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Achintya Halder, Ph.D. - Publications

Affiliations: 
2006 Georgia Institute of Technology, Atlanta, GA 
Area:
Electronics and Electrical Engineering
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10 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2008 Halder A, Bhattacharya S, Chatterjee A. System-level specification testing of wireless transceivers Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 16: 263-276. DOI: 10.1109/Tvlsi.2007.912144  0.67
2006 Halder A, Chatterjee A. Low-cost production testing of wireless transmitters Proceedings of the Ieee International Conference On Vlsi Design. 2006: 437-442. DOI: 10.1109/VLSID.2006.113  0.612
2005 Halder A, Chatterjee A. Low-cost alternate EVM test for wireless receiver systems Proceedings of the Ieee Vlsi Test Symposium. 255-260. DOI: 10.1109/VTS.2005.53  0.606
2005 Halder A, Chatterjee A. Low-cost production test of BER for wireless receivers Proceedings of the Asian Test Symposium. 2005: 64-69. DOI: 10.1109/ATS.2005.78  0.516
2005 Halder A, Chatterjee A. Test generation for specification test of analog circuits using efficient test response observation methods Microelectronics Journal. 36: 820-832. DOI: 10.1016/j.mejo.2005.03.005  0.568
2005 Bhattacharya S, Halder A, Srinivasan G, Chatterjee A. Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications Journal of Electronic Testing. 21: 323-339. DOI: 10.1007/S10836-005-6361-9  0.528
2004 Akbay SS, Halder A, Chatterjee A, Keezer D. Low-cost test of embedded RF/analog/mixed-signal circuits in SOPs Ieee Transactions On Advanced Packaging. 27: 352-363. DOI: 10.1109/Tadvp.2004.828819  0.528
2004 Halder A, Chatterjee A. Automated test generation and test point selection for specification test of analog circuits Proceedings - 5th International Symposium On Quality Electronic Design, Isqued 2004. 401-406. DOI: 10.1109/ISQED.2004.1283707  0.53
2003 Halder A, Bhattacharya S, Chatterjee A. Automatic multitone alternate test generaton for RF circuits using behavioral models Ieee International Test Conference (Tc). 665-673.  0.593
2001 Halder A, Chatterjee A. Specification based digital compatible built-in test of embdded analog circuits Proceedings of the Asian Test Symposium. 344-349.  0.454
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