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Gangshi Hu, Ph.D. - Publications

Affiliations: 
2010 University of California, Los Angeles, Los Angeles, CA 
Area:
Advanced materials processing, process modeling, dynamics and control, applied mathematics, desalination and water treatment
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24 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2017 Garg A, Corbett B, Mhaskar P, Hu G, Flores-Cerrillo J. Subspace-based model identification of a hydrogen plant startup dynamics Computers & Chemical Engineering. 106: 183-190. DOI: 10.1016/J.Compchemeng.2017.05.020  0.537
2012 Zhang X, Huang J, Hu G, Orkoulas G, Christofides PD. Controlling aggregate thin film surface morphology for improved light trapping using a patterned deposition rate profile Chemical Engineering Science. 67: 101-110. DOI: 10.1016/J.Ces.2011.03.047  0.792
2011 Huang J, Hu G, Orkoulas G, Christofides PD. Dynamics and lattice-size dependence of surface mean slope in thin-film deposition Industrial and Engineering Chemistry Research. 50: 1219-1230. DOI: 10.1021/Ie100012W  0.799
2011 Huang J, Hu G, Orkoulas G, Christofides PD. Dependence of film surface roughness on surface migration and lattice size in thin film deposition Proceedings of the American Control Conference. 2957-2962.  0.791
2010 Huang J, Hu G, Orkoulas G, Christofides PD. Lattice-size dependence and dynamics of surface mean slope in a thin film deposition process Ifac Proceedings Volumes (Ifac-Papersonline). 9: 811-816. DOI: 10.3182/20100705-3-Be-2011.00134  0.805
2010 Zhang X, Hu G, Orkoulas G, Christofides PD. Simultaneous regulation of thin film surface mean slope and roughness for light trapping optimization using predictive control Proceedings of the Ieee Conference On Decision and Control. 6069-6076. DOI: 10.1109/CDC.2010.5717649  0.75
2010 Zhang X, Hu G, Orkoulas G, Christofides PD. Controller and estimator design for regulation of film thickness, surface roughness, and porosity in a multiscale thin film growth process Industrial and Engineering Chemistry Research. 49: 7795-7806. DOI: 10.1021/Ie901396G  0.762
2010 Zhang X, Hu G, Orkoulas G, Christofides PD. Multivariable model predictive control of thin film surface roughness and slope for light trapping optimization Industrial and Engineering Chemistry Research. 49: 10510-10516. DOI: 10.1021/Ie100814F  0.754
2010 Huang J, Hu G, Orkoulas G, Christofides PD. Dependence of film surface roughness and slope on surface migration and lattice size in thin film deposition processes Chemical Engineering Science. 65: 6101-6111. DOI: 10.1016/J.Ces.2010.08.035  0.787
2010 Zhang X, Hu G, Orkoulas G, Christofides PD. Predictive control of surface mean slope and roughness in a thin film deposition process Chemical Engineering Science. 65: 4720-4731. DOI: 10.1016/J.Ces.2010.05.025  0.781
2009 Hu G, Huang J, Orkoulas G, Christofides PD. Investigation of film surface roughness and porosity dependence on lattice size in a porous thin film deposition process. Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics. 80: 041122. PMID 19905288 DOI: 10.1103/Physreve.80.041122  0.793
2009 Hu G, Orkoulas G, Christofides PD. Simultaneous regulation of surface roughness and porosity in thin film growth Ifac Proceedings Volumes (Ifac-Papersonline). 7: 922-927. DOI: 10.3182/20090712-4-Tr-2008.00151  0.775
2009 Hu G, Zhang X, Orkoulas G, Christofides PD. Simultaneous regulation of film thickness, surface roughness and porosity in a multiscale thin film growth process Proceedings of the Ieee Conference On Decision and Control. 2387-2394. DOI: 10.1109/CDC.2009.5399542  0.74
2009 Hu G, Orkoulas G, Christofides PD. Model predictive control of film porosity in thin film deposition Proceedings of the American Control Conference. 4797-4804. DOI: 10.1109/ACC.2009.5160202  0.694
2009 Lou Y, Hu G, Christofides PD. Model predictive control of nonlinear stochastic PDEs: Application to a sputtering process Proceedings of the American Control Conference. 2476-2483. DOI: 10.1109/ACC.2009.5160139  0.633
2009 Hu G, Orkoulas G, Christofides PD. Stochastic modeling of film porosity in thin film deposition Proceedings of the American Control Conference. 4771-4778. DOI: 10.1109/ACC.2009.5160138  0.689
2009 Hu G, Orkoulas G, Christofides PD. Stochastic modeling and simultaneous regulation of surface roughness and porosity in thin film deposition Industrial and Engineering Chemistry Research. 48: 6690-6700. DOI: 10.1021/Ie900708V  0.798
2009 Hu G, Orkoulas G, Christofides PD. Regulation of film thickness, surface roughness and porosity in thin film growth using deposition rate Chemical Engineering Science. 64: 3903-3913. DOI: 10.1016/J.Ces.2009.05.034  0.767
2009 Hu G, Orkoulas G, Christofides PD. Modeling and control of film porosity in thin film deposition Chemical Engineering Science. 64: 3668-3682. DOI: 10.1016/J.Ces.2009.05.008  0.72
2008 Hu G, Lou Y, Christofides PD. Dynamic output feedback covariance control of linear stochastic dissipative partial differential equations Proceedings of the American Control Conference. 260-266. DOI: 10.1109/ACC.2008.4586501  0.62
2008 Hu G, Lou Y, Christofides PD. Dynamic output feedback covariance control of stochastic dissipative partial differential equations Chemical Engineering Science. 63: 4531-4542. DOI: 10.1016/J.Ces.2008.06.026  0.65
2008 Hu G, Lou Y, Christofides PD. Model parameter estimation and feedback control of surface roughness in a sputtering process Chemical Engineering Science. 63: 1800-1816. DOI: 10.1016/J.Ces.2007.12.008  0.747
2008 Lou Y, Hu G, Christofides PD. Model predictive control of nonlinear stochastic partial differential equations with application to a sputtering process Aiche Journal. 54: 2065-2081. DOI: 10.1002/Aic.11511  0.722
2007 Lou Y, Hu G, Christofides PD, Orkoulas G. PARAMETER IDENTIFICATION FOR NONLINEAR STOCHASTIC PDE MODEL OF A SPUTTERING PROCESS Ifac Proceedings Volumes. 40: 215-220. DOI: 10.3182/20070606-3-Mx-2915.00154  0.707
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