Year |
Citation |
Score |
2014 |
Kim C, Kim Y, Song C, Kim SS, Kim S, Kang HC, Hwu Y, Tsuei KD, Liang KS, Noh do Y. Resolution enhancement in coherent x-ray diffraction imaging by overcoming instrumental noise. Optics Express. 22: 29161-9. PMID 25402155 |
0.308 |
|
2013 |
Chien CC, Tseng PY, Chen HH, Hua TE, Chen ST, Chen YY, Leng WH, Wang CH, Hwu Y, Yin GC, Liang KS, Chen FR, Chu YS, Yeh HI, Yang YC, et al. Imaging cells and sub-cellular structures with ultrahigh resolution full-field X-ray microscopy. Biotechnology Advances. 31: 375-86. PMID 22546483 DOI: 10.1016/j.biotechadv.2012.04.005 |
0.313 |
|
2013 |
Lee CH, Liang KS, Chern MY. The structures of yttrium iron garnet/gadolinium gallium garnet superlattice thin films studied by synchrotron X-ray surface scattering Journal of the Chinese Chemical Society. 60: 870-876. DOI: 10.1002/jccs.201200602 |
0.374 |
|
2009 |
Liu DG, Chang CH, Liu CY, Chang SH, Juang JM, Song YF, Yu KL, Liao KF, Hwang CS, Fung HS, Tseng PC, Huang CY, Huang LJ, Chung SC, Tang MT, ... ... Liang KS, et al. A dedicated small-angle X-ray scattering beamline with a superconducting wiggler source at the NSRRC. Journal of Synchrotron Radiation. 16: 97-104. PMID 19096180 DOI: 10.1107/S0909049508034134 |
0.304 |
|
2008 |
Chu YS, Yi JM, De Carlo F, Shen Q, Lee W, Wu HJ, Wang CL, Wang JY, Liu CJ, Wang CH, Wu SR, Chien CC, Hwu Y, Tkachuk A, Yun W, ... ... Liang KS, et al. Hard-x-ray microscopy with Fresnel zone plates reaches 40nm Rayleigh resolution Applied Physics Letters. 92: 103119. DOI: 10.1063/1.2857476 |
0.31 |
|
2007 |
Song YF, Chang CH, Liu CY, Chang SH, Jeng US, Lai YH, Liu DG, Chung SC, Tsang KL, Yin GC, Lee JF, Sheu HS, Tang MT, Hwang CS, Hwu YK, ... Liang KS, et al. X-ray beamlines for structural studies at the NSRRC superconducting wavelength shifter. Journal of Synchrotron Radiation. 14: 320-5. PMID 17587656 DOI: 10.1107/S0909049507021516 |
0.384 |
|
2007 |
Liu W, Hsieh WF, Hsu C, Liang KS, Chien FS. Threading dislocations in domain-matching epitaxial films of ZnO Journal of Applied Crystallography. 40: 924-930. DOI: 10.1107/S0021889807033997 |
0.322 |
|
2007 |
Yin G, Chen F, Hwu Y, Shieh HD, Liang KS. Quantitative phase retrieval in transmission hard x-ray microscope Applied Physics Letters. 90: 181118. DOI: 10.1063/1.2724066 |
0.311 |
|
2005 |
Tang M, Song Y, Yin G, Lee T, Ko C, Tsang K, Liang KS. X-ray Microscopy Project at NSRRC Acta Crystallographica Section a Foundations of Crystallography. 61: c117-c117. DOI: 10.1107/S0108767305095073 |
0.317 |
|
2005 |
Hsu C, Jeng U, Lee H, Huang C, Liang K, Windover D, Lu T, Jin C. Structural study of a low dielectric thin film using X-ray reflectivity and grazing incidence small angle X-ray scattering Thin Solid Films. 472: 323-327. DOI: 10.1016/J.TSF.2004.07.062 |
0.412 |
|
2005 |
Lai Y, Sun Y, Jeng U, Huang Y, Song Y, Dronyak R, Tsang K, Liang K. A new small angle X-ray scattering station at NSRRC Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions With Materials and Atoms. 238: 205-213. DOI: 10.1016/J.NIMB.2005.06.050 |
0.318 |
|
2003 |
Lee HH, Jang HW, Kim DH, Noh DY, Yi MS, Tang M, Liang KS. Structural characterization of InGaN thin films and multiple quantum wells: An approach of combining various X-ray scattering methods Physica B: Condensed Matter. 336: 109-117. DOI: 10.1016/S0921-4526(03)00278-3 |
0.37 |
|
2002 |
Lee H, Chang W, Hsu C, Liang K, Lee J, Juang J, Wu K, Uen T, Gou Y. X-Ray scattering study of crystallization behavior in homoepitaxial growth of SrTiO3 films Thin Solid Films. 418: 163-168. DOI: 10.1016/S0040-6090(02)00770-8 |
0.336 |
|
2000 |
Hsu C, Lee H, Liang K, Jeng U, Windover D, Lu T, Jin C. Grazing Incidence Small Angle X-Ray Scattering Study on Low Dielectric Thin Films Mrs Proceedings. 612. DOI: 10.1557/PROC-612-D5.23.1 |
0.335 |
|
2000 |
Lee H, Liang KS, Lee C, Wu T. Real-time x-ray scattering study of growth behavior of sputter-deposited LaNiO3 thin films on Si substrates Journal of Materials Research. 15: 2606-2611. DOI: 10.1557/JMR.2000.0374 |
0.356 |
|
1999 |
Lee H, Lee C, Liang KS, Wu T. Real-time x-ray scattering study of sputter-deposited LaNiO3 thin films on Si substrates Mrs Proceedings. 569. DOI: 10.1557/PROC-569-153 |
0.358 |
|
1998 |
Lee C, Lee H, Liang K, Wu T. In situ fixed angle X-ray reflectivity study of sputter-deposited amorphous LaNiO3 thin film on Si substrate Physica B: Condensed Matter. 248: 109-114. DOI: 10.1016/S0921-4526(98)00213-0 |
0.321 |
|
1997 |
Je JH, Noh DY, Kim HK, Liang KS. The crossover of preferred orientation in TiN film growth: A real time x-ray scattering study Journal of Materials Research. 12: 9-12. DOI: 10.1557/JMR.1997.0003 |
0.325 |
|
1997 |
Fenter P, Eberhardt A, Liang KS, Eisenberger P. Epitaxy and chainlength dependent strain in self-assembled monolayers Journal of Chemical Physics. 106: 1600-1608. DOI: 10.1063/1.473281 |
0.663 |
|
1997 |
Je JH, Noh DY, Kim HK, Liang KS. Preferred orientation of TiN films studied by a real time synchrotron x-ray scattering Journal of Applied Physics. 81: 6126-6133. DOI: 10.1063/1.364394 |
0.357 |
|
1996 |
Fenter P, Eisenberger P, Burrows P, Forrest SR, Liang KS. Epitaxy at the organic-inorganic interface Physica B: Condensed Matter. 221: 145-151. DOI: 10.1016/0921-4526(95)00917-5 |
0.61 |
|
1995 |
Koltover I, Idziak SHJ, Safinya CR, Steinberg S, Israelachvili JN, Liang KS. Application of the X-ray surface forces apparatus (XSFA) to studies of confined complex fluid systems Materials Research Society Symposium - Proceedings. 366: 101-112. DOI: 10.1557/Proc-366-101 |
0.304 |
|
1995 |
Li J, Liang KS, Camillone N, Leung TYB, Scoles G. The structure of n‐octadecane thiol monolayers self‐assembled on Au(001) studied by synchrotron x‐ray and helium atom diffraction Journal of Chemical Physics. 102: 5012-5028. DOI: 10.1063/1.469551 |
0.486 |
|
1995 |
Liang KS, Li J, Scoles G, Ulman A. Counterion overlayers at the interface between an electrolyte and an ω-functionalized monolayer self-assembled on gold. An X-ray reflectivity study Langmuir. 11: 4418-4427. |
0.52 |
|
1993 |
Huang H, Chang SL, Liang KS. A dynamical effect of crystal truncation rod and its application to X-ray study of Cu3Au (001) surface Acta Crystallographica Section a Foundations of Crystallography. 49: c311-c312. DOI: 10.1107/S0108767378091333 |
0.371 |
|
1993 |
Liang KS. Self-assembled monolayers on crystal surfaces studied by surface X-ray scattering Acta Crystallographica Section a Foundations of Crystallography. 49: c323-c323. DOI: 10.1107/S0108767378090996 |
0.504 |
|
1993 |
Camillone N, Chidsey CED, Eisenberger P, Fenter P, Li J, Liang KS, Liu GY, Scoles G. Structural defects in self-assembled organic monolayers via combined atomic beam and x-ray diffraction The Journal of Chemical Physics. 99: 744-747. |
0.665 |
|
1992 |
Lee C, Liang K. X-ray studies of misfit dislocations in the interface of epitaxial Nb films on sapphire Acta Metallurgica Et Materialia. 40: S143-S147. DOI: 10.1016/0956-7151(92)90274-I |
0.373 |
|
1991 |
Liang KS, Lee CH. Pinning of Misfit Dislocations in film Growth Studied by Grazing Incidence X-ray Scattering Mrs Proceedings. 237. DOI: 10.1557/PROC-237-375 |
0.373 |
|
1991 |
Fenter P, Li J, Eisenberger p, Ramanarayanan TA, Liang KS. A Grazing Incidence X-Ray Diffraction Study of Self-Assembled Monolayers Mrs Proceedings. 237: 291. DOI: 10.1557/Proc-237-291 |
0.683 |
|
1991 |
Fenter P, Eisenberger P, Li J, Camillone N, Bernasek S, Scoles G, Ramanarayanan TA, Liang KS. Structure of octadecyl thiol self-assembled on the silver(111) surface: an incommensurate monolayer Langmuir. 7: 2013-2016. DOI: 10.1021/La00058A008 |
0.662 |
|
1991 |
Liang KS, Chien FZ, Hughes GJ, Meitzner GD, Sinfelt JH. The nature of rhenium in silica-supported platinum rhenium clusters: synchrotron x-ray diffraction studies The Journal of Physical Chemistry. 95: 9974-9979. DOI: 10.1021/J100177A067 |
0.315 |
|
1990 |
Lee CH, Liang KS, Shieu FS, Sass SL, Flynn CP. Interface structure of epitaxial Nb films on sapphire: grazing incidence X-ray diffraction and X-ray reflectivity studies Mrs Proceedings. 209: 679. DOI: 10.1557/Proc-209-679 |
0.442 |
|
1990 |
Hung HH, Liang KS, Lee CH, Lu T. Microstructure of Epitaxial Al(111)/Si(111) Films Studied by Synchrotron Grazing Incidence X-Ray Diffraction Mrs Proceedings. 202. DOI: 10.1557/PROC-202-301 |
0.309 |
|
1990 |
NEWSAM JM, KING HEJ, LIANG KS. ChemInform Abstract: X-Ray Diffraction Using Synchrotron Radiation: A Catalysis Perspective Cheminform. 21. DOI: 10.1002/CHIN.199042341 |
0.33 |
|
1989 |
Shen Y, Safinya CR, Fetters L, Adam M, Witten T, Liang KS, Chance R, Stokes J. X-Ray Diffraction Studies of Zwitterionic Associating Polymers Mrs Proceedings. 177. DOI: 10.1557/Proc-177-27 |
0.336 |
|
1988 |
Newsam JM, King HE, Liang KS. X-Ray Diffraction Using Synchrotron Radiation - A Catalysis Perspective Advances in X-Ray Analysis. 32: 9-20. DOI: 10.1154/S0376030800020231 |
0.354 |
|
1986 |
Liang KS, Eisenberger P. Grazing Incidence X-Ray Scattering Study of Surface Defects Mrs Proceedings. 82. DOI: 10.1557/PROC-82-493 |
0.567 |
|
1980 |
Liang KS, deNaufville JP, Jacobson AJ, Chianelli RR, Betts F. Structure of amorphous transition metal sulfides Journal of Non-Crystalline Solids. 35: 1249-1254. DOI: 10.1016/0022-3093(80)90369-5 |
0.377 |
|
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