Michael D. Reed, Ph.D. - Publications
Affiliations: | University of Florida, Gainesville, Gainesville, FL, United States |
Area:
advanced electronic materialsYear | Citation | Score | |||
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2005 | Reed MD, Kryliouk OM, Mastro MA, Anderson TJ. Growth and characterization of single-crystalline gallium nitride using (1 0 0) LiAlO2 substrates Journal of Crystal Growth. 274: 14-20. DOI: 10.1016/J.Jcrysgro.2004.09.079 | 0.563 | |||
2001 | Mastro MA, Kryliouk OM, Reed MD, Anderson TJ, Davydov A, Shapiro A. Thermal Stability of MOCVD and HVPE GaN Layers in H2, HCl, NH3 and N2 Physica Status Solidi (a) Applied Research. 188: 467-471. DOI: 10.1002/1521-396X(200111)188:1<467::Aid-Pssa467>3.0.Co;2-1 | 0.548 | |||
1999 | Kryliouk O, Reed M, Dann T, Anderson T, Chai B. Large area GaN substrates Materials Science and Engineering B: Solid-State Materials For Advanced Technology. 66: 26-29. DOI: 10.1016/S0921-5107(99)00114-2 | 0.491 | |||
1999 | Kryliouk O, Reed M, Dann T, Anderson T, Chai B. Growth of GaN single crystal substrates Materials Science and Engineering B: Solid-State Materials For Advanced Technology. 59: 6-11. DOI: 10.1016/S0921-5107(98)00403-6 | 0.5 | |||
1999 | Kryliouk O, Reed M, Mastro M, Anderson T, Chai B. GaN substrates: Growth and characterization Physica Status Solidi (a) Applied Research. 176: 407-410. DOI: 10.1002/(Sici)1521-396X(199911)176:1<407::Aid-Pssa407>3.0.Co;2-Q | 0.539 | |||
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