Manan Syal, Ph.D. - Publications

Affiliations: 
2005 Virginia Polytechnic Institute and State University, Blacksburg, VA, United States 
Area:
Electronics and Electrical Engineering

10 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2007 Syal M, Chandrasekar K, Vimjam V, Hsiao MS, Chang YS, Chakravarty S. A study of implication based pseudo functional testing Proceedings - International Test Conference. DOI: 10.1109/TEST.2006.297667  0.6
2006 Syal M, Hsiao MS. New techniques for untestable fault identification in sequential circuits Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 25: 1117-1131. DOI: 10.1109/TCAD.2005.855967  0.6
2005 Syal M, Arora R, Hsiao MS. Extended forward implications and dual recurrence relations to identify sequentially untestable faults Proceedings - Ieee International Conference On Computer Design: Vlsi in Computers and Processors. 2005: 453-460. DOI: 10.1109/ICCD.2005.53  0.6
2005 Syal M, Hsiao MS. VERISEC: VERIfying equivalence of sequential circuits using SAT Proceedings - Ieee International High-Level Design Validation and Test Workshop, Hldvt. 2005: 52-59. DOI: 10.1109/HLDVT.2005.1568813  0.6
2005 Syal M, Natarajan S, Chakravarty S, Hsiao MS. Untestable multi-cycle path delay faults in industrial designs Proceedings of the Asian Test Symposium. 2005: 194-201. DOI: 10.1109/ATS.2005.111  0.6
2005 Vimjam VC, Syal M, Hsiao MS. Untestable fault identification through enhanced necessary value assignments Proceedings of the Acm Great Lakes Symposium On Vlsi, Glsvlsi. 176-181.  0.6
2004 Syal M, Hsiao MS. Untestable fault identification using recurrence relations and impossible value assignments Proceedings of the Ieee International Conference On Vlsi Design. 17: 481-486.  0.6
2004 Syal M, Chakravarty S, Hsiao MS. Identifying untestable transition faults in latch based designs with multiple clocks Proceedings - International Test Conference. 1034-1043.  0.6
2003 Syal M, Hsiao MS, Doreswamy KB, Chakravarty S. Efficient implication-based untestable bridge fault identifier Proceedings of the Ieee Vlsi Test Symposium. 2003: 393-398. DOI: 10.1109/VTEST.2003.1197680  0.6
2003 Syal M, Hsiao MS. A novel, low-cost algorithm for sequentially untestable fault identification Proceedings -Design, Automation and Test in Europe, Date. 316-321. DOI: 10.1109/DATE.2003.1253626  0.6
Show low-probability matches.