Year |
Citation |
Score |
2019 |
Zhang B, Liu W, Meng L, Zhang Z, Zhang L, Wu X, Dai J, Mao G, Wei Y. Study of the perpendicular self-assembly of a novel high- block copolymer without any neutral layer on a silicon substrate. Rsc Advances. 9: 3828-3837. PMID 35518108 DOI: 10.1039/c8ra10319d |
0.626 |
|
2016 |
Ablikim M, Achasov MN, Ahmed S, Ai XC, Albayrak O, Albrecht M, Ambrose DJ, Amoroso A, An FF, An Q, Bai JZ, Baldini Ferroli R, Ban Y, Bennett DW, Bennett JV, ... ... Dai JP, et al. Observation of an Anomalous Line Shape of the η^{'}π^{+}π^{-} Mass Spectrum near the pp[over ¯] Mass Threshold in J/ψ→γη^{'}π^{+}π^{-}. Physical Review Letters. 117: 042002. PMID 27494467 DOI: 10.1103/Physrevlett.117.042002 |
0.347 |
|
2016 |
Ablikim M, Achasov MN, Ai XC, Albayrak O, Albrecht M, Ambrose DJ, Amoroso A, An FF, An Q, Bai JZ, Baldini Ferroli R, Ban Y, Bennett DW, Bennett JV, Bertani M, ... ... Dai JP, et al. Observation of h_{c} Radiative Decay h_{c}→γη^{'} and Evidence for h_{c}→γη. Physical Review Letters. 116: 251802. PMID 27391715 DOI: 10.1103/Physrevlett.116.251802 |
0.324 |
|
2006 |
Dai J, Chang SW, Hamad A, Yang D, Felix N, Ober CK. Molecular glass resists for high-resolution patterning Chemistry of Materials. 18: 3404-3411. DOI: 10.1021/Cm052452M |
0.621 |
|
2006 |
Bratton D, Yang D, Dai J, Ober CK. Recent progress in high resolution lithography Polymers For Advanced Technologies. 17: 94-103. DOI: 10.1002/Pat.662 |
0.517 |
|
2002 |
Bae YC, Douki K, Yu T, Dai J, Schmaljohann D, Koerner H, Ober CK, Conley W. Tailoring Transparency of Imageable Fluoropolymers at 157 nm by Incorporation of Hexafluoroisopropyl Alcohol to Photoresist Backbones Chemistry of Materials. 14: 1306-1313. DOI: 10.1021/Cm010789S |
0.676 |
|
2001 |
Bae YC, Douki K, Yu T, Dai J, Schmaljohann D, Kang SH, Kim KH, Koerner H, Conley W, Miller D, Balasubramanian R, Holl S, Ober CK. Rejuvenation of 248nm Resist Backbones for 157nm Lithography. Journal of Photopolymer Science and Technology. 14: 613-620. DOI: 10.2494/Photopolymer.14.613 |
0.68 |
|
2000 |
Schmaljohann D, Young CB, Dai J, Weibel GL, Hamad AH, Ober CK. Fundamental Studies of Fluoropolymer Photoresists for 157 nm Lithography. Journal of Photopolymer Science and Technology. 13: 451-458. DOI: 10.2494/Photopolymer.13.451 |
0.656 |
|
Show low-probability matches. |