Selim S. Akbay, Ph.D.

2010 Georgia Institute of Technology, Atlanta, GA 
Electronics and Electrical Engineering
"Selim Akbay"


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Abhijit Chatterjee grad student 2010 Georgia Tech
 (Constraint-driven RF test stimulus generation and built -in test.)
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Akbay SS, Torres JL, Rumer JM, et al. (2007) Alternate test of RF front ends with IP constraints: Frequency domain test generation and validation Proceedings - International Test Conference
Voorakaranam R, Akbay SS, Bhattacharya S, et al. (2007) Signature testing of analog and RF circuits: Algorithms and methodology Ieee Transactions On Circuits and Systems I: Regular Papers. 54: 1018-1031
Akbay SS, Chatterjee A. (2007) Fault-based alternate test of RF components 2007 Ieee International Conference On Computer Design, Iccd 2007. 518-525
Akbay SS, Sen S, Chatterjee A. (2007) Testing RF components with supply current signatures Proceedings of the Asian Test Symposium. 393-398
Akbay SS, Chatterjee A. (2005) Built-in test of RF components using mapped feature extraction sensors Proceedings of the Ieee Vlsi Test Symposium. 243-248
Han D, Akbay SS, Bhattacharya S, et al. (2005) On-chip self-calibration of RF circuits using Specification-driven Built-In Self Test (S-BIST) Proceedings - 11th Ieee International On-Line Testing Symposium, Iolts 2005. 2005: 106-111
Akbay SS, Chatterjee A. (2004) Feature extraction based built-in alternate test of RF components using a noise reference Proceedings of the Ieee Vlsi Test Symposium. 273-278
Akbay SS, Halder A, Chatterjee A, et al. (2004) Low-cost test of embedded RF/analog/mixed-signal circuits in SOPs Ieee Transactions On Advanced Packaging. 27: 352-363
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