Paul K. Ampadu, Ph.D.
Affiliations: | 2004 | Cornell University, Ithaca, NY, United States |
Area:
Electronics and Electrical EngineeringGoogle:
"Paul Ampadu"Parents
Sign in to add mentorKevin Kornegay | grad student | 2004 | Cornell | |
(An energy -efficient approach to 3G turbo decoding.) |
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Publications
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Li C, Yang M, Ampadu P. (2018) An Energy-Efficient NoC Router with Adaptive Fault-Tolerance Using Channel Slicing and On-Demand TMR Ieee Transactions On Emerging Topics in Computing. 6: 538-550 |
Zhang M, Ampadu P. (2014) Two-Layer Error Control Codes Combining Rectangular and Hamming Product Codes for Cache Error Journal of Low Power Electronics and Applications. 4: 44-62 |
Yu Q, Zhang M, Ampadu P. (2013) Addressing network-on-chip router transient errors with inherent information redundancy Acm Transactions in Embedded Computing Systems. 12: 105 |
Yu Q, Ampadu P. (2012) Dual-Layer Adaptive Error Control for Network-on-Chip Links Ieee Transactions On Very Large Scale Integration Systems. 20: 1304-1317 |
Zhang M, Stojanovic VM, Ampadu P. (2012) Reliable Ultra-Low-Voltage Cache Design for Many-Core Systems Ieee Transactions On Circuits and Systems Ii-Express Briefs. 59: 858-862 |
Wolpert D, Ampadu P. (2012) Exploiting programmable temperature compensation devices to manage temperature-induced delay uncertainty Ieee Transactions On Circuits and Systems I: Regular Papers. 59: 735-748 |
Íñiguez-De-La-Torre I, Purohit S, Kaushal V, et al. (2011) Exploring digital logic design using ballistic deflection transistors through monte carlo simulations Ieee Transactions On Nanotechnology. 10: 1337-1346 |
Wolpert D, Diduck Q, Ampadu P. (2011) nand Gate Design for Ballistic Deflection Transistors Ieee Transactions On Nanotechnology. 10: 150-154 |
Yu Q, Ampadu P. (2011) A Dual-Layer Method for Transient and Permanent Error Co-Management in NoC Links Ieee Transactions On Circuits and Systems Ii-Express Briefs. 58: 36-40 |
Margala M, Ampadu P, Shapir Y, et al. (2010) Ballistic electronics: Breaking the barrier in terahertz speed processing Proceedings of Spie - the International Society For Optical Engineering. 7671 |