Year |
Citation |
Score |
2019 |
Liu Y, Yu Y, Lin S, Chiu S. Electromigration effect upon single- and two-phase Ag-Cu alloy strips: An in situ study Scripta Materialia. 173: 134-138. DOI: 10.1016/J.SCRIPTAMAT.2019.08.008 |
0.388 |
|
2019 |
Tseng T, Yang C, Chiang J, Huang J, Chen C, Lin S, Wang C, Wu AT. Interfacial reactions of 68In–32Bi, 50In–50Bi and 33In–67Bi low melting alloys on Cu substrates Materials Science and Engineering: A. 759: 506-513. DOI: 10.1016/J.MSEA.2019.05.074 |
0.442 |
|
2018 |
Lin S, Yeh C, Wang M. On the formation mechanism of solid-solution Cu-to-Cu joints in the Cu/Ni/Ga/Ni/Cu system Materials Characterization. 137: 14-23. DOI: 10.1016/J.MATCHAR.2018.01.020 |
0.35 |
|
2017 |
Lin S, Wang M, Yeh C, Chang H, Liu Y. High-strength and thermal stable Cu-to-Cu joint fabricated with transient molten Ga and Ni under-bump-metallurgy Journal of Alloys and Compounds. 702: 561-567. DOI: 10.1016/J.JALLCOM.2016.12.444 |
0.339 |
|
2015 |
Lin S, Chang R, Chen S, Tsai M, Hsu C. Solid-state reactions between Sn-20.0 wt.%In-x wt.%Zn solders and Ag and Ni substrates Materials Chemistry and Physics. 154: 60-65. DOI: 10.1016/J.MATCHEMPHYS.2015.01.045 |
0.582 |
|
2015 |
Lin S, Wang Y, Kuo H. Strong coupling effects during Cu/In/Ni interfacial reactions at 280 °C Intermetallics. 58: 91-97. DOI: 10.1016/J.INTERMET.2014.12.002 |
0.452 |
|
2015 |
Lin Sk, Chang Hm, Cho Cl, Liu Yc, Kuo Yk. Formation of solid-solution Cu-to-Cu joints using Ga solder and Pt under bump metallurgy for three-dimensional integrated circuits Electronic Materials Letters. 11: 687-694. DOI: 10.1007/s13391-015-5015-z |
0.302 |
|
2014 |
Lin SK, Tsai MY, Tsai PC, Hsu BH. Formation of alternating interfacial layers in Au-12Ge/Ni joints. Scientific Reports. 4: 4557. PMID 24690992 DOI: 10.1038/srep04557 |
0.597 |
|
2014 |
Lin S, Chang R, Chen S, Tsai M, Hsu C. Effects of zinc on the interfacial reactions of tin–indium solder joints with copper Journal of Materials Science. 49: 3805-3815. DOI: 10.1007/s10853-014-8092-8 |
0.554 |
|
2013 |
Chen S, Hsu C, Lin S, Hsu C. Reaction evolution in Sn–20.0 wt% In–2.8 wt% Ag/Ni couples Journal of Materials Research. 28: 3257-3260. DOI: 10.1557/JMR.2013.308 |
0.577 |
|
2013 |
Lin S, Hsu C, Chen S, Hsu C. Interfacial reactions in Sn–20In–2.8Ag/Cu couples Materials Chemistry and Physics. 142: 268-275. DOI: 10.1016/J.MATCHEMPHYS.2013.07.014 |
0.587 |
|
2013 |
Lin S, Cho C, Chang H. Interfacial Reactions in Cu/Ga and Cu/Ga/Cu Couples Journal of Electronic Materials. 43: 204-211. DOI: 10.1007/s11664-013-2721-x |
0.314 |
|
2012 |
Chen S, Zi A, Gierlotka W, Yang C, Wang C, Lin S, Hsu C. Phase equilibria of Sn–Sb–Cu system Materials Chemistry and Physics. 132: 703-715. DOI: 10.1016/J.MATCHEMPHYS.2011.11.088 |
0.484 |
|
2010 |
Lin S, Chen K, Chen H, Liou W, Yen Y. Abnormal spalling phenomena in the Sn-0.7Cu/Au/Ni/SUS304 interfacial reactions Journal of Materials Research. 25: 2278-2286. DOI: 10.1557/JMR.2010.0305 |
0.523 |
|
2009 |
Lin S, Chung T, Chen S, Chang C. 250 °C isothermal section of ternary Sn-In-Cu phase equilibria Journal of Materials Research. 24: 2628-2637. DOI: 10.1557/JMR.2009.0317 |
0.6 |
|
2008 |
Lin S, Yang C, Wu S, Chen S. Liquidus Projection and Solidification of the Sn-In-Cu Ternary Alloys Journal of Electronic Materials. 37: 498-506. DOI: 10.1007/S11664-008-0380-0 |
0.567 |
|
2007 |
Gierlotka W, Chen S, Lin S. Thermodynamic description of the Cu–Sn system Journal of Materials Research. 22: 3158-3165. DOI: 10.1557/JMR.2007.0396 |
0.546 |
|
2007 |
Lin S, Yorikado Y, Jiang J, Kim K, Suganuma K, Chen S, Tsujimoto M, Yanada I. Mechanical deformation-induced Sn whiskers growth on electroplated films in the advanced flexible electronic packaging Journal of Materials Research. 22: 1975-1986. DOI: 10.1557/JMR.2007.0232 |
0.495 |
|
2007 |
Chen S, Wang C, Lin S, Chiu C, Chen C. Phase transformation and microstructural evolution in solder joints Jom. 59: 39-43. DOI: 10.1007/S11837-007-0008-5 |
0.518 |
|
2007 |
Lin S, Yorikado Y, Jiang J, Kim K, Suganuma K, Chen S, Tsujimoto M, Yanada I. Microstructure Development of Mechanical-Deformation-Induced Sn Whiskers Journal of Electronic Materials. 36: 1732-1734. DOI: 10.1007/S11664-007-0284-4 |
0.477 |
|
2007 |
Chen S, Wang C, Lin S, Chiu C. Phase Diagrams of Pb-Free Solders and Their Related Materials Systems Cheminform. 38. DOI: 10.1002/CHIN.200724212 |
0.505 |
|
2006 |
Chen S, Lin S. Electric current-induced abnormal Cu/γ-InSn4 interfacial reactions Journal of Materials Research. 21: 3065-3071. DOI: 10.1557/JMR.2006.0378 |
0.609 |
|
2006 |
Lin S, Chen S. Interfacial reactions in the Sn–20 at.% In/Cu and Sn–20 at.% In/Ni couples at 160 °C Journal of Materials Research. 21: 1712-1717. DOI: 10.1557/JMR.2006.0200 |
0.678 |
|
2006 |
Chen S, Lin S. Effects of temperature on interfacial reactions in γ–InSn4/Ni couples Journal of Materials Research. 21: 1161-1166. DOI: 10.1557/JMR.2006.0137 |
0.663 |
|
2006 |
Chen S, Lin S, Yang C. Interfacial reactions in the pb-free composite solders with indium layers Journal of Electronic Materials. 35: 72-75. DOI: 10.1007/S11664-006-0186-X |
0.565 |
|
2006 |
Chen S, Wang C, Lin S, Chiu C. Phase Diagrams of Pb-Free Solders and their Related Materials Systems Journal of Materials Science: Materials in Electronics. 18: 19-37. DOI: 10.1007/S10854-006-9010-X |
0.505 |
|
2004 |
Chen S, Lin S, Jao J. Electromigration Effects upon Interfacial Reactions in Flip-Chip Solder Joints Materials Transactions. 45: 661-665. DOI: 10.2320/MATERTRANS.45.661 |
0.548 |
|
Show low-probability matches. |