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Mustafa B. Yelten, Ph.D. - Publications

Affiliations: 
2011 North Carolina State University, Raleigh, NC 
Area:
Electronics and Electrical Engineering, Nanotechnology, Computer Engineering
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21 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Caglar A, Yelten MB. A 180-nm X -Band Cryogenic CMOS LNA Ieee Microwave and Wireless Components Letters. 30: 395-398. DOI: 10.1109/Lmwc.2020.2979341  0.303
2020 Güney A, Yelten MB, Ferhanoğlu O, Kahraman N. Experimental and modeling studies of automotive-qualified OLEDs under electrical stress Microelectronics Reliability. 111: 113704. DOI: 10.1016/J.Microrel.2020.113704  0.428
2020 Erol D, Güngördü AD, Dündar G, Yelten MB. A switchable DC offset cancellation circuit for time-based degradation correction Analog Integrated Circuits and Signal Processing. 1-7. DOI: 10.1007/S10470-020-01714-W  0.478
2020 Gencer FB, Xhafa X, İnam BB, Yelten MB. Design and validation of an artificial neural network based on analog circuits Analog Integrated Circuits and Signal Processing. 1-9. DOI: 10.1007/S10470-020-01713-X  0.49
2020 Xhafa X, Yelten MB. Design of a tunable LNA and its variability analysis through surrogate modeling International Journal of Numerical Modelling-Electronic Networks Devices and Fields. DOI: 10.1002/Jnm.2724  0.45
2019 Afacan E, Dündar G, Başkaya F, Pusane AE, Yelten MB. On Chip Reconfigurable CMOS Analog Circuit Design and Automation Against Aging Phenomena: Sense and React Acm Transactions On Design Automation of Electronic Systems. 24: 1-22. DOI: 10.1145/3325069  0.466
2019 Ilik S, Kabaoglu A, Solmaz NS, Yelten MB. Modeling of Total Ionizing Dose Degradation on 180-nm n-MOSFETs Using BSIM3 Ieee Transactions On Electron Devices. 66: 4617-4622. DOI: 10.1109/Ted.2019.2926931  0.476
2019 Kabaoglu A, Solmaz NS, Ilik S, Uzun Y, Yelten MB. Statistical MOSFET Modeling Methodology for Cryogenic Conditions Ieee Transactions On Electron Devices. 66: 66-72. DOI: 10.1109/Ted.2018.2877942  0.444
2019 Caglar A, Yelten MB. Design of Cryogenic LNAs for High Linearity in Space Applications Ieee Transactions On Circuits and Systems I-Regular Papers. 66: 4619-4627. DOI: 10.1109/Tcsi.2019.2936506  0.352
2019 Kabaoğlu A, Şahin-Solmaz N, İlik S, Uzun Y, Yelten MB. Variability-aware cryogenic models of mosfets: validation and circuit design Semiconductor Science and Technology. 34: 115004. DOI: 10.1088/1361-6641/Ab3Ff9  0.507
2019 İlik S, Gencer FB, Solmaz NŞ, Çağlar A, Yelten MB. Radiation tolerance impact of trap density near the drain and source regions of a MOSFET Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 449: 1-5. DOI: 10.1016/J.Nimb.2019.04.040  0.333
2018 Saniç MT, Yelten MB. Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits Analog Integrated Circuits and Signal Processing. 97: 39-47. DOI: 10.1007/S10470-018-1243-0  0.513
2018 Akso E, Soysal İB, Yelten MB. Surrogate modeling and variability analysis of on-chip spiral inductors: Surrogate modeling and variability analysis of on-chip spiral inductors International Journal of Numerical Modelling-Electronic Networks Devices and Fields. 31. DOI: 10.1002/Jnm.2313  0.462
2013 Zhu T, Yelten MB, Steer MB, Franzon PD. Model-based variation-aware integrated circuit design Surrogate-Based Modeling and Optimization: Applications in Engineering. 2147483647: 171-188. DOI: 10.1007/978-1-4614-7551-4_8  0.648
2012 Yelten MB, Franzon PD, Steer MB. Analog negative-bias-temperature-instability monitoring circuit Ieee Transactions On Device and Materials Reliability. 12: 177-179. DOI: 10.1109/Tdmr.2011.2178096  0.582
2012 Yelten MB, Zhu T, Koziel S, Franzon PD, Steer MB. Demystifying surrogate modeling for circuits and systems Ieee Circuits and Systems Magazine. 12: 45-63. DOI: 10.1109/Mcas.2011.2181095  0.584
2012 Yelten MB, Franzon PD, Steer MB. Process mismatch analysis based on reduced-order models Proceedings - International Symposium On Quality Electronic Design, Isqed. 648-655. DOI: 10.1109/ISQED.2012.6187561  0.571
2012 Yelten MB, Franzon PD, Steer MB. Comparison of modeling techniques in circuit variability analysis International Journal of Numerical Modelling: Electronic Networks, Devices and Fields. 25: 288-302. DOI: 10.1002/Jnm.836  0.641
2011 Yelten MB, Franzon PD, Steer MB. Surrogate-model-based analysis of analog circuits-part II: Reliability analysis Ieee Transactions On Device and Materials Reliability. 11: 458-465. DOI: 10.1109/Tdmr.2011.2160063  0.668
2011 Yelten MB, Franzon PD, Steer MB. Surrogate-model-based analysis of analog circuits-part I: Variability analysis Ieee Transactions On Device and Materials Reliability. 11: 466-473. DOI: 10.1109/TDMR.2011.2160063  0.669
2011 Zhu T, Yelten MB, Steer MB, Franzon PD. Application of surrogate modeling in variation-aware macromodel and circuit design Simultech 2011 - Proceedings of 1st International Conference On Simulation and Modeling Methodologies, Technologies and Applications. 502-508.  0.659
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