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Deok-Yong Park, Ph.D. - Publications

Affiliations: 
2000 University of California, Los Angeles, Los Angeles, CA 
Area:
Materials Science Engineering, Metallurgy Engineering
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7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2013 Shin D, Sim C, Koo B, Park D. Effect of Deposition Conditions on Properties of Cu Thin Films Electrodeposited from Pyrophosphate Baths Journal of the Korean Chemical Society. 16: 19-29. DOI: 10.5229/Jkes.2013.16.1.19  0.331
2013 Park KY, Uhm YR, Choi SJ, Park D. The Effects of Current Density on the Grain Size of Electroplated Thick Film Nickel(Ni) by Using Ni Metal Powder Dissolved Chloride Bath Journal of Korean Medical Science. 23: 12-17. DOI: 10.4283/Jkms.2013.23.1.012  0.339
2011 Park D. Study of Stress Changes in Nanocrystalline Ni Thin Films Eletrodeposited from Chloride Baths Journal of the Korean Chemical Society. 14: 163-170. DOI: 10.5229/Jkes.2011.14.3.163  0.351
2010 Chang CH, Rheem Y, Choa Y, Park D, Myung NV. Galvanic displacement of BixTey thin films from sacrificial iron group thin films Electrochimica Acta. 55: 1072-1080. DOI: 10.1016/J.Electacta.2009.09.066  0.329
2010 Chang CH, Rheem Y, Choa Y, Shin DH, Park D, Myung NV. Bi and Te thin films synthesized by galvanic displacement from acidic nitric baths Electrochimica Acta. 55: 743-752. DOI: 10.1016/J.Electacta.2009.09.038  0.327
2006 Cho I, Park D, Ihn H. Study of Stress Changes in Nanocrystalline CoW Thin/Thick Film Alloys Eletrodeposited from Citrate Baths Journal of the Korean Chemical Society. 9: 141-150. DOI: 10.5229/Jkes.2006.9.4.141  0.33
2001 Park D, Yang J, Collins JM. Coarsening of Lamellar Microstructures in Directionally Solidified Yttrium Aluminate/Alumina Eutectic Fiber Journal of the American Ceramic Society. 84: 2991-2996. DOI: 10.1111/J.1151-2916.2001.Tb01126.X  0.407
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