Chuanzhao Yu, Ph.D.
Affiliations: | 2006 | University of Central Florida, Orlando, FL, United States |
Area:
Electronics and Electrical EngineeringGoogle:
"Chuanzhao Yu"Parents
Sign in to add mentorJiann S. Yuan | grad student | 2006 | University of Central Florida | |
(Study of nanoscale CMOS device and circuit reliability.) |
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Publications
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Kuang W, Cao L, Yu C, et al. (2008) PMOS breakdown effects on digital circuits – Modeling and analysis Microelectronics Reliability. 48: 1597-1600 |
Yu C, Jiang L, Yuan J. (2006) Study of performance degradations in DC-DC converter due to hot carrier stress by simulation Microelectronics Reliability. 46: 1840-1843 |
Yu C, Yuan JS, Xiao E. (2006) Dynamic voltage stress effects on nMOS varactor Microelectronics Reliability. 46: 1812-1816 |
Yu C, Yuan JS, Sadat A. (2005) Dynamic stress-induced high-frequency noise degradations in nMOSFETs Microelectronics Reliability. 45: 1794-1799 |
Yu C, Xiao E, Yuan JS. (2005) Voltage stress-induced hot carrier effects on SiGe HBT VCO Microelectronics Reliability. 45: 1402-1405 |