Jiann S. Yuan - Publications

Affiliations: 
University of Central Florida, Orlando, FL, United States 
Area:
Electronics and Electrical Engineering, Computer Science

43 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2014 Yuan JS, Chen S. Power amplifier resilient design for process and temperature variations using an on-chip PLL sensing signal Microelectronics Reliability. 54: 167-171. DOI: 10.1016/j.microrel.2013.09.006  0.96
2012 Yao D, Wei Q, Xu W, Syrenne RD, Yuan JS, Su Z. Comparative genomic analysis of NAC transcriptional factors to dissect the regulatory mechanisms for cell wall biosynthesis. Bmc Bioinformatics. 13: S10. PMID 23046216 DOI: 10.1186/1471-2105-13-S15-S10  0.48
2012 Yuan JS, Chen S. A simulation study of colpitts oscillator reliability and variability Ieee Transactions On Device and Materials Reliability. 12: 576-581. DOI: 10.1109/TDMR.2012.2195181  0.88
2011 Chen S, Yuan JS. Adaptive gate bias for power amplifier temperature compensation Ieee Transactions On Device and Materials Reliability. 11: 442-449. DOI: 10.1109/TDMR.2011.2160264  1
2011 Kutty K, Yuan JS, Chen S. Evaluation of gate oxide breakdown effect on cascode class e power amplifier performance Microelectronics Reliability. 51: 1302-1308. DOI: 10.1016/j.microrel.2011.03.027  0.44
2011 Shi W, Ding SY, Yuan JS. Comparison of insect gut cellulase and xylanase activity across different insect species with distinct food sources Bioenergy Research. 4: 1-10. DOI: 10.1007/s12155-010-9096-0  0.36
2010 Di C, Xu W, Su Z, Yuan JS. Comparative genome analysis of PHB gene family reveals deep evolutionary origins and diverse gene function. Bmc Bioinformatics. 11: S22. PMID 20946606 DOI: 10.1186/1471-2105-11-S6-S22  0.48
2009 Xu Z, Zhang D, Hu J, Zhou X, Ye X, Reichel KL, Stewart NR, Syrenne RD, Yang X, Gao P, Shi W, Doeppke C, Sykes RW, Burris JN, Bozell JJ, ... ... Yuan JS, et al. Comparative genome analysis of lignin biosynthesis gene families across the plant kingdom. Bmc Bioinformatics. 10: S3. PMID 19811687 DOI: 10.1186/1471-2105-10-S11-S3  0.48
2009 Zhou X, Su Z, Sammons RD, Peng Y, Tranel PJ, Stewart CN, Yuan JS. Novel software package for cross-platform transcriptome analysis (CPTRA). Bmc Bioinformatics. 10: S16. PMID 19811681 DOI: 10.1186/1471-2105-10-S11-S16  0.48
2008 Yuan JS, Li YO, Ue JW, Wesley AS, Diosady LL. Development of field test kits for determination of microencapsulated iron in double-fortified salt. Food and Nutrition Bulletin. 29: 288-96. PMID 19227053  0.68
2008 Yuan JS, Jiang L. Evaluation of hot-electron effect on LDMOS device and circuit performances Ieee Transactions On Electron Devices. 55: 1519-1523. DOI: 10.1109/TED.2008.922850  1
2008 Yuan JS, Yu C. HfO2 gate breakdown and channel hot electron effect on MOSFET third-order intermodulation Ieee Transactions On Electron Devices. 55: 2790-2794. DOI: 10.1109/TED.2008.2003031  1
2007 Yu C, Yuan JS. Electrical and temperature stress effects on class-AB power amplifier performances Ieee Transactions On Electron Devices. 54: 1346-1350. DOI: 10.1109/TED.2007.896601  1
2007 Yu C, Yuan JS. CMOS device and circuit degradations subject to HfO2 gate breakdown and transient charge-trapping effect Ieee Transactions On Electron Devices. 54: 59-67. DOI: 10.1109/TED.2006.887517  1
2007 Jiang L, Yuan JS. Dynamic stress effect on LDMOS RF performances Pesc Record - Ieee Annual Power Electronics Specialists Conference. 995-996. DOI: 10.1109/PESC.2007.4342125  0.96
2006 Yu C, Yuan JS, Suehle J. Channel hot-electron degradation on 60-nm HfO2-Gated nMOSFET DC and RF performances Ieee Transactions On Electron Devices. 53: 1065-1072. DOI: 10.1109/TED.2006.871837  0.48
2006 Yu C, Yuan JS. hot carrier-induced degradation on high-k trnasistors and low noise amplifier Ieee International Reliability Physics Symposium Proceedings. 707-708. DOI: 10.1109/RELPHY.2006.251335  1
2006 Di J, Yuan JS. Energy-aware design for multi-rail encoding using NCL Iee Proceedings: Circuits, Devices and Systems. 153: 100-106. DOI: 10.1049/ip-cds:20059030  1
2006 Yu C, Yuan JS, Xiao E. Dynamic voltage stress effects on nMOS varactor Microelectronics Reliability. 46: 1812-1816. DOI: 10.1016/j.microrel.2006.07.075  1
2005 Yu C, Yuan JS. MOS RF reliability subject to dynamic voltage stress - Modeling and analysis Ieee Transactions On Electron Devices. 52: 1751-1758. DOI: 10.1109/TED.2005.852546  0.92
2005 Yuan JS, Di J. Teaching low-power electronic design in electrical and computer engineering Ieee Transactions On Education. 48: 169-182. DOI: 10.1109/TE.2004.837039  1
2005 Yu C, Yuan JS. RF reliability subject to dynamic voltage stress in NMOS circuits Ieee International Reliability Physics Symposium Proceedings. 431-434.  1
2005 Di J, Yuan JS. Energy-aware dual-rail bit-wise completion pipelined multipliers design Conference Proceedings - Ieee Southeastcon. 49-54.  0.96
2005 Di J, Yuan JS. Dynamic active-bit detection and operands exchange for designing energy-aware asynchronous multipliers Proceedings of the 2005 International Conference On Computer Design, Cdes'05. 218-223.  1
2004 Yuan JS, Kuang W. Teaching asynchronous design in digital integrated circuits Ieee Transactions On Education. 47: 397-404. DOI: 10.1109/TE.2004.825923  1
2004 Kuang W, Yuan JS. Energy-efficient self-timed circuit design using supply voltage scaling Iee Proceedings: Circuits, Devices and Systems. 151: 278-284. DOI: 10.1049/ip-cds:20040296  1
2004 Di J, Yuan JS, Hagedorn M. Analytical input mapping for modelling energy dissipation of complex CMOS gates Iee Proceedings: Circuits, Devices and Systems. 151: 294-299. DOI: 10.1049/ip-cds:20040160  0.4
2004 Yu C, Yuan JS. RF reliability of MOSFETs subject to electrical stress International Conference On Solid-State and Integrated Circuits Technology Proceedings, Icsict. 2: 816-819.  1
2003 Di J, Yuan JS. Run-time reconfigurable power-aware pipelined signed array multiplier design Scs 2003 - International Symposium On Signals, Circuits and Systems, Proceedings. 2: 405-408. DOI: 10.1109/SCS.2003.1227075  1
2003 Di J, Yuan JS, Demara R. High throughput power-aware FIR filter design based on fine-grain pipelining multipliers and adders Proceedings of Ieee Computer Society Annual Symposium On Vlsi, Isvlsi. 2003: 260-261. DOI: 10.1109/ISVLSI.2003.1183490  0.6
2003 Kuang W, Yuan JS. An adaptive supply-voltage scheme for low power self-timed CMOS digital design Proceedings of the Ieee International Conference On Vlsi Design. 2003: 315-319. DOI: 10.1109/ICVD.2003.1183156  1
2003 Yang L, Yuan JS. Design of a new CMOS output buffer with low switching noise Proceedings of the International Conference On Microelectronics, Icm. 2003: 131-134. DOI: 10.1109/ICM.2003.238496  0.32
2003 Xiao E, Yuan JS. Evaluation of oscillator phase noise subject to reliability Proceedings of the Annual Ieee International Frequency Control Symposium. 565-568.  1
2003 Xiao E, Yuan JS. RF circuit design in reliability Ieee Mtt-S International Microwave Symposium Digest. 1.  1
2003 Xiao E, Yuan JS. RF circuit design in reliability Ieee Mtt-S International Microwave Symposium Digest. 1.  1
2003 Di J, Yuan JS. Power-aware pipelined multiplier design based on 2-dimensional pipeline gating Proceedings of the Ieee Great Lakes Symposium On Vlsi. 64-67.  0.96
2002 Kuang W, Yuan JS. Low power operation using self-timed circuits and ultra-low supply voltage Proceedings of the International Conference On Microelectronics, Icm. 2002: 185-188. DOI: 10.1109/ICM-02.2002.1161526  1
2002 Xiao E, Yuan JS. Hot carrier and soft breakdown effects on VCO performance Ieee Mtt-S International Microwave Symposium Digest. 1: 569-572.  1
2002 Xiao E, Yuan JS. RF circuit performance degradation due to hot carrier effects and soft breakdown Midwest Symposium On Circuits and Systems. 1.  1
2002 Kuang W, Yuan JS. Soft digital signal processing using self-timed circuits Ieee International Conference On Semiconductor Electronics, Proceedings, Icse. 194-198.  1
2002 Di J, Yuan JS, Hagedorn M. Energy-aware multiplier design in multi-rail encoding logic Midwest Symposium On Circuits and Systems. 2: II294-II297.  0.36
2002 Di J, Yuan JS, Hagedorn M. Switching activity modeling of multi-rail speed-independent circuits - A probabilistic approach Midwest Symposium On Circuits and Systems. 1: I475-I478.  0.56
2000 Zhang J, Yuan JS, Ma Y. Modeling short channel effect on high-k and stacked-gate MOSFETs Solid-State Electronics. 44: 2089-2091. DOI: 10.1016/S0038-1101(00)00152-0  0.64
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