Michael S. Hsiao - Publications

Affiliations: 
Virginia Polytechnic Institute and State University, Blacksburg, VA, United States 
Area:
Electronics and Electrical Engineering, Computer Science

25 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2014 Bhunia S, Hsiao MS, Banga M, Narasimhan S. Hardware trojan attacks: Threat analysis and countermeasures Proceedings of the Ieee. 102: 1229-1247. DOI: 10.1109/JPROC.2014.2334493  0.703
2011 Banga M, Hsiao MS. ODETTE: A non-scan design-for-test methodology for Trojan detection in ICs 2011 Ieee International Symposium On Hardware-Oriented Security and Trust, Host 2011. 18-23. DOI: 10.1109/HST.2011.5954989  0.732
2011 Banga M, Rahagude N, Hsiao MS. Design-for-test methodology for non-scan at-speed testing Proceedings -Design, Automation and Test in Europe, Date. 191-196.  0.737
2010 Banga M, Hsiao MS. Trusted RTL: Trojan detection methodology in pre-silicon designs Proceedings of the 2010 Ieee International Symposium On Hardware-Oriented Security and Trust, Host 2010. 56-59. DOI: 10.1109/HST.2010.5513114  0.714
2009 Banga M, Hsiao MS. A novel sustained vector technique for the detection of hardware trojans Proceedings: 22nd International Conference On Vlsi Design - Held Jointly With 7th International Conference On Embedded Systems. 327-332. DOI: 10.1109/VLSI.Design.2009.22  0.72
2009 Donglikar S, Banga M, Chandrasekar M, Hsiao MS. Fast circuit topology based method to configure the scan chains in Illinois scan architecture Proceedings - International Test Conference. DOI: 10.1109/TEST.2009.5355661  0.714
2009 Banga M, Hsiao MS. VITAMIN: Voltage inversion technique to ascertain malicious insertions in ICs 2009 Ieee International Workshop On Hardware-Oriented Security and Trust, Host 2009. 104-107. DOI: 10.1109/HST.2009.5224960  0.724
2009 Hsiao MS, Banga M. Kiss the scan goodbye: A non-scan architecture for high coverage, low test data volume and low test application time Proceedings of the Asian Test Symposium. 225-230. DOI: 10.1109/ATS.2009.17  0.733
2008 He N, Hsiao MS. A new testability guided abstraction to solving bit-vector formula Acm International Conference Proceeding Series. 39-45. DOI: 10.1145/1512464.1512473  0.516
2008 Banga M, Chandrasekar M, Lei F, Hsiao MS. Guided test generation for isolation and detection of embedded trojans in ICs Proceedings of the Acm Great Lakes Symposium On Vlsi, Glsvlsi. 363-366. DOI: 10.1145/1366110.1366196  0.729
2008 Banga M, Hsiao MS. A region based approach for the identification of hardware Trojans 2008 Ieee International Workshop On Hardware-Oriented Security and Trust, Host. 40-47. DOI: 10.1109/HST.2008.4559047  0.733
2007 Vimjam VC, Hsiao MS. Explicit safety property strengthening in SAT-based induction Proceedings of the Ieee International Conference On Vlsi Design. 63-68. DOI: 10.1109/VLSID.2007.80  0.787
2007 Syal M, Chandrasekar K, Vimjam V, Hsiao MS, Chang YS, Chakravarty S. A study of implication based pseudo functional testing Proceedings - International Test Conference. DOI: 10.1109/TEST.2006.297667  0.646
2006 Vimjam VC, Hsiao MS. Fast illegal state identification for improving SAT-based induction Proceedings - Design Automation Conference. 241-246. DOI: 10.1145/1146909.1146972  0.795
2006 Vimjam VC, Hsiao MS. Efficient fault collapsing via generalized dominance relations Proceedings of the Ieee Vlsi Test Symposium. 2006: 258-263. DOI: 10.1109/VTS.2006.31  0.802
2006 Syal M, Hsiao MS. New techniques for untestable fault identification in sequential circuits Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 25: 1117-1131. DOI: 10.1109/Tcad.2005.855967  0.65
2005 Syal M, Arora R, Hsiao MS. Extended forward implications and dual recurrence relations to identify sequentially untestable faults Proceedings - Ieee International Conference On Computer Design: Vlsi in Computers and Processors. 2005: 453-460. DOI: 10.1109/ICCD.2005.53  0.656
2005 Vimjam VC, Hsiao MS. Increasing the deductibility in CNF instances for efficient SAT-based bounded model checking Proceedings - Ieee International High-Level Design Validation and Test Workshop, Hldvt. 2005: 184-191. DOI: 10.1109/HLDVT.2005.1568835  0.79
2005 Syal M, Hsiao MS. VERISEC: VERIfying equivalence of sequential circuits using SAT Proceedings - Ieee International High-Level Design Validation and Test Workshop, Hldvt. 2005: 52-59. DOI: 10.1109/HLDVT.2005.1568813  0.645
2005 Syal M, Natarajan S, Chakravarty S, Hsiao MS. Untestable multi-cycle path delay faults in industrial designs Proceedings of the Asian Test Symposium. 2005: 194-201. DOI: 10.1109/ATS.2005.111  0.636
2005 Vimjam VC, Syal M, Hsiao MS. Untestable fault identification through enhanced necessary value assignments Proceedings of the Acm Great Lakes Symposium On Vlsi, Glsvlsi. 176-181.  0.784
2004 Syal M, Hsiao MS. Untestable fault identification using recurrence relations and impossible value assignments Proceedings of the Ieee International Conference On Vlsi Design. 17: 481-486.  0.65
2004 Syal M, Chakravarty S, Hsiao MS. Identifying untestable transition faults in latch based designs with multiple clocks Proceedings - International Test Conference. 1034-1043.  0.601
2003 Syal M, Hsiao MS, Doreswamy KB, Chakravarty S. Efficient implication-based untestable bridge fault identifier Proceedings of the Ieee Vlsi Test Symposium. 2003: 393-398. DOI: 10.1109/VTEST.2003.1197680  0.644
2003 Syal M, Hsiao MS. A novel, low-cost algorithm for sequentially untestable fault identification Proceedings -Design, Automation and Test in Europe, Date. 316-321. DOI: 10.1109/DATE.2003.1253626  0.633
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