Yiheng Xu, Ph.D. - Publications
Affiliations: | 2000 | University of Maryland, College Park, College Park, MD |
Area:
BiomedicalYear | Citation | Score | |||
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2002 | Xu Y, Gougousi T, Henn-Lecordier L, Liu Y, Cho S, Rubloff GW. Thickness metrology and end point control in W chemical vapor deposition process from SiH4/WF6 using in situ mass spectrometry Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 20: 2351-2360. DOI: 10.1116/1.1520555 | 0.488 | |||
2001 | Sreenivasan R, Gougousi T, Xu Y, Kidder J, Zafiriou E, Rubloff GW. Run to run control in tungsten chemical vapor deposition using H2/WF6 at low pressures Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 19: 1931-1941. DOI: 10.1116/1.1406159 | 0.521 | |||
2000 | Gougousi T, Xu Y, Kidder JN, Rubloff GW, Tilford CR. Process diagnostics and thickness metrology using in situ mass spectrometry for the chemical vapor deposition of W from H2/WF6 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18: 1352-1363. DOI: 10.1116/1.591478 | 0.486 | |||
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