Cody Friesen - Publications

Affiliations: 
Materials Science and Engineering Arizona State University, Tempe, AZ, United States 
Area:
Materials Science Engineering, Inorganic Chemistry

17 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2014 Mickelson L, Castro H, Switzer E, Friesen C. Bulk stress evolution during intercalation of lithium in graphite Journal of the Electrochemical Society. 161: A2121-A2127. DOI: 10.1149/2.0591414Jes  0.681
2013 Switzer EE, Zeller R, Chen Q, Sieradzki K, Buttry DA, Friesen C. Oxygen reduction reaction in ionic liquids: The addition of protic species Journal of Physical Chemistry C. 117: 8683-8690. DOI: 10.1021/Jp400845U  0.626
2012 Engstrom EL, Heaton T, Kennedy JK, Friesen C. Observations in the H-Pd{111} system via stress and EQCM measurements Journal of the Electrochemical Society. 159: A613-A617. DOI: 10.1149/2.069205Jes  0.31
2010 Tang L, Li X, Cammarata RC, Friesen C, Sieradzki K. Electrochemical stability of elemental metal nanoparticles. Journal of the American Chemical Society. 132: 11722-6. PMID 20669944 DOI: 10.1021/Ja104421T  0.301
2010 Tang L, Han B, Persson K, Friesen C, He T, Sieradzki K, Ceder G. Electrochemical stability of nanometer-scale Pt particles in acidic environments. Journal of the American Chemical Society. 132: 596-600. PMID 20017546 DOI: 10.1021/Ja9071496  0.327
2009 Mickelson LL, Friesen C. Direct observation of bifunctional electrocatalysis during CO oxidation at Ru(theta=0.37)/Pt{111} surfaces via surface stress measurements. Journal of the American Chemical Society. 131: 14879-84. PMID 19778065 DOI: 10.1021/Ja904432C  0.7
2009 Mickelson L, Friesen C. A minimally arbitrary numerical method for the separation of faradaic and background currents of interest Electrochemical and Solid-State Letters. 12: F43-F45. DOI: 10.1149/1.3243915  0.66
2009 Bautista-Martinez JA, Tang L, Belieres JP, Zeller R, Angell CA, Friesen C. Hydrogen redox in protic ionic liquids and a direct measurement of proton thermodynamics Journal of Physical Chemistry C. 113: 12586-12593. DOI: 10.1021/Jp902762C  0.607
2008 Mickelson L, Heaton T, Friesen C. Surface stress observations during the adsorption and electrochemical oxidation of CO on Pt{111} Journal of Physical Chemistry C. 112: 1060-1063. DOI: 10.1021/jp076502h  0.716
2007 Kennedy JK, Friesen C. The effect of oxygen adsorption on Cu{111} thin film growth stresses Journal of Applied Physics. 101. DOI: 10.1063/1.2436838  0.395
2006 Friesen C. Thermodynamic separability of ultra-thin film surfaces and interfaces Surface Science. 600: 1012-1016. DOI: 10.1016/J.Susc.2005.12.034  0.327
2005 Friesen C, Thompson CV. Comment on "Compressive stress in polycrystalline Volmer-Weber films". Physical Review Letters. 95: 229601; author reply. PMID 16384272 DOI: 10.1103/Physrevlett.95.229601  0.363
2005 Trimble T, Tang L, Vasiljevic N, Dimitrov N, van Schilfgaarde M, Friesen C, Thompson CV, Seel SC, Floro JA, Sieradzki K. Anion adsorption induced reversal of coherency strain. Physical Review Letters. 95: 166106. PMID 16241822 DOI: 10.1103/Physrevlett.95.166106  0.404
2004 Friesen C, Thompson CV. Correlation of stress and atomic-scale surface roughness evolution during intermittent homoepitaxial growth of (111)-oriented Ag and Cu. Physical Review Letters. 93: 056104. PMID 15323716 DOI: 10.1103/Physrevlett.93.056104  0.396
2004 Friesen C, Seel SC, Thompson CV. Reversible stress changes at all stages of Volmer-Weber film growth Journal of Applied Physics. 95: 1011-1020. DOI: 10.1063/1.1637728  0.394
2002 Friesen C, Thompson CV. Reversible stress relaxation during precoalescence interruptions of volmer-weber thin film growth. Physical Review Letters. 89: 126103. PMID 12225105 DOI: 10.1103/Physrevlett.89.126103  0.42
2001 Friesen C, Dimitrov N, Cammarata RC, Sieradzki K. Surface stress and electrocapillarity of solid electrodes Langmuir. 17: 807-815. DOI: 10.1021/La000911M  0.476
Show low-probability matches.