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Sooryong Lee, Ph.D.

Affiliations: 
2003 Texas A & M University, College Station, TX, United States 
Area:
Electronics and Electrical Engineering, Computer Science
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M Ray Mercer grad student 2003 Texas A & M
 (A new ATPG algorithm to generate compact test sets which detect static and dynamic defects in VLSI circuits.)

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Dworak J, Wicker JD, Lee S, et al. (2001) Defect-oriented testing and defective-part-level prediction Ieee Design and Test of Computers. 18: 31-40
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