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Daryl G. Beetner - Publications

Affiliations: 
Electrical Engineering Missouri University of Science and Technology, Rolla, MO, United States 
Area:
Electricity and Magnetism Physics, Electronics and Electrical Engineering
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31 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Marathe S, Patnaik A, Mi R, Ghosh K, Kim J, Pommerenke D, Beetner DG. Measurement-Based Validation of Integrated Circuit Transient Electromagnetic Event Sensors Ieee Transactions On Electromagnetic Compatibility. 62: 1555-1562. DOI: 10.1109/Temc.2020.3006166  0.33
2020 Rezaei H, Meiguni JS, Sorensen M, Jobava RG, Khilkevich V, Fan J, Beetner DG, Pommerenke D. Source Reconstruction in Near-Field Scanning Using Inverse MoM for RFI Application Ieee Transactions On Electromagnetic Compatibility. 62: 1628-1636. DOI: 10.1109/Temc.2020.3006031  0.366
2020 Makharashvili T, Bai S, Connor S, Ruehli AE, Berger P, Drewniak JL, Beetner DG. Circuit Models for the Inductance of Eight-Terminal Decoupling Capacitors Ieee Transactions On Components, Packaging and Manufacturing Technology. 10: 142-150. DOI: 10.1109/Tcpmt.2019.2952138  0.385
2018 Schulze TE, Beetner DG, Shi Y, Kwiat KA, Kamhoua CA. Combating Data Leakage Trojans in Commercial and ASIC Applications With Time-Division Multiplexing and Random Encoding Ieee Transactions On Very Large Scale Integration Systems. 26: 2007-2015. DOI: 10.1109/Tvlsi.2018.2844180  0.331
2018 Patnaik A, Marathe S, Liu S, Pommerenke D, Beetner DG. A Transient Event Sensor for Efficient System-Level ESD Testing Ieee Transactions On Electromagnetic Compatibility. 60: 1231-1239. DOI: 10.1109/Temc.2018.2810607  0.342
2018 Patnaik A, Beetner DG, Suchak M, Seva R, Pamidimukkala K, Edgington G, Moseley R, Feddeler J, Stockinger M, Pommerenke D. An On-Chip Detector of Transient Stress Events Ieee Transactions On Electromagnetic Compatibility. 60: 1053-1060. DOI: 10.1109/Temc.2017.2785039  0.343
2016 Zhai L, Zhang X, Bondarenko N, Loken D, Van Doren TP, Beetner DG. Mitigation emission strategy based on resonances from a power inverter system in electric vehicles Energies. 9. DOI: 10.3390/En9060419  0.467
2016 Bondarenko N, Makharashvili T, He J, Berger P, Drewniak J, Ruehli AE, Beetner DG. Development of simple physics-based circuit macromodel from PEEC Ieee Transactions On Electromagnetic Compatibility. 58: 1485-1493. DOI: 10.1109/Temc.2016.2575847  0.422
2016 Conley B, Henny P, Erickson N, Halligan MS, Toby B, Pommerenke DJ, Walker M, Essary C, Dixon P, Beetner DG. Shielding Methods for Gigahertz-Frequency Wideband Analog-Integrated Circuits Ieee Transactions On Electromagnetic Compatibility. 58: 1042-1051. DOI: 10.1109/Temc.2016.2548430  0.693
2016 Halligan MS, Tian X, Li X, Connor S, Beetner DG, Drewniak JL. Quantifying High-Density Connector Radiation in a Lossy Multisignal Environment Ieee Transactions On Electromagnetic Compatibility. 58: 270-277. DOI: 10.1109/Temc.2015.2502267  0.684
2015 Gao X, Sui C, Hemmady S, Rivera J, Yakura SJ, Pommerenke D, Patnaik A, Beetner DG. Modeling Static Delay Variations in Push–Pull CMOS Digital Logic Circuits Due to Electrical Disturbances in the Power Supply Ieee Transactions On Electromagnetic Compatibility. DOI: 10.1109/Temc.2015.2428272  0.407
2014 Halligan MS, Beetner DG. Maximum crosstalk estimation in lossless and homogeneous transmission lines Ieee Transactions On Microwave Theory and Techniques. 62: 1953-1961. DOI: 10.1109/Tmtt.2014.2328975  0.705
2014 Stagner C, Beetner DG, Grant SL. A comparison of algorithms for detecting synchronous digital devices using their unintended electromagnetic emissions Ieee Transactions On Electromagnetic Compatibility. 56: 1304-1312. DOI: 10.1109/Temc.2014.2321391  0.354
2014 Halligan MS, Beetner DG. Maximum crosstalk estimation in weakly coupled transmission lines Ieee Transactions On Electromagnetic Compatibility. 56: 736-744. DOI: 10.1109/Temc.2014.2304735  0.72
2014 Ren L, Li T, Chandra S, Chen X, Bishnoi H, Sun S, Boyle P, Zamek I, Fan J, Beetner DG, Drewniak JL. Prediction of power supply noise from switching activity in an FPGA Ieee Transactions On Electromagnetic Compatibility. 56: 699-706. DOI: 10.1109/Temc.2013.2293872  0.304
2013 Stagner C, Halligan M, Osterwise C, Beetner DG, Grant SL. Locating noncooperative radio receivers using wideband stimulated emissions Ieee Transactions On Instrumentation and Measurement. 62: 667-674. DOI: 10.1109/Tim.2012.2219141  0.691
2011 Stagner C, Conrad A, Osterwise C, Beetner DG, Grant S. A practical superheterodyne-receiver detector using stimulated emissions Ieee Transactions On Instrumentation and Measurement. 60: 1461-1468. DOI: 10.1109/Tim.2010.2101330  0.383
2011 Weng H, Beetner DG, Dubroff RE. Prediction of radiated emissions using near-field measurements Ieee Transactions On Electromagnetic Compatibility. 53: 891-899. DOI: 10.1109/Temc.2011.2141998  0.384
2011 Hu K, Weng H, Beetner DG, Pommerenke D, Drewniak J. Unbalanced Currents in Integrated Circuits and Their Effect on TEM Cell Emissions Ieee Transactions On Electromagnetic Compatibility. DOI: 10.1109/Temc.2011.2118214  0.425
2011 Dong X, Weng H, Beetner DG, Hubing TH. Approximation of worst case crosstalk at high frequencies Ieee Transactions On Electromagnetic Compatibility. 53: 202-208. DOI: 10.1109/Temc.2010.2081676  0.486
2011 Weng H, Beetner DG, Dubroff RE. Frequency-domain probe characterization and compensation using reciprocity Ieee Transactions On Electromagnetic Compatibility. 53: 2-10. DOI: 10.1109/Temc.2010.2059030  0.33
2010 Reck JN, Hu K, Li S, Weng H, Beetner DG, O'Keefe MJ, Ramsay DS, Drewniak JL. Fabrication of two-layer thin-film magnetic-field microprobes on freestanding SU-8 photoepoxy Ieee Transactions On Device and Materials Reliability. 10: 26-32. DOI: 10.1109/Tdmr.2009.2033382  0.314
2009 Wu M, Beetner DG, Hubing TH, Ke H, Sun S. Statistical prediction of "Reasonable worst-case" Crosstalk in cable bundles Ieee Transactions On Electromagnetic Compatibility. 51: 842-851. DOI: 10.1109/Temc.2009.2026740  0.397
2009 Koo J, Han L, Herrin S, Moseley R, Carlton R, Beetner DG, Pommerenke D. A nonlinear microcontroller power distribution network model for the characterization of immunity to electrical fast transients Ieee Transactions On Electromagnetic Compatibility. 51: 611-619. DOI: 10.1109/Temc.2009.2023670  0.35
2008 Deng S, Hubing TH, Beetner DG. Using TEM cell measurements to estimate the maximum radiation from PCBs with cables due to magnetic field coupling Ieee Transactions On Electromagnetic Compatibility. 50: 419-423. DOI: 10.1109/Temc.2008.919026  0.414
2008 Deng S, Hubing T, Beetner D. Estimating Maximum Radiated Emissions From Printed Circuit Boards With an Attached Cable Ieee Transactions On Electromagnetic Compatibility. 50: 215-218. DOI: 10.1109/Temc.2007.915288  0.595
2007 Deng S, Hubing T, Beetner DG. Characterizing the electric field coupling from IC heatsink structures to external cables using TEM cell measurements Ieee Transactions On Electromagnetic Compatibility. 49: 785-791. DOI: 10.1109/Temc.2007.908825  0.4
2007 Weng H, Beetner DG, DuBroff RE, Shi J. Estimation of high-frequency currents from near-field scan measurements Ieee Transactions On Electromagnetic Compatibility. 49: 805-815. DOI: 10.1109/Temc.2007.908264  0.421
2006 Dong X, Weng H, Beetner DG, Hubing TH, Wunsch DC, Noll M, Göksu H, Moss B. Detection and identification of vehicles based on their unintended electromagnetic emissions Ieee Transactions On Electromagnetic Compatibility. 48: 752-758. DOI: 10.1109/Temc.2006.882841  0.342
2005 Weng H, Beetner DG, Dubroff RE, Shi J. Estimation of current from near-field measurement Ieee International Symposium On Electromagnetic Compatibility. 1: 222-227. DOI: 10.1109/ISEMC.2005.1513504  0.302
2004 Dong X, Weng H, Beetner DG, Hubing T, Wiese R, McCallum J. A preliminary study of maximum system-level crosstalk at high frequencies for coupled transmission lines Ieee International Symposium On Electromagnetic Compatibility. 2: 419-423.  0.319
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