Alfred V. Gomes, Ph.D.

2003 Georgia Institute of Technology, Atlanta, GA 
Electronics and Electrical Engineering
"Alfred Gomes"


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Abhijit Chatterjee grad student 2003 Georgia Tech
 (Alternate test generation for detection of parametric faults.)
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Choi H, Gomes AV, Chatterjee A. (2011) Signal acquisition of high-speed periodic signals using incoherent sub-sampling and back-end signal reconstruction algorithms Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 19: 1125-1135
Gomes AV, Chatterjee A. (2001) Distance constrained dimensionality reduction for parametric fault test generator Proceedings of the Asian Test Symposium. 411-416
Gomes AV, Chatterjee A. (1999) Minimal length diagnostic tests for analog circuits using test history Proceedings -Design, Automation and Test in Europe, Date. 189-194
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