Xiangdong Xuan, Ph.D.

Affiliations: 
2004 Georgia Institute of Technology, Atlanta, GA 
Area:
Electronics and Electrical Engineering
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"Xiangdong Xuan"

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Abhijit Chatterjee grad student 2004 Georgia Tech
 (Analysis and design of reliable mixed-signal CMOS circuits.)
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Publications

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Xuan X, Chatterjee A, Singh AD. (2006) Lifetime prediction and design-for-reliability of IC interconnections with electromigration induced degradation in the presence of manufacturing defects Journal of Electronic Testing: Theory and Applications (Jetta). 22: 471-482
Xuan X, Chatterjee A, Singh AD. (2004) Application of local design-for-reliability techniques for reducing wear-out degradation of CMOS combinational logic circuits Proceedings - Ninth Ieee European Test Symposium, Ets 2004. 24-29
Xuan X, Chatterjee A, Singh AD. (2003) Aret for system-level IC reliability simulation Ieee International Reliability Physics Symposium Proceedings. 2003: 572-573
Xuan X, Singh AD, Chatterjee A. (2003) Reliability evaluation for integrated circuit with defective interconnect under electromigration Proceedings - International Symposium On Quality Electronic Design, Isqed. 2003: 29-34
Xuan X, Chatterjee A. (2001) Sensitivity and reliability evaluation for mixed-signal ICs under electromigration and hot-carrier effects Ieee International Workshop On Defect and Fault Tolerance in Vlsi Systems. 323-328
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