Sounil Biswas, Ph.D. - Publications
Affiliations: | 2008 | Carnegie Mellon University, Pittsburgh, PA |
Area:
Electronics and Electrical EngineeringYear | Citation | Score | |||
---|---|---|---|---|---|
2014 | Biswas S, Wang H, Blanton RD(. Reducing test cost of integrated, heterogeneous systems using pass-fail test data analysis Acm Transactions On Design Automation of Electronic Systems. 19: 20. DOI: 10.1145/2566666 | 0.49 | |||
2011 | Biswas S, Blanton RD. Reducing Test Execution Cost of Integrated, Heterogeneous Systems Using Continuous Test Data Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 30: 148-158. DOI: 10.1109/Tcad.2010.2066630 | 0.472 | |||
2006 | Biswas S, Blanton RD. Statistical Test Compaction Using Binary Decision Trees Ieee Design & Test of Computers. 23: 452-462. DOI: 10.1109/Mdt.2006.154 | 0.364 | |||
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