Chang Chang, Ph.D.

Affiliations: 
University of California, Berkeley, Berkeley, CA, United States 
Google:
"Chang Chang"

Parents

Sign in to add mentor
David Wood grad student 2002 UC Berkeley
 (Coherence techniques at extreme ultraviolet wavelengths.)
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Chang C, Sakdinawat A, Fischer P, et al. (2006) Single-element objective lens for soft x-ray differential interference contrast microscopy. Optics Letters. 31: 1564-6
Rosfjord K, Chang C, Miyakawa R, et al. (2006) Direct index of refraction measurements at extreme-ultraviolet and soft-x-ray wavelengths. Applied Optics. 45: 1730-6
Chang C, Anderson E, Naulleau P, et al. (2002) Direct measurement of index of refraction in the extreme-ultraviolet wavelength region with a novel interferometer. Optics Letters. 27: 1028-30
Chang C, Naulleau P, Anderson E, et al. (2002) Diffractive optical elements based on Fourier optical techniques: a new class of optics for extreme ultraviolet and soft x-ray wavelengths. Applied Optics. 41: 7384-9
Liu Y, Seminario M, Tomasel FG, et al. (2001) Achievement of essentially full spatial coherence in a high-average-power soft-x-ray laser Physical Review a. Atomic, Molecular, and Optical Physics. 63: 338021-338025
Liu Y, Seminario M, Tomasel FG, et al. (2001) Spatial coherence measurement of a high average power table-top soft X-ray laser Journal De Physique Iv. 11
Chang C, Naulleau PP, Anderson EH, et al. (2001) Spatial coherence properties of undulator radiation based on Thompson-Wolf two-pinhole measurement Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment. 467: 913-916
Chang C, Naulleau P, Anderson E, et al. (2000) Spatial coherence characterization of undulator radiation Optics Communications. 182: 25-34
Naulleau PP, Goldberg KA, Lee SH, et al. (1999) Extreme-ultraviolet phase-shifting point-diffraction interferometer: a wave-front metrology tool with subangstrom reference-wave accuracy. Applied Optics. 38: 7252-63
Attwood DT, Naulleau P, Goldberg KA, et al. (1999) Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions Ieee Journal of Quantum Electronics. 35: 709-719
See more...