Muhammad M. Nisar, Ph.D.

Affiliations: 
2010 Georgia Institute of Technology, Atlanta, GA 
Area:
Electronics and Electrical Engineering
Google:
"Muhammad Nisar"

Parents

Sign in to add mentor
Abhijit Chatterjee grad student 2010 Georgia Tech
 (Robust low -power signal processing and communication algorithms.)
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Nisar MM, Chatterjee A. (2011) Guided probabilistic checksums for error control in low-power digital filters Ieee Transactions On Computers. 60: 1313-1326
Nisar MM, Natarajan J, Chatterjee A. (2010) Dynamic power modulation in baseband OFDM signal processor using application driven metrics: Image transmission and processing Latw2010 - 11th Latin-American Test Workshop
Nisar MM, Chatterjee A. (2009) Environment and process adaptive low power wireless baseband signal processing using dual real-time feedback Journal of Low Power Electronics. 5: 313-325
Nisar MM, Chatterjee A. (2008) Test enabled process tuning for adaptive baseband OFDM processor Proceedings of the Ieee Vlsi Test Symposium. 9-16
Nisar MM, Senguttuvan R, Chatterjee A. (2008) Adaptive signal scaling driven critical path modulation for low power baseband OFDM processors Proceedings of the Ieee International Frequency Control Symposium and Exposition. 71-76
Nisar MM, Chatterjee A. (2008) Guided probabilistic checksums for error control in low power digital-filters Proceedings - 14th Ieee International On-Line Testing Symposium, Iolts 2008. 239-244
Ashouei M, Nisar MM, Chatterjee A, et al. (2007) Probabilistic self-adaptation of nanoscale CMOS circuits: Yield maximization under increased intra-die variations Proceedings of the Ieee International Conference On Vlsi Design. 711-716
Nisar MM, Ashouei M, Chatterjee A. (2007) Probabilistic concurrent error compensation in nonlinear digital filters using linearized checksums Proceedings - Iolts 2007 13th Ieee International On-Line Testing Symposium. 173-178
See more...