Jeongtae Kim, Ph.D.

2004 University of Michigan, Ann Arbor, Ann Arbor, MI 
Electronics and Electrical Engineering
"Jeongtae Kim"


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Jeffrey A. Fessler grad student 2004 University of Michigan
 (Intensity based image registration using robust similarity measure and constrained optimization: Applications for radiation therapy.)
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Choi E, Kim J. (2020) Deep Learning Based Defect Inspection Using the Intersection Over Minimum Between Search and Abnormal Regions International Journal of Precision Engineering and Manufacturing. 21: 747-758
Choi E, Chae S, Kim J. (2019) Machine Learning-Based Fast Banknote Serial Number Recognition Using Knowledge Distillation and Bayesian Optimization. Sensors (Basel, Switzerland). 19
Han M, Kim J. (2019) Joint Banknote Recognition and Counterfeit Detection Using Explainable Artificial Intelligence. Sensors (Basel, Switzerland). 19
Jo H, Kim J. (2019) Regularized Auto-Encoder-Based Separation of Defects from Backgrounds for Inspecting Display Devices Electronics. 8: 533
Ha T, Kim J. (2019) Image Reconstruction of Moving Objects Using Multiple IR-UWB Radar Signals Ieee Sensors Journal. 19: 9402-9410
Lee E, Yang S, Han M, et al. (2016) Depth-based refocusing for reducing directional aliasing artifacts. Optics Express. 24: 28065-28079
Kim D, Ahn S, Kim J. (2016) Parametric Blind Restoration of Bi-level Images with Unknown Intensities Ieie Transactions On Smart Processing and Computing. 5: 319-322
Seok J, Kim J. (2014) Alternating minimization of the negative Poisson likelihood function for the global analysis of fluorescence lifetime imaging microscopy data. Optics Express. 22: 24977-87
Kim J, An S, Ahn S, et al. (2013) Depth-variant deconvolution of 3D widefield fluorescence microscopy using the penalized maximum likelihood estimation method. Optics Express. 21: 27668-81
Kim J, Seok J, Lee H, et al. (2013) Penalized maximum likelihood estimation of lifetime and amplitude images from multi-exponentially decaying fluorescence signals. Optics Express. 21: 20240-53
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