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Thomas A. Germer - Publications

Affiliations: 
National Institute of Standards and Technology, Gaithersburg, MD, United States 
Area:
Optical scatter, polarization
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Year Citation  Score
2022 Chue-Sang J, Litorja M, Goldfain AM, Germer TA. Spatial frequency domain Mueller matrix imaging. Journal of Biomedical Optics. 27: 126003. PMID 36530345 DOI: 10.1117/1.JBO.27.12.126003  0.659
2022 Lemaillet P, Patrick HJ, Germer TA, Hanssen L, Johnson BC, Georgiev GT. Goniometric and hemispherical reflectance and transmittance measurements of fused silica diffusers. Proceedings of Spie--the International Society For Optical Engineering. 9961. PMID 35527792 DOI: 10.1117/12.2237975  0.72
2021 Patrick HJ, Cooksey CC, Germer TA, Nadal ME, Zarobila CJ. Bidirectional reflectance capabilities of the NIST Robotic Optical Scattering Instrument. Applied Optics. 60: 8774-8786. PMID 34613103 DOI: 10.1364/AO.435117  0.711
2020 Germer TA. Scattering mechanism for quadratic evolution of depolarization. Optics Letters. 45: 483-486. PMID 33223583  0.707
2020 Sparks WB, Parenteau MN, Blankenship RE, Germer TA, Patty CHL, Bott KM, Telesco CM, Meadows VS. Spectropolarimetry of Primitive Phototrophs as Global Surface Biosignatures. Astrobiology. PMID 33216615 DOI: 10.1089/ast.2020.2272  0.695
2020 Fischbach W, Germer T, Langer F, Mössner J. Coagulation Disorders: Manifestations in the Gastrointestinal Tract. Visceral Medicine. 36: 288-291. PMID 33005654 DOI: 10.1159/000509888  0.623
2020 Germer TA. Evolution of transmitted depolarization in diffusely scattering media. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 37: 980-987. PMID 32543599 DOI: 10.1364/Josaa.390598  0.73
2020 Smestad GP, Germer TA, Alrashidi H, Fernández EF, Dey S, Brahma H, Sarmah N, Ghosh A, Sellami N, Hassan IAI, Desouky M, Kasry A, Pesala B, Sundaram S, Almonacid F, et al. Modelling photovoltaic soiling losses through optical characterization. Scientific Reports. 10: 58. PMID 31919401 DOI: 10.1038/S41598-019-56868-Z  0.695
2020 Germer TA. Scattering mechanism for quadratic evolution of depolarization Optics Letters. 45: 483. DOI: 10.1364/Ol.383215  0.37
2019 Sparks WB, Germer TA, Sparks RM. Classical polarimetry with a twist: a compact, geometric approach. Publications of the Astronomical Society of the Pacific. Astronomical Society of the Pacific. 131. PMID 31579323 DOI: 10.1088/1538-3873/Ab1933  0.701
2019 Angelo JP, Germer TA, Litorja M. Structured illumination Mueller matrix imaging. Biomedical Optics Express. 10: 2861-2868. PMID 31259056 DOI: 10.1364/Boe.10.002861  0.729
2019 Castagna A, Carol Johnson B, Voss K, Dierssen HM, Patrick H, Germer TA, Sabbe K, Vyverman W. Uncertainty in global downwelling plane irradiance estimates from sintered polytetrafluoroethylene plaque radiance measurements. Applied Optics. 58: 4497-4511. PMID 31251264 DOI: 10.1364/Ao.58.004497  0.713
2018 Roccapriore KM, Lyvers DP, Brown DP, Poutrina E, Urbas AM, Germer TA, Drachev VP. Waveguide coupling via magnetic gratings with effective strips. Applied Sciences (Basel, Switzerland). 8. PMID 31275624 DOI: 10.3390/App8040617  0.724
2018 Patty CHL, Luo DA, Snik F, Ariese F, Buma WJ, Ten Kate IL, van Spanning RJM, Sparks WB, Germer TA, Garab G, Kudenov MW. Imaging linear and circular polarization features in leaves with complete Mueller matrix polarimetry. Biochimica Et Biophysica Acta. PMID 29526506 DOI: 10.1016/J.Bbagen.2018.03.005  0.714
2017 Fischer G, Drahi E, Foldyna M, Germer TA, Johnson EV. Plasma nanotexturing of silicon surfaces for photovoltaics applications: influence of initial surface finish on the evolution of topographical and optical properties. Optics Express. 25: A1057-A1071. PMID 29220984 DOI: 10.1364/Oe.25.0A1057  0.722
2017 Germer TA. Full four-dimensional and reciprocal Mueller matrix bidirectional reflectance distribution function of sintered polytetrafluoroethylene. Applied Optics. 56: 9333-9340. PMID 29216106 DOI: 10.1364/Ao.56.009333  0.75
2017 Germer TA, Sharma KA, Brown TG, Oliver JB. Polarized optical scattering by inhomogeneities and surface roughness in an anisotropic thin film. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 34: 1974-1984. PMID 29091646 DOI: 10.1364/Josaa.34.001974  0.728
2017 Liman CD, Germer TA, Sunday DF, DeLongchamp DM, Kline RJ. Modeling the polarized X-ray scattering from periodic nanostructures with molecular anisotropy Journal of Applied Crystallography. 50: 1677-1690. DOI: 10.1107/S160057671701408X  0.409
2016 Germer TA. Bidirectional scattering distribution function measurements from volume diffusers: correction factors and associated uncertainties. Applied Optics. 55: 6978-82. PMID 27607273 DOI: 10.1364/Ao.55.006978  0.724
2016 Patrick HJ, Germer TA, Zarobila CJ, Cooksey CC, Yoon HW. Optical reflectance of pyrheliometer absorption cavities: progress toward SI-traceable measurements of solar irradiance. Applied Optics. 55: 6346-54. PMID 27534478 DOI: 10.1364/Ao.55.006346  0.726
2016 Sharma KA, Germer TA, Smith C, Zuegel J, Oliver JB, Brown TG. Scattered-Light Analysis of Birefringent Coatings for Distributed Polarization Rotators Frontiers in Optics. DOI: 10.1364/Fio.2016.Jw4A.48  0.388
2016 Lemaillet P, Patrick HJ, Germer TA, Hanssen L, Johnson BC, Georgiev GT. Goniometric and hemispherical reflectance and transmittance measurements of fused silica diffusers Proceedings of Spie. 9961: 996109. DOI: 10.1117/12.2237975  0.404
2016 Germer TA, Foldyna M, Mrazkova Z, Fischer G, Drahi E. Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces Proceedings of Spie. 9961: 996107. DOI: 10.1117/12.2236976  0.412
2014 Tarrio CS, Grantham SE, Germer TA, Rife JC, Lucatorto TB, Kriese M, Platonov Y, Jiang L, Rodriguez J. Improved measurement capabilities at the NIST EUV reflectometry facility Proceedings of Spie. 9048. DOI: 10.1117/12.2046290  0.334
2014 Germer TA, Stover JC, Schröder S. Angle-Resolved Diffuse Reflectance and Transmittance Experimental Methods in the Physical Sciences. 46: 291-331. DOI: 10.1016/B978-0-12-386022-4.00008-X  0.38
2014 Gaertner AA, Yoon HW, Germer TA. Chapter 3 - Dispersive Methods Experimental Methods in the Physical Sciences. 46: 67-95. DOI: 10.1016/B978-0-12-386022-4.00003-0  0.329
2014 Germer TA, Zwinkels JC, Tsai BK. Theoretical Concepts in Spectrophotometric Measurements Experimental Methods in the Physical Sciences. 46: 12-66. DOI: 10.1016/B978-0-12-386022-4.00002-9  0.437
2013 Patrick HJ, Zarobila CJ, Germer TA. The NIST Robotic Optical Scatter Instrument (ROSI) and its application to BRDF measurements of diffuse reflectance standards for remote sensing Proceedings of Spie. 8866: 886615. DOI: 10.1117/12.2023095  0.405
2013 Lemaillet P, Germer TA, Kline RJ, Sunday DF, Wang C, Wu W. Intercomparison between optical and x-ray scatterometry measurements of FinFET structures Proceedings of Spie. 8681. DOI: 10.1117/12.2011144  0.33
2012 Lee JH, Ro HW, Huang R, Lemaillet P, Germer TA, Soles CL, Stafford CM. Anisotropic, hierarchical surface patterns via surface wrinkling of nanopatterned polymer films. Nano Letters. 12: 5995-9. PMID 23088734 DOI: 10.1021/Nl303512D  0.71
2012 Ghassemi P, Lemaillet P, Germer TA, Shupp JW, Venna SS, Boisvert ME, Flanagan KE, Jordan MH, Ramella-Roman JC. Out-of-plane Stokes imaging polarimeter for early skin cancer diagnosis. Journal of Biomedical Optics. 17: 076014. PMID 22894497 DOI: 10.1117/1.Jbo.17.7.076014  0.709
2012 Sparks W, Germer TA, MacKenty JW, Snik F. Compact and robust method for full Stokes spectropolarimetry. Applied Optics. 51: 5495-511. PMID 22859040 DOI: 10.1364/Ao.51.005495  0.716
2012 Germer TA. Realizable differential matrices for depolarizing media. Optics Letters. 37: 921-3. PMID 22378439 DOI: 10.1364/Ol.37.000921  0.678
2012 Germer TA. Large-Angle in-Plane Light Scattering from Rough Surfaces: Comment. Applied Optics. 40: 5708-10. PMID 18364859 DOI: 10.1364/Ao.40.005708  0.414
2012 Sung L, Mulholland GW, Germer TA. Polarized light-scattering measurements of dielectric spheres upon a silicon surface. Optics Letters. 24: 866-8. PMID 18073878 DOI: 10.1364/Ol.24.000866  0.676
2012 Stover JC, Schröder S, Germer TA. Upper roughness limitations on the TIS/RMS relationship Proceedings of Spie. 8495: 849503. DOI: 10.1117/12.930770  0.406
2012 Patrick HJ, Zarobila CJ, Germer TA, Ying VA, Cooksey CA, Tsai BK. Tunable supercontinuum fiber laser source for BRDF measurements in the STARR II gonioreflectometer Proceedings of Spie. 8495. DOI: 10.1117/12.930742  0.356
2012 Patrick HJ, Hanssen LM, Zeng J, Germer TA. BRDF measurements of graphite used in high-temperature fixed point blackbody radiators: a multi-angle study at 405 nm and 658 nm Metrologia. 49: S81-S92. DOI: 10.1088/0026-1394/49/2/S81  0.398
2012 Sparks W, Hough JH, Germer TA, Robb F, Kolokolova L. Remote sensing of chiral signatures on Mars Planetary and Space Science. 72: 111-115. DOI: 10.1016/J.Pss.2012.08.010  0.316
2011 Germer TA, Patrick HJ. Mueller matrix bidirectional reflectance distribution function measurements and modeling of diffuse reflectance standards Proceedings of Spie - the International Society For Optical Engineering. 8160. DOI: 10.1117/12.892713  0.328
2011 Foldyna M, Germer TA, Bergner BC, Dixson RG. Generalized ellipsometry of artificially designed line width roughness Thin Solid Films. 519: 2633-2636. DOI: 10.1016/J.Tsf.2010.11.085  0.314
2010 Bergner BC, Germer TA, Suleski TJ. Effective medium approximations for modeling optical reflectance from gratings with rough edges. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 27: 1083-90. PMID 20448775 DOI: 10.1364/Josaa.27.001083  0.715
2010 Germer TA, Patrick HJ. Effect of bandwidth and numerical aperture in optical scatterometry Proceedings of Spie. 7638. DOI: 10.1117/12.846776  0.312
2010 Martin WE, Hesse E, Hough JH, Sparks WB, Cockell CS, Ulanowski Z, Germer TA, Kaye PH. Polarized optical scattering signatures from biological materials Journal of Quantitative Spectroscopy and Radiative Transfer. 111: 2444-2459. DOI: 10.1016/J.Jqsrt.2010.07.001  0.422
2009 Sparks WB, Hough J, Germer TA, Chen F, DasSarma S, DasSarma P, Robb FT, Manset N, Kolokolova L, Reid N, Macchetto FD, Martin W. Detection of circular polarization in light scattered from photosynthetic microbes. Proceedings of the National Academy of Sciences of the United States of America. 106: 7816-21. PMID 19416893 DOI: 10.1073/Pnas.0810215106  0.731
2009 Marx E, Germer TA, Vorburger TV, Park BC. Angular distribution of light scattered from a sinusoidal grating. Applied Optics. 39: 4473-85. PMID 18350034 DOI: 10.1364/Ao.39.004473  0.426
2009 Wang B, Sparks WB, Germer TA, Leadbetter A. A spectroscopic polarimeter for detecting chiral signatures in astrobiological samples Proceedings of Spie. 7441: 744108. DOI: 10.1117/12.826378  0.349
2009 Silver RM, Zhang NF, Barnes BM, Zhou H, Heckert A, Dixson R, Germer TA, Bunday B. Improving optical measurement accuracy using multi-technique nested uncertainties 7272-02 Proceedings of Spie - the International Society For Optical Engineering. 7272. DOI: 10.1117/12.816569  0.304
2009 Patrick HJ, Germer TA, Ding Y, Ro HW, Richter LJ, Soles CL. In situ measurement of annealing-induced line shape evolution in nanoimprinted polymers using scatterometry Proceedings of Spie - the International Society For Optical Engineering. 7271. DOI: 10.1117/12.815360  0.649
2009 Germer TA, Patrick HJ, Silver RM, Bunday B. Developing an uncertainty analysis for optical scatterometry Proceedings of Spie. 7272. DOI: 10.1117/12.814835  0.321
2009 Bergner BC, Germer TA, Suleski TJ. Effect of line-width roughness on optical scatterometry measurements Proceedings of Spie. 7272. DOI: 10.1117/12.813770  0.321
2009 Sparks WB, Hough J, Germer TA, Chen F, DasSarma S, DasSarma P, Robb FT, Manset N, Kolokolova L, Reid N, Macchetto FD, Martin W. Detection of circular polarization in light scattered from photosynthetic microbes (Proceedings of the National Academy of Sciences of the United States of America (2009) 106, 19, (7816-7821) 10.1073/pnas.0810215106) Proceedings of the National Academy of Sciences of the United States of America. 106: 10871. DOI: 10.1073/Pnas.0905400106  0.36
2009 Sparks WB, Hough JH, Kolokolova L, Germer TA, Chen F, DasSarma S, DasSarma P, Robb FT, Manset N, Reid IN, Macchetto FD, Martin W. Circular polarization in scattered light as a possible biomarker Journal of Quantitative Spectroscopy and Radiative Transfer. 110: 1771-1779. DOI: 10.1016/J.Jqsrt.2009.02.028  0.397
2008 Attota R, Germer TA, Silver RM. Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysis. Optics Letters. 33: 1990-2. PMID 18758588 DOI: 10.1364/Ol.33.001990  0.702
2008 Germer TA, Wolters C, Brayton D. Calibration of wafer surface inspection systems using spherical silica nanoparticles Optics Express. 16: 4698-4705. PMID 18542566 DOI: 10.1364/Oe.16.004698  0.729
2008 Kenyon E, Cresswell MW, Patrick HJ, Germer TA. Modeling the effect of finite size gratings on scatterometry measurements Proceedings of Spie. 6922. DOI: 10.1117/12.772769  0.388
2008 Patrick HJ, Attota R, Barnes BM, Germer TA, Dixson RG, Stocker MT, Silver RM, Bishop MR. Optical critical dimension measurement of silicon grating targets using back focal plane scatterfield microscopy Journal of Micro/Nanolithography, Mems, and Moems. 7. DOI: 10.1117/1.2885275  0.359
2008 Patrick HJ, Germer TA, Ding Y, Ro HW, Richter LJ, Soles CL. Scatterometry for in situ measurement of pattern reflow in nanoimprinted polymers Applied Physics Letters. 93. DOI: 10.1063/1.3046117  0.655
2007 Ding Y, Ro HW, Germer TA, Douglas JF, Okerberg BC, Karim A, Soles CL. Relaxation behavior of polymer structures fabricated by nanoimprint lithography. Acs Nano. 1: 84-92. PMID 19206524 DOI: 10.1021/Nn700014P  0.701
2007 Boulbry B, Ramella-Roman JC, Germer TA. Improved method for calibrating a Stokes polarimeter. Applied Optics. 46: 8533-41. PMID 18071386 DOI: 10.1364/Ao.46.008533  0.721
2007 Germer TA. Effect of line and trench profile variation on specular and diffuse reflectance from a periodic structure. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 24: 696-701. PMID 17301859 DOI: 10.1364/Josaa.24.000696  0.699
2007 Boulbry B, Ramella-Roman JC, Germer TA. Truncated singular value decomposition method for calibrating a Stokes Polarimeter Proceedings of Spie - the International Society For Optical Engineering. 6682. DOI: 10.1117/12.734452  0.368
2007 Patrick HJ, Germer TA. Progress toward traceable nanoscale optical critical dimension metrology for semiconductors Proceedings of Spie. 6672. DOI: 10.1117/12.734080  0.384
2007 Silver R, Germer T, Attota R, Barnes BM, Bunday B, Allgair J, Marx E, Jun J. Fundamental limits of optical critical dimension metrology: A simulation study Proceedings of Spie - the International Society For Optical Engineering. 6518. DOI: 10.1117/12.716604  0.343
2007 Germer TA. Modeling the Effect of Line Profile Variation on Optical Critical Dimension Metrology Proceedings of Spie. 6518. DOI: 10.1117/12.704246  0.32
2006 Dyer SD, Dennis T, Street LK, Etzel SM, Germer TA, Dienstfrey A. Spectroscopic phase-dispersion optical coherence tomography measurements of scattering phantoms. Optics Express. 14: 8138-53. PMID 19529186 DOI: 10.1364/Oe.14.008138  0.743
2006 Dyer SD, Dennis T, Williams PA, Street LK, Etzel SM, Joseph Espejo R, Germer TA, Milner TE. High sensitivity measurements of the scattering dispersion of phantoms using spectral domain optical coherence tomography Proceedings of Spie - the International Society For Optical Engineering. 6079. DOI: 10.1117/12.649180  0.407
2006 Boulbry B, Germer TA, Ramella-Roman JC. A novel hemispherical spectro-polarimetric scattering instrument for skin lesion imaging Progress in Biomedical Optics and Imaging - Proceedings of Spie. 6078. DOI: 10.1117/12.648164  0.363
2005 Ramella-Roman JC, Duncan D, Germer TA. Out-of-plane polarimetric imaging of skin: Surface and subsurface effects Progress in Biomedical Optics and Imaging - Proceedings of Spie. 5686: 142-153. DOI: 10.1117/12.592399  0.352
2005 Germer TA, Mulholland GW. Particle Size Metrology: Comparison Between Aerosol Electrical Mobility and Laser Surface Light Scattering Techniques Characterization and Metrology For Ulsi Technology. 788: 579-583. DOI: 10.1063/1.2063021  0.63
2004 Germer TA, Marx E. Ray model of light scattering by flake pigments or rough surfaces with smooth transparent coatings. Applied Optics. 43: 1266-74. PMID 15008529 DOI: 10.1364/Ao.43.001266  0.746
2004 Kim JH, Ehrman SH, Mulholland GW, Germer TA. Polarized light scattering by dielectric and metallic spheres on oxidized silicon surfaces. Applied Optics. 43: 585-91. PMID 14765917 DOI: 10.1364/Ao.43.000585  0.793
2004 Kim JH, Ehrman SH, Germer TA. Influence of particle oxide coating on light scattering by submicron metal particles on silicon wafers Applied Physics Letters. 84: 1278-1280. DOI: 10.1063/1.1650555  0.759
2003 Kim JH, Babushok VI, Germer TA, Mulholland GW, Ehrman SH. Cosolvent-assisted spray pyrolysis for the generation of metal particles Journal of Materials Research. 18: 1614-1622. DOI: 10.1557/Jmr.2003.0222  0.753
2002 Germer TA. Light scattering by slightly nonspherical particles on surfaces. Optics Letters. 27: 1159-61. PMID 18026393 DOI: 10.1364/Ol.27.001159  0.724
2002 Kim JH, Ehrman SH, Mulholland GW, Germer TA. Polarized light scattering by dielectric and metallic spheres on silicon wafers. Applied Optics. 41: 5405-12. PMID 12211571 DOI: 10.1364/Ao.41.005405  0.791
2002 Kim J, Germer T, Mulholland G, Ehrman S. Size-Monodisperse Metal Nanoparticles via Hydrogen-Free Spray Pyrolysis Advanced Materials. 14: 518-521. DOI: 10.1002/1521-4095(20020404)14:7<518::Aid-Adma518>3.0.Co;2-P  0.745
2001 Germer TA. Polarized light scattering by microroughness and small defects in dielectric layers. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 18: 1279-88. PMID 11393621 DOI: 10.1364/Josaa.18.001279  0.426
2000 Germer TA. Measurement of roughness of two interfaces of a dielectric film by scattering ellipsometry Physical Review Letters. 85: 349-352. PMID 10991280 DOI: 10.1103/Physrevlett.85.349  0.408
2000 Shaw P, Gupta R, Germer TA, Arp U, Lucatorto TB, Lykke KR. Characterization of materials using an ultraviolet radiometric beamline at SURF III Metrologia. 37: 551-554. DOI: 10.1088/0026-1394/37/5/47  0.348
1999 Germer TA, Asmail CC. Polarization of light scattered by microrough surfaces and subsurface defects Journal of the Optical Society of America a-Optics Image Science and Vision. 16: 1326-1332. DOI: 10.1364/Josaa.16.001326  0.437
1999 Germer TA, Asmail CC. Goniometric Optical Scatter Instrument for Out-of-Plane Ellipsometry Measurements Review of Scientific Instruments. 70: 3688-3695. DOI: 10.1063/1.1149950  0.415
1998 Germer TA, Scheer BW. Polarization of out-of-plane optical scatter from SiO2 films grown on photolithographically-generated microrough silicon Proceedings of Spie - the International Society For Optical Engineering. 3426: 160-168. DOI: 10.1117/12.328451  0.339
1998 Germer TA. Application of bidirectional ellipsometry to the characterization of roughness and defects in dielectric layers High-Power Lasers and Applications. 3275: 121-131. DOI: 10.1117/12.304397  0.422
1998 Kelley EF, Jones GR, Germer TA. Display reflectance model based on the BRDF Displays. 19: 27-34. DOI: 10.1016/S0141-9382(98)00028-6  0.338
1997 Germer TA, Asmail CC, Scheer BW. Polarization of out-of-plane scattering from microrough silicon. Optics Letters. 22: 1284-6. PMID 18188214 DOI: 10.1364/Ol.22.001284  0.431
1997 Germer TA. Angular dependence and polarization of out-of-plane optical scattering from particulate contamination, subsurface defects, and surface microroughness Applied Optics. 36: 8798. DOI: 10.1364/Ao.36.008798  0.435
1997 Germer TA, Kołasin-acuteski KW, Stephenson JC, Richter LJ. Depletion-electric-field-induced second-harmonic generation near oxidized GaAs(001) surfaces Physical Review B. 55: 10694-10706. DOI: 10.1103/Physrevb.55.10694  0.643
1995 Cavanagh RR, Germer TA, Stephenson JC. Ultrafast time-resolved infrared probing of energy transfer at surfaces Vibrational Spectroscopy. 9: 77-83. DOI: 10.1016/0924-2031(94)00064-N  0.596
1994 Germer TA, Stephenson JC, Heilweil EJ, Cavanagh RR. Picosecond time-resolved adsorbate response to substrate heating: Spectroscopy and dynamics of CO/Cu(100) The Journal of Chemical Physics. 101: 1704-1716. DOI: 10.1063/1.467792  0.576
1993 Germer TA, Stephenson JC, Heilweil EJ, Cavanagh RR. Hot carrier excitation of adlayers: Time-resolved measurement of adsorbate-lattice coupling. Physical Review Letters. 71: 3327-3330. PMID 10054945 DOI: 10.1103/Physrevlett.71.3327  0.578
1993 Germer TA, Stephenson JC, Heilweil EJ, Cavanagh RR. Picosecond measurement of substrate-to-adsorbate energy transfer: The frustrated translation of CO/Pt(111) The Journal of Chemical Physics. 98: 9986-9994. DOI: 10.1063/1.464324  0.586
1993 Germer TA, Young RY, Ho W, Ravel MK. Charge-coupled-device based time-of-flight charged particle analyzer Review of Scientific Instruments. 64: 3132-3138. DOI: 10.1063/1.1144320  0.545
1993 Cavanagh RR, Germer TA, Heilweil EJ, Stephenson JC. Time-resolved measurements of substrate to adsorbate energy transfer Faraday Discussions. 96: 235-243. DOI: 10.1039/Fd9939600235  0.591
1990 Germer TA, Ho W. Formation of hydroxyl and water from photoreaction of hydrogen and molecular oxygen coadsorbed on Pt(111) Journal of Chemical Physics. 93: 1474-1475. DOI: 10.1063/1.459158  0.537
1989 Germer TA, Ho W. Energy transfer and photochemistry on a metal surface: Mo(CO)6 on Rh(100) Journal of Vacuum Science and Technology. 7: 1878-1881. DOI: 10.1116/1.576020  0.576
1989 Germer TA, Ho W. Direct characterization of the hydroxyl intermediate during reduction of oxygen on Pt(111) by time-resolved electron energy loss spectroscopy Chemical Physics Letters. 163: 449-454. DOI: 10.1016/0009-2614(89)85166-8  0.535
1988 Richter LJ, Germer TA, Sethna JP, Ho W. Electron-energy-loss spectroscopy of H adsorbed on Rh(100): Interpretation of overtone spectra as two-phonon bound states. Physical Review. B, Condensed Matter. 38: 10403-10420. PMID 9945891 DOI: 10.1103/Physrevb.38.10403  0.711
1988 Germer TA, Ho W. The adsorption and photochemistry of Mo(CO)6 on Rh(100) Journal of Chemical Physics. 89: 562-569. DOI: 10.1063/1.455446  0.55
1988 Richter LJ, Germer TA, Ho W. Coadsorption-induced site changes: Bridging hydrogen from CO and H on Rh(100) Surface Science. 195: L182-L192. DOI: 10.1016/0039-6028(88)90342-1  0.717
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2011 Foldyna M, Germer TA, Bergner BC. Mueller matrix ellipsometry of artificial non-periodic line edge roughness in presence of finite numerical aperture Proceedings of Spie. 7971. DOI: 10.1117/12.879518  0.298
2001 Germer TA, Nadal ME. Modeling the appearance of special effect pigment coatings Proceedings of Spie - the International Society For Optical Engineering. 4447: 77-86. DOI: 10.1117/12.446721  0.293
2013 Germer TA. Assessing consistency of a Mueller matrix measurement by rotation of the sample under test Proceedings of Spie. 8873: 887303. DOI: 10.1117/12.2024853  0.284
2001 GERMER TA, GUPTA R, HANSSEN LM, SHIRLEY EL. Optical Properties of Materials: A Sampling of NIST Contributions Optics and Photonics News. 12: 38. DOI: 10.1364/Opn.12.2.000038  0.26
2016 Patrick HJ, Germer TA, Zarobila CJ, Cooksey CC, Yoon HW. Optical reflectance of pyrheliometer absorption cavities: Progress toward SI-traceable measurements of solar irradiance Applied Optics. 55: 6346-6354. DOI: 10.1364/AO.55.006346  0.259
2013 Bunday B, Germer TA, Vartanian V, Cordes A, Cepler A, Settens C. Gaps analysis for CD metrology beyond the 22 nm node Proceedings of Spie - the International Society For Optical Engineering. 8681. DOI: 10.1117/12.2012472  0.227
2007 Ramella-Roman JC, Boulbry B, Germer TA. Hemispherical imaging of skin with polarized light Progress in Biomedical Optics and Imaging - Proceedings of Spie. 6535. DOI: 10.1117/12.740962  0.207
2004 Kaufmann L, Germer T. Auktionscontrolling Controlling Und Management. 48: 194-199. DOI: 10.1007/BF03254275  0.12
2009 Germer T, Schwarz M. Procedural Arrangement of Furniture for Real-Time Walkthroughs Computer Graphics Forum. 28: 2068-2078. DOI: 10.1111/j.1467-8659.2009.01351.x  0.035
2002 Kaufmann L, Germer T. Knowledge Management: Best Practices in EuropeKnowledge Management: Best Practices in Europe By MertinsKai, HeisigPeter, and VorbeckJens (Eds.). Berlin: Springer-Verlag, 2001. 263 pages, hard cover, $49.95. Academy of Management Perspectives. 16: 161-162. DOI: 10.5465/AME.2002.6640273  0.012
2020 Germer T, Uelwer T, Conrad S, Harmeling S. PyMatting: A Python Library for Alpha Matting Journal of Open Source Software. 5: 2481. DOI: 10.21105/joss.02481  0.01
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