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James W. Ciston, Ph.D. - Publications

Affiliations: 
2009 Materials Science and Engineering Northwestern University, Evanston, IL 
Area:
Materials Science Engineering, Condensed Matter Physics
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12 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2010 Ciston J, Subramanian A, Kienzle D, Marks L. Why the case for clean surfaces does not hold water: Structure and morphology of hydroxylated nickel oxide (111) Surface Science. 604: 155-164. DOI: 10.1016/J.Susc.2009.10.033  0.641
2009 Ciston J, Subramanian A, Robinson IK, Marks LD. Diffraction refinement of localized antibonding at the Si(111) 7×7 surface Physical Review B - Condensed Matter and Materials Physics. 79. DOI: 10.1103/Physrevb.79.193302  0.766
2009 Ciston J, Subramanian A, Marks LD. Water-driven structural evolution of the polar MgO (111) surface: An integrated experimental and theoretical approach Physical Review B - Condensed Matter and Materials Physics. 79. DOI: 10.1103/Physrevb.79.085421  0.752
2009 Ciston J, Haigh SJ, Kim JS, Kirkland AI, Marks L. Real-space Measurements of Bonding Charge Density in Aberration-corrected High Resolution Electron Microscopy Microscopy and Microanalysis. 15: 1478-1479. DOI: 10.1017/S1431927609094719  0.602
2008 Ciston J, Deng B, Marks LD, Own CS, Sinkler W. A quantitative analysis of the cone-angle dependence in precession electron diffraction. Ultramicroscopy. 108: 514-22. PMID 17854997 DOI: 10.1016/J.Ultramic.2007.08.004  0.726
2008 Sinkler W, Own C, Ciston J, Marks L. Models for simplified treatment of precession electron diffraction Acta Crystallographica Section a Foundations of Crystallography. 64: C76-C77. DOI: 10.1107/S0108767308097559  0.703
2008 Ciston J, Subramanian A, Robinson I, Marks L. Experimental measurements of bond density at the Si(111)-7x7 surface Acta Crystallographica Section a Foundations of Crystallography. 64: C86-C87. DOI: 10.1107/S0108767308097213  0.72
2007 Ciston J, Deng B, Marks L, Sinkler W, Own C. Precession Electron Diffraction: Optimized Experimental Conditions to Detect Valence Charge Density Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607073667  0.732
2007 Sinkler W, Own C, Ciston J, Marks L. Statistical Treatment of Precession Electron Diffraction Data with Principal Components Analysis Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607072844  0.698
2006 Marks LD, Ciston J, Deng B, Subramanian A. Fitting valence charge densities at a crystal surface. Acta Crystallographica. Section a, Foundations of Crystallography. 62: 309-15. PMID 16788270 DOI: 10.1107/S0108767306021295  0.737
2006 Ciston J, Marks L, Feidenhans'l R, Bunk O, Falkenberg G, Lauridsen EM. Experimental surface charge density of the Si (100) -2×1H surface Physical Review B. 74: 85401. DOI: 10.1103/Physrevb.74.085401  0.667
2005 Feidenhans'l R, Bunk O, Ciston J, Marks LD. Three dimensional charge density measurements at surfaces Acta Crystallographica Section A. 61: 96-96. DOI: 10.1107/S0108767305095929  0.614
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