Sourindra M. Chaudhuri, Ph.D. - Publications
Affiliations: | 2015 | Electrical Engineering | Princeton University, Princeton, NJ |
Area:
Biological & Biomedical,Computing & Networking,Energy & Environment,High-Performance Computing,Integrated Electronic Systems,Nanotechnologies,Quantum Information,SecurityYear | Citation | Score | |||
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2016 | Chaudhuri SM, Jha NK. Ultra-low-leakage and high-performance logic circuit design using multiparameter asymmetric FinFETs Acm Journal On Emerging Technologies in Computing Systems. 12. DOI: 10.1145/2832913 | 0.529 | |||
2016 | Chaudhuri S, Bhoj AN, Bhattacharya D, Jha NK. Fast FinFET Device Simulation under Process-Voltage Variations Using an Assisted Speed-Up Mechanism Proceedings of the Ieee International Conference On Vlsi Design. 2016: 300-305. DOI: 10.1109/VLSID.2016.34 | 0.306 | |||
2014 | Chaudhuri SM, Mishra P, Jha NK. Accurate leakage/delay estimation for FinFET standard cells under PVT variations using the response surface methodology Acm Journal On Emerging Technologies in Computing Systems. 11. DOI: 10.1145/2665066 | 0.649 | |||
2014 | Chaudhuri SM, Jha NK. 3D vs. 2D device simulation of FinFET logic gates under PVT variations Acm Journal On Emerging Technologies in Computing Systems. 10. DOI: 10.1145/2567670 | 0.685 | |||
2012 | Chaudhuri S, Mishra P, Jha NK. Accurate leakage estimation for FinFET standard cells using the response surface methodology Proceedings of the Ieee International Conference On Vlsi Design. 238-244. DOI: 10.1109/VLSID.2012.77 | 0.615 | |||
2011 | Chaudhuri S, Jha NK. 3D vs. 2D analysis of FinFET logic gates under process variations Proceedings - Ieee International Conference On Computer Design: Vlsi in Computers and Processors. 435-436. DOI: 10.1109/ICCD.2011.6081437 | 0.603 | |||
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