Eric A. Karl, Ph.D.
Affiliations: | 2008 | University of Michigan, Ann Arbor, Ann Arbor, MI |
Area:
Electronics and Electrical EngineeringGoogle:
"Eric Karl"Parents
Sign in to add mentor| Dennis M. Sylvester | grad student | 2008 | University of Michigan | |
| (Unreliable silicon: Circuit through system-level techniques for mitigating the adverse effects of process variation, device degradation and environmental conditions.) | ||||
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Publications
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| Guo Z, Kim D, Nalam S, et al. (2019) A 23.6-Mb/mm $^{2}$ SRAM in 10-nm FinFET Technology With Pulsed-pMOS TVC and Stepped-WL for Low-Voltage Applications Ieee Journal of Solid-State Circuits. 54: 210-216 |
| Kulkarni JP, Keane J, Koo KH, et al. (2016) 5.6 Mb/mm² 1R1W 8T SRAM Arrays Operating Down to 560 mV Utilizing Small-Signal Sensing With Charge Shared Bitline and Asymmetric Sense Amplifier in 14 nm FinFET CMOS Technology Ieee Journal of Solid-State Circuits |
| Koo KH, Wei L, Keane J, et al. (2015) A 0.094um2 high density and aging resilient 8T SRAM with 14nm FinFET technology featuring 560mV VMIN with read and write assist Ieee Symposium On Vlsi Circuits, Digest of Technical Papers. 2015: C266-C267 |
| Karl E, Guo Z, Conary J, et al. (2015) A 0.6 V, 1.5 GHz 84 Mb SRAM in 14 nm FinFET CMOS Technology With Capacitive Charge-Sharing Write Assist Circuitry Ieee Journal of Solid-State Circuits |
| Karl E, Wang Y, Ng YG, et al. (2013) A 4.6 GHz 162 Mb SRAM design in 22 nm tri-gate CMOS technology with integrated read and write assist circuitry Ieee Journal of Solid-State Circuits. 48: 150-158 |
| Singh P, Karl E, Blaauw D, et al. (2012) Compact Degradation Sensors for Monitoring NBTI and Oxide Degradation Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 20: 1645-1655 |
| Singh P, Karl E, Sylvester D, et al. (2011) Dynamic NBTI management using a 45 nm multi-degradation sensor Ieee Transactions On Circuits and Systems I: Regular Papers. 58: 2026-2037 |
| Singh P, Zhuo C, Blaauw D, et al. (2009) Sensor-driven reliability and wearout management Ieee Design and Test of Computers. 26: 40-48 |
| Karl E, Blaauw D, Sylvester D, et al. (2008) Multi-mechanism reliability modeling and management in dynamic systems Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 16: 476-487 |
| Sylvester D, Blaauw D, Karl E. (2006) ElastIC: An adaptive self-healing architecture for unpredictable silicon Ieee Design and Test of Computers. 23: 484-490 |