David P. Nackashi, Ph.D.

Affiliations: 
2004 North Carolina State University, Raleigh, NC 
Area:
Electronics and Electrical Engineering
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"David Nackashi"

Parents

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Paul Franzon grad student 2004 NCSU
 (Circuit and integration technologies for molecular electronics.)
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Publications

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Unocic RR, Sacci RL, Brown GM, et al. (2014) Quantitative electrochemical measurements using in situ ec-S/TEM devices. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20: 452-61
Allard LF, Bigelow WC, Zhang S, et al. (2014) Controlled in Situ gas reaction studies of catalysts at high temperature and pressure with atomic resolution Microscopy and Microanalysis. 20: 1572-1573
Allard LF, Overbury SH, Bigelow WC, et al. (2012) Novel MEMS-based gas-cell/heating specimen holder provides advanced imaging capabilities for in situ reaction studies. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 18: 656-66
Jin Z, Nackashi D, Lu W, et al. (2010) Decoration, migration, and aggregation of palladium nanoparticles on graphene sheets Chemistry of Materials. 22: 5695-5699
He T, Corley DA, Lu M, et al. (2009) Controllable molecular modulation of conductivity in silicon-based devices. Journal of the American Chemical Society. 131: 10023-30
Allard LF, Bigelow WC, Jose-Yacaman M, et al. (2009) A new MEMS-based system for ultra-high-resolution imaging at elevated temperatures. Microscopy Research and Technique. 72: 208-15
Damiano J, Nackashi DP, Mick SE. (2008) A MEMS-based technology platform for in-situ TEM heating studies Microscopy and Microanalysis. 14: 1332-1333
Allard LF, Bigelow WC, Nackashi D, et al. (2008) A new paradigm for ultra-high-resolution imaging at elevated temperatures Microscopy and Microanalysis. 14: 792-793
Briceno M, Hattar K, Damiano J, et al. (2008) In-situ TEM observations on the sintering process of colloidal gold using an ultra-fast heating stage Microscopy and Microanalysis. 14: 1336-1337
He T, Lu M, Yao J, et al. (2008) Reversible modulation of conductance in silicon devices via UV/visible-light irradiation Advanced Materials. 20: 4541-4546
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