Enjun Xiao, Ph.D.
Affiliations: | 2003 | University of Central Florida, Orlando, FL, United States |
Area:
Electronics and Electrical EngineeringGoogle:
"Enjun Xiao"Parents
Sign in to add mentor| Jiann S. Yuan | grad student | 2003 | University of Central Florida | |
| (CMOS RF circuit design and reliability for wireless communications.) | ||||
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Publications
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| Kuang W, Xiao E, Ibarra CM, et al. (2007) Design asynchronous circuits for soft error tolerance Proceedings 2007 Ieee International Conference On Integrated Circuit Design and Technology, Icicdt. 221-225 |
| Yu C, Yuan JS, Shen J, et al. (2006) Study of electrical stress effect on SiGe HBT low-noise amplifier performance by simulation Ieee Transactions On Device and Materials Reliability. 6: 550-554 |
| Yu C, Yuan JS, Xiao E. (2006) Dynamic voltage stress effects on nMOS varactor Microelectronics Reliability. 46: 1812-1816 |
| Xiao E, Ghosh PP. (2005) Stress induced performance degradation in LC oscillators Proceedings of the Ieee International Frequency Control Symposium and Exposition. 2005: 559-561 |
| Yu C, Xiao E, Yuan JS. (2005) Voltage stress-induced hot carrier effects on SiGe HBT VCO Microelectronics Reliability. 45: 1402-1405 |
| Xiao E, Ghosh PP, Yu C, et al. (2005) Hot carrier and soft breakdown effects on LNA performance for ultra wideband communications Microelectronics Reliability. 45: 1382-1385 |
| Xiao E, Zhu P, Yuan JS, et al. (2005) Analysis and modeling of LNA circuit reliability Digest of Papers - Ieee Radio Frequency Integrated Circuits Symposium. 69-72 |
| Xiao E. (2005) Hot carrier effect on CMOS RF amplifiers Ieee International Reliability Physics Symposium Proceedings. 680-681 |
| Xiao E, Yuan JS, Yang H. (2004) CMOS RF and DC Reliability Subject to Hot Carrier Stress and Oxide Soft Breakdown Ieee Transactions On Device and Materials Reliability. 4: 92-98 |
| Yang H, Yuan JS, Liu Y, et al. (2003) Effect of gate-oxide breakdown on rf performance Ieee Transactions On Device and Materials Reliability. 3: 93-97 |