Year |
Citation |
Score |
2020 |
Malac M, Cloutier M, Salomons M, Chen S, Yakubu S, Leeson M, Pitters J, Vick D, Price D, Homeniuk D, Hayashida M, Egerton R. NanoMi: An Open Source (Scanning) Transmission Electron Microscope. Microscopy and Microanalysis. 1-4. DOI: 10.1017/S1431927620019431 |
0.601 |
|
2020 |
Hayashida M, Phengchat R, Homeniuk D, Malac M, Harada K, Akashi T, Ohmido N, Fukui K. Higher-order Structure of Human Chromosomes Observed by Electron Tomography and Electron Diffraction Microscopy and Microanalysis. 1-5. DOI: 10.1017/S1431927620015421 |
0.361 |
|
2020 |
Kano E, Malac M, Hayashida M. Substrate and contamination effects on the thermal expansion coefficient of suspended graphene measured by electron diffraction Carbon. 163: 324-332. DOI: 10.1016/J.Carbon.2020.02.008 |
0.324 |
|
2019 |
Harada K, Malac M, Hayashida M, Niitsu K, Shimada K, Homeniuk D, Beleggia M. Toward the quantitative the interpretation of hole-free phase plate images in a transmission electron microscope. Ultramicroscopy. 209: 112875. PMID 31790929 DOI: 10.1016/J.Ultramic.2019.112875 |
0.357 |
|
2019 |
Hayashida M, Cui K, Homeniuk D, Phengchat R, Blackburn AM, Malac M. Parameters affecting the accuracy of nanoparticle shape and size measurement in 3D. Micron (Oxford, England : 1993). 123: 102680. PMID 31146186 DOI: 10.1016/J.Micron.2019.102680 |
0.335 |
|
2019 |
Hettler S, Grünewald L, Malac M. Quasi non-diffractive electron Bessel beams using direct phase masks with applications in electron microscopy New Journal of Physics. 21: 033007. DOI: 10.1088/1367-2630/Ab03Da |
0.407 |
|
2019 |
Malac M, Homeniuk D, Hayashida M, Fujii T, Yaguchi T, Egerton R. In-Situ Mass Thickness Calibrations Using MWCNTs Microscopy and Microanalysis. 25: 792-793. DOI: 10.1017/S1431927619004690 |
0.441 |
|
2018 |
Hettler S, Onoda J, Wolkow R, Pitters J, Malac M. Charging of electron beam irradiated amorphous carbon thin films at liquid nitrogen temperature. Ultramicroscopy. 196: 161-166. PMID 30412841 DOI: 10.1016/J.Ultramic.2018.10.010 |
0.351 |
|
2018 |
Hayashida M, Cui K, Najarian AM, McCreery R, Jehanathan N, Pawlowicz C, Motoki S, Kawasaki M, Konyuba Y, Malac M. Hole free phase plate tomography for materials sciences samples. Micron (Oxford, England : 1993). 116: 54-60. PMID 30300824 DOI: 10.1016/J.Micron.2018.09.005 |
0.344 |
|
2018 |
Hayashida M, Cui K, Malac M, Egerton R. Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEM. Ultramicroscopy. 188: 8-12. PMID 29499457 DOI: 10.1016/J.Ultramic.2018.02.003 |
0.582 |
|
2018 |
Hayashida M, Ogawa S, Malac M. Evaluation of electron tomography reconstruction methods for interface roughness measurement. Microscopy Research and Technique. PMID 29464824 DOI: 10.1002/Jemt.23006 |
0.336 |
|
2018 |
Kotani A, Harada K, Malac M, Salomons M, Hayashida M, Mori S. Observation of FeGe skyrmions by electron phase microscopy with hole-free phase plate Aip Advances. 8: 055216. DOI: 10.1063/1.5028398 |
0.326 |
|
2018 |
Hayashida M, Najarian AM, McCreery R, Malac M. Hole Free Phase Plate Electron Tomography in Material Sciences Microscopy and Microanalysis. 24: 2224-2225. DOI: 10.1017/S1431927618011601 |
0.336 |
|
2018 |
Homeniuk D, Delgado FP, Malac M, Hayashida M. Automation of Image Processing for Nano-beam Diffraction Measurements Microscopy and Microanalysis. 24: 1720-1721. DOI: 10.1017/S143192761800908X |
0.304 |
|
2018 |
Fujii T, Malac M, Kano E, Hayashida M, Yaguchi T, Egerton R. Toward Quantitative Bright Field TEM Imaging of Ultra Thin Samples Microscopy and Microanalysis. 24: 1612-1613. DOI: 10.1017/S1431927618008541 |
0.531 |
|
2017 |
Hettler S, Kano E, Dries M, Gerthsen D, Pfaffmann L, Bruns M, Beleggia M, Malac M. Charging of carbon thin films in scanning and phase-plate transmission electron microscopy. Ultramicroscopy. 184: 252-266. PMID 28992559 DOI: 10.1016/J.Ultramic.2017.09.009 |
0.417 |
|
2017 |
Malac M, Hettler S, Hayashida M, Kawasaki M, Konyuba Y, Okura Y, Iijima H, Ishikawa I, Beleggia M. Computer simulations analysis for determining the polarity of charge generated by high energy electron irradiation of a thin film. Micron (Oxford, England : 1993). 100: 10-22. PMID 28448831 DOI: 10.1016/J.Micron.2017.03.015 |
0.342 |
|
2017 |
Cui K, Bosnick K, Indoe R, Malac M, Mcleod RA. Quality evaluation of ultra-thin samples: Application to graphene. Microscopy Research and Technique. PMID 28370692 DOI: 10.1002/Jemt.22869 |
0.332 |
|
2017 |
Hettler S, Dries M, Hermann P, Obermair M, Gerthsen D, Malac M. Carbon contamination in scanning transmission electron microscopy and its impact on phase-plate applications. Micron (Oxford, England : 1993). 96: 38-47. PMID 28249218 DOI: 10.1016/J.Micron.2017.02.002 |
0.419 |
|
2017 |
Hayashida M, Malac M. Sample preparation method for 3D size measurements of polystyrene nanoparticles with nominal 30, 50, 70 and 100 nm diameters by electron tomography Measurement Science and Technology. 28: 087001. DOI: 10.1088/1361-6501/Aa6F4E |
0.37 |
|
2017 |
Shekhar P, Malac M, Gaind V, Dalili N, Meldrum A, Jacob Z. Momentum-Resolved Electron Energy Loss Spectroscopy for Mapping the Photonic Density of States Acs Photonics. 4: 1009-1014. DOI: 10.1021/Acsphotonics.7B00103 |
0.348 |
|
2017 |
Hayashida M, Cui K, Malac M. Temperature Measurement in a TEM using Electron Diffraction of Amorphous Films Microscopy and Microanalysis. 23: 950-951. DOI: 10.1017/S1431927617005414 |
0.376 |
|
2017 |
Malac M, Kano E, Hayashida M, Kawasaki M, Motoki S, Egerton R, Ishikawa I, Okura Y, Beleggia M. Hole-Free Phase Plate Energy Filtering Imaging of Graphene: Toward Quantitative Hole-Free Phase Plate Imaging in a TEM Microscopy and Microanalysis. 23: 842-843. DOI: 10.1017/S1431927617004871 |
0.54 |
|
2017 |
Hettler S, Hermann P, Dries M, Obermair M, Gerthsen D, Malac M. Contamination and Charging of Amorphous Thin Films Suitable as Phase Plates for Phase-Contrast Transmission Electron Microscopy Microscopy and Microanalysis. 23: 830-831. DOI: 10.1017/S1431927617004810 |
0.363 |
|
2017 |
Morales-Cruz D, Paraguay-Delgado F, Borja-Urby R, Basurto-Cereceda S, Herrera-Pérez G, Longo P, Malac M. Band gap measurement of Bi 2 Mo x W 1-x O 6 by low loss electron energy loss spectroscopy Materials Science in Semiconductor Processing. 63: 184-189. DOI: 10.1016/J.Mssp.2017.02.016 |
0.38 |
|
2016 |
Hayashida M, Malac M. Practical electron tomography guide: Recent progress and future opportunities. Micron (Oxford, England : 1993). 91: 49-74. PMID 27728842 DOI: 10.1016/J.Micron.2016.09.010 |
0.327 |
|
2015 |
Hayashida M, Kumagai K, Malac M. Three dimensional accurate morphology measurements of polystyrene standard particles on silicon substrate by electron tomography. Micron (Oxford, England : 1993). 79: 53-8. PMID 26342192 DOI: 10.1017/S1431927615012805 |
0.348 |
|
2015 |
Hayashida M, Gunawan L, Malac M, Pawlowicz C, Couillard M. High-accuracy electron tomography of semiconductor devices Microscopy and Microanalysis. 21: 1609-1610. DOI: 10.1017/S143192761500882X |
0.311 |
|
2015 |
Malac M, Beleggia M, Rowan T, Egerton R, Kawasaki M, Okura Y, McLeod RA. Electron Beam-Induced Charging and Modifications of Thin Films Microscopy and Microanalysis. 21: 1385-1388. DOI: 10.1017/S1431927615007710 |
0.58 |
|
2014 |
Hayashida M, Malac M, Bergen M, Egerton RF, Li P. Accurate measurement of relative tilt and azimuth angles in electron tomography: a comparison of fiducial marker method with electron diffraction. The Review of Scientific Instruments. 85: 083704. PMID 25173273 DOI: 10.1063/1.4892436 |
0.601 |
|
2014 |
Egerton RF, Mcleod RA, Malac M. Validity of the dipole approximation in TEM-EELS studies. Microscopy Research and Technique. 77: 773-8. PMID 25045082 DOI: 10.1002/Jemt.22398 |
0.561 |
|
2014 |
Hayashida M, Malac M, Bergen M, Li P. Nano-dot markers for electron tomography formed by electron beam-induced deposition: nanoparticle agglomerates application. Ultramicroscopy. 144: 50-7. PMID 24837022 DOI: 10.1017/S1431927614005637 |
0.4 |
|
2014 |
McLeod RA, Bergen M, Malac M. Phase measurement error in summation of electron holography series. Ultramicroscopy. 141: 38-50. PMID 24713344 DOI: 10.1016/J.Ultramic.2014.03.001 |
0.321 |
|
2014 |
McLeod RA, Kupsta M, Malac M. Determination of localized visibility in off-axis electron holography. Ultramicroscopy. 138: 4-12. PMID 24370949 DOI: 10.1016/J.Ultramic.2013.11.005 |
0.418 |
|
2014 |
Hayashida M, Malac M, Bergen M, Li P, Egerton R. Electron diffraction based tilt angle measurements in electron tomography Microscopy and Microanalysis. 20: 806-807. DOI: 10.1017/S1431927614005753 |
0.565 |
|
2014 |
Malac M, Kimoto K, Egerton R, Shekhar P, Jacob Z, Taniguchi Y, Gaind V. Angle-resolved valence EELS of a single crystal gold sample Microscopy and Microanalysis. 20: 628-629. DOI: 10.1017/S1431927614004863 |
0.506 |
|
2014 |
Malac M, Beleggia M, Egerton R, Kawasaki M, Berge M, Okura Y, Ishikawa I, Motoki K. Charging of thin film phase plates under electron beam irradiation Microscopy and Microanalysis. 20: 230-231. DOI: 10.1017/S1431927614002876 |
0.587 |
|
2014 |
Shekhar P, Gaind V, Malac M, Egerton R, Jacob Z. Momentum-resolved electron energy loss spectroscopy (q-EELS) for quantum plasmonics and metamaterials Optics Infobase Conference Papers. |
0.548 |
|
2013 |
Pollard S, Malac M, Beleggia M, Kawasaki M, Zhu Y. Magnetic imaging with a Zernike-type phase plate in a transmission electron microscope Applied Physics Letters. 102. DOI: 10.1063/1.4803908 |
0.366 |
|
2013 |
Zhang HR, Egerton R, Malac M. Electron irradiation damage and color centers of MgO nanocube Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 316: 137-143. DOI: 10.1016/J.Nimb.2013.08.042 |
0.616 |
|
2012 |
Malac M, Beleggia M, Kawasaki M, Li P, Egerton RF. Convenient contrast enhancement by a hole-free phase plate. Ultramicroscopy. 118: 77-89. PMID 22743212 DOI: 10.1016/J.Ultramic.2012.02.004 |
0.597 |
|
2012 |
Wang X, Lockwood R, Vick D, Li P, Meldrum A, Malac M. A convenient method for electron tomography sample preparation using a focused ion beam. Microscopy Research and Technique. 75: 1165-9. PMID 22461153 DOI: 10.1002/Jemt.22044 |
0.547 |
|
2012 |
Zhang HR, Egerton RF, Malac M. Local thickness measurement through scattering contrast and electron energy-loss spectroscopy. Micron (Oxford, England : 1993). 43: 8-15. PMID 21803591 DOI: 10.1016/J.Micron.2011.07.003 |
0.563 |
|
2012 |
Sayed SY, Wang F, Malac M, Li P, Wang D, Buriak J. Preferential face deposition of gold nanoparticles on silicon nanowires by galvanic displacement Crystengcomm. 14: 5230-5234. DOI: 10.1039/C2Ce25254F |
0.329 |
|
2012 |
McLeod R, Malac M. Two-step Deconvolution in Electron Energy-loss Spectroscopy on hBN K-edge Microscopy and Microanalysis. 18: 1034-1035. DOI: 10.1017/S1431927612007027 |
0.381 |
|
2012 |
Li P, Kupsta M, Cui K, Malac M, Hosseinkhannazer H, Ning Y, LaForge J, Beaudry A, Brett M. Electron Tomography Applied to an Indium Tin Oxide Nanowhisker Microscopy and Microanalysis. 18: 568-569. DOI: 10.1017/S1431927612004692 |
0.37 |
|
2012 |
Malac M, Bergen M, Egerton R, Kawasaki M, Beleggia M, Furukawa H, Shimizu M. Practical hole-free phase plate imaging: principles, advantages and pitfalls Microscopy and Microanalysis. 18: 484-485. DOI: 10.1017/S1431927612004278 |
0.512 |
|
2012 |
Wang XY, Lockwood R, Malac M, Furukawa H, Li P, Meldrum A. Reconstruction and visualization of nanoparticle composites by transmission electron tomography Ultramicroscopy. 113: 96-105. DOI: 10.1016/J.Ultramic.2011.11.001 |
0.339 |
|
2011 |
Malac M, Egerton R, Wang J. Radiation damage and electron energy loss spectroscopy of Au particles on amorphous Ge substrates Acta Crystallographica Section a Foundations of Crystallography. 67: C636-C637. DOI: 10.1107/S0108767311083899 |
0.555 |
|
2011 |
Chen J, Jiang H, Qian H, Malac M. Nanoscale structure of oxidized and reduced rhodium-loaded ZrO 2-CeO2 catalysts Journal of Physical Chemistry C. 115: 14173-14179. DOI: 10.1021/Jp112272C |
0.308 |
|
2011 |
Zhang H, Egerton R, Malac M. EELS Investigation of the Formulas for Inelastic Mean Free Path Microscopy and Microanalysis. 17: 1466-1467. DOI: 10.1017/S1431927611008208 |
0.541 |
|
2011 |
McLeod R, Bergen M, Malac M. Technique for Complex Averaging of Electron Holograms Microscopy and Microanalysis. 17: 918-919. DOI: 10.1017/S1431927611005460 |
0.357 |
|
2011 |
Wang X, Lockwood R, Vick D, Meldrum A, Malac M. A New Method to Fabricate 3D Electron Tomography Sample Using FIB Technique Microscopy and Microanalysis. 17: 690-691. DOI: 10.1017/S1431927611004326 |
0.554 |
|
2011 |
Wang X, Li P, Malac M, Lockwood R, Meldrum A. The spatial distribution of silicon NCs and erbium ion clusters by simultaneous high-resolution energy filtered and Z-contrast STEM and transmission electron tomography Physica Status Solidi (C) Current Topics in Solid State Physics. 8: 1038-1043. DOI: 10.1002/Pssc.201000393 |
0.541 |
|
2010 |
Borzsonyi G, Beingessner RL, Yamazaki T, Cho JY, Myles AJ, Malac M, Egerton R, Kawasaki M, Ishizuka K, Kovalenko A, Fenniri H. Water-soluble J-type rosette nanotubes with giant molar ellipticity. Journal of the American Chemical Society. 132: 15136-9. PMID 20936820 DOI: 10.1021/Ja105028W |
0.521 |
|
2010 |
Krause KM, Vick DW, Malac M, Brett MJ. Taking a little off the top: nanorod array morphology and growth studied by focused ion beam tomography. Langmuir : the Acs Journal of Surfaces and Colloids. 26: 17558-67. PMID 20879751 DOI: 10.1021/La103070X |
0.35 |
|
2010 |
Wang J, Wang XJ, Jiao Y, Chu MW, Malac M, Li Q. Surface plasmon resonance in interacting Si nanoparticle chains. Nanoscale. 2: 681-4. PMID 20648309 DOI: 10.1039/B9Nr00352E |
0.309 |
|
2010 |
Li P, Concepcion P, Wang X, Malac M, Meldrum A. Electron Tomography of Si and Er Particles in SiOx film Without Missing Wedge Microscopy and Microanalysis. 16: 1886-1887. DOI: 10.1017/S143192761006280X |
0.565 |
|
2010 |
Wang X, Malac M, Meldrum A, Lockwood R, Li P, Furukawa H. Limits of Tomographic Reconstruction of Discrete Nanoparticles Microscopy and Microanalysis. 16: 1868-1869. DOI: 10.1017/S143192761006068X |
0.51 |
|
2010 |
Zhang H, Egerton R, Malac M. Local Thickness Measurement in TEM Microscopy and Microanalysis. 16: 344-345. DOI: 10.1017/S1431927610058630 |
0.552 |
|
2010 |
Li P, Chen J, Malac M, Yan H, Bonifas A, McCreery R. HRTEM and Nano-Beam Diffraction Analysis of Metal-Molecule Interface Microscopy and Microanalysis. 16: 1896-1897. DOI: 10.1017/S1431927610055935 |
0.307 |
|
2010 |
Li P, Malac M, Glaves J, Young H. Electron Diffraction Analysis of 2D Protein Crystals with Large dhkl Spacing Microscopy and Microanalysis. 16: 1080-1081. DOI: 10.1017/S1431927610055923 |
0.328 |
|
2010 |
Malac M, Kawasaki M, Beleggia M, Li P, Egerton R. Convenient Contrast Enhancement by Hole-Free Phase Plate in a TEM Microscopy and Microanalysis. 16: 526-527. DOI: 10.1017/S1431927610055807 |
0.563 |
|
2010 |
Jiang H, Chen J, Malac M. Study of the Rhodium Nanoparticles in ZrO2-CeO2 Based Catalytic Materials using Nano Beam Diffraction and High Resolution TEM Microscopy and Microanalysis. 16: 1514-1515. DOI: 10.1017/S1431927610055789 |
0.342 |
|
2010 |
Zhang H, Malac M, Egerton R. Electron Irradiation Damage of MgO Nanocube Microscopy and Microanalysis. 16: 1794-1795. DOI: 10.1017/S1431927610054735 |
0.602 |
|
2010 |
Egerton RF, McLeod R, Wang F, Malac M. Basic questions related to electron-induced sputtering in the TEM Ultramicroscopy. 110: 991-997. DOI: 10.1016/J.Ultramic.2009.11.003 |
0.578 |
|
2009 |
Sayed SY, Wang F, Malac M, Meldrum A, Egerton RF, Buriak JM. Heteroepitaxial growth of gold nanostructures on silicon by galvanic displacement. Acs Nano. 3: 2809-17. PMID 19719082 DOI: 10.1021/Nn900685A |
0.57 |
|
2009 |
Wang F, Egerton R, Malac M. Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS). Ultramicroscopy. 109: 1245-9. PMID 19577847 DOI: 10.1016/J.Ultramic.2009.05.011 |
0.572 |
|
2009 |
Wang J, Wang XJ, Jiao Y, Li Q, Chu MW, Malac M. From nanoparticle to nanocable: Impact of size and geometrical constraints on the optical modes of Si/SiO2 core/shell nanostructures Applied Physics Letters. 95. DOI: 10.1063/1.3237162 |
0.341 |
|
2009 |
Wang J, Li Q, Peng LM, Malac M. The dielectric response of the H2Ti3O7 nanotube investigated by valence electron energy loss spectroscopy Applied Physics Letters. 94. DOI: 10.1063/1.3067994 |
0.384 |
|
2009 |
Wang F, Sayed SY, Malac M, Wang D, Egerton R, Buriak J. TEM studies of Au/Si epilayer interfaces Microscopy and Microanalysis. 15: 1450-1451. DOI: 10.1017/S1431927609095658 |
0.521 |
|
2009 |
Wang J, Li Q, Peng LM, Malac M. Electron energy loss spectroscopy study on the dielectric response of single H2Ti3O7 nanotube Microscopy and Microanalysis. 15: 1218-1219. DOI: 10.1017/S1431927609095452 |
0.369 |
|
2009 |
Moreno MS, Cadavid D, Santilĺn MJ, Egerton RF, Malac M. Electron radiation damage in TiOx nanobelts Microscopy and Microanalysis. 15: 1340-1341. DOI: 10.1017/S143192760909463X |
0.528 |
|
2009 |
Kawasaki M, Malac M, Li P, Qian H, Egerton R. Convenient electron optics set up for zernike phase microscopy in TEM Microscopy and Microanalysis. 15: 1234-1235. DOI: 10.1017/S1431927609094598 |
0.53 |
|
2009 |
Li P, Wang X, Malac M, Egerton R, Meldrum A, Lenz F, Liang X, Wang J. 3D imaging of Si and Er Nanoclusters in Er Doped SiO1.5 films by STEM tomography Microscopy and Microanalysis. 15: 1256-1257. DOI: 10.1017/S1431927609093143 |
0.632 |
|
2009 |
Egerton R, Wang F, McLeod R, Malac M. Basic questions related to electron-induced sputtering Microscopy and Microanalysis. 15: 1356-1357. DOI: 10.1017/S1431927609092204 |
0.589 |
|
2008 |
Malac M, Beleggia M, Taniguchi Y, Egerton RF, Zhu Y. Low-dose performance of parallel-beam nanodiffraction. Ultramicroscopy. 109: 14-21. PMID 18768263 DOI: 10.1016/J.Ultramic.2008.07.004 |
0.599 |
|
2008 |
Malac M, Zhu Y, Botton G. Electron energy-loss spectroscopy. Preface. Micron (Oxford, England : 1993). 39: 639-40. PMID 18060795 DOI: 10.1016/J.Micron.2007.10.003 |
0.387 |
|
2008 |
Egerton RF, Wang F, Malac M, Moreno MS, Hofer F. Fourier-ratio deconvolution and its Bayesian equivalent. Micron (Oxford, England : 1993). 39: 642-7. PMID 18036824 DOI: 10.1016/J.Micron.2007.10.004 |
0.568 |
|
2008 |
Malac M, Beleggia M, Egerton R, Zhu Y. Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase plates. Ultramicroscopy. 108: 126-40. PMID 17509765 DOI: 10.1016/J.Ultramic.2007.03.008 |
0.575 |
|
2008 |
Wang F, Egerton RF, Malac M, McLeod RA, Moreno MS. The spatial resolution of electron energy loss and x-ray absorption fine structure Journal of Applied Physics. 104. DOI: 10.1063/1.2960582 |
0.624 |
|
2008 |
Sayed SY, Wang F, Malac M, Egerton R, Buriak J. Synthesis and interfacial characterization of Au nanoparticles on Si nanowires Microscopy and Microanalysis. 14: 302-303. DOI: 10.1017/S1431927608086881 |
0.535 |
|
2008 |
McLeod RA, Malac M. Evaluating visibility and spatial resolution in electron holography Microscopy and Microanalysis. 14: 854-855. DOI: 10.1017/S1431927608083967 |
0.347 |
|
2008 |
Egerton R, Wang F, Malac M. Spatial resolution and delocalization of the EELS core-loss fine structure Microscopy and Microanalysis. 14: 1344-1345. DOI: 10.1017/S1431927608082597 |
0.529 |
|
2008 |
Wang F, Egerton R, Malac M. Use of Fourier-ratio deconvolution for processing low-loss EELS spectra Microscopy and Microanalysis. 14: 1412-1413. DOI: 10.1017/S1431927608082573 |
0.519 |
|
2007 |
Wang F, Malac M, Egerton RF. Alternative methods of identifying the oxidation of metallic nanoparticles embedded in a matrix. Micron (Oxford, England : 1993). 38: 371-6. PMID 16959491 DOI: 10.1016/J.Micron.2006.06.006 |
0.54 |
|
2007 |
Malac M, Beleggia M, Egerton R, Zhu Y. Bright-field TEM imaging of single molecules: dream or near future? Ultramicroscopy. 107: 40-9. PMID 16820263 DOI: 10.1016/J.Ultramic.2006.05.001 |
0.593 |
|
2007 |
Qian H, Malac M, Egerton RF. Microscopy of pentacene thin films Philosophical Magazine. 87: 253-266. DOI: 10.1080/14786430600953756 |
0.57 |
|
2007 |
Wang F, Malac M, Egerton RF, Meldrum A, Zhu X, Liu Z, MacDonald N, Li P, Freeman MR. Multilayer route to iron nanoparticle formation in an insulating matrix Journal of Applied Physics. 101. DOI: 10.1063/1.2434953 |
0.574 |
|
2007 |
Wang F, Malac M, Egerton RF, Meldrum A, Li P, Freeman MR, Veinot JGC. Controlled growth of silicon oxide nanowires from a patterned reagent Journal of Physical Chemistry C. 111: 1865-1867. DOI: 10.1021/Jp0675476 |
0.538 |
|
2007 |
Wang F, Malac M, Qian H, Egerton R. Oxidation Mapping by Postpeak Technique Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607077513 |
0.576 |
|
2007 |
Malac M, Wang F, Egerton R, Taniguchi Y. Parallel Beam Nano-Diffraction Analysis of Individual Nanoparticles Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607072984 |
0.545 |
|
2007 |
Malac M. Microscopy of Nanostructures Micron. 38: 333-334. DOI: 10.1016/J.Micron.2006.06.001 |
0.361 |
|
2007 |
Hessel C, Summers M, Meldrum A, Malac M, Veinot J. Inside Front Cover: Direct Patterning, Conformal Coating, and Erbium Doping of Luminescent nc-Si/SiO2 Thin Films from Solution Processable Hydrogen Silsesquioxane (Adv. Mater. 21/2007) Advanced Materials. 19: NA-NA. DOI: 10.1002/Adma.200790084 |
0.317 |
|
2006 |
Wang F, Egerton RF, Malac M. Interpretation of the postpeak in iron fluorides and oxides. Ultramicroscopy. 106: 925-32. PMID 16764991 DOI: 10.1016/J.Ultramic.2006.04.005 |
0.566 |
|
2006 |
Wang F, Malac M, Egerton RF. Energy-loss near-edge fine structures of iron nanoparticles. Micron (Oxford, England : 1993). 37: 316-23. PMID 16563777 DOI: 10.1016/J.Micron.2005.12.003 |
0.557 |
|
2006 |
Egerton RF, Qian H, Malac M. Improving the energy resolution of X-ray and electron energy-loss spectra. Micron (Oxford, England : 1993). 37: 310-5. PMID 16376551 DOI: 10.1016/J.Micron.2005.11.005 |
0.595 |
|
2006 |
Zhu Y, Beetz T, Wu L, Klie R, Huang L, Lau JW, Schofield MA, Volkov VV, Beleggia M, Malac M. Measurements of functional response of nano-objects using advanced electron microscopy Microscopy and Microanalysis. 12: 540-541. DOI: 10.1017/S143192760606925X |
0.346 |
|
2006 |
Malac M, Beleggia M, Egerton R, Zhu Y. Optimized Cs-corrected imaging of radiation-sensitive high-resolution objects Microscopy and Microanalysis. 12: 1458-1459. DOI: 10.1017/S1431927606067341 |
0.525 |
|
2006 |
Wang F, Malac M, Egerton RF, Li P, Meldrum A, Freeman MR. An ELNES study of SiO2 nanowires grown from a patterned reagent Microscopy and Microanalysis. 12: 1172-1173. DOI: 10.1017/S1431927606064336 |
0.524 |
|
2005 |
Malac M, Egerton R, Freeman M, Lau J, Zhu Y, Wu L. Electron-beam patterning with sub-2 nm line edge roughness Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 23: 271-273. DOI: 10.1116/1.1856466 |
0.575 |
|
2005 |
Qian H, Egerton R, Malac M. Electron Radiation Damage of Pentacene Thin Films Measured in TEM Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605503817 |
0.594 |
|
2005 |
Malac M, Beleggia M, Egerton RF, Zhu Y. Cs Corrected Bright Field Imaging of Radiation Sensitive Materials Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605501053 |
0.522 |
|
2005 |
Egerton RF, Malac M. EELS in the TEM Journal of Electron Spectroscopy and Related Phenomena. 143: 43-50. DOI: 10.1016/J.Elspec.2003.12.009 |
0.608 |
|
2004 |
Egerton RF, Li P, Malac M. Radiation damage in the TEM and SEM. Micron (Oxford, England : 1993). 35: 399-409. PMID 15120123 DOI: 10.1016/J.Micron.2004.02.003 |
0.594 |
|
2004 |
Egerton RF, Malac M. The lateral range and energy deposition of fast secondary electrons Microscopy and Microanalysis. 10: 1382-1383. DOI: 10.1017/S1431927604880541 |
0.601 |
|
2003 |
Beleggia M, Schofield MA, Zhu Y, Malac M, Liu Z, Freeman M. Quantitative study of magnetic field distribution by electron holography and micromagnetic simulations Applied Physics Letters. 83: 1435-1437. DOI: 10.1063/1.1603355 |
0.336 |
|
2002 |
Egerton RF, Malac M. Improved background-fitting algorithms for ionization edges in electron energy-loss spectra. Ultramicroscopy. 92: 47-56. PMID 12138942 DOI: 10.1016/S0304-3991(01)00155-3 |
0.572 |
|
2002 |
Malac M, Schoefield M, Zhu Y, Egerton R. Exposure characteristics of cobalt fluoride (CoF 2) self-developing electron-beam resist on sub-100 nm scale Journal of Applied Physics. 92: 1112-1121. DOI: 10.1063/1.1487914 |
0.628 |
|
2002 |
Volkov VV, Zhu Y, Malac M, Lau JW, Schofield MA. Magnetic induction mapping in TEM of micro- and nano-patterned Co/Ni arrays Microscopy and Microanalysis. 8: 1344-1345. DOI: 10.1017/S1431927602103345 |
0.337 |
|
2001 |
Zhu Y, Egerton RF, Malac M. Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging. Ultramicroscopy. 87: 135-45. PMID 11330500 DOI: 10.1016/S0304-3991(00)00094-2 |
0.62 |
|
2001 |
Malac M. Observations of the microscopic growth mechanism of pillars and helices formed by glancing-angle thin-film deposition Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 19: 158-166. DOI: 10.1116/1.1326940 |
0.34 |
|
2001 |
Malac M, Egerton RF. Thin-film regular-array structures with 10-100 nm repeat distance Nanotechnology. 12: 11-13. DOI: 10.1088/0957-4484/12/1/303 |
0.577 |
|
2001 |
Zhu Y, Wu L, Volkov V, Li Q, Gu G, Moodenbaugh AR, Malac M, Suenaga M, Tranquada J. Microstructure and structural defects in MgB2 superconductor Physica C: Superconductivity and Its Applications. 356: 239-253. DOI: 10.1016/S0921-4534(01)00700-6 |
0.317 |
|
2001 |
Minami H, Manage D, Tsui YY, Fedosejevs R, Malac M, Egerton R. Diamond-like-carbon films produced by magnetically guided pulsed laser deposition Applied Physics a: Materials Science and Processing. 73: 531-534. DOI: 10.1007/S003390101009 |
0.494 |
|
2000 |
Dick B, Brett MJ, Smy TJ, Freeman MR, Malac M, Egerton RF. Periodic magnetic microstructures by glancing angle deposition Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 18: 1838-1844. DOI: 10.1116/1.582481 |
0.527 |
|
1999 |
Malac M, Egerton RF. Calibration Specimens for Determining Energy-Dispersive X-ray k-Factors of Boron, Nitrogen, Oxygen, and Fluorine. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 5: 29-38. PMID 10227824 DOI: 10.1017/S1431927699000021 |
0.605 |
|
1999 |
Malac M, Egerton RF, Brett MJ, Dick B. Fabrication of submicrometer regular arrays of pillars and helices Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 17: 2671-2674. DOI: 10.1116/1.591046 |
0.53 |
|
1998 |
Egerton R, Malac M. K-Factor Standards for Low-Z Quantification Microscopy and Microanalysis. 4: 230-231. DOI: 10.1017/S1431927600021279 |
0.48 |
|
Show low-probability matches. |