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Mark G. Karpovsky

Affiliations: 
Boston University, Boston, MA, United States 
Area:
Electronics and Electrical Engineering, Computer Science
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"Mark Karpovsky"
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Parents

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Children

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Lev A. Zakrevski grad student 2001 Boston University
Mehmet Mustafa grad student 2006 Boston University
Konrad J. Kulikowski grad student 2009 Boston University

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Publications

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Bu L, Karpovsky MG, Kinsy MA. (2019) Design of reliable storage and compute systems with lightweight group testing based non-binary error correction codes Iet Computers and Digital Techniques. 13: 140-153
Wang Z, Karpovsky M, Bu L. (2016) Design of Reliable and Secure Devices Realizing Shamir's Secret Sharing Ieee Transactions On Computers. 65: 2443-2455
Keren O, Karpovsky M. (2015) Relations Between the Entropy of a Source and the Error Masking Probability for Security-Oriented Codes Ieee Transactions On Communications. 63: 206-214
Karpovsky M, Levitin L, Mustafa M. (2014) Optimal Turn Prohibition for Deadlock Prevention in Networks With Regular Topologies Ieee Transactions On Control of Network Systems. 1: 74-85
Karpovsky M, Wang Z. (2014) Design of Strongly Secure Communication and Computation Channels by Nonlinear Error Detecting Codes Ieee Transactions On Computers. 63: 2716-2728
Wang Z, Karpovsky M, Joshi A. (2012) Nonlinear Multi-Error Correction Codes for Reliable MLC nand Flash Memories Ieee Transactions On Very Large Scale Integration Systems. 20: 1221-1234
Wang Z, Karpovsky M, Joshi A. (2012) Secure Multipliers Resilient to Strong Fault-Injection Attacks Using Multilinear Arithmetic Codes Ieee Transactions On Very Large Scale Integration Systems. 20: 1036-1048
Kulikowski KJ, Karpovsky MG. (2011) Robust correction of repeating errors by non-linear codes Iet Communications. 5: 2317-2327
Levitin L, Karpovsky M, Mustafa M. (2010) Minimal Sets of Turns for Breaking Cycles in Graphs Modeling Networks Ieee Transactions On Parallel and Distributed Systems. 21: 1342-1353
Wang Z, Karpovsky M, Kulikowski KJ. (2010) Design of memories with concurrent error detection and correction by nonlinear SEC-DED codes Journal of Electronic Testing: Theory and Applications (Jetta). 26: 559-580
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