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Lin Yuan, Ph.D. - Publications

Affiliations: 
2006 University of Maryland, College Park, College Park, MD 
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7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2012 Hong L, Wang Z, Yuan L, Tan J, Wang L, Qu G, Zhang D, Lin R, Liu S. Subcellular distribution of CdSe quantum dots (QDs) in breast cancer cells. Journal of Nanoscience and Nanotechnology. 12: 365-7. PMID 22523988 DOI: 10.1166/JNN.2012.5765  0.424
2012 Qu G, Zhang C, Yuan L, He J, Wang Z, Wang L, Liu S, Jiang G. Quantum dots impair macrophagic morphology and the ability of phagocytosis by inhibiting the Rho-associated kinase signaling. Nanoscale. 4: 2239-44. PMID 22395807 DOI: 10.1039/c2nr30243h  0.427
2011 Yuan L, Leventhal SR, Gu J, Qu G. TALk: A temperature-aware leakage minimization technique for real-time systems Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 30: 1564-1568. DOI: 10.1109/Tcad.2011.2160541  0.585
2010 Drinic̀€ M, Kirovski D, Yuan L, Qu G, Potkonjak M. Field division routing Eurasip Journal On Wireless Communications and Networking. 2010. DOI: 10.1155/2010/560797  0.573
2008 Yuan L, Qu G, Villa T, Sangiovanni-Vincentelli A. An FSM reengineering approach to sequential circuit synthesis by state splitting Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 27: 1159-1164. DOI: 10.1109/Tcad.2008.923245  0.491
2006 Yuan L, Qu G. A combined gate replacement and input vector control approach for leakage current reduction Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 14: 173-182. DOI: 10.1109/Tvlsi.2005.863747  0.484
2005 Yuan L, Qu G. Analysis of energy reduction on dynamic voltage scaling-enabled systems Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 24: 1827-1837. DOI: 10.1109/Tcad.2005.852658  0.489
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