface Journal of Physics: Condensed Matter. 19: 249001. DOI: 10.1088/0953-8984/19/24/249001 |
0.324 |
|
2006 |
Shi BM, Xie MH, Wu HS, Wang N, Tong SY. Transition between wurtzite and zinc-blende GaN: An effect of deposition condition of molecular-beam epitaxy Applied Physics Letters. 89: 151921. DOI: 10.1063/1.2360916 |
0.302 |
|
2005 |
Zhang RQ, Lifshitz Y, Ma DDD, Zhao YL, Frauenheim T, Lee ST, Tong SY. Structures and energetics of hydrogen-terminated silicon nanowire surfaces. Journal of Chemical Physics. 123: 144703-144703. PMID 16238412 DOI: 10.1063/1.2047555 |
0.346 |
|
2005 |
Liu Y, Xie MH, Cao YG, Wu HS, Tong SY. A study of InxGa1−xN growth by reflection high-energy electron diffraction Journal of Applied Physics. 97: 23502. DOI: 10.1063/1.1840101 |
0.349 |
|
2004 |
Xie MH, Zheng LX, Dai XQ, Wu HS, Tong SY. A model for GaN `ghost' islands Surface Science. 558: 195-200. DOI: 10.1016/J.Susc.2004.04.003 |
0.331 |
|
2002 |
Xie MH, Cheung SH, Zheng LX, Tong SY, Zhang BS, Yang H. GROWTH AND STRUCTURAL PROPERTIES OF GaN FILMS ON FLAT AND VICINAL SiC(0001) SUBSTRATES International Journal of Modern Physics B. 16: 165-172. DOI: 10.1142/S0217979202009603 |
0.305 |
|
2002 |
Tong SY, Wu H. Direct inversion of low-energy electron diffraction (LEED) IV spectra: the surface Patterson function* Journal of Physics: Condensed Matter. 14: 1231-1236. DOI: 10.1088/0953-8984/14/6/310 |
0.37 |
|
2001 |
Altman MS, Chung WF, He ZQ, Poon HC, Tong SY. Quantum size effect in low energy electron diffraction of thin films Applied Surface Science. 169: 82-87. DOI: 10.1016/S0169-4332(00)00644-9 |
0.348 |
|
2001 |
Zheng LX, Xie MH, Xu SJ, Cheung SH, Tong SY. Current-induced migration of surface adatoms during GaN growth by molecular beam epitaxy Journal of Crystal Growth. 227: 376-380. DOI: 10.1016/S0022-0248(01)00727-8 |
0.303 |
|
2000 |
Xie MH, Seutter SM, Zheng LX, Cheung SH, Ng YF, Wu H, Tong SY. Surface Morphology of GaN: Flat versus Vicinal Surfaces Mrs Internet Journal of Nitride Semiconductor Research. 5: 174-180. DOI: 10.1557/S1092578300004245 |
0.313 |
|
2000 |
Tong SY. Why is the positron an ideal particle for studying surface structure Surface Science. 457. DOI: 10.1016/S0039-6028(00)00469-6 |
0.384 |
|
1999 |
Xie MH, Seutter SM, Zheng LX, Cheung SH, Ng YF, Wu H, Tong SY. Surface morphology of GaN: Flat versus vicinal surfaces Mrs Proceedings. 595. DOI: 10.1557/Proc-595-F99W3.29 |
0.36 |
|
1999 |
Tong SY. Inversion of low-energy electron diffraction data with no pre-knowledge factor beyond optical holography Advances in Physics. 48: 135-165. DOI: 10.1080/000187399243473 |
0.393 |
|
1999 |
Tong SY. Advances in direct and diffraction methods for surface structural determination Surface Science. 433: 32-39. DOI: 10.1016/S0039-6028(99)00082-5 |
0.346 |
|
1998 |
Poon HC, Tong SY, Chung WF, Altman MS. Low Energy Electron Diffraction Analysis of Ultrathin Ag Films on W(110) Surface Review and Letters. 5: 1143-1149. DOI: 10.1142/S0218625X9800147X |
0.339 |
|
1998 |
Tong SY, Mok CW, Wu H, Xin LZ. Role of scattering-factor anisotropy in electron, positron, and photon holography Physical Review B. 58: 10815-10822. DOI: 10.1103/Physrevb.58.10815 |
0.325 |
|
1997 |
Tong SY, Chu TP, Wu H, Huang H. Low-Energy Electron Holograms: Properties And Method Of Inversion Surface Review and Letters. 4: 459-467. DOI: 10.1142/S0218625X97000444 |
0.32 |
|
1996 |
Giergiel J, Pang AW, Hopster H, Guo X, Tong SY, Weller D. Erratum: Surface structure of epitaxial Gd(0001) films on W(110) studied by quantitative LEED analysis Physical Review. B, Condensed Matter. 54: 17223. PMID 9985859 DOI: 10.1103/Physrevb.54.17223 |
0.307 |
|
1995 |
Giergiel J, Pang AW, Hopster H, Guo X, Tong SY, Weller D. Surface structure of epitaxial Gd(0001) films on W(110) studied by quantitative LEED analysis. Physical Review. B, Condensed Matter. 51: 10201-10204. PMID 9977704 DOI: 10.1103/Physrevb.51.10201 |
0.324 |
|
1995 |
Tobin JG, Waddill GD, Li H, Tong SY. Photoelectron diffraction imaging of a surface alloy Surface Science. 334: 263-275. DOI: 10.1016/0039-6028(95)00437-8 |
0.36 |
|
1994 |
Tong SY, Li H, Huang H. Surface Crystallography by Inverting Diffraction Spectra Surface Review and Letters. 1: 303-318. DOI: 10.1142/S0218625X9400031X |
0.358 |
|
1994 |
Zhao TC, Tong SY, Ignatiev A. Determination Of Linear-Chain Multiple Bound State Resonances In Reflection High-Energy Electron Diffraction Surface Review and Letters. 1: 261-271. DOI: 10.1142/S0218625X94000266 |
0.352 |
|
1994 |
Tong SY, Chen Y, Bohnen KP, Rodach T, Ho KM. The Structure And Lattice Dynamics Of Unreconstructed Fcc (001) And (111) Metal Surfaces Surface Review and Letters. 1: 97-107. DOI: 10.1142/S0218625X94000126 |
0.365 |
|
1994 |
Tong SY. Electron-diffraction for surface studies - the first 30 years Surface Science. 299: 358-374. DOI: 10.1016/0039-6028(94)90667-X |
0.361 |
|
1994 |
Over H, Gierer M, Bludau H, Ertl G, Tong SY. Fingerprinting technique in low-energy electron diffraction Surface Science. 314: 243-268. DOI: 10.1016/0039-6028(94)90010-8 |
0.579 |
|
1993 |
Tobin JG, Waddill GD, Li H, Tong SY. Imaging of a surface alloy with energy-dependent photoelectron holography. Physical Review Letters. 70: 4150-4153. PMID 10054059 DOI: 10.1103/Physrevlett.70.4150 |
0.36 |
|
1993 |
Over H, Huang H, Tong SY, Fan WC, Ignatiev A. Low-energy electron diffraction as a direct identification technique: Atomic structures of Ag- and Li-induced Si(111)-( sqrt 3 x sqrt 3 )R30 degrees. Physical Review. B, Condensed Matter. 48: 15353-15357. PMID 10008075 DOI: 10.1103/PHYSREVB.48.15353 |
0.509 |
|
1992 |
Tong SY, Huang H, Guo XQ. Low-energy electron and low-energy positron holography. Physical Review Letters. 69: 3654-3657. PMID 10046879 DOI: 10.1103/Physrevlett.69.3654 |
0.369 |
|
1992 |
Tong SY, Li H, Huang H. Principles of energy extension in electron-emission holography. Physical Review B. 46: 4155-4171. PMID 10004146 DOI: 10.1103/Physrevb.46.4155 |
0.344 |
|
1992 |
Wei CM, Tong SY. Direct atomic structure by holographic diffuse LEED Surface Science. 274. DOI: 10.1016/0039-6028(92)90828-T |
0.351 |
|
1991 |
Chen Y, Tong SY, Rocca M, Moretto P, Valbusa U, Bohnen KP, Ho KM. High-resolution electron energy-loss spectroscopy analysis of Ag(001): discovery of a new surface longitudinal mode using first-principles phonon calculations Surface Science. 250. DOI: 10.1016/0039-6028(91)90702-T |
0.382 |
|
1990 |
Erskine JL, Chen Y, Jeong EJ, Tong SY, Yater J. Detection of odd symmetry shear modes at metal surfaces by inelastic electron scattering: Experiment and theory Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 2649-2652. DOI: 10.1116/1.576687 |
0.367 |
|
1989 |
Bartynski RA, Heskett D, Garrison K, Watson G, Zehner DM, Mei WN, Tong SY, Pan X. The first interlayer spacing of Ta(100) determined by photoelectron diffraction Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 7: 1931-1936. DOI: 10.1116/1.575988 |
0.333 |
|
1989 |
Chen Y, Wu ZQ, Tong SY, Black JE. A comparison of green's function and slab methods of calculating surface vibration spectral densities: p(2 × 2)O on Ni(100) as an example Surface Science. 210: 271-281. DOI: 10.1016/0039-6028(89)90116-7 |
0.314 |
|
1988 |
Tong SY, Huang H, Wei CM, Packard WE, Men FK, Glander G, Webb MB. Low-energy electron diffraction analysis of the Si(111)7 X 7 structure Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 6: 615-624. DOI: 10.1116/1.575179 |
0.362 |
|
1988 |
Jamison KD, Zhou DN, Cohen PI, Zhao TC, Tong SY. Surface structure analysis using reflection high‐energy electron diffraction Journal of Vacuum Science and Technology. 6: 611-614. DOI: 10.1116/1.575178 |
0.392 |
|
1988 |
Huang H, Tong SY, Packard WE, Webb MB. Atomic geometry of Si(111) 7×7 by dynamical low-energy electron diffraction Physics Letters A. 130: 166-170. DOI: 10.1016/0375-9601(88)90422-7 |
0.335 |
|
1988 |
Tong SY, Zhao TC, Poon HC, Jamison KD, Zhou DN, Cohen PI. Multiple scattering analysis of reflection high-energy electron diffraction intensities from GaAs(110) Physics Letters A. 128: 447-450. DOI: 10.1016/0375-9601(88)90128-4 |
0.405 |
|
1988 |
Zhao TC, Tong SY. Dynamical calculation of RHEED rocking curves for Ag(001) and Pt(111) Ultramicroscopy. 26: 151-159. DOI: 10.1016/0304-3991(88)90387-7 |
0.306 |
|
1986 |
Poon HC, Snider D, Tong SY. Small-atom approximation in forward- and back-scattering photoelectron spectroscopies Physical Review B. 33: 2198-2206. DOI: 10.1103/Physrevb.33.2198 |
0.315 |
|
1986 |
Mills DL, Tong SY. Theoretical aspects of electron energy loss spectroscopy Philosophical Transactions of the Royal Society A. 318: 179-198. DOI: 10.1098/Rsta.1986.0070 |
0.352 |
|
1985 |
Nagano S, Tong SY. Multiple-scattering theory of low-energy electron diffraction for a nonspherical scattering potential. Physical Review B. 32: 6562-6570. PMID 9936761 DOI: 10.1103/Physrevb.32.6562 |
0.322 |
|
1985 |
Xu ML, Hall BM, Tong SY, Rocca M, Ibach H, Lehwald S, Black JE. Energy dependence of inelastic electron scattering cross section by surface vibrations: Experimental measurement and theoretical interpretation Physical Review Letters. 54: 1171-1174. DOI: 10.1103/Physrevlett.54.1171 |
0.342 |
|
1985 |
Puga MW, Xu G, Tong SY. The surface geometry of GaAs(110) Surface Science. 164. DOI: 10.1016/0167-2584(85)90561-4 |
0.364 |
|
1984 |
Tong SY, Mei WN, Xu G. The geometric structures of the GaAs(111) and (110) surfaces Journal of Vacuum Science & Technology B. 2: 393-398. DOI: 10.1116/1.582831 |
0.368 |
|
1984 |
Poon HC, Tong SY. Focusing and diffraction effects in angle-resolved x-ray photoelectron spectroscopy Physical Review B. 30: 6211-6213. DOI: 10.1103/Physrevb.30.6211 |
0.323 |
|
1984 |
Tong SY. Exploring surface structure Physics Today. 37: 50-59. DOI: 10.1063/1.2916351 |
0.321 |
|
1983 |
Hall BM, Tong SY, Mills DL. Large-angle electron-energy-loss spectroscopy with the inclusion of a surface image potential Physical Review Letters. 50: 1277-1280. DOI: 10.1103/Physrevlett.50.1277 |
0.363 |
|
1981 |
Hall BM, Tong SY. IMAGE POTENTIAL BARRIER FOR LARGE ANGLE INELASTIC ELECTRON SCATTERING FROM SURFACES Journal of Vacuum Science &Amp; Technology. 20: 578-579. DOI: 10.1116/1.571392 |
0.359 |
|
1981 |
Tong SY, Li CH. Diffraction effects in angle-resolved photoemission spectroscopy Critical Reviews in Solid State and Materials Sciences. 10: 209-231. DOI: 10.1080/10408438108243634 |
0.376 |
|
1979 |
Mrstik BJ, Tong SY, Hove MAV. Atomic structure of clean and arsenic-covered GaAs(110) surfaces Journal of Vacuum Science and Technology. 16: 1258-1261. DOI: 10.1116/1.570137 |
0.351 |
|
1978 |
Tong SY, Maldonado AL. The structure of Si(OOl) 2 × 1 surface - Studied by low energy electron diffraction Surface Science. 78: 459-466. DOI: 10.1016/0039-6028(78)90091-2 |
0.387 |
|
1977 |
Hove MAV, Tong SY, Elconin MH. Surface structure refinements of 2HMoS2, 2HNbSe2 and W(100)p(2 × 1)O via new reliability factors for surface crystallography Surface Science. 64: 85-95. DOI: 10.1016/0039-6028(77)90259-X |
0.304 |
|
1977 |
Mrstik BJ, Kaplan R, Reinecke TL, Hove MV, Tong SY. Determination of the surface structure of layered compounds by low-energy electron diffraction Il Nuovo Cimento B. 38: 387-395. DOI: 10.1007/Bf02723509 |
0.36 |
|
1976 |
Hove MAV, Tong SY. Surface structures of W(110) and W(100) faces by the dynamical LEED approach Surface Science. 54: 91-100. DOI: 10.1016/0039-6028(76)90090-X |
0.322 |
|
1976 |
Tong SY, Hove MAV. Layer iteration calculation of angle-resolved ultraviolet photoemission: c(2 × 2) oxygen overlayer on Ni(001) Solid State Communications. 19: 543-546. DOI: 10.1016/0038-1098(76)90062-4 |
0.339 |
|
1975 |
Tong SY. Theory of low-energy electron diffraction Progress in Surface Science. 7: 1-48. DOI: 10.1016/0079-6816(75)90010-6 |
0.313 |
|
1975 |
Tong SY. Layer iteration calculation of low-energy electron-diffraction by Beeby's multiple scattering method Solid State Communications. 16: 91-94. DOI: 10.1016/0038-1098(75)90797-8 |
0.331 |
|
1975 |
Mrstik BJ, Tong SY, Kaplan R, Ganguly AK. Accurate interpretation of LEED intensity spectra of a layered transition-metal dichalcogenide compound Solid State Communications. 17: 755-758. DOI: 10.1016/0038-1098(75)90402-0 |
0.333 |
|
1974 |
Ignatiev A, Rhodin TN, Tong SY. Low energy electron diffraction study of the krypton (111) surface Surface Science. 42: 37-49. DOI: 10.1016/0039-6028(74)90004-1 |
0.396 |
|
1973 |
Tong SY, Rhodin TN, Ignatiev A. Layer-dependent surface mean-square vibration amplitudes by low-energy-electron diffraction Physical Review B. 8: 906-913. DOI: 10.1103/Physrevb.8.906 |
0.353 |
|
1973 |
Tong SY, Rhodin TN, Tait RH. Application of the t-matrix perturbation method to the analysis of low-energy-electron-diffraction spectra for aluminum Physical Review B. 8: 430-440. DOI: 10.1103/Physrevb.8.430 |
0.312 |
|
1973 |
Tong SY, Rhodin TN, Tait RH. t-matrix approach in low-energy-electron diffraction Physical Review B. 8: 421-430. DOI: 10.1103/Physrevb.8.421 |
0.314 |
|
1973 |
Tong SY, Rhodin TN, Tait RH. t-Matrix formalism of low-energy electron-diffraction for clean and overlayer systems Surface Science. 34: 457-464. DOI: 10.1016/0039-6028(73)90130-1 |
0.304 |
|
1972 |
Ignatjevs A, Rhodin TN, Tong SY, Lundqvist BI, Pendry JB. LEED Thermal Scattering Studies of Xe (111) Surfaces Journal of Vacuum Science and Technology. 9: 720-720. DOI: 10.1116/1.1317761 |
0.305 |
|
1972 |
Tait RH, Tong SY, Rhodin TN. New perturbative approach to the application of low-energy electron diffraction-the t-matrix formalism Physical Review Letters. 28: 553-556. DOI: 10.1103/Physrevlett.28.553 |
0.303 |
|
1971 |
Tong SY, Rhodin TN. Interpretation of low-energy electron-diffraction spectra for a free-electron metal in terms of multiple scattering involving strong inelastic damping Physical Review Letters. 26: 711-715. DOI: 10.1103/Physrevlett.26.711 |
0.339 |
|
1971 |
Ignatjevs A, Rhodin TN, Tong SY, Lundqvist BI, Pendry JB. LEED spectra study of temperature effects in crystalline xenon surfaces Solid State Communications. 9: 1851-1855. DOI: 10.1016/0038-1098(71)90105-0 |
0.337 |
|
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