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Nan Chen - Publications

Affiliations: 
2010 University of Wisconsin, Madison, Madison, WI 
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39 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Ren H, Zou C, Chen N, Li R. Large-Scale Datastreams Surveillance via Pattern-Oriented-Sampling Journal of the American Statistical Association. 1-39. DOI: 10.6084/M9.Figshare.12928885.V1  0.341
2020 Zhang C, Chen N, Wu J. Spatial rank-based high-dimensional monitoring through random projection Journal of Quality Technology. 52: 111-127. DOI: 10.1080/00224065.2019.1571336  0.519
2020 Zhu J, Chen N, Shen C. A new data-driven transferable remaining useful life prediction approach for bearing under different working conditions Mechanical Systems and Signal Processing. 139: 106602. DOI: 10.1016/J.Ymssp.2019.106602  0.378
2019 Wang W, Chen N, Chen X, Yang L. A Variational Inference-Based Heteroscedastic Gaussian Process Approach for Simulation Metamodeling Acm Transactions On Modeling and Computer Simulation. 29: 1-22. DOI: 10.1145/3299871  0.661
2019 Wang R, Zhang L, Chen N. Spatial Correlated Data Monitoring in Semiconductor Manufacturing Using Gaussian Process Model Ieee Transactions On Semiconductor Manufacturing. 32: 104-111. DOI: 10.1109/Tsm.2018.2883763  0.714
2019 Peng W, Ye Z, Chen N. Joint Online RUL Prediction for Multivariate Deteriorating Systems Ieee Transactions On Industrial Informatics. 15: 2870-2878. DOI: 10.1109/Tii.2018.2869429  0.315
2019 Zhu J, Chen N, Peng W. Estimation of Bearing Remaining Useful Life Based on Multiscale Convolutional Neural Network Ieee Transactions On Industrial Electronics. 66: 3208-3216. DOI: 10.1109/Tie.2018.2844856  0.31
2018 Zhang C, Chen N. Statistical Analysis of Simulation Output from Parallel Computing Acm Transactions On Modeling and Computer Simulation. 28: 1-22. DOI: 10.1145/3186327  0.33
2018 Sun Q, Ye Z, Chen N. Optimal Inspection and Replacement Policies for Multi-Unit Systems Subject to Degradation Ieee Transactions On Reliability. 67: 401-413. DOI: 10.1109/Tr.2017.2778283  0.331
2017 Ren H, Chen N, Zou C. Projection-based outlier detection in functional data Biometrika. 104: 411-423. DOI: 10.1093/Biomet/Asx012  0.321
2017 Yuan Y, Chen N, Zhou S. Modeling Regression Quantile Process Using Monotone B-Splines Technometrics. 59: 338-350. DOI: 10.1080/00401706.2016.1211553  0.59
2017 Xu X, Chen N. A state-space-based prognostics model for lithium-ion battery degradation Reliability Engineering & System Safety. 159: 47-57. DOI: 10.1016/J.Ress.2016.10.026  0.307
2017 Dong H, Chen N, Wang K. Wafer yield prediction using derived spatial variables Quality and Reliability Engineering International. 33: 2327-2342. DOI: 10.1002/Qre.2192  0.308
2016 Xu X, Li Z, Chen N. A Hierarchical Model for Lithium-Ion Battery Degradation Prediction Ieee Transactions On Reliability. 65: 310-325. DOI: 10.1109/Tr.2015.2451074  0.304
2016 Zhang L, Wang K, Chen N. Monitoring wafers geometric quality using an additive Gaussian process model Iie Transactions (Institute of Industrial Engineers). 48: 1-15. DOI: 10.1080/0740817X.2015.1027455  0.715
2016 Chen N, Zi X, Zou C. A Distribution-Free Multivariate Control Chart Technometrics. 58: 448-459. DOI: 10.1080/00401706.2015.1049750  0.388
2016 Zhang C, Chen N, Zou C. Robust Multivariate Control Chart Based on Goodness-of-Fit Test Journal of Quality Technology. 48: 139-161. DOI: 10.1080/00224065.2016.11918156  0.391
2015 Tsui KL, Chen N, Zhou Q, Hai Y, Wang W. Prognostics and Health Management: A Review on Data Driven Approaches Mathematical Problems in Engineering. 2015: 793161. DOI: 10.1155/2015/793161  0.408
2015 Yang D, Chen N. Expanding Existing Solar Irradiance Monitoring Network Using Entropy Ieee Transactions On Sustainable Energy. 6: 1208-1215. DOI: 10.1109/Tste.2015.2421734  0.309
2015 Chen N, Tang Y, Ye ZS. Robust Quantile Analysis for Accelerated Life Test Data Ieee Transactions On Reliability. DOI: 10.1109/Tr.2015.2500368  0.383
2015 Zeng L, Chen N. Bayesian hierarchical modeling for monitoring optical profiles in low-E glass manufacturing processes Iie Transactions. 47: 109-124. DOI: 10.1080/0740817X.2014.892230  0.36
2015 Ou Y, Wu Z, Khoo MBC, Chen N. A rational sequential probability ratio test control chart for monitoring process shifts in mean and variance Journal of Statistical Computation and Simulation. 85: 1765-1781. DOI: 10.1080/00949655.2014.901327  0.411
2015 Chen N, Zhou S. CUSUM statistical monitoring of M/M/1 queues and extensions Technometrics. 57: 245-256. DOI: 10.1080/00401706.2014.923787  0.51
2015 Choe Y, Byon E, Chen N. Importance Sampling for Reliability Evaluation With Stochastic Simulation Models Technometrics. 57: 351-361. DOI: 10.1080/00401706.2014.1001523  0.374
2015 Chen N, Li Z, Ou Y. Multivariate Exponentially Weighted Moving-Average Chart for Monitoring Poisson Observations Journal of Quality Technology. 47: 252-263. DOI: 10.1080/00224065.2015.11918131  0.319
2015 Ou Y, Chen N, Khoo MBC. An efficient multivariate control charting mechanism based on SPRT International Journal of Production Research. 53: 1937-1949. DOI: 10.1080/00207543.2014.925601  0.382
2015 Ye Z, Chen N, Shen Y. A new class of Wiener process models for degradation analysis Reliability Engineering & System Safety. 139: 58-67. DOI: 10.1016/J.Ress.2015.02.005  0.362
2015 Chen N, Ye Z, Xiang Y, Zhang L. Condition-based maintenance using the inverse Gaussian degradation model European Journal of Operational Research. 243: 190-199. DOI: 10.1016/J.Ejor.2014.11.029  0.684
2015 Ye Z, Chen N, Tsui K. A Bayesian Approach to Condition Monitoring with Imperfect Inspections Quality and Reliability Engineering International. 31: 513-522. DOI: 10.1002/Qre.1609  0.366
2014 Ye Z, Xie M, Tang L, Chen N. Semiparametric Estimation of Gamma Processes for Deteriorating Products Technometrics. 56: 504-513. DOI: 10.1080/00401706.2013.869261  0.355
2014 Ye Z, Chen N. The Inverse Gaussian Process as a Degradation Model Technometrics. 56: 302-311. DOI: 10.1080/00401706.2013.830074  0.404
2013 Yuan Y, Chen N, Zhou S. Adaptive B-spline knot selection using multi-resolution basis set Iie Transactions (Institute of Industrial Engineers). 45: 1263-1277. DOI: 10.1080/0740817X.2012.726758  0.49
2013 Chen N, Tsui KL. Condition monitoring and remaining useful life prediction using degradation signals: revisited Iie Transactions. 45: 939-952. DOI: 10.1080/0740817X.2012.706376  0.377
2011 Chen N, Zhou S. Simulation-based estimation of cycle time using quantile regression Iie Transactions (Institute of Industrial Engineers). 43: 176-191. DOI: 10.1080/0740817X.2010.521806  0.564
2011 Chen N, Chen Y, Li Z, Zhou S, Sievenpiper C. Optimal variability sensitive condition-based maintenance with a Cox PH model International Journal of Production Research. 49: 2083-2100. DOI: 10.1080/00207541003694811  0.578
2011 Chen N, Yuan Y, Zhou S. Performance analysis of queue length monitoring of M/G/1 systems Naval Research Logistics. 58: 782-794. DOI: 10.1002/Nav.20483  0.541
2009 Loose JP, Chen N, Zhou S. Surrogate modeling of dimensional variation propagation in multistage assembly processes Iie Transactions (Institute of Industrial Engineers). 41: 893-904. DOI: 10.1080/07408170902906027  0.598
2009 Chen N, Zhou S. Detectability study for statistical monitoring of multivariate dynamic processes Iie Transactions (Institute of Industrial Engineers). 41: 593-604. DOI: 10.1080/07408170802389308  0.494
2008 Chen N, Zhou S, Chang TS, Huang H. Attribute control charts using generalized zero-inflated poisson distribution Quality and Reliability Engineering International. 24: 793-806. DOI: 10.1002/Qre.928  0.565
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