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David Attwood - Publications

Affiliations: 
Applied Science & Technology University of California, Berkeley, Berkeley, CA, United States 
Area:
Optics Physics, Electronics and Electrical Engineering, Applied Mathematics
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53 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2017 Zürch M, Jung R, Späth C, Tümmler J, Guggenmos A, Attwood D, Kleineberg U, Stiel H, Spielmann C. Transverse Coherence Limited Coherent Diffraction Imaging using a Molybdenum Soft X-ray Laser Pumped at Moderate Pump Energies. Scientific Reports. 7: 5314. PMID 28706258 DOI: 10.1038/S41598-017-05789-W  0.44
2012 Singer A, Sorgenfrei F, Mancuso AP, Gerasimova N, Yefanov OM, Gulden J, Gorniak T, Senkbeil T, Sakdinawat A, Liu Y, Attwood D, Dziarzhytski S, Mai DD, Treusch R, Weckert E, et al. Spatial and temporal coherence properties of single free-electron laser pulses. Optics Express. 20: 17480-95. PMID 23038301 DOI: 10.1364/Oe.20.017480  0.312
2011 Vartanyants IA, Singer A, Mancuso AP, Yefanov OM, Sakdinawat A, Liu Y, Bang E, Williams GJ, Cadenazzi G, Abbey B, Sinn H, Attwood D, Nugent KA, Weckert E, Wang T, et al. Coherence properties of individual femtosecond pulses of an x-ray free-electron laser. Physical Review Letters. 107: 144801. PMID 22107200 DOI: 10.1103/Physrevlett.107.144801  0.436
2010 Sakdinawat A, Attwood D. Nanoscale X-ray imaging Nature Photonics. 4: 840-848. DOI: 10.1038/Nphoton.2010.267  0.469
2009 Corlett J, Attwood D, Byrd J, Denes P, Falcone R, Heimann P, Leemans W, Padmore H, Prestemon S, Sannibale F, Schlueter R, Schroeder C, Staples J, Venturini M, Warwick T, et al. R&D for a Soft X-Ray Free Electron Laser Facility Lawrence Berkeley National Laboratory. DOI: 10.2172/964409  0.349
2009 Attwood D. Introduction to diffraction limited X-ray optics Optics Infobase Conference Papers. DOI: 10.1364/Fio.2009.Ftha1  0.467
2008 Attwood D. Coherence, optics and applications at X‐ray wavelengths X‐Ray and Inner‐Shell Processes. 215: 270-277. DOI: 10.1063/1.39797  0.328
2006 Attwood D. Microscopy: nanotomography comes of age. Nature. 442: 642-3. PMID 16900191 DOI: 10.1038/442642B  0.399
2006 Chang C, Sakdinawat A, Fischer P, Anderson E, Attwood D. Single-element objective lens for soft x-ray differential interference contrast microscopy. Optics Letters. 31: 1564-6. PMID 16642173 DOI: 10.1364/Ol.31.001564  0.46
2006 Rosfjord K, Chang C, Miyakawa R, Barth H, Attwood D. Direct index of refraction measurements at extreme-ultraviolet and soft-x-ray wavelengths. Applied Optics. 45: 1730-6. PMID 16572688 DOI: 10.1364/Ao.45.001730  0.42
2005 Chao W, Harteneck BD, Liddle JA, Anderson EH, Attwood DT. Soft X-ray microscopy at a spatial resolution better than 15 nm. Nature. 435: 1210-3. PMID 15988520 DOI: 10.1038/Nature03719  0.377
2003 Chao W, Anderson E, Denbeaux GP, Harteneck B, Liddle JA, Olynick DL, Pearson AL, Salmassi F, Song CY, Attwood DT. 20-nm resolution x-ray microscopy demonstrated by use of multilayer test structures [corrected]. Optics Letters. 28: 2019-21. PMID 14587801 DOI: 10.1364/Ol.28.002019  0.365
2003 Gibson EA, Paul A, Wagner N, Tobey R, Gaudiosi D, Backus S, Christov IP, Aquila A, Gullikson EM, Attwood DT, Murnane MM, Kapteyn HC. Coherent soft x-ray generation in the water window with quasi-phase matching. Science (New York, N.Y.). 302: 95-8. PMID 14526077 DOI: 10.1126/Science.1088654  0.328
2003 Chang C, Naulleau P, Attwood D. Analysis of illumination coherence properties in small-source systems such as synchrotrons. Applied Optics. 42: 2506-12. PMID 12749562 DOI: 10.1364/Ao.42.002506  0.359
2003 Chao W, Anderson E, Denbeaux G, Harteneck B, Liddle JA, Pearson A, Olynick D, Salmassi F, Song CY, Attwood D. Microscopy: Photon-BasedMicroscopy With 20-nmSpatial Resolution Optics & Photonics News. 14: 18-18. DOI: 10.1364/Opn.14.12.000018  0.315
2003 Chao W, Anderson EH, Denbeaux G, Harteneck B, Pearson AL, Olynick D, Salmassi F, Song C, Attwood D. Demonstration of 20 nm half-pitch spatial resolution with soft x-ray microscopy Journal of Vacuum Science & Technology B. 21: 3108-3111. DOI: 10.1116/1.1619956  0.45
2003 Takemoto K, Mizuno T, Yoshikawa T, Mishibata H, Ueki T, Uyama T, Miyoshi T, Sawa D, Matsumoto T, Wada N, Onoda H, Kojima K, Niemann B, Hettwer M, Rudolph D, ... ... Attwood D, et al. X-ray microscopy in Ritsumeikan Synchrotron Radiation center Journal De Physique Iv. 104: 57-61. DOI: 10.1051/Jp4:200300029  0.472
2002 Chang C, Anderson E, Naulleau P, Gullikson E, Goldberg K, Attwood D. Direct measurement of index of refraction in the extreme-ultraviolet wavelength region with a novel interferometer. Optics Letters. 27: 1028-30. PMID 18026354 DOI: 10.1364/Ol.27.001028  0.437
2002 Chang C, Naulleau P, Anderson E, Rosfjord K, Attwood D. Diffractive optical elements based on Fourier optical techniques: a new class of optics for extreme ultraviolet and soft x-ray wavelengths. Applied Optics. 41: 7384-9. PMID 12502293 DOI: 10.1364/Ao.41.007384  0.375
2002 Bartels RA, Paul A, Green H, Kapteyn HC, Murnane MM, Backus S, Christov IP, Liu Y, Attwood D, Jacobsen C. Generation of spatially coherent light at extreme ultraviolet wavelengths. Science (New York, N.Y.). 297: 376-8. PMID 12130779 DOI: 10.1126/Science.1071718  0.385
2002 Naulleau P, Goldberg KA, Anderson EH, Attwood D, Batson P, Bokor J, Denham P, Gullikson E, Harteneck B, Hoef B, Jackson K, Olynick D, Rekawa S, Salmassi F, Blaedel K, et al. Sub-70 nm extreme ultraviolet lithography at the Advanced Light Source static microfield exposure station using the engineering test stand set-2 optic Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 20: 2829. DOI: 10.1116/1.1524976  0.382
2002 Attwood D. Soft x-ray microscopy and extreme ultraviolet lithography: Imaging in the 20-50 nm regime (abstract) (invited) Review of Scientific Instruments. 73: 1637. DOI: 10.1063/1.1448129  0.426
2002 Köhler M, Zweck J, Bayreuther G, Fischer P, Schütz G, Denbeaux G, Attwood D. Micromagnetic investigation of sub-1 0 0-nm magnetic domains in atomically stacked Fe (0 0 1)/Au(0 0 1) multilayers Journal of Magnetism and Magnetic Materials. 240: 79-82. DOI: 10.1016/S0304-8853(01)00750-8  0.319
2001 Fischer P, Eimüller T, Schütz G, Bayreuther G, Tsunashima S, Takagi N, Denbeaux G, Attwood D. Magnetic domains in nanostructured media studied with M-TXM. Journal of Synchrotron Radiation. 8: 325-7. PMID 11512768 DOI: 10.1107/S0909049500015089  0.404
2001 Fischer P, Eimüller T, Glück S, Schütz G, Tsunashima S, Kumazawa M, Takagi N, Denbeaux G, Attwood D. High Resolution Imaging of Magnetic Domains with Magnetic Soft X-ray Microscopy Journal of the Magnetics Society of Japan. 25: 186-191. DOI: 10.3379/Jmsjmag.25.186  0.471
2001 Denbeaux G, Fischer P, Kusinski G, Le Gros M, Pearson A, Attwood D. A full field transmission x-ray microscope as a tool for high-resolution magnetic imaging Ieee Transactions On Magnetics. 37: 2764-2766. DOI: 10.1109/20.951300  0.422
2001 Fischer P, Eimüller T, Schütz G, Köhler M, Bayreuther G, Denbeaux G, Attwood D. Study of in-plane magnetic domains with magnetic transmission x-ray microscopy Journal of Applied Physics. 89: 7159-7161. DOI: 10.1063/1.1355333  0.401
2001 Denbeaux G, Anderson E, Chao W, Eimüller T, Johnson L, Köhler M, Larabell C, Legros M, Fischer P, Pearson A, Schütz G, Yager D, Attwood D. Soft X-ray microscopy to 25 nm with applications to biology and magnetic materials Nuclear Instruments and Methods in Physics Research, Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 467: 841-844. DOI: 10.1016/S0168-9002(01)00480-6  0.462
2001 Eimüller T, Fischer P, Köhler M, Scholz M, Guttmann P, Denbeaux G, Glück S, Bayreuther G, Schmahl G, Attwood D, Schütz G. Transmission X-ray microscopy using X-ray magnetic circular dichroism Applied Physics a: Materials Science and Processing. 73: 697-701. DOI: 10.1007/S003390100963  0.435
2001 Attwood DT. Applications of short wavelength radiation: Soft x-ray microscopy and EUV lithography Journal De Physique. Iv : Jp. 11.  0.33
2000 Anderson EH, Olynick DL, Harteneck B, Veklerov E, Denbeaux G, Chao W, Lucero A, Johnson L, Attwood D. Nanofabrication and diffractive optics for high-resolution X-ray applications Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18: 2970-2975. DOI: 10.1116/1.1321282  0.484
2000 Chang C, Naulleau P, Anderson E, Attwood D. Spatial coherence characterization of undulator radiation Optics Communications. 182: 25-34. DOI: 10.1016/S0030-4018(00)00811-7  0.409
1999 Hirai A, Takemoto K, Nishino K, Niemann B, Hettwer M, Rudolph D, Anderson E, Attwood D, Kern DP, Nakayama Y, Kihara H. Transmission X-Ray Microscopy with 50 nm Resolution Installed at Ritsumeikan Synchrotron Radiation Center. Japanese Journal of Applied Physics. 38: 274-278. DOI: 10.1143/Jjap.38.274  0.447
1998 Hirai A, Takemoto K, Nishino K, Watanabe N, Anderson E, Attwood D, Kern D, Hettwer M, Rudolph D, Aoki S, Nakayama Y, Kihara H. Imaging soft X-ray microscope at Rits Synchrotron Radiation Center. Journal of Synchrotron Radiation. 5: 1102-4. PMID 15263759 DOI: 10.1107/S0909049597018529  0.467
1998 Goldberg KA, Naulleau P, Lee S, Bresloff C, Henderson C, Attwood D, Bokor J. High-accuracy interferometry of extreme ultraviolet lithographic optical systems Journal of Vacuum Science & Technology B. 16: 3435-3439. DOI: 10.1116/1.590498  0.382
1998 Gwyn CW, Stulen R, Sweeney D, Attwood D. Extreme ultraviolet lithography Journal of Vacuum Science & Technology B. 16: 3142-3149. DOI: 10.1116/1.590453  0.34
1998 Lee SH, Naulleau P, Goldberg K, Tejnil E, Medecki H, Bresloff C, Chang C, Attwood D, Bokor J. At-wavelength interferometry of extreme ultraviolet lithographic optics Characterization and Metrology For Ulsi Technology. 449: 553-557. DOI: 10.1063/1.56843  0.353
1997 Tejnil E, Goldberg KA, Lee S, Medecki H, Batson PJ, Denham PE, MacDowell AA, Bokor J, Attwood D. At-wavelength interferometry for extreme ultraviolet lithography Journal of Vacuum Science & Technology B. 15: 2455-2461. DOI: 10.1116/1.589666  0.349
1996 Watanabe N, Aoki S, Shimanuki Y, Kawasaki K, Taniguchi M, Anderson E, Attwood D, Kern D, Shimizu S, Nagata H, Horikawa Y, Mochimaru S, Kihara H. Soft X-ray microscope with zone plate at UVSOR Journal of Electron Spectroscopy and Related Phenomena. 80: 365-368. DOI: 10.1016/0368-2048(96)02993-3  0.449
1995 Wang J‐, Kagoshima Y, Miyahara T, Ando M, Aoki S, Anderson E, Attwood D, Kern D. A zone plate soft x‐ray microscope using monochromatized undulator radiation at the beamline NE1B of the TRISTAN Accumulation Ring Review of Scientific Instruments. 66: 1401-1403. DOI: 10.1063/1.1145987  0.372
1993 Attwood D, Sommargren G, Beguiristain R, Nguyen K, Bokor J, Ceglio N, Jackson K, Koike M, Underwood J. Undulator radiation for at-wavelength interferometry of optics for extreme-ultraviolet lithography. Applied Optics. 32: 7022-31. PMID 20856562 DOI: 10.1364/Ao.32.007022  0.354
1993 Kagoshima Y, Wang J, Ando M, Aoki S, Anderson E, Attwood D, Kern D. Sub-100-nm-Resolution Zone Plate Soft X-Ray Microscope Using Undulator Radiation Japanese Journal of Applied Physics. 32: 3332-3333. DOI: 10.1143/Jjap.32.3332  0.468
1992 Attwood D. New Opportunities at Soft-X-Ray Wavelengths Physics Today. 45: 24-31. DOI: 10.1063/1.881314  0.468
1990 Rothman S, Anderson E, Attwood D, Batson P, Goncz K, Tackaberry R, Turek S, Howells M, Buckley C, Kern D, Jacobsen C, Kirz J, Rarback H, Rivers M, Shu D. Soft X-ray Microscopy in Biology and Medicine: Status and Prospects Physica Scripta. 1990: 18-22. DOI: 10.1088/0031-8949/1990/T31/002  0.373
1990 Kirz J, Ade H, Anderson E, Attwood D, Buckley C, Hellman S, Howells M, Jacobsen C, Kern D, Lindaas S, McNulty I, Oversluizen M, Rarback H, Rivers M, Rothman S, et al. X-ray Microscopy with the NSLS Soft X-ray Undulator Physica Scripta. 1990: 12-17. DOI: 10.1088/0031-8949/1990/T31/001  0.452
1990 Rarback H, Buckley C, Goncz K, Ade H, Anderson E, Attwood D, Batson P, Hellman S, Jacobsen C, Kern D, Kirz J, Lindaas S, McNulty I, Oversluizen M, Rivers M, et al. The scanning transmission microscope at the NSLS Nuclear Inst. and Methods in Physics Research, A. 291: 54-59. DOI: 10.1016/0168-9002(90)90033-3  0.407
1990 Attwood D. Challenges for utilization of the new synchrotron facilities Nuclear Inst. and Methods in Physics Research, A. 291: 1-7. DOI: 10.1016/0168-9002(90)90024-Z  0.366
1989 Rothman SS, Iskander N, Attwood D, Vladimirsky Y, McQuaid K, Grendell J, Kirz J, Ade H, McNulty I, Kern D. The interior of a whole and unmodified biological object--the zymogen granule--viewed with a high-resolution X-ray microscope. Biochimica Et Biophysica Acta. 991: 484-6. PMID 2730924 DOI: 10.1016/0304-4165(89)90077-9  0.459
1989 Buckley C, Rarback H, Alforque R, Shu D, Ade H, Hellman S, Iskander N, Kirz J, Lindaas S, Mcnulty I, Oversluizen M, Tang E, Attwood D, DiGennaro R, Howells M, et al. Soft-x-ray imaging with the 35 period undulator at the NSLS Review of Scientific Instruments. 60: 2444-2447. DOI: 10.1063/1.1140694  0.374
1988 Rarback H, Shu D, Feng SC, Ade Kirz HJ, McNulty I, Kern DP, Chang THP, Vladimirsky Y, Iskander N, Attwood D, McQuaid K, Rothman S. Scanning x-ray microscope with 75-nm resolution Review of Scientific Instruments. 59: 52-59. DOI: 10.1063/1.1139965  0.444
1985 Attwood D, Halbach K, Kim KJ. Tunable coherent X-rays Science. 228: 1265-1272. DOI: 10.1126/Science.228.4705.1265  0.441
1977 Attwood DT, Coleman LW. Picosecond X-Ray spectral studies Proceedings of Spie - the International Society For Optical Engineering. 97: 318-324. DOI: 10.1117/12.955239  0.317
1977 Attwood DT. TIME-RESOLVED X-RAY PINHOLE PHOTOGRAPHY OF COMPRESSED LASER FUSION TARGETS Int Congr On High Speed Photogr (Photonics), 12th. 97: 325-332.  0.336
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