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Dzmitry Maliuk, Ph.D. - Publications

Affiliations: 
2013 Yale University, New Haven, CT 
Area:
Electronics and Electrical Engineering
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11/14 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2016 Volanis G, Maliuk D, Lu Y, Subramani KS, Antonopoulos A, Makris Y. On-die learning-based self-calibration of analog/RF ICs Proceedings of the Ieee Vlsi Test Symposium. 2016. DOI: 10.1109/VTS.2016.7477297  0.702
2015 Maliuk D, Makris Y. An Experimentation Platform for On-Chip Integration of Analog Neural Networks: A Pathway to Trusted and Robust Analog/RF ICs. Ieee Transactions On Neural Networks and Learning Systems. 26: 1721-34. PMID 25248194 DOI: 10.1109/Tnnls.2014.2354406  0.765
2015 Jin Y, Maliuk D, Makris Y. Hardware trojan detection in Analog/RF integrated circuits Secure System Design and Trustable Computing. 241-268. DOI: 10.1007/978-3-319-14971-4_7  0.606
2014 Maliuk D, Makris Y. An analog non-volatile neural network platform for prototyping RF BIST solutions Proceedings -Design, Automation and Test in Europe, Date. DOI: 10.7873/DATE2014.381  0.767
2014 Maliuk D, Makris Y. On-chip intelligence: A pathway to self-testable, tunable, and trusted analog/RF ICs Midwest Symposium On Circuits and Systems. 1077-1080. DOI: 10.1109/MWSCAS.2014.6908605  0.768
2013 Jin Y, Maliuk D, Makris Y. A post-deployment IC trust evaluation architecture Proceedings of the 2013 Ieee 19th International On-Line Testing Symposium, Iolts 2013. 224-225. DOI: 10.1109/IOLTS.2013.6604083  0.718
2012 Maliuk D, Kupp N, Makris Y. Towards a fully stand-alone analog/RF BIST: A cost-effective implementation of a neural classifier Proceedings of the Ieee Vlsi Test Symposium. 62-67. DOI: 10.1109/VTS.2012.6231081  0.69
2012 Maliuk D, Makris Y. A dual-mode weight storage analog neural network platform for on-chip applications Iscas 2012 - 2012 Ieee International Symposium On Circuits and Systems. 2889-2892. DOI: 10.1109/ISCAS.2012.6271917  0.798
2012 Jin Y, Maliuk D, Makris Y. Post-deployment trust evaluation in wireless cryptographic ICs Proceedings -Design, Automation and Test in Europe, Date. 965-970.  0.714
2010 Maliuk D, Stratigopoulosz HG, Huang H, Makris Y. Analog neural network design for RF built-in self-test Proceedings - International Test Conference. DOI: 10.1109/TEST.2010.5699272  0.736
2010 Maliuk D, Stratigopoulos HG, Makris Y. An analog VLSI multilayer perceptron and its application towards built-in self-test in analog circuits Proceedings of the 2010 Ieee 16th International On-Line Testing Symposium, Iolts 2010. 71-76. DOI: 10.1109/IOLTS.2010.5560230  0.734
Low-probability matches (unlikely to be authored by this person)
2013 Weger AJ, Stellari F, Kim S, Ainspan HA, Kwark Y, Baks CW, Maliuk D, Song P. 32nm CMOS SOI test site for emission tool evaluation Conference Proceedings From the International Symposium For Testing and Failure Analysis. 336-340.  0.294
2013 Stellari F, Weger AJ, Kim S, Maliuk D, Song P, Ainspan HA, Kwark Y, Baks CW, Kindereit U, Anant V, Lundquist T. A Superconducting Nanowire Single-Photon Detector (SnSPD) system for ultra low voltage Time-Resolved Emission (TRE) measurements of VLSI circuits Conference Proceedings From the International Symposium For Testing and Failure Analysis. 182-188.  0.278
2013 Stellari F, Song P, Weger AJ, Maliuk D, Ainspan HA, Kim S, Kwark Y, Baks CW. Tester-based methods to enhance spatial resolvability and interpretation of time-integrated and time-resolved emission measurements Conference Proceedings From the International Symposium For Testing and Failure Analysis. 341-349.  0.206
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