Matthew T. Russell, Ph.D. - Publications
Affiliations: | 2008 | Chemistry | Northwestern University, Evanston, IL |
Area:
Catalyic ChemistryYear | Citation | Score | |||
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2007 | Guo N, DiBenedetto SA, Kwon DK, Wang L, Russell MT, Lanagan MT, Facchetti A, Marks TJ. Supported metallocene catalysis for in situ synthesis of high energy density metal oxide nanocomposites. Journal of the American Chemical Society. 129: 766-7. PMID 17243805 DOI: 10.1021/Ja066965L | 0.456 | |||
2007 | Yoon MH, DiBenedetto SA, Russell MT, Facchetti A, Marks TJ. High-performance n-channel carbonyl-functionalized quaterthiophene semiconductors: Thin-film transistor response and majority carrier type inversion via simple chemical protection/deprotection Chemistry of Materials. 19: 4864-4881. DOI: 10.1021/Cm071230G | 0.522 | |||
2007 | Pingree LSC, Russell MT, Marks TJ, Hersam MC. Monitoring interface traps in operating organic light-emitting diodes using impedance spectroscopy Thin Solid Films. 515: 4783-4787. DOI: 10.1016/J.Tsf.2006.11.186 | 0.448 | |||
2007 | Pingree LSC, Russell MT, Scott BJ, Marks TJ, Hersam MC. Probing individual nanoscale organic light-emitting diodes with atomic force electroluminescence microscopy and bridge-enhanced nanoscale impedance microscopy Organic Electronics: Physics, Materials, Applications. 8: 465-479. DOI: 10.1016/J.Orgel.2007.02.008 | 0.407 | |||
2006 | Russell MT, Pingree LS, Hersam MC, Marks TJ. Microscale features and surface chemical functionality patterned by electron beam lithography: a novel route to poly(dimethylsiloxane) (PDMS) stamp fabrication. Langmuir : the Acs Journal of Surfaces and Colloids. 22: 6712-8. PMID 16831018 DOI: 10.1021/La060319I | 0.397 | |||
2006 | Pingree LSC, Russell MT, Marks TJ, Hersam MC. Field dependent negative capacitance in small-molecule organic light-emitting diodes Journal of Applied Physics. 100. DOI: 10.1063/1.2234544 | 0.398 | |||
2005 | Pingree LSC, Scott BJ, Russell MT, Marks TJ, Hersam MC. Negative capacitance in organic light-emitting diodes Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1865346 | 0.419 | |||
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