Manan Syal, Ph.D.

2005 Virginia Polytechnic and State University, United States 
Electronics and Electrical Engineering
"Manan Syal"


Sign in to add mentor
Michael S. Hsiao grad student 2005 Virginia Tech
 (Static learning for problems in VLSI test and verification.)
BETA: Related publications


You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Syal M, Chandrasekar K, Vimjam V, et al. (2007) A study of implication based pseudo functional testing Proceedings - International Test Conference
Syal M, Hsiao MS. (2006) New techniques for untestable fault identification in sequential circuits Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 25: 1117-1131
Syal M, Arora R, Hsiao MS. (2005) Extended forward implications and dual recurrence relations to identify sequentially untestable faults Proceedings - Ieee International Conference On Computer Design: Vlsi in Computers and Processors. 2005: 453-460
Syal M, Hsiao MS. (2005) VERISEC: VERIfying equivalence of sequential circuits using SAT Proceedings - Ieee International High-Level Design Validation and Test Workshop, Hldvt. 2005: 52-59
Syal M, Natarajan S, Chakravarty S, et al. (2005) Untestable multi-cycle path delay faults in industrial designs Proceedings of the Asian Test Symposium. 2005: 194-201
Vimjam VC, Syal M, Hsiao MS. (2005) Untestable fault identification through enhanced necessary value assignments Proceedings of the Acm Great Lakes Symposium On Vlsi, Glsvlsi. 176-181
Syal M, Hsiao MS. (2004) Untestable fault identification using recurrence relations and impossible value assignments Proceedings of the Ieee International Conference On Vlsi Design. 17: 481-486
Syal M, Chakravarty S, Hsiao MS. (2004) Identifying untestable transition faults in latch based designs with multiple clocks Proceedings - International Test Conference. 1034-1043
Syal M, Hsiao MS, Doreswamy KB, et al. (2003) Efficient implication-based untestable bridge fault identifier Proceedings of the Ieee Vlsi Test Symposium. 2003: 393-398
Syal M, Hsiao MS. (2003) A novel, low-cost algorithm for sequentially untestable fault identification Proceedings -Design, Automation and Test in Europe, Date. 316-321
See more...