Year |
Citation |
Score |
2017 |
Kang KM, Choi SH, Hwang M, Yun TJ, Kim JH, Sohn CH. T1 Shortening in the Globus Pallidus after Multiple Administrations of Gadobutrol: Assessment with a Multidynamic Multiecho Sequence. Radiology. 162852. PMID 29091750 DOI: 10.1148/radiol.2017162852 |
0.316 |
|
2017 |
Im S, Lee HN, Jung HS, Yang S, Park EJ, Hwang MS, Jeong WJ, Choi DW. Transcriptome-Based Identification of the Desiccation Response Genes in Marine Red Algae Pyropia tenera (Rhodophyta) and Enhancement of Abiotic Stress Tolerance by PtDRG2 in Chlamydomonas. Marine Biotechnology (New York, N.Y.). PMID 28421378 DOI: 10.1007/s10126-017-9744-x |
0.321 |
|
2016 |
Kang HS, Ko A, Kwon JE, Kyung MS, Moon GI, Park JH, Lee HS, Suh JH, Lee JM, Hwang MS, Kim K, Hong JH, Hwang IG. Urinary benzophenone concentrations and their association with demographic factors in a South Korean population. Environmental Research. 149: 1-7. PMID 27155137 DOI: 10.1016/j.envres.2016.04.036 |
0.329 |
|
2016 |
Hwang ME, Kwon S. DPFFs: C 2 MOS Direct Path Flip-Flops for Process-Resilient Ultradynamic Voltage Scaling Journal of Electrical and Computer Engineering. 2016. DOI: 10.1155/2016/8268917 |
0.329 |
|
2011 |
Hwang ME. Supply-voltage scaling close to the fundamental limit under process variations in nanometer technologies Ieee Transactions On Electron Devices. 58: 2808-2813. DOI: 10.1109/Ted.2011.2151257 |
0.323 |
|
2010 |
Hwang ME, Roy K. ABRM: Adaptive β-ratio modulation for process-tolerant ultradynamic voltage scaling Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 18: 281-290. DOI: 10.1109/Tvlsi.2008.2010767 |
0.462 |
|
2009 |
Hwang ME, Jung SO, Roy K. Slope interconnect effort: Gate-interconnect interdependent delay modeling for early CMOS circuit simulation Ieee Transactions On Circuits and Systems I: Regular Papers. 56: 1428-1441. DOI: 10.1109/Tcsi.2008.2006217 |
0.429 |
|
2005 |
Hwang ME, Raychowdhury A, Roy K. Energy-recovery techniques to reduce on-chip power density in molecular nanotechnologies Ieee Transactions On Circuits and Systems I: Regular Papers. 52: 1580-1589. DOI: 10.1109/Tcsi.2005.851692 |
0.529 |
|
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